Device for accurately acquiring geometric morphology of rock structural surface and fine quantification method

Abstract

The present application relates to the technical field of rock mechanics, and provides a device for accurately acquiring the geometric morphology of rock structural surfaces and a fine quantification method. The device is used to assist in positioning the undulating structural surface when optically scanning the undulating structural surface of the sample to be tested; in the acquisition device, a tray for placing the sample to be tested is rotatably mounted on a base, and the sample to be tested placed on the upper surface of the tray is clamped by a fixture mounted on the top surface of the tray, and the rotation angle between the upper surface of the tray and the base is adjusted by the tray rotating around an axis extending along a first direction connected to the base, so that the undulating structural surface of the sample to be tested can face the scanning lens of the optical scan, thereby realizing the positioning of the undulating structural surface of the optical scan, and realizing the leveling of the undulating structural surface with an inclination; finally, the positioning coordinate mark set on the fixture is used to assist in establishing a unified coordinate system for the geometric morphology point cloud data acquired by optical scanning.

Description

Technical Field

[0001] The present application relates to the technical field of rock mechanics, and in particular to a device for accurately acquiring the geometric morphology of a rock structure surface and a fine quantification method. Background Art

[0002] Natural rock mass is a geological body formed after a long geological process, and contains a large number of discontinuous structural surfaces such as joints, microcracks, pores, holes, faults, etc. In rock mass engineering such as slopes, tunnels, and dams, the existence of structural surfaces often weakens the strength of the rock mass. Its geometric morphology and shear characteristics largely determine the mechanical properties of the surrounding rock mass and affect the stability of rock mass control. Therefore, the widespread existence of structural surfaces in rock mass provides favorable conditions for the occurrence of geological disasters such as landslides, rock bursts, and earthquakes, posing a huge threat to engineering safety.

[0003] In the study of rock mass structural surfaces, the geometric morphology of the structural surface is the basis for studying its mechanical properties. At present, the measurement of the geometric morphology and roughness of the structural surface mainly includes three basic types: naked eye observation comparison, probe scanning, and optical scanning. Among them, naked eye observation is affected by subjective factors, probe scanning has higher requirements for the flatness of the structural surface, and optical scanning is more scientific and universal. However, when using optical equipment to obtain the geometric morphology parameters of the structural surface, it is required that the scanning of the micro-convex bodies on the structural surface will not be blocked due to the angle, which is a major problem for the leveling of structural surface samples with an inclination. Summary of the invention

[0004] The purpose of this application is to provide a device for accurately acquiring the geometric morphology of a rock structure surface and a fine quantification method to solve or alleviate the problems existing in the above-mentioned prior art.

[0005] In order to achieve the above objectives, this application provides the following technical solutions:

[0006] The present application provides a device for accurately acquiring the geometric morphology of a rock structural surface, which is used to assist in locating the undulating structural surface when optically scanning the undulating structural surface of a sample to be tested. The device comprises: a base;

[0007] A tray is rotatably mounted on the base;

[0008] A clamp, mounted on the upper surface of the tray, for clamping the sample to be tested placed on the upper surface of the tray; wherein the tray can rotate around an axis extending along a first direction and rotatably connected to the base, so as to adjust the undulating structure surface of the sample to be tested to face the scanning lens of the optical scanning;

[0009] The fixture is provided with positioning coordinate marks for establishing a unified coordinate system for the geometrical morphology point cloud data acquired by the optical scanning; wherein the plane where the positioning marks are located is parallel to the upper surface of the tray.

[0010] Preferably, a plurality of adjustment legs are rotatably mounted on the lower surface of the base; the adjustment legs are capable of telescopic movement, and the inclination angle of the base relative to the scanning lens is adjusted by adjusting the different telescopic amounts of the plurality of adjustment legs; wherein the axis through which the adjustment legs are rotatably connected to the base extends along a second direction; wherein the second direction is perpendicular to the first direction.

