Component sorting device

Abstract

The present invention relates to a component classification device, and more particularly, to a component classification device that automatically classifies components such as semiconductor chips according to classification standards. The present invention discloses a component classification device, comprising: a loading unit (100) for loading a tray (30), the tray (30) loading components (10) to be inspected; a DC testing unit (170) for receiving the components (10) to be inspected from the loading unit (100) to perform a DC test; an X-Y workbench (410) for moving a refining plate (20) in an X-Y direction, the refining plate (20) for loading the components to be inspected that are tested as high-quality products by the DC testing unit (170) at an empty position where the components (10) to be classified are led out. (10); an unloading section (300), which loads the components (10) to be classified derived from the smelting plate (20) on a tray (30) corresponding to the preset classification standard according to the preset classification standard; a first buffer tray section (610), which is configured to move the tray (30) to a loading position on the upper side of the DC testing section (170) and to a avoidance position spaced horizontally from the loading position, so as to temporarily load the components (10) that are found unqualified by the DC test results of the DC testing section (170) on the tray (30).

Description

Technical Field

[0001] The present invention relates to a component sorting device, and more particularly, to a component sorting device that automatically sorts components such as semiconductor chips according to a sorting standard. Background Art

[0002] Semiconductor elements (hereinafter, referred to as "elements") are subjected to various inspections after completing the packaging process, such as reliability inspections for electrical characteristics, heat, or pressure.

[0003] The inspection of semiconductor components includes a burn-in test, in which a plurality of components are inserted into a sintered board, the sintered board is placed in a sintered test device, and heat or pressure is applied for a predetermined period of time to determine whether the components are defective.

[0004] A component handler for burn-in test generally refers to a device that sorts (unloads) components from a board loaded with components that have completed burn-in test to each tray according to the inspection results of each component, such as good quality and bad quality, and reinserts (loads) new components to be subjected to burn-in test into empty positions (sockets) of the board where the components are located.

[0005] On the other hand, the performance of the component processor as described above is evaluated by the number of classifications per unit time (UPH: Units Per Hour), and UPH depends on the time required to transport components and smelted boards between the various components that constitute the component processor.

[0006] Therefore, in order to improve the performance of UPH, ie, the element processor, it is necessary to improve the structure and arrangement of each constituent element.

[0007] As described above, as a component sorting device for improving UPH, there are Korean Patent No. 10-1133188 (Patent Document 1), Korean Patent No. 10-1177319 (Patent Document 2), Korean Publication No. 10-2016-48628 (Patent Document 3), and the like.

[0008] On the other hand, as the market size of standardized components such as SDRAM (Synchronous Dynamic Random Access Memory) and recently NAND flash memory expands, production is being expanded on a large scale.

[0009] Then, in mass production, the need to inspect components also increases, so it is necessary to provide a plurality of component sorting devices for sorting components according to the inspection results as a subsequent process. Summary of the invention

[0010] (Problem to be solved)

[0011] The object of the present invention is to provide a component sorting device, which serves as a component sorting device for supplying components for aging test and sorting components that have completed aging test, optimizes the configuration of a loading section for loading components to be inspected, a DC testing section for performing DC test, an unloading section for loading components derived from a smelting plate onto a tray, etc., thereby minimizing the occupied space while effectively performing the component sorting process.

[0012] (Methods of solving the problem)

[0013] The present invention is proposed to achieve the above-mentioned purpose. The present invention provides a component classification device, comprising: a loading part 100, a loading tray 30, the tray 30 is loaded with components 10 to be inspected; a DC test part 170, receiving the components 10 to be inspected from the loading part 100 to perform DC testing; an XY workbench 410, moving a refining plate 20 in an XY direction, the refining plate 20 is used to load the components 10 to be inspected that are tested as high-quality products by the DC test part 170 at an empty position where the components 10 to be classified are derived; an unloading part 300, according to a preset classification standard, loads the components 10 to be classified derived from the refining plate 20 on a tray 30 corresponding to the classification standard; a first buffer tray part 610, which is set to be able to move the tray 30 to a loading position on the upper side of the DC test part 170 and a avoidance position spaced horizontally from the loading position, so as to temporarily load the components 10 that are found to be unqualified by the DC test result of the DC test part 170 on the tray 30.

