Online detection method of test board

Abstract

An online detection method for a test board, wherein the test board is installed on an automatic test machine and is used to test an integrated circuit based on a signal provided by the automatic test machine. The test board includes multiple signal paths for electrically connecting to the integrated circuit to be tested so as to transmit a test signal to the integrated circuit. The online detection method includes: suspending the ends of the multiple signal paths used to connect to the integrated circuit, detecting whether each of the multiple signal paths has leakage, and determining that the test board is operating abnormally in response to leakage of at least one of the multiple signal paths. The online detection method is performed before testing each batch of integrated circuits.

Description

Technical Field

[0001] The present disclosure relates to the technical field of integrated circuit testing, and in particular to an online detection method for a test board. Background Art

[0002] The field of integrated circuit testing technology is a core industry of the new generation of information technology industry. It has an extremely important strategic position and is one of the most important high-tech technologies to promote the development of national economy and social informatization. After integrated circuits, such as chips, are packaged, they need to undergo various tests, such as reliability testing, which is usually completed using an automatic tester in conjunction with a test board. Summary of the invention

[0003] Some embodiments of the present disclosure provide an online detection method of a test board, wherein the test board is mounted on an automatic tester and is used to test an integrated circuit based on a signal provided by the automatic tester. The test board includes a plurality of signal paths, which are used to be electrically connected to the integrated circuit to be tested so as to transmit a test signal to the integrated circuit. The online detection method includes:

[0004] Suspending the ends of the plurality of signal paths used to connect the integrated circuit, detecting whether each of the plurality of signal paths has leakage, and determining that the test board is operating abnormally in response to at least one of the plurality of signal paths having leakage,

[0005] The online detection method is performed before testing each batch of integrated circuits.

[0006] In some embodiments, the automatic test machine includes a parameter measurement unit, and the detecting whether each of the plurality of signal paths has leakage includes:

[0007] applying a first voltage to each of the plurality of signal paths using a parameter measurement unit, and testing a first current of each signal path,

[0008] For each signal path, in response to the first current being greater than a first threshold, it is determined that the signal path is leaking.

[0009] In some embodiments, using the plurality of signal paths to connect the ends of the integrated circuit to be suspended comprises:

[0010] The integrated circuit to be tested is not placed at the position to be tested so that ends of the plurality of signal paths used to connect the integrated circuit are suspended.

[0011] In some embodiments, the online detection method further comprises:

[0012] The multiple signal paths are used to connect the ends of the integrated circuit to ground, and each of the multiple signal paths is detected to see whether it has abnormal impedance. In response to at least one of the multiple signal paths having abnormal impedance, it is determined that the test board is operating abnormally.

[0013] In some embodiments, using the plurality of signal paths to connect the ends of the integrated circuit to ground includes:

[0014] A metal block having the same shape and volume as the integrated circuit to be tested is placed at the position to be tested, so that the multiple signal paths of the test board are electrically connected to the metal block.

[0015] In some embodiments, the automatic test machine includes a parameter measurement unit, and the detecting whether each of the plurality of signal paths has abnormal impedance includes:

[0016] applying a second voltage to each of the plurality of signal paths using a parameter measurement unit, and testing a second current of each signal path,

[0017] For each signal path, the impedance of the signal path is obtained according to the second voltage and the second current, and in response to the impedance being greater than a second threshold, it is determined that the signal path has abnormal impedance.

[0018] In some embodiments, the test board also includes a peripheral circuit, and the online detection method also includes: suspending the ends of the integrated circuit used to connect the multiple signal paths, and using an automatic testing machine to detect the peripheral circuit of the test board to determine whether the peripheral circuit of the test board is working abnormally, and in response to the abnormal working of the tested peripheral circuit, determining that the test board is working abnormally.

[0019] In some embodiments, the peripheral circuit includes a relay, the automatic test machine includes a first signal source port and a first signal capture port, the first signal source port, the relay and the first signal capture port constitute a first loop,

[0020] The step of using an automatic testing machine to detect the peripheral circuit of the test board to determine whether the peripheral circuit of the test board is working abnormally includes:

[0021] In response to the relay being in a connected state, the automatic test machine outputs the first detection signal from the first signal source port, and if the first signal capture port does not detect the first feedback signal, determines that the relay is operating abnormally;

[0022] In response to the relay being in an open state, the automatic test machine outputs a first detection signal from the first signal source port, and if the first signal capture port detects a first feedback signal, it is determined that the relay is operating abnormally; and

[0023] In response to the relay operating abnormally, it is determined that the peripheral circuit operates abnormally.