[0011] Preferably, a dovetail groove is provided on the tray along the first direction; correspondingly, a dovetail rail matching the dovetail groove is provided on the clamp, and a threaded anchor screw is installed on the clamp so that after the clamp clamps the test sample, the anchor screw can be rotated to tighten and fix the clamp and the tray to each other.

[0012] Preferably, the clamp comprises: a clamping plate and a clamping adjustment assembly; there are two clamping plates, both of which are slidably mounted on the dovetail slide groove through the dovetail slide rail, and can move along the first direction to adjust the relative distance between the two clamping plates; both ends of the clamping plate are respectively provided with clamping light holes passing through the first direction; the clamping adjustment assembly comprises: a clamping screw and an adjusting nut; both ends of the clamping screw respectively pass through the clamping light holes directly opposite to each other on the two clamping plates; there are two adjusting nuts, which are respectively threadedly connected to the two ends of the clamping screw and the parts extending out of the outside of the two clamping plates.

[0013] Preferably, the clamping plate is also provided with a vertical positioning mark perpendicular to the upper surface of the tray, and the vertical positioning mark is used to match the vertical positioning symbol on the sample to be tested to adjust the first inclination angle of the undulating structural surface of the sample to be tested.

[0014] Preferably, a transverse positioning mark is provided on the upper surface of the pallet, wherein the transverse positioning mark is perpendicular to the vertical positioning mark and perpendicular to the first direction; the transverse positioning mark is used to match the transverse positioning symbol on the sample to be tested so as to adjust the second inclination angle of the undulating structural surface of the sample to be tested.

[0015] Preferably, it also includes: a positioning scale, which is installed on the base and is provided with a positioning pointer; correspondingly, a positioning rod is provided on the tray; wherein the positioning pointer is in contact with the positioning rod and can move along the positioning groove on the positioning scale to determine the rotation angle between the tray and the base.

[0016] Preferably, the positioning rod is a threaded rod, which is threadedly connected to the pallet along the first direction; and / or the end of the threaded rod facing the positioning scale matches the tightening groove provided on the positioning scale, so that after the rotation angle between the pallet and the base is determined by the positioning pointer, the threaded rod is rotated so that the threaded rod abuts against the bottom surface of the tightening groove.

[0017] Preferably, a damping plate is provided at the rotational connection between the tray and the base, so as to increase the rotational damping between the tray and the base.

[0018] The embodiment of the present application also provides a method for finely quantifying the geometric morphology of a rock structural surface, wherein the test sample is assisted in positioning by any of the above-mentioned devices for accurately acquiring the geometric morphology of a rock structural surface, so as to acquire multiple geometric morphology point cloud data of the undulating structural surface of the test sample by optical scanning; the method comprises:

[0019] Step S101, automatically splicing, optimizing and fusing the acquired multiple geometric morphology point cloud data of the undulating structural surface of the sample to be tested, and encapsulating the obtained synthetic point cloud data to obtain a synthetic mesh surface of the undulating structural surface;

[0020] Step S102: Cover the synthetic mesh surface of the undulating structure surface with covering units of different sizes to determine the overall fractal dimension of the undulating structure surface. , and the fractal dimensions of the undulating structural surface under the covering units of different sizes , so as to obtain the optimal covering unit of the undulating structural surface;

[0021] Step S103: According to the size The area of ​​the undulating structure surface under the optimal coverage unit and the corresponding projected area , determine the fractal fluctuation coefficient of the undulating structural surface ; and, based on size The roughness probability of the undulating structure surface under the optimal coverage unit at different viewing angles in both the positive and negative directions , the anisotropic coefficient of the undulating structural surface is obtained ;

[0022] Step S104: According to the determined boundary coverage unit of the undulating structural surface, the undulating structural surface is separated into first-order undulation and second-order undulation, and the structural hierarchy coefficient of the undulating structural surface is calculated according to the undulation level separation result. ;

[0023] Step S105: according to the fractal fluctuation coefficient of the undulating structural surface , anisotropic transmission coefficient , structural hierarchy coefficient , determine the geometric morphology parameters of the undulating structural surface .