[0014] (Effects of the Invention)

[0015] The component sorting device of the present invention is a component inspection device for supplying and sorting components before and after inspections such as aging tests. The loading part loads the components to be inspected, and the unloading part loads the components that have been inspected as high-quality products on the smelting plate to load the pallets for unloading. The conveying directions of the pallets of the loading part and the pallets of the unloading part are arranged parallel to each other, and the supply and discharge of pallets to the device are performed adjacent to the unloading part, thereby having the advantages of automating the supply and discharge of pallets and significantly reducing the occupied space.

[0016] In addition, the component sorting device of the present invention optimizes the configuration of a loading section for loading components to be inspected, a DC testing section for performing DC testing, an unloading section for loading components exported from a smelting plate on a tray, and the like, thereby having the advantage of minimizing the occupied space while effectively performing the component sorting process.

[0017] In addition, the component classification device of the present invention also has a module exchange unit, which automatically replaces the test socket, tray, etc. of the DC test unit used inside the device according to changes in the component's external specifications, such as planar dimensions, thereby having the advantage of convenient use of the device.

[0018] In particular, the component sorting device of the present invention is configured by locating the module exchange portion on the upper side of the device, thereby minimizing the occupied space while effectively executing the component sorting process.

[0019] For example, in the module exchange part, the loading part for the test socket, tray, etc. of the DC test part is located on the upper side, especially sharing at least a part with the transport track of the transport tool to optimize the configuration, thereby minimizing the occupied space while effectively executing the component sorting process. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is a planar configuration diagram showing the component classification device of the present invention.

[0021] Figure 2 It is shown in Figure 1 A front view of an example of the configuration of a transport tool used in the process of transporting components between a loading section, a DC test section, a first buffer tray section, a smelting plate, and an unloading section in a component sorting device.

[0022] Figure 3 It is shown in Figure 1 A side view of the configuration of a first pallet transport unit, a transport tool, and a second pallet transport unit in a component sorting device. DETAILED DESCRIPTION

[0023] Hereinafter, the component sorting device of the present invention will be described below with reference to the drawings.

[0024] like Figures 1 to 3 As shown, the component classification device of the first embodiment of the present invention includes: a loading part 100, a loading tray 30, wherein the tray 30 is loaded with components 10 to be inspected; a DC test part 170, which receives the components 10 to be inspected from the loading part 100 to perform a DC test; an XY workbench 410, which moves the refining plate 20 in the XY direction, wherein the refining plate 20 is used to load the components 10 to be inspected that are tested as high-quality products by the DC test part 170 at an empty position where the components 10 to be classified are led out; an unloading part 300, which loads the components 10 to be classified led out from the refining plate 20 on the tray 30 corresponding to the classification standard according to a preset classification standard; and a first buffer tray part 610, which is configured so that the tray 30 can move to a loading position on the upper side of the DC test part 170 and a avoidance position spaced from the loading position, so as to temporarily load the components 10 that are found to be unqualified by the DC test result of the DC test part 170.

[0025] The refinement board 20 is a board loaded with components 10 to pass an aging test of an aging test device (not shown), and has sockets into which the components 10 are respectively inserted so that electrical characteristics and signal characteristics can be tested at high temperature.

[0026] The refined plate 20 is mounted on an XY workbench 410 provided in a component sorting device, and the components 10 that have completed the aging test are unloaded and loaded at the same time.

[0027] For the XY table 410, in order to load the smelting plate 20 with the component 10 inserted therein and unload the smelting plate 20 with the component 10 inserted therein, the smelting plate 20 is used as one of the structures, such as Figure 1 As shown, a refined plate exchanging device (not shown) is included to receive the refined plate 20 to be exchanged with the element 10 or to discharge the refined plate 20 after the exchange of the element 10 is completed.