[0024] In some embodiments, the peripheral circuit includes an amplifier, the test board is provided with an amplifier feedback loop, the automatic test machine includes a second signal source port and a second signal capture port, the second signal source port, the amplifier and the second signal capture port constitute a second loop,

[0025] The step of using an automatic testing machine to detect the peripheral circuit of the test board to determine whether the peripheral circuit of the test board is working abnormally includes:

[0026] The automatic test machine outputs a second detection signal from the second signal source port, and if the second signal capture port does not detect the second feedback signal, determines that the amplifier is operating abnormally; and

[0027] In response to the amplifier operating abnormally, it is determined that the peripheral circuit operates abnormally.

[0028] In some embodiments, in response to the test board operating abnormally, the automatic testing machine issues an alarm message.

[0029] Compared with the related art, the above solution of the embodiment of the present disclosure has at least the following beneficial effects:

[0030] The test board is tested online by using the test resources on the automatic test machine, avoiding manual testing after the test board is disassembled from the automatic test machine, improving the testing efficiency of the test board, and further improving the testing efficiency of the integrated circuit. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] The drawings herein are incorporated into the specification and constitute a part of the specification, showing embodiments consistent with the present disclosure, and together with the specification, are used to explain the principles of the present disclosure. Obviously, the drawings described below are only some embodiments of the present disclosure, and for ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings:

[0032] Figure 1 A schematic diagram of the structure of a test system provided in some embodiments of the present disclosure;

[0033] Figure 2 A flow chart of an online detection method of a test board provided in some embodiments of the present disclosure;

[0034] Figure 3 A schematic diagram of the structure of a circuit board facing a reinforcing plate provided in some embodiments of the present disclosure;

[0035] Figure 4 A schematic diagram of the structure of a circuit board provided in some embodiments of the present disclosure, which is away from a reinforcing plate;

[0036] Figure 5 A schematic diagram of the structure of a reinforcement plate provided in some embodiments of the present disclosure;

[0037] Figure 6 A flow chart of an online detection method of a test board provided in some embodiments of the present disclosure;

[0038] Figure 7 A schematic diagram of online detection of a test board provided in some embodiments of the present disclosure;

[0039] Figure 8 A schematic diagram of online detection of a test board provided in some embodiments of the present disclosure. DETAILED DESCRIPTION

[0040] In order to make the purpose, technical solutions and advantages of the present disclosure clearer, the present disclosure will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present disclosure, rather than all of the embodiments. Based on the embodiments in the present disclosure, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present disclosure.

[0041] The terms used in the embodiments of the present disclosure are only for the purpose of describing specific embodiments, and are not intended to limit the present disclosure. The singular forms "a", "said" and "the" used in the embodiments of the present disclosure and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings, and "multiple" generally includes at least two.

[0042] It should be understood that the term "and / or" used in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0043] It should be understood that although the terms first, second, third, etc. may be used to describe in the present disclosure, these should not be limited to these terms. These terms are only used to distinguish. For example, without departing from the scope of the present disclosure, the first may also be referred to as the second, and similarly, the second may also be referred to as the first.

[0044] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a product or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such product or device. In the absence of more restrictions, the elements defined by the sentence "comprises a" do not exclude the presence of other identical elements in the product or device including the elements.

[0045] The present disclosure provides an online detection method for a test board, wherein the test board is installed on an automatic test machine and is used to test an integrated circuit based on a signal provided by the automatic test machine. The test board includes multiple signal paths for electrically connecting to the integrated circuit to be tested so as to transmit a test signal to the integrated circuit. The online detection method includes: suspending ends of the multiple signal paths used to connect the integrated circuit, detecting whether each of the multiple signal paths has leakage, and determining that the test board is operating abnormally in response to leakage of at least one of the multiple signal paths. The online detection method is performed before testing each batch of integrated circuits.

[0046] The present invention utilizes the test resources on the automatic test machine to perform online testing on the test board, avoiding manual testing after the test board is disassembled from the automatic test machine, improving the testing efficiency of the test board, and further improving the testing efficiency of the integrated circuit.

[0047] The optional embodiments of the present disclosure are described in detail below with reference to the accompanying drawings.