[0024] Preferably, in step S102, according to the formula:

[0025]

[0026] Determine the overall fractal dimension of the undulating structural surface , and the fractal dimension of the undulating structural surface ; In the formula, For size When the covering unit covers the synthetic mesh surface of the undulating structure surface, the total number of covering meshes; For size When the covering unit covers the synthetic mesh surface of the undulating structure surface, the total number of covering meshes; For size The rough surface area of ​​the undulating structure surface under the covering unit, For size The projection area of ​​the rough surface of the undulating structure surface under the covering unit.

[0027] Preferably, in step S103, according to the formula:

[0028]

[0029] Determine the fractal relief coefficient of the undulating structural surface ; In the formula, ; For size The total number of covered grids when the optimal covering unit covers the synthetic grid surface of the undulating structure surface; For the The area of ​​the covered grid.

[0030] Preferably, in step S102, according to the formula:

[0031]

[0032] Determine the anisotropy coefficient of the undulating structure surface ; In the formula, For size The optimal coverage unit of the undulating structure surface in both positive and negative directions has an apparent inclination angle of The roughness probability under .

[0033] Preferably, in step S104, according to , and determine the boundary coverage unit of the undulating structural surface; wherein, For size The rough surface area of ​​the undulating structure surface under the covering unit, For size The projection area of ​​the rough surface of the undulating structure surface under the covering unit;

[0034] In larger size The overall fractal dimension of the undulating structure surface is calculated within the boundary coverage unit. and the fractal dimension of the undulating structure surface under the covering unit of different sizes ,Sure The covering unit at the time is the optimal covering unit of the primary undulating structure in the undulating structure surface;

[0035] In less than size The overall fractal dimension of the undulating structure surface is calculated within the boundary coverage unit. and the fractal dimension of the undulating structure surface under the covering unit of different sizes ,Sure The covering unit at this time is the optimal covering unit of the secondary undulating structure in the undulating structure surface.

[0036] Preferably, according to the formula:

[0037]

[0038] Determine the roughness coefficient of different undulation levels of the undulating structural surface ;

[0039] In the formula, For size When the covering unit covers the synthetic mesh surface of the undulating structure surface, the first The area of ​​the covered grid; For size When the covering unit covers the synthetic grid curved surface of the undulating structural surface, the total coverage area of ​​the covering grid corresponding to different undulation levels.

[0040] Preferably, according to the formula:

[0041]

[0042] Determine the structural hierarchy of the undulating structural surface through the coefficient ; In the formula, is the maximum roughness coefficient in the primary undulating structure surface, is the minimum roughness coefficient in the primary undulating structural surface; is the maximum roughness coefficient in the secondary undulating structure surface, is the minimum roughness coefficient in the secondary undulating structure surface, is the single-side size of the optimal covering unit of the primary undulating structural surface, is the single-side size of the optimal covering unit of the secondary undulating structural surface, is the single side size of the boundary covering unit.

[0043] Preferably, according to the formula:

[0044]

[0045] Determine the geometrical parameters of the undulating structural surface ; In the formula, is the fractal fluctuation coefficient of the undulating structural surface, is the anisotropic transmission coefficient of the undulating structural surface, is the structural hierarchy passing coefficient of the undulating structural surface.

[0046] Beneficial effects:

[0047] The device for accurately acquiring the geometric morphology of a rock structural surface provided in an embodiment of the present application is used to assist in positioning the undulating structural surface when optically scanning the undulating structural surface of a test sample; in the acquisition device, a tray for placing the test sample is rotatably mounted on a base, and the test sample placed on the upper surface of the tray is clamped by a clamp mounted on the top surface of the tray, and the rotation angle between the upper surface of the tray and the base is adjusted by rotating the tray around an axis extending along a first direction connected to the base, so that the undulating structural surface of the test sample can face the scanning lens of the optical scanning, thereby achieving the positioning of the undulating structural surface of the optical scanning and the leveling of the undulating structural surface with an inclination angle; finally, the positioning coordinate marks set on the clamp are used to assist in establishing a unified coordinate system for the geometric morphology point cloud data acquired by optical scanning.