[0028] Then, the XY table 410 is configured to be driven by an XY table driving unit (not shown) to move the smelting plate 20, and then the component 10 can be inserted into the empty position of the smelting plate 20 by the first conveying tool 530 or the component 10 can be taken out from the smelting plate 20 by the second conveying tool 520.

[0029] The XY table driving unit is linked with the second conveying tool 520 and the first conveying tool 530. The XY table 410 loaded with the smelting plate 20 moves in XY or XY-θ, etc., so that the second conveying tool 520 and the first conveying tool 530 can easily export or load the component 10 from the smelting plate 20, and can have various structures.

[0030] That is, the XY worktable driving unit is configured to move the XY worktable 410 so as to cooperate with the second conveying tool 520 to extract the component 10 from the refining plate 20 and cooperate with the first conveying tool 530 to insert the component 10 into an empty position of the refining plate 20. Once the component 10 is inserted into the refining plate 20, the XY worktable 410 can be moved to the refining plate exchange position.

[0031] On the other hand, the XY workbench 410 is arranged on the main body 40 constituting the component sorting device of the present invention, and the main body 40 may include an upper plate (not shown), and the upper plate is formed with an opening portion (not shown) for the second conveying tool 520 and the first conveying tool 530 to extract the component 10 from the smelting plate 20 or load the component 10.

[0032] Then, a socket pressurizing member 45 is disposed on the upper side of the XY workbench 410 , and the socket pressurizing member 45 presses the sockets disposed on the refining plate 20 to facilitate the export and loading of components on the refining plate 20 .

[0033] The socket pressurizing member 45 can guide out the components inserted into the socket of the refining plate 20 or can load the components, and can have various structures according to the socket structure of the refining plate 20.

[0034] On the other hand, the socket pressurizing member 45 needs to be different according to the external specifications of the component 10, and is preferably configured to be manually or automatically replaceable.

[0035] Then, a visual device (not shown) for aligning the position of the smelting plate 20 may be provided on the upper portion of the socket press 45 so as to guide and discharge the component 10 through the first conveying tool 530 and the second conveying tool 520 .

[0036] The loading part 100 may have various structures as a structure for loading the tray 30 on which the plurality of components 10 to be loaded on the smelting plate 20 are loaded.

[0037] On the other hand, the loading section 100 may be provided with a 2D scanner 960, which is provided at the upper part of the conveying direction of the tray 30 to inspect the tray cover, the tray 30 itself, the components 10 loaded on the tray 30, etc., recognize QR codes, etc.

[0038] The loading unit 100 is similar to Patent Documents 1 to 3 and is generally configured to include a guide unit that guides each tray 30 to move in the Y-axis direction and a drive unit (not shown) that moves the tray 30 .

[0039] Here, when the arrangement direction of the element 10 leading-out position and the unloading part 300 with respect to the smelting plate 20 is an X-axis, a direction perpendicular to the X-axis in the horizontal direction is defined as a Y-axis.

[0040] The unloading unit 300 is a structure for loading the components 10 to be sorted, which are led out from the smelting plate 20 , on the tray 30 corresponding to the sorting standard according to the preset sorting standard, and may have various structures.

[0041] For example, Figure 1 As shown, the unloading section 300 may include: one or more high-quality product tray sections 320, on which trays 30 loaded with components 10 to be classified as high-quality products are placed; one or more DC tray sections 310, on which trays 30 loaded with components 10 that are found to be unqualified by the inspection results of the DC testing section 170 are placed; and one or more rejection tray sections 330, on which trays 30 loaded with components 10 to be classified into various classification levels are placed corresponding to the number of classification levels other than high-quality products in the refining plate 20.

[0042] The high-quality product tray unit 320 is a structure for placing the tray 30 for loading the components 10 to be classified as high-quality products. The structure is similar to that of the loading unit 100 and may have various structures.

