High-voltage detection module, device and method for multilayer capacitor

Abstract

The invention relates to a high-voltage detection module, device and method for a multilayer capacitor, and the device and method mainly employ a first electrode group and a second electrode group of the high-voltage detection module to clamp the multilayer capacitor for testing, and do not need any other mechanism or device to assist the supporting or fixing of the multilayer capacitor for the suspension testing, wherein air is directly used for insulation. Therefore, no metal filing is generated, and no surge can be generated. In addition, the first and second electrode groups can be used for contact testing firstly before the high-voltage detection, i.e., detecting the whether the electrode end faces of the first and second electrode groups and the multilayer capacitor fully contact with each other firstly, and then carrying out the high-voltage detection, so as to guarantee that the detection electrode groups and the multilayer capacitors are connected in advance, and prevent the poor contact from causing a testing failure.

Description

technical field [0001] The invention relates to a high-voltage detection module, high-voltage detection equipment and detection method of a laminated capacitor, in particular to a detection module, detection device and detection method suitable for high-voltage testing of a laminated capacitor. Background technique [0002] As the size of electronic devices continues to be thinner and smaller, multilayer capacitors have obvious advantages in volume compared to traditional ceramic capacitors. Therefore, the demand for multilayer capacitors continues to rise, and the development of capacitor specifications is also becoming more diverse. However, in terms of the permissible testing specifications and testing methods of the existing testing equipment for multilayer capacitors, it can no longer meet the requirements. [0003] Please also see Figure 1A and Figure 1B , Figure 1A It is a schematic diagram of a known turntable detection device, Figure 1B It is a partial cross-s...

AI Technical Summary

Problems solved by technology

That is to say, the known detection equipment does not carry out the so-called contact test (contact check), so the test failure caused by the electrical contact problem cannot be ruled out.

However, in view of such a situation, the known equipment will directly judge the multilayer capacitor C as a defective product, and cannot detect the situation of poor contact, which seriously affects the accuracy of the test.

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