[0048] Figure 1 A schematic diagram of the structure of a test system provided in some embodiments of the present disclosure, such as Figure 1 As shown, the test system 100 includes an automatic tester 10 (ATE, Automatic Test Equipment), for example, an integrated circuit automatic tester. The automatic tester is used to detect the performance and function of an integrated circuit, such as a chip, and a plurality of connection components are arranged on the top surface thereof, which are used to connect with a test board and provide the test board with tester resources, i.e., various test signals. The chip is, for example, an FBGA chip, a flash chip, etc.

[0049] The test board 20 is arranged on the top surface of the automatic test machine 10 and connected to the automatic test machine. The test board 20 includes a circuit board 21 and a reinforcing plate 22 that supports and fixes the circuit board 21. The circuit board 21 is used to receive resources from the automatic test machine to test an integrated circuit to be tested, such as a chip. The circuit board 21 is, for example, a PCB board. The reinforcing plate 22 is used to support and fix the circuit board, so that the overall strength of the test board 20 is enhanced and it is not easy to deform, such as Figure 1As shown, when performing integrated circuit testing, the reinforcing plate 22 is located between the circuit board 21 and the automatic tester 10 .

[0050] A fixture 40 may be installed on the side of the test board 20 away from the automatic test machine 10 . The fixture 40 is used to fix and connect the integrated circuit 50 to be tested. The fixture 40 has an interface for connecting the integrated circuit 50 and the circuit board 21 .

[0051] Figure 2 A schematic diagram of the structure of a test board provided for some embodiments of the present disclosure; Figure 3 A schematic diagram of the structure of a circuit board facing a reinforcing plate provided in some embodiments of the present disclosure; Figure 4 A schematic diagram of the structure of a circuit board provided in some embodiments of the present disclosure, which is away from a reinforcing plate; Figure 5 A schematic diagram of the structure of a reinforcement plate provided in some embodiments of the present disclosure.

[0052] like Figure 2-5 As shown, the test board 20 includes a circuit board 21 and a reinforcing plate 22 supporting the circuit board 21. The circuit board 21 includes a test circuit assembly 211, which is arranged on one side of the circuit board 21, for example, on the side facing the reinforcing plate 22. The test circuit assembly 211 converts the test signal provided by the automatic test machine 10 into a test signal required for testing the integrated circuit 50. The test board 20 also includes a mounting component 212, which is arranged on the other side of the circuit board, for example, on the side away from the reinforcing plate 22, and is configured as a fixture 40 for mounting the integrated circuit. The orthographic projection of the mounting component 212 on the circuit board 21 falls within the orthographic projection of the test circuit assembly 211 on the circuit board, that is, the test circuit assembly 211 occupies the same or larger area than the mounting component 212.

[0053] The reinforcing plate 22 is configured to support and fix the circuit board 21, and the reinforcing plate 22 includes a first hollow hole 221, and the orthographic projection of the first hollow hole 221 on the circuit board 21 covers the orthographic projection of the test circuit assembly 211 on the circuit board 21. That is, the area of ​​the first hollow hole 221 is the same as or larger than the area occupied by the test circuit assembly 211.

[0054] In other embodiments, Figure 3 As shown, the circuit board 21 may further include a peripheral circuit 213, for example, arranged on both sides of the test circuit component 211, and spaced apart from the test circuit component 211. The peripheral circuit 213 is used to provide auxiliary test signals, for example, including relays, amplifiers, memories, etc. The circuit board 21 may further include a plurality of interface circuit components 214, arranged on both sides of the test circuit component 211 and the peripheral circuit 213, and configured to receive resources of the automatic test machine, for example, electrically connected to the probe of the automatic test machine 10. Figure 3As shown, on each side of the test circuit component 211 and the peripheral circuit 213, the interface circuit components 214 are arranged side by side, for example, in a row, and are spaced apart from each other.

[0055] Accordingly, in other embodiments, Figure 5 As shown, the reinforcing plate 22 also has a second hollow hole 222, corresponding to the peripheral circuit 213 on the circuit board 21, for example, arranged on both sides of the first hollow hole 221. The orthographic projection of the second hollow hole 222 on the circuit board 21 covers the orthographic projection of the corresponding peripheral circuit 213 on the circuit board 21. The reinforcing plate 22 also has a plurality of third hollow holes 222, corresponding one-to-one to the plurality of interface circuit components 214 on the circuit board 21, for example, arranged on both sides of the first hollow hole 221 and the second hollow hole 222, as shown in FIG. Figure 5 As shown, on each side of the first hollow hole 221 and the second hollow hole 222, the third hollow holes 222 are arranged side by side, for example, in a row, and are spaced apart from each other. In this case, the reinforcing plate 22 is basically in a grid-like structure.

