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Microparticle detection device

A detection device and a technology for microparticles, which are used in measurement devices, material analysis by optical means, instruments, etc., to achieve the effect of improving image contrast and good optical display effect

Pending Publication Date: 2021-02-02
UTECHZONE CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The light source is adapted to provide an illuminating beam

Method used

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  • Microparticle detection device
  • Microparticle detection device
  • Microparticle detection device

Examples

Experimental program
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Embodiment Construction

[0030] figure 1 It is a schematic diagram of a particle detection device according to an embodiment of the present invention. Please refer to figure 1 . This embodiment provides a microparticle detection device 100 for detecting a plurality of microparticles P of a target object 10 . For example, the target object 10 is a circuit board, and the plurality of particles P are conductive particles on the circuit board. However, the microparticle detection device 100 can actually be applied to detect different types of protruding microparticles, and the present invention is not limited thereto.

[0031] The particle detection device 100 includes a light source 110 , an optical system 120 and an image acquisition device 130 . Specifically, in this embodiment, the particle detection device 100 further includes a processing unit 140 . The light source 110 is adapted to provide an illumination beam L1 into the optical system 120 . The light source 110 is, for example, a halogen l...

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Abstract

The invention provides a microparticle detection device which is used for detecting a plurality of microparticles of a target object. The microparticle detection device comprises a light source, an optical system and an image acquisition device. Light source adapted to provide an illumination beam. The optical system is disposed on a transmission path of the illumination beam. The optical system includes an optical focusing element having a depth-of-field value. The optical system provides a detection light beam to a target object to generate an image light beam. The image acquisition device is disposed on a transmission path of the image light beam. The detection light beam is a collimated light beam, and the focal plane of the optical focusing element is not overlapped with the surface with the microparticles in the target object.

Description

technical field [0001] The invention relates to an illuminating device, in particular to a particle detection device. Background technique [0002] With the development of science and technology, people have higher and higher requirements for the precision and quality of electronic components in electronic products. For example, the quality and appearance inspection of various components on circuit boards in electronic products is an important step in the manufacturing and inspection process to ensure that the circuit boards function normally. In the current production process of the circuit board, there is a step of bonding the copper foil substrate after applying the conductive particle slurry. Therefore, in order to ensure that the circuit board has a good manufacturing process, during or after the manufacturing process, it is necessary to observe the structure of the tiny conductive particles with testing equipment to calculate the density of the conductive particles. ...

Claims

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Application Information

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IPC IPC(8): G01N21/84G01N21/01
CPCG01N21/84G01N21/01
Inventor 黄冠勋张勋豪
Owner UTECHZONE CO LTD