A detection probe for solar cell

Abstract

The present application provides a detection probe for a solar cell, comprising: a needle column, a needle sleeve and a spring; the needle sleeve comprises a cover plate and a hollow sleeve, the cover plate covers one end of the sleeve; the two ends of the spring are ground flat and tightened, the spring is placed in the sleeve, and the spring can freely expand and contract in the sleeve along the axial direction of the sleeve, and one end of the spring abuts the cover plate; the needle column comprises a penetration section, an abutment section, a matching section and a probe from one end to the other end in sequence; the penetration section and the abutment section are located in the sleeve, the penetration section is close to the cover plate, and the penetration spring part and the matching section are partially located in the sleeve and partially extend out of the sleeve, and the penetration section, the abutment section and the matching section are all matched with the inner wall clearance of the sleeve; the inner wall of the sleeve is provided with an inward protrusion structure, and the protrusion structure is used to limit the abutment section on the side of the protrusion structure close to the cover plate. During the use of the probe, the spring will expand and contract along the axial direction of the sleeve when subjected to force, and guide the needle column to move along the axial direction.

Description

Technical Field

[0001] The present application relates to the technical field of solar cell production and manufacturing, and in particular to a detection probe for solar cell. Background Art

[0002] Before solar cells are manufactured, they must be subjected to current voltage test (IV) and electroluminescent (EL) tests. IV testing is mainly used to test the efficiency of solar cells, and EL testing is mainly used to test defects in solar cells. Currently, IV and EL tests are performed on solar cells using probes.

[0003] However, the spring in the existing probe is prone to axial distortion when subjected to force, which not only causes abnormal friction between the probe needle column and the probe sleeve and causes jamming, but also makes it difficult to accurately position the probe head, affecting the reliability of the test. Summary of the invention

[0004] The embodiment of the present application provides a detection probe for a solar cell to solve the problem in the related art that the spring in the probe is prone to axial distortion when subjected to force, making it difficult for the probe tip to fully contact the solar cell, affecting the accuracy and reliability of the test.

[0005] In order to solve the above technical problems, this application is implemented as follows:

[0006] The embodiment of the present application provides a detection probe for a solar cell, characterized in that it comprises: a needle column, a needle sleeve and a spring;

[0007] The needle sleeve comprises a cover plate and a hollow sleeve, wherein the cover plate covers one end of the sleeve;

[0008] The two ends of the spring are ground flat and tightened, the spring is placed in the sleeve, and the spring can freely expand and contract in the sleeve along the axial direction of the sleeve, one end of the spring abuts against the cover plate, and one end of the spring abuts against the cover plate;

[0009] The needle column includes a penetration section, an abutment section, a fitting section and a probe in sequence from one end to the other end;

[0010] The penetration section and the abutment section are located in the sleeve, the penetration section is close to the cover plate and penetrates the part of the spring, the matching section is partially located in the sleeve and partially extends out of the sleeve, and the penetration section, the abutment section and the matching section are all in clearance with the inner wall of the sleeve;

[0011] A protrusion structure is provided on the inner wall of the sleeve, and the protrusion structure is used to limit the abutment section at a side of the protrusion structure close to the cover plate.

[0012] In the embodiments of the present application, the detection probe of the solar cell has at least the following advantages:

[0013] Since both ends of the spring are ground and tightened, one end of the spring abuts against the cover plate, and the spring can freely expand and contract in the sleeve along the axial direction of the sleeve. The penetration section of the needle column penetrates the part of the spring. In this way, during the use of the detection probe, the spring will expand and contract along the axial direction of the sleeve when subjected to force, and guide the needle column to move along the axial direction, thereby reducing the jamming caused by the friction between the needle column and the inner wall of the sleeve. Due to the rigidity of the spring, it can still maintain a good guiding effect during long-term use, thereby ensuring the reliability of the probe and extending the service life of the detection probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 A schematic diagram showing the structure of a detection probe provided in an embodiment of the present application;

[0015] Figure 2 A schematic diagram showing the structure of a needle sleeve of a detection probe provided in an embodiment of the present application;

[0016] Figure 3 A schematic diagram showing the structure of a needle column of a detection probe provided in an embodiment of the present application;

[0017] Figure 4 A schematic diagram showing the structure of a spring of a detection probe provided in an embodiment of the present application.