[0043] The DC tray unit 310 is a structure for placing and loading the tray 30 of the components 10 that are found to be defective as a result of the inspection by the DC test unit 170 . The structure is similar to that of the loading unit 100 , and may have various structures.

[0044] The reject tray unit 330 is a structure for placing trays 30 for loading components 10 to be classified into each classification level corresponding to the number of classification levels other than good quality products in the refining plate 20. The structure is similar to that of the loading unit 100 and can have various structures.

[0045] Here, the number of the reject tray portion 330 may be determined according to the number of classification levels.

[0046] On the other hand, the quality tray unit 320, the DC tray unit 310 and the rejection tray unit 330 include a guide unit and a drive unit, etc., and can have various structures, wherein the guide unit guides the tray 30 to move in the Y-axis direction, and the drive unit is used to move the tray 30 along the guide unit.

[0047] On the other hand, Figure 1 As shown, after the loading unit 100 unloads the components 10 from the tray 30, the empty tray 30 passes through the first tray conveying unit 671 (see Figure 3 ) can be transferred to the unloading unit 300, etc.

[0048] At this time, components 10 may remain on the tray 30 . In order to remove the components 10 remaining on the tray 30 before the tray 30 is transferred from the loading unit 100 to the unloading unit 300 , a tray rotating unit 150 may be provided to rotate the tray 30 to remove the remaining components 10 .

[0049] like Figure 1 As shown, the pallet rotating unit 150 is configured to be disposed on a first pallet transport path TT1 of the pallet 30 between the loading unit 100 and the unloading unit 300 , receives the pallet 30 from the loading unit 100 through the first pallet transporting unit 671 , rotates the pallet 30 , and then transfers the pallet 30 to the unloading unit 300 .

[0050] In addition, a first tray loading unit 161 may be placed on a first tray transporting route TT1 of the tray 30 between the loading unit 100 and the unloading unit 300 , and may temporarily load an empty tray 30 without components 10 .

[0051] The first pallet loading unit 161 may have any structure as long as it can temporarily load an empty pallet 30 that is not loaded with components 10 on the first pallet transport path TT1 of the pallet 30 between the loading unit 100 and the unloading unit 300 .

[0052] The DC test unit 170 is a structure provided between the loading unit 100 and the socket pressurizer 45 to receive the component 10 to be inspected from the loading unit 100 and perform a DC test, and may have various structures.

[0053] The DC test unit 170 may be composed of a plurality of sockets that can be electrically connected to the components 10 and may have various structures. Preferably, the DC test unit 170 may be provided with the same number of sockets as the number of the trays 30 in the horizontal direction.

[0054] The test results of the DC test unit 170 on the respective components 10 are used as data for classification in the DC tray unit 310 described later.

[0055] Here, the components are transported from the tray 30 of the loading part 100 to the DC test part 170 by the third transport tool 510 .

[0056] On the other hand, when the outer specifications (such as the size) of the component 10 to be processed are changed, it is necessary to replace the test socket constituting the DC test section 170 .

[0057] Prior to this, it is preferred that the test sockets of the DC test section 170 be configured to be automatically replaceable with other types of test sockets loaded in a replacement part loading section (not shown).

[0058] Here, in order to smoothly replace the test socket of the DC test unit 170, the test socket of the DC test unit 170 is preferably configured to be movable in the Y-axis direction.

[0059] The first buffer tray unit 610 is a structure in which the tray 30 can be moved to a loading position above the DC test unit 170 and a avoidance position spaced from the loading position to temporarily load the components 10 that are found to be unqualified by the DC test result of the DC test unit 170, and can have various structures.

[0060] For example, the first buffer tray portion 610 may be configured to enable the tray 30 to move in the Y-axis direction, similar to the loading portion 100 .

[0061] Then, the upper part of the DC test unit 170 is determined as the loading position, and the front and rear parts in the Y-axis direction can be determined as the avoidance positions based on the upper part of the DC test unit 170.

[0062] In order to smoothly transfer the components 10 that are found to be unqualified by the DC test results of the DC test unit 170, two or more trays 30 may be transported, and the moving paths may be arranged vertically to prevent interference during movement.

