Small current test abnormality judging method for excitation system
A technology of excitation system and discrimination method, which is applied in the field of measurement, can solve problems that affect the timeliness of abnormal judgment in small current tests, errors in temperature signal measurement, and easy jamming of switches, etc., so as to avoid sudden accidents and control gradual occurrence failures, increased availability, and reduced unnecessary downtime
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[0027] The specific implementation manners of the present invention will be described in further detail below in conjunction with the accompanying drawings.
[0028] Such as Figure 1-2 As shown, the present invention relates to a method for judging the abnormality of the small current test of the excitation system, comprising the following steps:
[0029] A. Collect the three-phase input current I of the AC side of the rectifier A , I B` , I C and rectifier DC side load current I R ;
[0030] B. Through the formula: I AV =(I A +I B +I C ) / 3, the calculated AC average current I AV ;
[0031] By formula:
[0032]
[0033] Calculate the differential current I D ;
[0034] By formula:
[0035]
[0036] Calculate the DC average current I F ;
[0037] C. When|I F -I R |>0.6I R When the small current test of the excitation system is judged to be abnormal, when the small current test is normal, the DC average current is approximately equal to the DC side load...
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