[0018] Reference numerals:

[0019] 1-needle column, 100-penetrating section, 11-introduction section, 12-transition section, 13-abutment section, 14-matching section, 15-probe, 2-needle sleeve, 21-sleeve, 22-cover plate, 23-protrusion structure, 231-annular protrusion, 3-spring. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0021] It should be understood that the references to "one embodiment" or "an embodiment" throughout the specification mean that the specific features, structures, or characteristics associated with the embodiment are included in at least one embodiment of the present application. Therefore, the references to "in one embodiment" or "in an embodiment" appearing throughout the specification do not necessarily refer to the same embodiment. In addition, these specific features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

[0022] In the embodiment of the present application, a detection probe for a solar cell is provided, referring to Figures 1 to 4 The detection probe of the solar cell may specifically include a needle column 1, a needle sleeve 2 and a spring 3. The needle sleeve 2 includes a cover plate 22 and a hollow sleeve 21. The cover plate 22 covers one end of the sleeve 21. Both ends of the spring 3 are ground and tightened. The spring 3 is placed in the sleeve 21, and the spring 3 can freely expand and contract in the sleeve 21 along the axial direction of the sleeve 21; the needle column 1 includes a penetration section 100, a contact section 13, a matching section 14 and a probe 15 from one end to the other end; the penetration section 100 is a hollow sleeve 21. The spring 3 is placed in the sleeve 21, and the spring 3 can freely expand and contract in the sleeve 21 along the axial direction of the sleeve 21. The needle column 1 includes a penetration section 100, a contact section 13, a matching section 14 and a probe 15 in sequence from one end to the other end; The setting section 100 and the abutting section 13 are located in the sleeve 21, the setting section 100 is close to the cover plate 22, and the part of the spring 3 is penetrated, the matching section 14 is partially located in the sleeve 21, and partially extends out of the sleeve 21, and the setting section 100, the abutting section 13 and the matching section 14 are all matched with the inner wall clearance of the sleeve 21; the inner wall of the sleeve 21 is provided with an inward protrusion structure 23, and the protrusion structure 23 is used to limit the abutting section 13 on the side of the protrusion structure 23 close to the cover plate 22. During the use of the detection probe of this embodiment, the spring 3 will expand and contract along the axial direction of the sleeve when subjected to force, and guide the needle column to move along the axial direction, thereby reducing the jamming caused by the friction between the needle column and the inner wall of the sleeve. Due to the rigidity of the spring, it can still maintain a good guiding effect in long-term use, thereby ensuring the reliability of the probe and extending the service life of the probe.

[0023] Specifically, if Figure 1 As shown, the detection probe of the solar cell (hereinafter referred to as the detection probe) may include a needle column 1, a needle sleeve 2 and a spring 3. Figure 2 As shown, the needle sleeve 2 includes a cover plate 22 and a hollow sleeve 21, that is, the sleeve 21 has a receiving space, and the cover plate 22 covers one end of the sleeve 21. In practical applications, the sleeve 21 and the cover plate 22 are an integrally formed structure, so that the needle sleeve 2 has a higher strength, and the detection probe has a higher strength, thereby improving the service life of the detection probe.

[0024] Specifically, if Figure 4 As shown, both ends of the spring 3 are ground flat and tightened, so that the contact area between the spring 3 and its matching support surface can be increased, so that the spring 3 will not be twisted as much as possible within the working elastic force range, and the reverse extension of the direction of the force can be maintained. Figure 1As shown, the spring 3 is placed in the sleeve 21, one end of the spring 3 abuts against the surface of the cover plate 22 close to the sleeve 21 (referred to as the inner surface of the cover plate 22), and the spring 3 can freely expand and contract in the sleeve 21 along the axial direction of the sleeve 21 (the vertical direction shown in the figure).