[0063] That is, preferably, the first buffer tray unit 610 can be provided with two or more moving sections along the vertical direction of the Z axis, and the moving section is a section where the tray 30 moves back and forth in the Y axis direction between the loading position and the moving section DC of the DC transport tool 550 .

[0064] On the other hand, the process of transferring the component 10 between the DC test part 170 and the first buffer tray part 610 may be performed in various ways for smoothly operating a processor.

[0065] For example, after the components are transported to the DC testing unit 170 by the first transport tool 510 and the DC testing results show that all the components are of good quality, the components are directly transferred to the refinement board 40 by the second transport tool 520 .

[0066] On the other hand, if there are some components 10 that are found to be unqualified by the DC test result, all components 10 loaded in the DC test unit 170 are loaded on the tray 30 of the first buffer tray unit 610 after being unloaded by the first conveyor 510 .

[0067] Then, when all the trays 30 of the first buffer tray unit 610 are loaded with components 10, the trays 30 are moved to the conveying path DC of the DC conveyor 550. At this time, when the trays 30 are moved to the conveying path DC of the DC conveyor 550, other trays 30 receive components 10 that are unqualified in the DC test results.

[0068] On the other hand, in the tray 30 moved to the transport path DC of the DC transport tool 550 described later, except for the components 10 judged to be good quality, all the components 10 that are found to be unqualified by the DC test results are transferred to the DC tray part 302 through the DC transport tool 550, and only the good quality components 10 are left on the tray 30.

[0069] On the other hand, the pallet 30 from which all the components 10 inspected as unqualified are removed is moved back to the loading position, and then transferred to the smelting plate 40 by the second conveying tool 520 .

[0070] Then, the tray 30 needs to be replaced according to the external specifications of the component 10 , similar to the replacement process of the DC test unit 170 , and is preferably configured to be automatically replaced with other types of trays loaded in the replacement component loading unit 680 .

[0071] For example, the tray 30 of the first buffer tray unit 610 can move in the Y-axis direction and is configured to be able to move to the above-mentioned first tray transport route TT1, and then can receive trays 30 of other specifications from the loading unit 100 or the first tray loading unit 161 through the first tray transport unit 671.

[0072] On the other hand, the component 10 may have various structures in order to smoothly transport the component 10, and a plurality of transport tools may be configured in various arrangements.

[0073] For example, Figures 1 to 3 As shown, the conveying tool may include: a third conveying tool 510, which is configured to move back and forth between the loading part 100 and the DC testing part 170 in the X-axis direction to transfer a plurality of components 10 from the loading part 100 to the DC testing part 170; a first conveying tool 530, which is configured to move back and forth between the component 10 loading position for the refining board 20 and the DC testing part 170 in the X-axis direction to load a plurality of components 10 inspected as high-quality products in the DC testing part 170 onto the refining board 20; a second conveying tool 520, which is disposed between the component 10 exporting position for the refining board 20 and the unloading part 300 to transfer the components 10 to be classified as high-quality products from the second buffer tray part 620 to the unloading part 300.

[0074] On the other hand, the arrangement of the components 10 loaded on the smelting plate 20 is different from the arrangement of the components 10 loaded on the tray 30 of the loading unit 100 and the like, and the arrangement on the smelting plate 20 is relatively more.

[0075] Therefore, the first conveying tool 530 and the second conveying tool 520 for conveying the components 10 to the smelting plate 20 or for exporting the components 10 are preferably configured to convey a relatively larger number of components 10 than the remaining conveying tools. For example, the first conveying tool 530 and the second conveying tool 520 are 5×2, while the remaining conveying tools may be 5×1, etc.

[0076] When the transport tool is constructed as described above, in addition to the position where a relatively large number of components 10 need to be transported, the transport tool for transporting a small number of components 10 can be used at the position where a relatively small number of components 10 need to be transported, thereby saving the manufacturing cost of the device and improving the size and stability of the device.

