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Defect location method based on text subject analysis of defect reports

A defect reporting and positioning method technology, which is applied in the direction of instruments, electrical digital data processing, calculation, etc., can solve problems such as difficult to meet, loss of important information of strong related words, special processing of defect source code file names and substring words, etc., to improve Precision and recall, the effect of improving accuracy

Active Publication Date: 2017-06-20
NANJING UNIV
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AI Technical Summary

Problems solved by technology

[0041] The problem described is a bug, but it has not been determined whether to fix it in the current version
[0048] In the previous defect localization model based on defect report text topic analysis, no special processing was performed on the substring words of the defect source code file name, and the important information of these strongly related words was lost, which was difficult to meet our desired effect.

Method used

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  • Defect location method based on text subject analysis of defect reports
  • Defect location method based on text subject analysis of defect reports
  • Defect location method based on text subject analysis of defect reports

Examples

Experimental program
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Effect test

example 1

[0143] Example 1: The L2SS model realizes the prediction of the defect report of the Eclipse project

[0144] 1. Input and output data description

[0145] We apply the method of the present invention to the defect report data of the Eclipse project. The input is the defect report text that has been resolved on the Eclipse project BugZilla. The statistics are as shown in Table 1: the data set has 6031 defect reports, and each defect report has The corresponding tags indicate files that need to be repaired.

[0146] The output is a quantitative evaluation of the 10-fold cross-validation of the L2SS topic model of the present invention on this data set.

[0147] 2. Model learning and parameter inference

[0148]First read all the defects, and read a stop word list at the same time. This stop word list includes not only the commonly used English stop word list, but also the stop words for the defect report itself, such as java language keywords. For each defect report, use the...

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Abstract

The invention discloses a defect location method based on text subject analysis of defect reports. The defect location method based on the text subject analysis of the defect reports comprises the steps that to solve the problem that the defect reports bring serious burdens to developers, the text analysis is conducted on solved defect reports in a defect tracking management system, a correlation between the defect reports and repairing codes is obtained, and unsolved defect reports are analyzed with the correlation, possible source code file lists to be repaired of new defect reports are provided for the developers, and therefore the maintenance efficiency of a software project is improved. On the basis of a supervised type text subject model Labeled-LDA (LLDA), a modified model of Label to Substrings (L2SS) is put forward. Experiments on an open source project Eclipse data set show that the defect location method based on the L2SS model has higher predictive effect than that of a traditional text subject model.

Description

technical field [0001] The invention relates to a defect location method based on defect report text subject analysis, which utilizes the text content in resolved defect reports to realize the location of defect source code files in unresolved defect reports. On the basis of topic analysis technology, using the feature that tag word substrings frequently appear in corresponding defect reports, a way of word generation is added, which effectively improves the accuracy of defect source code file location based on defect reports. Background technique [0002] In the process of large-scale open source software development, defect tracking management systems such as Bugzilla, Jira, GNATS, and trac are widely used to track and manage project defects. [0003] Take Bugzilla, the defect tracking management system in the Eclipse project, as an example. During the development, testing and maintenance of the entire project, when software development participants find a bug in the proje...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3608G06F11/3692
Inventor 吕建徐锋张晓飞
Owner NANJING UNIV
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