[0025] Specifically, if Figure 3 As shown, the needle column 1 includes a penetration section 100, a contact section 13, a matching section 14 and a probe 15 from one end to the other end. The probe 15 is mainly used to perform IV test and EL test on the solar cell. The end surface of the probe 15 away from the matching section 14 is a plane so as to stably contact with the solar cell to perform IV test and EL test.

[0026] Specifically, if Figure 1 As shown, the penetration section 100 and the abutment section 13 are located in the sleeve 21, and the penetration section 100 is close to the cover plate 22, that is, the needle column 1 penetrates into the accommodating space of the sleeve 21 from one end thereof. Figure 1 It can be seen that the penetration section 100 is penetrated from the other end of the spring 3 and penetrates a distance toward one end of the spring 3. The matching section 14 is partially located in the sleeve 21 and partially extends from the other end of the sleeve 21. The penetration section 100, the abutting section 13 and the matching section 14 (specifically, the portion of the matching section 14 located in the sleeve 21) are matched with the inner wall clearance of the sleeve 21, so that when the spring 3 is freely extended and retracted along the axial direction of the sleeve 21, that is, when the spring 3 is compressed or the spring 3 is restored from the compressed state to the original state, the needle column 1 can drive the probe to move along the axial direction of the sleeve 21.

[0027] Specifically, if Figure 1 and Figure 2 As shown, an inward protrusion structure 23 is provided on the inner wall of the sleeve 21, that is, the protrusion structure 23 protrudes from the inner wall of the sleeve 21 in the direction from the outer wall of one side of the sleeve 21 to the inner wall. The protrusion structure 23 is mainly used to limit the abutment section 13 on the side of the protrusion structure 23 close to the cover plate 22 to prevent the needle column 1 from slipping out of the needle sleeve 2 during the use of the detection probe, thereby affecting the detection of the detection probe. It should be noted that the protrusion structure 23 is usually set at a position close to the other end of the sleeve 21. Of course, the specific setting position of the protrusion structure 23 can also be in the middle area of ​​the sleeve 21. This embodiment does not need to be determined, and it can be set according to actual needs.

[0028] Specifically, since both ends of the spring 3 are ground and tightened, not only can the contact area between the other end of the spring 3 and the lower end surface of the abutment section 13 be increased, but also the contact area between one end of the spring 3 and the inner surface of the cover plate 22 can be increased, so that the spring 3 will not produce the axis of the spring 3 twisting as much as possible within the working elastic force range. In addition, during the use of the detection probe, the spring 3 will expand and contract along the axis direction of the sleeve when subjected to force, and guide the needle column to move along the axis direction, thereby reducing the friction between the needle column and the inner wall of the sleeve. The rigidity of the spring can still maintain a good guiding effect during long-term use, thereby ensuring the accuracy and reliability of the probe and extending the service life of the detection probe.

[0029] In the embodiments of the present application, Figure 3 As shown, the penetration section 100 includes an introduction section 11; the diameter of the introduction section 11 is smaller than the inner diameter of the spring 3, and the inner diameter of the spring 3 is smaller than the diameter of the abutment section 13; the diameter of the abutment section 13 is larger than the diameter of the matching section 14; the diameter of the probe is larger than the inner diameter of the sleeve 21.

[0030] Specifically, when the introduction section 11 is inserted into the spring 3, the inner diameter of the spring 3 and the outer diameter of the introduction section 11 are clearance-matched, that is, the inner diameter of the spring 3 is larger than the diameter of the introduction section 11, so that the spring 3 can be deformed. The clearance between the inner diameter of the spring 3 and the outer diameter of the introduction section 11 is as small as possible to ensure that the spring 3 does not produce axial distortion when deformed.

[0031] Specifically, the diameter of the abutment section 13 should be larger than the inner diameter of the spring 3, that is, the diameter of the abutment section 13 is also larger than the diameter of the introduction section 11. For example, the diameter of the abutment section 13 is 1.05-1.08 mm, and the diameter of the introduction section 11 is between 0.9-0.95 mm. In this way, when the spring 3 is compressed, the other end of the spring 3 (the end away from the cover plate 22) can abut against the end surface of the abutment section 13 close to the cover plate 22 (referred to as the lower end surface), and the lower end surface of the abutment section 13 can support the other end of the spring 3 and limit the axial position of the spring 3.

