Method for high resolution patterning using soft X-ray, process for preparing nano device using the method

a high-resolution pattern and soft x-ray technology, applied in the field of high-resolution patterning and the process of manufacturing a nano device using the high-resolution pattern, can solve the problems of inaccurate registration (1 m), process limitation of mass production, and difficulty in forming nano-scale high-resolution patterns using the method. achieve the effect of high resolution

Inactive Publication Date: 2008-02-14
POSTECH ACAD IND FOUND
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0011] Therefore, the present invention provides a method for fabricating a high resolution pattern of a desired shape within a short period of time.

Problems solved by technology

However, due to the limitations in the wavelength of usable light, equipment and technology requirements, and the resolution of polymeric photoresist used, it is difficult to form nano-scale high-resolution patterns with this method.
However, this technique has some problems to be solved, such as inaccurate registration (<1 μm) due to the deformation of an elastomeric stamp, incompatibility with current integrated circuit (IC) processes, etc.
However, its time-consuming serial pattern drawing processes limit commercialization through mass production.

Method used

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  • Method for high resolution patterning using soft X-ray, process for preparing nano device using the method
  • Method for high resolution patterning using soft X-ray, process for preparing nano device using the method
  • Method for high resolution patterning using soft X-ray, process for preparing nano device using the method

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0061] Initially, a cleaned silica substrate was dried in a vacuum of about 20 mtorr. A round-bottom flask was charged with a solution of (3-aminopropyl)diethoxymethylsilane in toluene (10−3M) under a nitrogen atmosphere. The dried silica substrate was immersed in that solution and reacted at room temperature for silylation.

[0062] After the silylation was completed, the substrate was washed with toluene, dried in an oven at 120° C. for 30 minutes, and cooled to room temperature. The cooled substrate was washed by ultrasonication in toluene, a solvent mixture of toluene and methanol in 1:1 by volume, and then methanol for 3 minutes each, and dried in a vacuum.

[0063] Next, the amino-silylated silica substrate was immersed in a solution of 20 mg of 4-nitrobenzaldehyde in 25 mL of ethanol for 6 hours in a nitrogen atmosphere for condensation. At this time, the reaction temperature was maintained at 50° C.

[0064] The substrate after the reaction was washed with excess methanol and by u...

example 2

[0068] A substrate with a pattern was manufactured in the same manner as in Example 1, except that a gold substrate instead of the silica substrate and 3-aminopropanethiol instead of the (3-aminopropyl)diethoxymethylsilane were used for amino-thiolation. A cleaned gold substrate was immersed in a solution of 3-aminopropanethiol in ethanol (10 mM) and reacted for 3 hours in a nitrogen atmosphere for the amino-thiolation. The substrate after the amino-thiolation was washed with an organic solvent and dried in a vacuum.

example 3

[0069] An aromatic imine molecular layer was formed on the substrate in the same manner as in Example 1, except that 4-nitrocinnamaldehyde instead of the 4-nitrobenzaldehyde was used. In patterning, soft X-rays of 500 eV were radiated onto the substrate for 4.5 hours until 80% of the nitro group was removed from the terminal ring in the aromatic imine molecular layer. Hydrolysis was carried out according to Example 1.

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Abstract

A method for nano-scale high resolution patterning of self-assembled monolayer using soft X-rays is provided. The method involves forming an aromatic imine molecular layer having substitutents at its terminal rings on a substrate, selectively cleaving bonds to the substituents of the aromatic imine molecular layer, and hydrolyzing the aromatic imine molecular layer.

Description

BACKGROUND OF THE INVENTION [0001] 1. Field of the Invention [0002] The present invention relates to a method for high resolution patterning and a process for manufacturing a nano device using the high resolution pattern, and more particularly, to a method for micro- or nano-scale high resolution patterning within a short period of time, and a nano device formed using the method. [0003] 2. Description of the Related Art [0004] With recent advances in the semiconductor industry and the need for highly-integrated semiconductor devices, nano- or micro-fabrication technologies for minute patterning attract more and more attention. [0005] As is expected by many experts that nanotechnology will be one of the leading technologies in the 21st century, nano-pattern fabrication is an essential technology of the highest priority in minute-circuit processing for large-capacity semiconductor devices. In addition, nano-patterning technology has wide applications, for example, in the bioengineerin...

Claims

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Application Information

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Patent Type & AuthorityApplications(United States)
IPC IPC(8): B32B5/16H01L21/302G03F7/075G03F7/00G03F7/004G03F7/16G03F7/20H01L21/027H01L21/033
CPCB81B2201/0214B81C1/00031B81C2201/0149B81C2201/0198B82Y10/00B82Y30/00Y10T428/261G03F7/0755G03F7/165G03F7/2039H01L21/0337H01L21/312Y10S430/168G03F7/0045H01L21/02118G03F7/00B82B3/00B82B1/00
InventorPARK, JOON WONLA, YOUNG HYEMOON, JOONG HOKIM, BONGSOOKANG, TAI HEEKIM, KI JEONG
OwnerPOSTECH ACAD IND FOUND