[0056] The test board 20 includes multiple signal paths for electrically connecting to the integrated circuit to be tested to transmit test signals to the integrated circuit. Specifically, the signal path refers to the internal circuit of the test board, one end of which is arranged at the interface circuit component 214 and connected to the test resources of the automatic test machine 10, and the other end is arranged at the mounting component 212 and is configured to be connected to the corresponding pins of the integrated circuit 50 through the fixture 40.

[0057] When testing integrated circuits such as chips, it is usually necessary to select a test board that matches the integrated circuit and install the test board on an automatic tester to perform the test of the integrated circuit. The integrated circuit is usually tested in batches. When the test board is abnormal, such as damaged, it will affect the test of the integrated circuit. In the related art, the test board is usually tested by PCB flying probe detection in the new processing stage before it is put into use to test various performances of the test board to avoid damage to the test board. For the test board that has been put into use, it is usually preliminarily judged that the test board is abnormal by the test yield of the integrated circuit. For example, during the integrated circuit testing process, if the yield of the test batch decreases significantly, it may be caused by the abnormality of the test board. At this time, it is necessary to stop the test of the integrated circuit, remove the test board from the automatic tester, and manually check the test board, such as using PCB flying probe inspection to determine the specific abnormality of the test board. In this case, the detection efficiency of the test board is not high, and it will affect the test efficiency of the integrated circuit.

[0058] In order to overcome the above problems, the inventor fully utilizes the functions of the automatic test machine and develops a detection program for the test board, which can perform online detection on the test board. The detection program is, for example, a computer program. The detection program instructions are called and executed by a processor, such as a processor of the automatic test machine, to implement the online detection method of the test board described later in this disclosure. The detection program can be, for example, nested in the test program of the integrated circuit batch test, so that the test board can be detected when the test board is installed on the automatic test machine. The test board detection program and the integrated circuit batch test program can also be used as two processes. Before each batch of integrated circuits is tested, the test board detection program is first executed. When the test board is ensured to work normally, the integrated circuit batch test program is executed to test the batch of integrated circuits. In this way, manual detection is avoided after the test board is disassembled from the automatic test machine, the detection efficiency of the test board is improved, and then the detection efficiency of the integrated circuit is improved.

[0059] Figure 6 A flowchart of an online detection method for a test board provided in some embodiments of the present disclosure.

[0060] like Figure 6 As shown, the online detection method of the test board may specifically include the following steps:

[0061] S601: Suspending the ends of the integrated circuit used to connect the multiple signal paths, detecting whether each of the multiple signal paths has leakage, and determining that the test board is operating abnormally in response to at least one of the multiple signal paths having leakage.

[0062] Specifically, the integrated circuit to be tested is not placed at the test position so that the ends of the multiple signal paths used to connect the integrated circuit are suspended, and a first voltage is applied to each of the multiple signal paths by using a parameter measurement unit on an automatic testing machine, and a first current of each signal path is tested. For each signal path, in response to the first current being greater than a first threshold, it is determined that the signal path has leakage, and in response to the first current being less than or equal to the first threshold, it is determined that the signal path has no leakage.

[0063] The pin parametric measurement unit (PPMU) is a functional module on the automatic tester 10, which can detect the state of each signal path. The parameter measurement unit can input voltage into the signal path and detect the circuit in the signal path, or input current into the signal path and detect the voltage in the signal path, thereby obtaining the state of the signal path.

[0064] For example, the force voltage measure current function (FVMI) of the parameter measurement unit is used to apply a first voltage to each signal path, such as the power supply voltage of the integrated circuit, such as 3.3V, to test the magnitude of the current in each signal path. Since the integrated circuit to be tested is not placed at the position to be tested, the end of each of the multiple signal paths used to connect the integrated circuit is suspended, and theoretically no current loop is formed. Therefore, for each signal path, the absolute value of the current measured by the parameter measurement unit should be within a very small range, such as within 10μA. If the absolute value of the current measured by the parameter measurement unit is less than or equal to the first threshold, such as 10μA, it can be determined that the signal path is working normally. If the absolute value of the current measured by the parameter measurement unit is greater than the first threshold, such as 10μA, it can be determined that the signal path is working abnormally, for example, it can be determined that there is leakage in the signal path, and then it is determined that the test board is working abnormally, and the test board needs to be checked to see whether the leakage of the signal path exceeds the standard due to moisture on the test board, and the signal path with problems is repaired.