[0032] It should be noted that the fit between the abutment section 13 (called the shaft) and the inner wall of the sleeve 21 (called the hole) is a clearance fit, for example: the basic size can be between Φ1.05-Φ1.08mm, and the tolerance zone of the hole is H7 and the tolerance zone of the shaft is g6 to form a clearance fit. With such a precision of fit, the needle column 1 and the sleeve 21 have a low degree of wear when they move, thereby increasing the frequency of use of the detection probe. The clearance fit between the protruding structure 23 and the matching section 14 can also adopt a combination of H7 / g6.

[0033] Specifically, if Figure 3As shown, since the inner wall of the sleeve 21 is provided with a protruding structure 23, it can be seen that the length of the radial space where the sleeve 21 is provided with the protruding structure 23 is smaller than the inner diameter of the sleeve 21. The protruding structure 23 limits the abutting section 13 at the side of the protruding structure 23 close to the cover plate 22, that is, part of the matching section 14 is located at the position where the sleeve 21 is provided with the protruding structure 23. Since the matching section 14 and the inner wall of the sleeve 21 are clearance-matched, the diameter of the matching section 14 should be smaller than the length of the radial space where the sleeve 21 is provided with the protruding structure 23, so that the diameter of the abutting section 13 should be larger than the diameter of the matching section 14. For example, the maximum height of the protruding structure 23 protruding from the inner wall of the sleeve 21 is less than 0.3 mm, and the diameter of the matching section 14 can be between 0.8-0.95 mm.

[0034] Specifically, if Figure 3 As shown, the diameter of the probe is between 2-2.2 mm, and the diameter of the probe is larger than the inner diameter of the sleeve 21, so that when the needle column 1 moves toward the cover plate 22, the probe enters the sleeve 21. Figure 3 As shown, the connection between the probe and the matching section 14 is set as a conical surface, which is convenient for processing.

[0035] In the embodiments of the present application, Figure 3 As shown, the penetration section 100 further includes: a transition section 12, which is located between the abutment section 13 and the introduction section 11; the diameter of the transition section 12 is smaller than the diameter of the introduction section 11; and the end surface of the introduction section 11 away from the transition section 12 is a conical surface.

[0036] Specifically, if Figure 3 As shown, the penetration section 100 also includes a transition section 12, which is located between the abutment section 13 and the introduction section 11. The diameter of the transition section 12 is smaller than the diameter of the introduction section 11. For example, the diameter of the transition section 12 can be between 0.7-0.85 mm. In this way, the abutment section 13 is larger than the diameter of the transition section 12, and the area of ​​the lower end surface of the abutment section 13 abutting the other end of the spring 3 can be increased to increase the contact area with the spring 3, so as to minimize the distortion of the axis of the spring 3 within the working elastic force range.

[0037] Specifically, if Figure 3 As shown, the end surface of the introduction section 11 away from the transition section 12 is a conical surface, so that it is easy to guide the needle column 1 into the sleeve 21 and penetrate into the spring 3.

[0038] In the embodiment of the present application, the needle column 1 is made of beryllium copper, the needle sleeve 2 is made of brass, and the spring 3 is made of titanium alloy.

[0039] Specifically, since beryllium copper has the advantages of high strength, high hardness, wear resistance, corrosion resistance, conductivity, etc., the needle column 1 of this embodiment is made of beryllium copper so that the needle column 1 can be suitable for repeated contact testing of solar cells.

[0040] Specifically, since brass has the advantages of wear resistance and good conductivity, the needle sleeve 2 of this embodiment is made of brass, that is, the sleeve 21 and the cover plate 22 are made of brass, which is mainly used to avoid friction damage between the needle column 1 and the sleeve 21 during relative movement, thereby increasing the service life of the detection probe.