[0077] The transverse number of pickers of the first conveyor 530 and the second conveyor 520 may be the same as the transverse number of component receiving slots (not shown) for loading components 10 in the first buffer tray unit 610 and the unloading unit 300 in consideration of the efficiency of the components 10 .

[0078] On the other hand, preferably, for the first conveying tool 530 and the second conveying tool 520, considering that the components 10 are conveyed corresponding to the first conveying tool 530 and the second conveying tool 520 respectively, the first conveying tool 530 and the second conveying tool 520 have the same number of lateral pickers.

[0079] On the other hand, the spacing between the components 10 on the smelting plate 20 and the spacing between the components 10 on the pallet 30 are usually different (twice), and for this reason, it is preferred that one of the first conveying tool 530, the second conveying tool 520, and the third conveying tool 510 can change the spacing between the components 10 picked up by the picker.

[0080] On the other hand, the third transport tool 510 , the first transport tool 530 , and the second transport tool 520 move along the round-trip movement route G.

[0081] Then, a classification route S is set at a position spaced apart from the reciprocating movement route G in the Y-axis direction, and the classification conveying tool 560 can be moved along the classification route S to load the components 10 on the trays 30 in the unloading section 300, and the components 10 that are found to be unqualified by the DC test results of the DC testing section 170 and the components 10 received from the second conveying tool 520 are loaded onto the corresponding trays 30 in the quality tray section 320, the DC tray section 310 and the rejected tray section 330 according to the classification levels.

[0082] The classification conveyance tool 560 is a structure that is configured to move along the classification route S to check the DC test results of the DC test part 170 as unqualified components 10 among the components 10 on the tray 30 loaded in the unloading part 300, and load the components 10 received from the second conveyance tool 520 into the corresponding trays 30 in the good product tray part 320, the DC tray part 310 and the rejection tray part 330 according to the classification level, and can have various structures.

[0083] On the other hand, the sorting route S is defined as a path along which the sorting transport tool 560 moves along the sorting guide member 591 , and the sorting guide member 591 is provided at a position spaced apart from the reciprocating route G in the Y-axis direction.

[0084] In particular, it is preferred that the sorting route S be disposed near the second tray transport portion 672 as a position spaced apart from the reciprocating movement route G in the Y-axis direction to achieve smooth sorting and minimize interference with the arrangement of other structures.

[0085] On the other hand, when the sorting and conveying tool 560 directly conveys the components 10 that are found to be unqualified by the DC test result of the DC test unit 170 described above from the first buffer tray unit 610, the moving path of the sorting and conveying tool 560 becomes longer, which significantly reduces the working speed.

[0086] In addition, the sorting guide member 591 for guiding the movement of the sorting conveying tool 560 is arranged across the device in the X-axis direction, which restricts the arrangement of other structures and has many structural problems.

[0087] Accordingly, preferably, the component sorting device of the present invention also includes a DC transport tool 550, which moves between the first buffer tray section 610 and the unloading section 300 (especially, the DC tray section 310) to transfer the components 10 that are inspected as unqualified by the DC test results of the DC test section 170 to the first buffer tray section 610 and the unloading section 300 (especially, the DC tray section 310).

[0088] The DC transport tool 550 is a structure that moves between the first buffer tray unit 610 and the unloading unit 300 (especially, the DC tray unit 310) to transfer the components 10 that are found to be unqualified by the DC test results of the DC test unit 170 to the first buffer tray unit 610 and the unloading unit 300 (especially, the DC tray unit 310), and can have various structures.

[0089] In particular, the DC transport tool 550 may include a relatively small number of pickers, for example, 2 pickers, compared to other transport tools, considering that the number of components 10 that are found unqualified by the DC test results of the DC test section 170 is relatively small.

