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Calibration method of Raman spectrum detector

A technology of Raman spectroscopy and calibration methods, applied in Raman scattering, instruments, measuring devices, etc., can solve the problems of difficult conditions and lack of real-time performance, and achieve good real-time performance, high calibration degree, and multiple calibration references Effect

Active Publication Date: 2018-06-15
NANKAI UNIV
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Problems solved by technology

The disadvantage of the existing self-calibration method is that it does not have real-time performance, only a constant correction value can be given, and it is difficult to grasp the conditions for self-calibration in what state

Method used

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  • Calibration method of Raman spectrum detector

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Embodiment Construction

[0021] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0022] Such as figure 1 As shown, the first embodiment of the present invention includes the following steps,

[0023] Step 1, use the Raman spectroscopic detector to sample the signal of the standard unified test time T time period on the standard reference substance to obtain the reference spectrum S1, wherein the standard reference substance is polystyrene, and the notch filter of the Raman spectroscopic detector The optical density parameter of the sheet is 6.5-7.5;

[0024] Step 2, use the Raman spectrometer to sample the signal of the substance to be detected in the T time period to obtain the initial spectrum S2;

[0025] Step 3, use the Raman spectrometer to sample the signal of the empty sample pool for a time period of T to obtain the current background spectrum S3;

[0026] Step 4: Calculate the first difference spectrum Sd1 between the referenc...

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Abstract

The invention relates to a calibration method of a Raman spectrum detector. The calibration method comprises the following operation steps: step 1, obtaining a reference spectrum S1; step 2, obtainingan initial spectrum S2; step 3, obtaining a current background spectrum S3; step 4, calculating a first difference spectrum Sd1 of the reference spectrum S1 and the initial spectrum S2, calculating asecond difference spectrum Sd2 of the reference spectrum S1 and the current background spectrum S3, and calculating a third difference spectrum Sd3 of the initial spectrum S2 and the current background spectrum S3; step 5, determining a first offset delta v1 and a second offset delta v2; and step 6, correcting a Raman spectrum of a detection result by using the first offset delta v1 or correctingthe Raman spectrum of the detection result by using a fourth offset delta v4. The calibration method provided by the invention has the advantages of multiple calibration references, high calibrationdegree and good real-time performance.

Description

technical field [0001] The invention relates to the technical field of Raman spectrum detection, in particular to a method for calibrating a Raman spectrum detector. Background technique [0002] The wavelength of the laser of the Raman spectrometer is usually determined by calibration measurement when the laser leaves the factory or when the Raman spectrometer leaves the factory. However, the wavelength of the laser will drift slightly due to ambient temperature and fluctuations in electronic circuits. Lasers used in Raman spectrometers usually have high requirements on the stability of the laser wavelength, requiring ±2cm-1 or higher, and its stability parameters directly affect the Raman shift measurement accuracy of the instrument. After the Raman spectrometer leaves the factory, the laser wavelength may drift after long-term use, environmental changes, and long-distance transportation. Usually, the laser wavelength is corrected by self-calibration and other methods. T...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/65G01N21/01
CPCG01N21/01G01N21/65
Inventor 徐晓轩王斌文虹镜时金蒙车颖梁菁徐阳阳杨江涛
Owner NANKAI UNIV
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