[0065] like Figure 6 As shown, the online detection method of the test board may specifically include the following steps:

[0066] S603: Use the multiple signal paths to connect the ends of the integrated circuit to ground, detect whether each of the multiple signal paths has abnormal impedance, and determine that the test board is operating abnormally in response to at least one of the multiple signal paths having abnormal impedance.

[0067] Specifically, a metal block having the same shape and volume as the integrated circuit to be tested is placed at the position to be tested, so that the multiple signal paths of the test board are electrically connected to the metal block, and the metal block is equivalent to the ground, that is, the multiple signal paths of the test board are grounded. In other embodiments, the metal block can also be connected to the ground signal, for example, the metal block is electrically connected to the ground signal path of the test board. A second voltage is applied to each of the multiple signal paths using a parameter measurement unit, and the second current of each signal path is tested. For each signal path, the impedance of the signal path is obtained according to the second voltage and the second current. In response to the impedance being greater than the second threshold, it is determined that the signal path has abnormal impedance.

[0068] For example, the force voltage measure current function (FVMI) of the parameter measurement unit is used to apply a second voltage, such as 0.2V, to each signal path to test the magnitude of the current in each signal path. The magnitude of the second voltage is determined according to the actual situation. For example, considering that the normal impedance to ground of each signal path is several Ω, the control current is about tens of mA, which meets the measurement range of the parameter measurement unit of the tester. Since the position to be tested is a metal block with the same shape and volume as the integrated circuit to be tested, the multiple signal paths of the test board are electrically connected to the metal block, that is, grounded, and theoretically a short circuit is formed. For each signal path, the impedance of the signal path can be obtained according to the second voltage input by the parameter measurement unit and the measured current. Usually, the impedance on the signal path should be in a very small range, for example, within 10Ω. If the impedance of a signal path is less than or equal to the second threshold, for example, 10Ω, then it can be determined that the signal path is working normally. If the impedance of a signal path is greater than the second threshold, for example, 10Ω, then it can be determined that the signal path is working abnormally, and then it can be determined that the test board is working abnormally. It is necessary to inspect the test board to check whether the impedance of some signal paths exceeds expectations due to contamination or damage, and repair the problematic signal paths.

[0069] It will be understood by those skilled in the art that, since the routing lengths of the signal paths on the test board are different, the setting of the second threshold is not fixed. A larger second threshold can be set for a signal path with a longer routing length, and a smaller second threshold can be set for a signal path with a shorter routing length.

[0070] like Figure 6 As shown, the online detection method of the test board may specifically include the following steps:

[0071] S605: Use the multiple signal paths to connect the end suspensions of the integrated circuit, and use an automatic testing machine to detect the peripheral circuits of the test board to determine whether the peripheral circuits of the test board are working abnormally. In response to the abnormal working of the tested peripheral circuits, determine that the test board is working abnormally.

[0072] When testing the peripheral circuit of the test board, the integrated circuit to be tested is not placed at the position to be tested so that the ends of the plurality of signal paths used to connect the integrated circuit are suspended. The peripheral circuit includes, for example, relays, amplifiers, etc., and the peripheral circuit is tested using the test resources of the automatic test machine.

[0073] The following explains the detection of peripheral circuits using relays and amplifiers as examples.

[0074] In some embodiments, the peripheral circuit includes a relay, the automatic test machine includes a first signal source port and a first signal capture port, the first signal source port, the relay and the first signal capture port constitute a first loop, and the use of the automatic test machine to detect the peripheral circuit of the test board to determine whether the peripheral circuit of the test board is operating abnormally includes: in response to the relay being in a connected state, the automatic test machine outputs the first detection signal from the first signal source port, and if the first signal capture port does not detect the first feedback signal, it is determined that the relay is operating abnormally; in response to the relay being in a disconnected state, the automatic test machine outputs the first detection signal from the first signal source port, and if the first signal capture port detects the first feedback signal, it is determined that the relay is operating abnormally; and in response to the relay operating abnormally, it is determined that the peripheral circuit is operating abnormally.

[0075] Specifically, Figure 7 Schematic diagram of online testing of a test board provided in some embodiments of the present disclosure. Figure 7 As shown, the automatic test machine 10 includes a first signal source port SRC1 and a first signal capture port CAP1, and the peripheral circuit 213 of the test board 20 installed on the automatic test machine 10 includes a relay K. The first signal source port SRC1, the relay K and the first signal capture port CAP1 constitute a first loop.