[0041] Specifically, since titanium alloy has the advantages of high strength, good corrosion resistance, high heat resistance and good fatigue limit, the spring 3 of this embodiment is made of titanium alloy to increase the service life of the detection probe.

[0042] It should be noted that the materials of the needle column 1, needle sleeve 2 and spring 3 are not limited to the above examples, and may be other materials. For example, the needle column 1, needle sleeve 2 and spring 3 may all be made of stainless steel or alloy. The specific materials of the needle column 1, needle sleeve 2 and spring 3 are not limited in this embodiment, and may be radially set according to actual conditions.

[0043] In the embodiment of the present application, the spring 3 is a compression spring; the length of the spring 3 in the natural state is less than the first distance, so that the spring 3 is in a pre-compression state. When the end face of the abutment section 13 away from the cover plate 22 abuts against the protruding structure 23, the first distance is the distance between the end face of the abutment section 13 close to the cover plate 22 and the surface of the cover plate 22 close to the spring 3.

[0044] Specifically, when the spring 3 is in a natural state, the length of the spring 3 is less than the first distance, so that the spring 3 is in a pre-compressed state, so that one end of the spring 3 can fit tightly with the inner surface of the cover plate 22, and the other end of the spring 3 can fit tightly with the lower end surface of the abutment section 13, so that the spring 3 can be subjected to an axial force (vertical direction shown in the figure) without generating axial distortion, thereby ensuring the accuracy of the probe test, and avoiding abnormal friction between the needle column 1 and the sleeve 21 during relative movement, thereby increasing the frequency of use of the detection probe. Among them, when the end surface of the abutment section 13 away from the cover plate 22 abuts against the raised structure 23, the first distance is the distance between the end surface of the abutment section 13 close to the cover plate 22 and the surface of the cover plate 22 close to the spring 3, that is, the first distance is the distance between the lower end surface of the abutment section 13 and the inner surface of the cover plate 22. The compression distance of the pre-compression of the spring 3 is between 1-4 mm, that is, the difference between the first distance and the length of the spring 3 is between 1-4 mm. The specific compression distance of the pre-compression of the spring 3 is not limited in this embodiment and can be set according to actual conditions.

[0045] In the embodiment of the present application, the number of the tightening turns at both ends of the spring 3 is between 2 and 11 turns.

[0046] In practical applications, in order to make the spring 3 evenly stressed during operation and ensure that the axis of the spring 3 is perpendicular to the end face of the spring 3, the two ends of the spring 3 are often tightened when manufacturing the spring 3. In this embodiment, the number of tightening circles at the two ends of the spring 3 is between 2 and 11 circles, so that the spring 3 does not produce axis distortion when subjected to axial force (vertical direction in the figure), ensuring the accuracy of the probe test, and greatly improving the use frequency of the test probe, thereby improving the gallium activation rate.

[0047] Specifically, the wire diameter d of the spring 3 is the diameter of the material (such as titanium alloy, stainless steel, etc.) of which the spring 3 is made, d is between 0.1-0.3 mm, and the number of turns of the spring 3 is between 50-100 turns. In this way, when the detection probe is in use, the elastic force F of the spring 3 can be between 0.5-3N, so that the spring 3 can better drive the needle column 1 to move along the axial direction. Among them, F=kx, k is the stiffness coefficient (or stubbornness coefficient), and x is the length of the spring 3 stretched (or shortened).

[0048] In the embodiment of the present application, the cover plate 22 is a flat plate structure.

[0049] Specifically, the cover plate 22 is a flat plate structure, so when the other end of the spring 3 abuts against the inner surface of the cover plate 22, the stability of the spring 3 can be improved, so that the spring 3 is more vertical and the force on the spring 3 is more uniform, so that the spring 3 will not produce axial distortion when subjected to axial force, thereby ensuring the accuracy of the probe test and greatly increasing the frequency of use of the test probe.