[0090] On the other hand, for the DC transport tool 550, as Figure 1 and Figure 3 As shown, considering that the movement range is longer than that of the classification transport tool 560, in order to ensure stable movement, the main guide component 592 that guides the movement of the first transport tool 530, the second transport tool 520 and the third transport tool 510 can be set to be spaced apart from the moving path G of the first transport tool 530, the second transport tool 520 and the third transport tool 510 in the Y-axis direction, so that it can move in a state combined with the main guide component 592.

[0091] Then, the DC transport tool 550 may be configured to move along a movement section DC set at an interval in the Y-axis direction from the movement paths G of the first transport tool 530 , the second transport tool 520 , and the third transport tool 510 .

[0092] On the other hand, the transport tools 510, 520, 530, 540, 550, 560 may include one or more pickers and picker transfer devices, and the pickers respectively have adsorption heads at the ends through vacuum pressure adsorption elements 10, and the picker transfer devices are used to move the pickers in XZ, YZ or XYZ directions.

[0093] In particular, the transport tool may arrange the pickers in one row or in multiple rows, such as 5×2, 4×2, etc.

[0094] On the other hand, Figure 1As shown, the component sorting device of the present invention includes a plate loader 800 which is provided at one side to continuously receive the refined plates 20 .

[0095] The plate loader 800 is a structure for loading the refined plate 20 with the component 10 inserted therein and sequentially loading the refined plate 20 with the component 10 inserted therein to transport it to the aging test, that is, a structure for continuously exchanging the refined plate 20 with the XY workbench 410, and is composed of the plate loader 800 disclosed in patent document 3, etc., and can have various structures.

[0096] On the other hand, it is preferable that the plate loader 800 is disposed adjacent to the loading unit 100 .

[0097] In particular, if the plate loader 800 is disposed adjacent to the loading unit 100 , the direction perpendicular to the tray conveying direction in the loading unit 100 is referred to as the Y-axis, and the loading unit 100 is coupled to the X-axis direction.

[0098] At this time, by combining the plate loader 800 as described above, the rack 50 loaded with the refined plate 20 can be introduced or discharged in the X-axis direction on the right side of the device, especially adjacent to the loading part 100.

[0099] On the other hand, in order to identify the pallet 30 in the route of transporting the pallet 30 from the loading unit 100, check the top of the component 10 loaded on the pallet 30, etc., that is, to perform functions according to design requirements, a first visual unit 191 such as a camera or a scanner can be provided.

[0100] Then, a second visual unit 192 , such as a camera or a scanner, may be provided to photograph the bottom surface of the component 10 picked up and transported by the third transport tool 510 between the loading unit 100 and the DC test unit 170 .

[0101] In addition, a third visual unit 193 , such as a camera or a scanner, may be provided between the DC test unit 170 and the component 10 loading position on the smelting plate 20 to photograph the bottom surface of the component 10 picked up and transported by the first transport tool 530 .

[0102] On the other hand, based on the round-trip movement route G of the third conveying tool 510, the first conveying tool 530 and the second conveying tool 520, a second pallet conveying route TT2 can be set at a position facing the first pallet conveying route TT1. The second pallet conveying route TT2 is a route for the second pallet conveying unit 672 that transports the pallet 30 between the loading section 100 and the unloading section 300.

[0103] The second pallet transport path TT2 is a path for the second pallet transport unit 672 to transport the pallet 30 between the loading unit 100 and the unloading unit 300 , and is set at a position facing the first pallet transport path TT1 based on the round-trip movement path G.

[0104] On the other hand, a second pallet loading portion 162 may be provided on the second pallet transport route TT2 to temporarily load an empty pallet 30 without components 10 .

[0105] The second pallet loading unit 162 may have any structure as long as it can temporarily load an empty pallet 30 that is not loaded with components 10 in the second pallet transport path TT2 of the pallet 30 between the loading unit 100 and the unloading unit 300 .

[0106] In addition, the second tray transport route TT2 may be provided with a sorting buffer 350 for temporarily loading the tray 30 filled with components 10 by the sorting tray unit 330 between the loading unit 100 and the unloading unit 300 .

