Electric connector accelerated storage life test method

Abstract

The invention discloses an electric connector accelerated storage life test method, which aims at the defects that the testing time of a constant stress accelerated life test is long, and the test precision of a progressive stress accelerated life test is not high. The electric connector accelerated storage life test method comprises the steps of: step 1, determining electric connector operating life t<g>, a storage environment temperature T<0>, a highest test temperature T<m> and cut-off time tau; step 2, determining an expression of a variance factor V<k> of an estimated value y(zeta 0) of a P-order quantile of electric connector storage life; step 3, calculating a minimum value V<k>(min) of the V<k>, and T<c>, k, pi, beta<0>, beta<1>, T<1> and sigma corresponding to the minimum value V<k>(min); step 4, calculating an electric connector test total sample size n; step 5 and 6, conducting two kinds of testing experiments; step 7, calculating estimated values of parameters of an electric connector model; step 8, and calculating storage life t<R> of the electric connector. The electric connector accelerated storage life test method can shorten the total testing time when compared with a constant stress accelerated life test scheme, and can realize rapid evaluation of the storage life of the electric connector.

Description

technical field [0001] The invention belongs to the technical field of life test of electrical connectors, in particular to an accelerated storage life test method of electrical connectors. Background technique [0002] For "long-term storage, one-time use" electrical connectors, major accidents are caused in order to avoid resource waste caused by early scrapping or have been scrapped but still put into use. Therefore, it is very necessary to evaluate the storage reliability of the electrical connector, and the evaluation of the storage reliability of the electrical connector is mostly realized by the accelerated storage life test. [0003] The test stress of the accelerated storage life test is determined by the environmental stress and failure mechanism in the actual storage environment. The failure mechanism of electrical connector storage environment mainly includes temperature and humidity stress. Since most electrical connectors use a sealing ring for compression se...

AI Technical Summary

Problems solved by technology

The sequential stress accelerated life test has the advantages of short test time and small sample size, but the statistical method is not yet mature and the test accuracy is not high. Therefore, it is necessary to find a combination of constant stress accelerated life test and sequential stress accelerated life test. The optimized design method of the accelerated storage life test program of the electrical connector, and then realize the rapid and accurate evaluation of the storage life of the electrical connector

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