[0050] In the embodiment of the present application, the needle column 1 is provided with a first nickel coating, and the first nickel coating is provided with a first gold coating; the needle sleeve 2 is provided with a second nickel coating, and the second nickel coating is provided with a second gold coating; the spring 3 is provided with a third nickel coating, and the third nickel coating is provided with a third gold coating; the thickness of the first nickel coating, the second nickel coating and the third nickel coating is between 1-3um, and the thickness of the first gold coating, the second gold coating and the third gold coating is between 0.2-2um. In this way, the resistivity of the detection probe can be very small when it is used, and the resistance of the detection probe is stable during the detection process to improve the accuracy of the detection, and the frequency of use of the detection probe can also be increased.

[0051] like Figure 2 As mentioned above, the cover plate 22 is provided with through holes to facilitate nickel plating and gold plating of the inner wall of the sleeve 21 .

[0052] In the embodiment of the present application, the protrusion structure 23 includes at least two annular protrusions 231 ; the at least two annular protrusions ( 231 ) are arranged at intervals along the axial direction of the sleeve 21 .

[0053] Specifically, in the axial direction of the sleeve 21, the protrusion structure 23 includes at least two annular protrusions 231 arranged at intervals. In this way, not only can the matching stability between the annular protrusion 231 and the matching section 14 be improved, so that the needle column 1 and the sleeve 21 are as coaxial as possible, thereby ensuring the accuracy of the probe detection, but also the needle column 1 can be moved along the straight line determined by at least two annular protrusions 231 to avoid the needle column and the sleeve of the probe from being stuck due to abnormal friction. For example, Figure 2 Two annular protrusions 231 are shown in the figure, and the two annular protrusions 231 are arranged at intervals along the axial direction of the sleeve 21.

[0054] It should be noted that if there are three or more annular protrusions 231, the distance between two adjacent annular protrusions 231 may be the same or different, and the specific setting position of each annular protrusion 231 may be set according to actual conditions, and this embodiment does not limit this.

[0055] In the embodiment of the present application, the cross-sectional shape of the annular protrusion 231 can be any one of an arc, a square and a triangle. The figure shows an arc, which is concave from the outer wall to the inner wall of the sleeve 21. Of course, in addition to the annular protrusion 231, the cross-sectional shape of the structure 23 can also be other shapes, and this embodiment is not limited to this. If the annular protrusion 231 includes more than two annular protrusions 231, the distance between two adjacent annular protrusions 231 is equal to further improve the matching stability between the annular protrusion 231 and the matching section 14, so that the needle column 1 and the sleeve 21 are as coaxial as possible.

[0056] In the embodiment of the present application, the height of the annular protrusion 231 protruding from the inner wall of the sleeve 21 is greater than 0 mm and less than or equal to 0.3 mm.

[0057] Specifically, the height of the annular protrusion 231 protruding from the inner wall of the sleeve 21 refers to the highest height of the annular protrusion 231 protruding from the inner wall of the sleeve 21. For example, the cross-sectional shape of the annular protrusion 231 shown in the figure is an arc, and the distance between the center of the arc and the inner wall of the sleeve 21 is between 0-0.3mm. Of course, the specific numerical value of the height of the annular protrusion 231 protruding from the inner wall of the sleeve 21 may not be limited in this embodiment and may be set according to actual conditions.

[0058] It should be noted that the ab written above refers to [a,b], that is, the closed interval of a and b. For example, 2-11 is the closed interval [2,11], which refers to 2, (2,11) and 11.

[0059] In the embodiments of the present application, the detection probe of the solar cell has at least the following advantages:

[0060] Since both ends of the spring are ground and tightened, one end of the spring abuts against the cover plate, and the spring can freely expand and contract along the axial direction of the sleeve 21 in the sleeve, and the penetration section of the needle column penetrates the part of the spring. In this way, during the use of the detection probe, the spring will expand and contract along the axial direction of the sleeve when subjected to force, and guide the needle column to move along the axial direction, thereby reducing the jamming caused by the friction between the needle column and the inner wall of the sleeve. Due to the rigidity of the spring, it can still maintain a good guiding effect during long-term use, thereby ensuring the reliability of the probe and extending the service life of the detection probe.

[0061] It should be noted that the various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referenced to each other.

[0062] Although the optional embodiments of the present application have been described, those skilled in the art may make additional changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including optional embodiments and all changes and modifications that fall within the scope of the present application.