[0107] In addition, the second pallet transport path TT2 may be set with a covering pallet portion 169 that temporarily loads a covering pallet (not shown) disposed at the uppermost side of a plurality of pallets 30 supplied in a bundle unit from the outside between the loading portion 100 and the unloading portion 300 .

[0108] On the other hand, the second pallet transport route TT2 may be provided with a pallet logistics section 168, which is used to receive pallets 30 of bundled units filled with components 10 loaded on the refining plate 20 from the outside or to discharge pallets 30 of bundled units filled with high-quality components 10 or pallets 30 of bundled units filled with multiple components 10 assigned a preset classification level to the outside.

[0109] The above is only a description of a part of the preferred embodiments that can be implemented by the present invention. Therefore, it is well known that the scope of the present invention is not limited to the above embodiments for interpretation, and the technical ideas of the present invention described above and its fundamental technical ideas are all included in the scope of the present invention.

Claims

1. A component sorting device, characterized in that: include: A loading section (100) for loading a tray (30) on which components (10) to be inspected are loaded; A DC testing section (170) receives the component (10) to be inspected from the loading section (100) to perform a DC test; An XY workbench (410) is used to move a refinement plate (20) in an XY direction, wherein the refinement plate (20) is used to load the components (10) to be inspected and tested as high-quality products by the DC testing unit (170) at an empty position for leading out the components (10) to be classified; An unloading unit (300) is configured to load the components (10) to be classified, which are derived from the smelting plate (20), onto a tray (30) corresponding to the classification standard according to a preset classification standard; The first buffer tray section (610) is configured to move the tray (30) toward a loading position on the upper side of the DC test section (170) and to a horizontally spaced avoidance position from the loading position, so as to temporarily load the components (10) that are found unqualified by the DC test results of the DC test section (170) on the tray (30). The loading unit (100) comprises a guide unit and a drive unit, wherein the guide unit is capable of guiding the tray (30) to move along the Y-axis direction, and the drive unit is used to move the tray (30). The first buffer pallet unit (610) is capable of moving along the Y-axis direction to a first pallet transport route (TT1) so as to receive an empty pallet (30) from the loading unit (100), wherein the first pallet transport route (TT1) is a route along which a first pallet transport unit (671) moves for transporting the pallet (30) between the loading unit (100) and the unloading unit (300).

2. The component sorting device according to claim 1, characterized in that: Also includes: One or more DC tray sections (310) for placing trays (30) loaded with components (10) found to be unqualified by the inspection results of the DC test section (170); and A DC transport tool (550) is provided, wherein the DC transport tool (550) moves between the first buffer tray section (610) and the DC tray section (310) to transfer components (10) that are found to be unqualified by the DC test results of the DC test section (170) to the first buffer tray section (610) and the DC tray section (310).

3. The component sorting device according to claim 2, characterized in that: The first buffer tray section (610) is provided with more than two moving intervals along the vertical direction of the Z axis, and the moving interval is the interval between the loading position and the moving interval (DC) of the DC transport tool (550) where the tray (30) moves back and forth along the Y axis.

4. The component classification device according to claim 1, characterized in that: Also includes: a third transport tool (510) configured to move back and forth between the loading section (100) and the DC testing section (170) in an X-axis direction to transfer a plurality of components (10) from the loading section (100) to the DC testing section (170); a first conveying tool (530) configured to reciprocate in the X-axis direction between a component (10) loading position for the refined plate (20) and the DC testing unit (170) to load a plurality of components (10) inspected as high-quality products in the DC testing unit (170) onto the refined plate (20); A second conveying tool (520) is provided between the component (10) leading-out position for the smelting plate (20) and the unloading section (300) to deliver the component (10) to be classified as a high-quality product to the unloading section (300). Based on the round-trip movement route (G) of the third transport tool (510), the first transport tool (530) and the second transport tool (520), a second pallet transport route (TT2) is set at a position facing the first pallet transport route (TT1). The second pallet transport route (TT2) is a route for the second pallet transport unit (672) that transports the pallet (30) between the loading section (100) and the unloading section (300).

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