[0076] The first signal source port SRC1 includes a first signal source first subport SRC1+ and a first signal source second subport SRC1-, and the first signal source first subport SRC1+ and the first signal source second subport SRC1-, for example, jointly provide a differential signal. The number of relays K is, for example, two, including a first relay K1 and a second relay K2, and each of the first relay K1 and the second relay K2 includes two switches, configured to control the conduction and disconnection of the circuit in which it is located. The first signal source first subport SRC1+ is sequentially connected to the first switch of the first relay K1 and the first switch of the second relay K2, and the first signal source second subport SRC1- is sequentially connected to the second switch of the first relay K1 and the second switch of the second relay K2, and the connection node between the first switch of the first relay K1 and the first switch of the second relay K2 is used to be electrically connected to the first bus port BUS+ of the chip to be tested, and the connection node between the second switch of the first relay K1 and the second switch of the second relay K2 is configured to be electrically connected to the second bus port BUS- of the chip to be tested. The first switch of the second relay K2 and the second switch of the second relay K2 are respectively electrically connected to the two ends of the primary coil of the transformer M. The first signal capture port CAP1 includes a first signal capture first sub-port CAP1+ and a first signal capture second sub-port CAP1-, and the first signal capture first sub-port CAP1+ and the first signal capture second sub-port CAP1- are electrically connected to the two ends of the secondary coil of the transformer M respectively, and the turn ratio of the primary coil to the secondary coil of the transformer M is, for example, 1:2.5. Figure 7 The integrated circuit 50 to be tested is shown in the figure, for example, a chip, but it only shows at least a part of the connection relationship between the peripheral circuit 213 of the test board 20 and the chip to be tested when performing chip detection. Specifically, when performing chip detection, the bus port of the chip to be tested can be connected to the first signal source port SRC1 or the first signal capture port CAP1 by opening or closing the first relay K1 and the second relay K2 of the peripheral circuit 213. When performing online detection of the test board, the chip to be tested is not placed at the position to be tested so that the ends of the multiple signal paths used to connect the chip are suspended. Through the online detection of the test board, for example, it is determined whether the relay K in the peripheral circuit 213 can work normally.

[0077] Specifically, in the process of performing online detection of the test board, in some embodiments, for example, the first relay K1 and the second relay K2 are first controlled to be in a connected state, and a first detection signal, such as a sine wave signal with a voltage value of 1V, is applied between the first signal source first subport SRC1+ and the first signal source second subport SRC1- of the automatic test machine 10, to detect whether a first feedback signal, such as a sine wave signal with a voltage of 2.5V, can be detected between the first signal capture first subport CAP1+ and the first signal capture second subport CAP1- of the automatic test machine 10. If the first feedback signal can be detected between the first signal capture first subport CAP1+ and the first signal capture second subport CAP1-, it is determined that the first relay K1 and the second relay K2 are working normally, and if the first feedback signal is not detected between the first signal capture first subport CAP1+ and the first signal capture second subport CAP1-, it is determined that the first relay K1 and / or the second relay K2 are working abnormally.

[0078] Then, the first relay K1 and the second relay K2 are controlled to be in the disconnecting device, for example, the first relay K1 and the second relay K2 are sequentially in the disconnecting state, and the order in which the first relay K1 and the second relay K2 are converted to the disconnecting state can be interchanged. A first detection signal is applied between the first signal source first subport SRC1+ and the first signal source second subport SRC1- of the automatic test machine 10, for example, a sine wave signal with a voltage value of 1V, to detect whether a first feedback signal can be detected between the first signal capture first subport CAP1+ and the first signal capture second subport CAP1- of the automatic test machine 10, for example, a sine wave signal with a voltage of 2.5V. If the first feedback signal can be detected between the first signal capture first subport CAP1+ and the first signal capture second subport CAP1-, it is determined that the first relay K1 and / or the second relay K2 are working abnormally, and if the first feedback signal is not detected between the first signal capture first subport CAP1+ and the first signal capture second subport CAP1-, it is determined that the first relay K1 and / or the second relay K2 are working normally.

[0079] If the relay operates abnormally, it can be determined that the peripheral circuit operates abnormally.

