Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Raman Spectrometer Calibration Method

A Raman spectroscopy and calibration method technology, applied in Raman scattering, instruments, measuring devices, etc., can solve the problems of lack of real-time performance and difficult to grasp conditions, and achieve good real-time performance, high calibration, and many calibration references. Effect

Active Publication Date: 2020-08-25
NANKAI UNIV
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantage of the existing self-calibration method is that it does not have real-time performance, only a constant correction value can be given, and it is difficult to grasp the conditions for self-calibration in what state

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Raman Spectrometer Calibration Method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0022] Such as figure 1 As shown, the first embodiment of the present invention includes the following steps,

[0023] Step 1, use the Raman spectroscopic detector to sample the signal of the standard unified test time T time period on the standard reference substance to obtain the reference spectrum S1, wherein the standard reference substance is polystyrene, and the notch filter of the Raman spectroscopic detector The optical density parameter of the sheet is 6.5~7.5;

[0024] Step 2, use the Raman spectrometer to sample the signal of the object to be detected in the T time period to obtain the initial spectrum S2;

[0025] Step 3, use the Raman spectrometer to sample the signal of the empty sample pool for a time period of T to obtain the current background spectrum S3;

[0026] Step 4: Calculate the first difference spectrum Sd1 between the reference s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
optical densityaaaaaaaaaa
Login to View More

Abstract

The invention relates to a calibration method of a Raman spectrum detector. The calibration method comprises the following operation steps: step 1, obtaining a reference spectrum S1; step 2, obtainingan initial spectrum S2; step 3, obtaining a current background spectrum S3; step 4, calculating a first difference spectrum Sd1 of the reference spectrum S1 and the initial spectrum S2, calculating asecond difference spectrum Sd2 of the reference spectrum S1 and the current background spectrum S3, and calculating a third difference spectrum Sd3 of the initial spectrum S2 and the current background spectrum S3; step 5, determining a first offset delta v1 and a second offset delta v2; and step 6, correcting a Raman spectrum of a detection result by using the first offset delta v1 or correctingthe Raman spectrum of the detection result by using a fourth offset delta v4. The calibration method provided by the invention has the advantages of multiple calibration references, high calibrationdegree and good real-time performance.

Description

technical field [0001] The invention relates to the technical field of Raman spectrum detection, in particular to a method for calibrating a Raman spectrum detector. Background technique [0002] The wavelength of the laser of the Raman spectrometer is usually determined by calibration measurement when the laser leaves the factory or when the Raman spectrometer leaves the factory. However, the wavelength of the laser will drift slightly due to ambient temperature and fluctuations in electronic circuits. Lasers used in Raman spectrometers generally have high requirements on the stability of the laser wavelength, requiring ±2cm-1 or higher, and their stability parameters directly affect the Raman shift measurement accuracy of the instrument. After the Raman spectrometer leaves the factory, the laser wavelength may drift after long-term use, environmental changes, and long-distance transportation. Usually, the laser wavelength is corrected by self-calibration and other methods...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/65G01N21/01
CPCG01N21/01G01N21/65
Inventor 徐晓轩王斌文虹镜时金蒙车颖梁菁徐阳阳杨江涛
Owner NANKAI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com