[0063] Finally, it should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity from another entity, and do not necessarily require or imply any such actual relationship or order between these entities. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that an article or terminal device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such article or terminal device. In the absence of further restrictions, the elements defined by the sentence "including one..." do not exclude the existence of other identical elements in the article or terminal device including the elements.

[0064] The technical solution provided by the present application is introduced in detail above. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. At the same time, for those skilled in the art, according to the principles and implementation methods of the present application, there may be changes in the specific implementation methods and application scopes. In summary, the content of this specification should not be understood as limiting the present application.

Claims

1. A detection probe for a solar cell, characterized in that: include: Needle column (1), needle sleeve (2) and spring (3); The needle sleeve (2) comprises a cover plate (22) and a hollow sleeve (21), wherein the cover plate (22) covers one end of the sleeve (21); Both ends of the spring (3) are ground flat and tightened, the spring (3) is placed in the sleeve (21), and the spring (3) can freely expand and contract in the sleeve (21) along the axial direction of the sleeve (21), and one end of the spring (3) abuts against the cover plate (22); The needle column (1) comprises, from one end to the other end, a penetration section (100), an abutment section (13), a matching section (14) and a probe (15); the needle column (1) is made of beryllium copper, the needle sleeve (2) is made of brass, and the spring (3) is made of titanium alloy; The penetration section (100) and the abutment section (13) are located in the sleeve (21); the penetration section (100) is close to the cover plate (22) and penetrates a portion of the spring (3); the matching section (14) is partially located in the sleeve (21) and partially protrudes from the sleeve (21); the penetration section (100), the abutment section (13) and the matching section (14) are all in clearance fit with an inner wall of the sleeve (21); An inwardly facing protruding structure (23) is provided on the inner wall of the sleeve (21), and the protruding structure (23) is used to limit the abutting section (13) to a side of the protruding structure (23) close to the cover plate (22), and to place the spring (3) in a pre-compressed state.

2. The detection probe for solar cell according to claim 1, characterized in that: The penetration section (100) comprises an introduction section (11); the diameter of the introduction section (11) is smaller than the inner diameter of the spring (3); and the inner diameter of the spring (3) is smaller than the diameter of the abutment section (13); The diameter of the abutting section (13) is greater than the diameter of the matching section (14); The diameter of the probe (15) is greater than the inner diameter of the sleeve (21).

3. The detection probe for solar cell according to claim 2, characterized in that: The penetration section (100) further comprises: a transition section (12), wherein the transition section (12) is located between the abutment section (13) and the introduction section (11); The diameter of the transition section (12) is smaller than the diameter of the introduction section (11); The end surface of the introduction section (11) away from the transition section (12) is a conical surface.

4. The detection probe for a solar cell according to claim 1, characterized in that: The number of the tightening circles at both ends of the spring (3) is between 2 and 11.

5. The detection probe for solar cell according to claim 1, characterized in that: The cover plate (22) is a flat plate structure.

6. The detection probe for solar cell according to claim 1, characterized in that: The needle column (1) is provided with a first nickel coating, and the first nickel coating is provided with a first gold coating; The needle sleeve (2) is provided with a second nickel coating, and the second nickel coating is provided with a second gold coating; The spring (3) is provided with a third nickel coating, and the third nickel coating is provided with a third gold coating; The thickness of the first nickel coating, the second nickel coating and the third nickel coating are all between 1-3 um, and the thickness of the first gold coating, the second gold coating and the third gold coating are all between 0.2-2 um.

7. The detection probe for solar cell according to claim 1, characterized in that: The protrusion structure (23) comprises at least two annular protrusions (231); At least two of the annular protrusions (231) are arranged at intervals along the axial direction of the sleeve (21).

8. The detection probe for a solar cell according to claim 7, characterized in that: The cross-sectional shape of the annular protrusion (231) is any one of an arc, a square and a triangle; The height of the annular protrusion (231) protruding from the inner wall of the sleeve (21) is greater than 0 mm and less than or equal to 0.3 mm.

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