[0080] In some embodiments, the peripheral circuit includes an amplifier, the test board is additionally provided with an amplifier feedback loop, the automatic test machine includes a second signal source port and a second signal capture port, the second signal source port, the amplifier and the second signal capture port constitute a second loop, and the use of the automatic test machine to detect the peripheral circuit of the test board to determine whether the peripheral circuit of the test board is operating abnormally includes: the automatic test machine outputs a second detection signal from the second signal source port, and if the second signal capture port does not detect the second feedback signal, determines that the amplifier is operating abnormally; and in response to the amplifier operating abnormally, determines that the peripheral circuit is operating abnormally.

[0081] Specifically, Figure 8 Schematic diagram of online testing of a test board provided in some embodiments of the present disclosure. Figure 8 As shown, the automatic test machine 10 includes a second signal source port SRC2 and a second signal capture port CAP2, and the peripheral circuit 213 of the test board 20 installed on the automatic test machine 10 includes an amplifier AMP, and the second signal source port SRC2, the amplifier AMP and the second signal capture port CAP2 constitute a second loop.

[0082] In this embodiment, the second signal source port SRC2 of the automatic tester 10 provides a test signal to the chip under test through an amplifier AMP, for example, an amplifier with an amplification factor of 2. Specifically, the second signal source port SRC2 of the automatic tester 10 is electrically connected to the first input port IN+ of the amplifier AMP in the peripheral circuit 213, the second input port IN- of the amplifier AMP in the peripheral circuit 213 is grounded, and the output terminal OUT of the amplifier AMP is used to connect to the integrated circuit 50 under test, for example, a chip, for example, a port of the chip, for example, the first port CH0, to provide the test signal to the integrated circuit 50 under test.

[0083] although Figure 8 The chip to be tested is shown in the figure, but it only shows at least a part of the connection relationship between the peripheral circuit 213 of the test board 20 and the chip to be tested when performing chip detection. Specifically, when performing chip detection, the amplifier AMP of the peripheral circuit 213 can make the port of the chip to be tested receive the detection signal. When performing online detection of the test board, the chip to be tested is not placed at the position to be tested so that the ends of the multiple signal paths used to connect the chip are suspended. Through the online detection of the test board, for example, it is determined whether the amplifier in the peripheral circuit 213 can work normally.

[0084] In this embodiment, Figure 8As shown, in order to realize the online detection of the test board 20, it is necessary to add a test loop 2131 on the test board, and the two ends of the test loop 2131 are respectively connected to the output end OUT of the amplifier AMP and the second signal capture port CAP2. In some embodiments, the test loop 2131 is also provided with a switch, and when the test board 20 performs online detection, the switch is in a conducting state, and when the chip test is performed, the switch is in a disconnected state.

[0085] Specifically, in the process of performing online detection of the test board, in some embodiments, for example, the switch of the test loop 2131 is first controlled to be in the on state, and a second detection signal, such as a sine wave signal with a voltage value of 1V, is applied to the first signal source port SRC2 of the automatic test machine 10 to detect whether the second signal capture port CAP2 of the automatic test machine 10 can detect a second feedback signal, such as a sine wave signal with a voltage of 2V. If the second signal capture port CAP2 can detect the second feedback signal, it is determined that the amplifier AMP is working normally, and if the second signal capture port CAP2 fails to detect the second feedback signal, it is determined that the amplifier AMP is working abnormally.

[0086] If the relay operates abnormally, it can be determined that the peripheral circuit operates abnormally.

[0087] In some embodiments of the present disclosure, Figure 6 The execution order of the steps in is not fixed, but can be interchanged.

[0088] In some embodiments of the present disclosure, an alarm device may also be provided on the automatic testing machine 10. When the test board performs online detection, if the test board works abnormally, the alarm device can detect alarm information, such as at least one of sound information, light information, etc.

[0089] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system, method and computer program product according to various embodiments of the present disclosure. In this regard, each square box in the flow chart or block diagram can represent a module, a program segment or a part of a code, and the module, the program segment or a part of the code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some implementations as replacements, the functions marked in the square box can also occur in a sequence different from that marked in the accompanying drawings. For example, two square boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each square box in the block diagram and / or flow chart, and the combination of the square boxes in the block diagram and / or flow chart can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0090] Finally, it should be noted that: each embodiment in this specification is described by way of example, and each embodiment focuses on the differences from other embodiments, and the same or similar parts between the embodiments can be referred to each other. For the system or device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the method part.

