Nonvolatile memory apparatus

a memory apparatus and non-volatile technology, applied in the field of semiconductor devices, can solve problems such as volatile memory, and achieve the effect of efficient data sensing structure and precise data sensing operation

Inactive Publication Date: 2014-06-26
SK HYNIX INC
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The patent describes a resistive memory device that can accurately sense data by measuring the changes in a current caused by the memory cell. The device has a structure that allows for efficient data sensing. The main technical effect of this invention is to provide a more reliable and accurate mechanism for sensing data stored in a resistive memory.

Problems solved by technology

However, since the capacitor has leakage current due to the characteristics thereof, the DRAM has a disadvantage in that it is a volatile memory.

Method used

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Embodiment Construction

[0038]Hereinafter, a nonvolatile memory apparatus according to the present invention will be described below with reference to the accompanying drawings through various embodiments.

[0039]FIG. 3 is a diagram schematically showing the configuration of a nonvolatile memory apparatus 1 in accordance with an embodiment of the present invention. In FIG. 3, the nonvolatile memory apparatus 1 may include a sensing voltage generation unit 110, a memory cell 120, a current copy unit 130, and a data sensing unit 140. The sensing voltage generation unit 110 may be configured to provide a sensing voltage VC with a constant level to a sensing node SAI in response to a reference voltage VREF and the voltage of the sensing node SAI.

[0040]The memory cell 120 may be connected with the sensing node SAI. The memory cell 120 receives the sensing voltage VC with a constant level, from the sensing node SAI. When the memory cell 120 receives the sensing voltage VC, sensing current ISEN flows according to t...

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Abstract

A nonvolatile memory apparatus includes a sensing voltage generation unit, a memory cell, a current copy unit and a data sensing unit. The sensing voltage generation unit provides a sensing voltage with a constant level, to a sensing node. The memory cell receives the sensing voltage from the sensing node. The current copy unit generates copied current with substantially the same magnitude as sensing current which flows through the memory cell. The data sensing unit senses the copied current and generates a multi-bit data output signal.

Description

CROSS-REFERENCES TO RELATED APPLICATION[0001]The present application claims priority under 35 U.S.C. §119(a) to Korean application numbers 10-2012-0150160 and 10-2012-0150161, filed on Dec. 21, 2012, in the Korean Intellectual Property Office, which are incorporated herein by reference in their entirety.BACKGROUND[0002]1. Technical Field[0003]Various embodiments relate to a semiconductor apparatus, and more particularly, to a memory apparatus which includes nonvolatile memory cells.[0004]2. Related Art[0005]A conventional DRAM includes a memory cell constituted by a capacitor, and data is stored by charging or discharging charges to and from the memory cell. However, since the capacitor has leakage current due to the characteristics thereof, the DRAM has a disadvantage in that it is a volatile memory. In order to overcome the disadvantage, memories which are nonvolatile and do not need the retention of data have been developed. In particular, attempts have continuously been made to ...

Claims

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Application Information

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Patent Type & AuthorityApplications(United States)
IPC IPC(8): G11C13/00
CPCG11C13/004G11C11/56G11C2211/5645G11C13/0038G11C13/0002G11C13/0026G11C13/0028
InventorPARK, CHULHYUN
OwnerSK HYNIX INC