Material analysis method and device

An analysis method and analysis device technology, applied in the direction of analysis materials, image analysis, measurement devices, etc., can solve the problems of seed damage, long identification time, etc., and achieve the effect of analysis and identification

Inactive Publication Date: 2018-06-22
CHINA HEFEI TAIHE OPTOELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

These methods require strong professional background knowledge and long identification time and will cause certain damage to the seeds

Method used

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  • Material analysis method and device
  • Material analysis method and device

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Embodiment Construction

[0051] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0052] Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts belong to the protection scope of the present invention.

[0053] At present, the conventional method ...

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Abstract

Embodiments of the invention relate to the technical field of sample classification, and in particular to a material analysis method and device. The method comprises the following steps of: obtaininga shot image comprising a plurality of materials; segmenting the image to obtain a plurality of pictures, wherein each picture comprises a material; respectively processing the pictures to obtain material information corresponding to the pictures; respectively matching the material information with pre-stored normal material models and abnormal material models so as to obtain material models corresponding to the material information; and processing the image according to the material models corresponding to the material models. Through the method, materials in images can be rapidly analyzed and identified.

Description

technical field [0001] The invention relates to the technical field of sample classification, in particular to a material analysis method and device. Background technique [0002] Seeds are the most basic means of production in agricultural production and the basis of all agricultural production. Accurate and rapid identification of seeds has important guiding significance for production. Commonly used methods for seed identification at home and abroad mainly include fluorescence scanning identification method, chemical identification method and electrophoresis identification method. These methods require strong professional background knowledge and long identification time and will cause certain damage to the seeds. Therefore, how to non-destructively and quickly identify crop seed categories is an important research direction. Contents of the invention [0003] In view of this, the object of the present invention is to provide a material analysis method and device to ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/12G06T7/70G06T7/90G01N21/84
CPCG06T7/0014G01N21/84G01N2021/8466G06T7/12G06T7/70G06T7/90G06T2207/30188
Inventor 陈猛徐雪颜天信唐麟杨贤良章广飞
Owner CHINA HEFEI TAIHE OPTOELECTRONICS TECH
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