[0091] The above embodiments are only used to illustrate the technical solutions of the present disclosure, rather than to limit them. Although the present disclosure has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present disclosure.

Claims

1. An online detection method for a test board, characterized in that: The test board is installed on the automatic test machine, electrically connected to the probe of the automatic test machine to receive the signal of the automatic test machine, and is used to test the packaged chip based on the signal provided by the automatic test machine. A fixture for fixing and connecting the packaged chip is installed on the side of the test board away from the automatic test machine. The test board includes multiple signal paths, which are used to be electrically connected to the packaged chip to be tested to transmit the test signal to the packaged chip. The online detection method includes: The ends of the packaged chips are connected to the plurality of signal paths, and each of the plurality of signal paths is detected to determine whether there is leakage, and in response to leakage of at least one of the plurality of signal paths, the test board is determined to be operating abnormally. The online detection method is performed before each batch of packaged chips is tested. Among them, the test board also includes a peripheral circuit, and the online detection method also includes: using the multiple signal paths to connect the end suspension of the packaged chip, using an automatic testing machine to detect the peripheral circuit of the test board to determine whether the peripheral circuit of the test board is working abnormally, and in response to the abnormal working of the tested peripheral circuit, determining that the test board is working abnormally.

2. The online detection method according to claim 1, wherein: The automatic test machine includes a parameter measurement unit, and the detecting whether each of the plurality of signal paths has leakage includes: applying a first voltage to each of the plurality of signal paths using a parameter measurement unit, and testing a first current of each signal path, For each signal path, in response to the first current being greater than a first threshold, it is determined that the signal path is leaking.

3. The online detection method according to claim 1, wherein: The method of using the plurality of signal paths to connect the end suspension of the packaged chip comprises: The packaged chip to be tested is not placed at the position to be tested so that the ends of the plurality of signal paths used to connect the packaged chip are suspended.

4. The online detection method according to claim 1, wherein: The online detection method also includes: The multiple signal paths are used to connect the ends of the packaged chip to ground, and each of the multiple signal paths is detected to see whether it has abnormal impedance. In response to at least one of the multiple signal paths having abnormal impedance, it is determined that the test board is operating abnormally.

5. The online detection method according to claim 4, wherein: Using the plurality of signal paths to connect the end of the packaged chip to ground includes: A metal block having the same shape and volume as the packaged chip to be tested is placed at the position to be tested, so that the multiple signal paths of the test board are electrically connected to the metal block.

6. The online detection method according to claim 4, wherein: The automatic test machine includes a parameter measurement unit, and the detecting whether each of the plurality of signal paths has abnormal impedance includes: applying a second voltage to each of the plurality of signal paths using a parameter measurement unit, and testing a second current of each signal path, For each signal path, the impedance of the signal path is obtained according to the second voltage and the second current, and in response to the impedance being greater than a second threshold, it is determined that the signal path has abnormal impedance.

7. The online detection method according to any one of claims 1 to 6, wherein: The peripheral circuit includes a relay, the automatic test machine includes a first signal source port and a first signal capture port, the first signal source port, the relay and the first signal capture port constitute a first loop, The step of using an automatic testing machine to detect the peripheral circuit of the test board to determine whether the peripheral circuit of the test board is working abnormally includes: In response to the relay being in a connected state, the automatic test machine outputs a first detection signal from the first signal source port, and if the first signal capture port does not detect a first feedback signal, determines that the relay is operating abnormally; In response to the relay being in an open state, the automatic test machine outputs a first detection signal from the first signal source port, and if the first signal capture port detects a first feedback signal, it is determined that the relay is operating abnormally; and In response to the relay operating abnormally, it is determined that the peripheral circuit operates abnormally.

8. The online detection method according to any one of claims 1 to 6, wherein: The peripheral circuit includes an amplifier, the test board is provided with an amplifier feedback loop, the automatic test machine includes a second signal source port and a second signal capture port, the second signal source port, the amplifier and the second signal capture port constitute a second loop, The step of using an automatic testing machine to detect the peripheral circuit of the test board to determine whether the peripheral circuit of the test board is working abnormally includes: The automatic test machine outputs a second detection signal from the second signal source port, and if the second signal capture port does not detect the second feedback signal, determines that the amplifier is operating abnormally; and In response to the amplifier operating abnormally, it is determined that the peripheral circuit operates abnormally.

9. The online detection method according to any one of claims 1 to 6, wherein: In response to the test board working abnormally, the automatic test machine issues an alarm message.

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