[0048] Therefore, before scanning the test sample, by adjusting the angle between the tray and the base to adapt to the undulating structural surfaces with different inclination angles, the angle of the undulating structural surface with an inclination can be accurately adjusted, so that the undulating structural surface is directly opposite the scanning lens, which satisfies the scanning of the undulating structural surfaces with different inclination angles and ensures the integrity of the morphology of the undulating structural surface; and through the positioning coordinate marks fixed on the fixture, a unified coordinate system of the acquired geometric morphology point cloud data is assisted to establish, so as to ensure that the different multiple geometric morphology point cloud data obtained during the optical scanning of the undulating structural surface are consistent when the coordinate system is established, so as to achieve the standardized establishment of different multiple geometric morphology point cloud data, ensure the output accuracy of the geometric morphology point cloud data of the undulating structural surface, and thus improve the calculation accuracy of the roughness of the undulating structural surface.

[0049] The multiple geometric morphology point cloud data of the undulating structural surface of the test sample are automatically spliced, optimized, and fused, and the synthesized point cloud data are encapsulated to obtain the synthetic grid surface of the undulating structural surface; then, the synthetic grid surface of the undulating structural surface is covered by covering units of different sizes to determine the overall fractal dimension of the undulating structural surface. , and the fractal dimension of the undulating structural surface under the cover units of different sizes , to obtain the optimal covering unit of the undulating structural surface; then, according to the size The area of ​​the undulating structure surface under the optimal coverage unit and the corresponding projected area , determine the fractal fluctuation coefficient of the undulating structural surface ; and, based on the size of The roughness probability of the undulating structure surface under the optimal coverage unit at different viewing angles in both positive and negative directions , the anisotropic coefficient of the undulating structural surface is obtained ; Then, according to the determined boundary coverage unit of the undulating structural surface, the undulating structural surface is separated into first-order undulation and second-order undulation, and the structural hierarchy coefficient of the undulating structural surface is calculated according to the undulation level separation result. ; Finally, the fractal fluctuation coefficient of the undulating structural surface , anisotropic transmission coefficient , structural hierarchy coefficient , determine the geometric morphology parameters of the undulating structural surface .

[0050] In this way, the whole process from acquiring the geometric morphology of the undulating structural surface of the test sample, standardizing the point cloud output to the quantification of the roughness is realized, and quantitative indicators that can comprehensively describe the undulation of the structural surface, the structural hierarchy and anisotropy of the undulation (anisotropy coefficient) are given from three aspects: the overall undulation of the undulating structural surface (fractal undulation coefficient), the structural hierarchy of the undulation (structural hierarchy coefficient), and the anisotropy of the undulation (anisotropy coefficient). The undulation characteristics of the undulating structural surface are described in a precise quantitative manner, and the control effect of the first-order and second-order undulations on the shear behavior of the rock structural surface and the anisotropy of the rock structural surface are quantified. BRIEF DESCRIPTION OF THE DRAWINGS

[0051] The drawings constituting part of the present application are used to provide a further understanding of the present application. The exemplary embodiments and descriptions of the present application are used to explain the present application and do not constitute an improper limitation on the present application. Among them:

[0052] Figure 1 A schematic diagram of the structure of a device for accurately acquiring the geometric morphology of a rock structure surface provided according to some embodiments of the present application;

[0053] Figure 2 A schematic diagram of an axial side view of a base provided according to some embodiments of the present application;

[0054] Figure 3 Another axial schematic diagram of a base provided according to some embodiments of the present application;

[0055] Figure 4 A schematic cross-sectional view of a base provided according to some embodiments of the present application;

[0056] Figure 5 A schematic diagram of the structure of a clamping plate provided according to some embodiments of the present application;

[0057] Figure 6 A schematic diagram of a process for finely quantifying the geometric morphology of a rock structure surface according to some embodiments of the present application;

[0058] Figure 7 A logical schematic diagram of a method for finely quantifying the geometric morphology of a rock structure surface according to some embodiments of the present application.

[0059] Description of reference numerals:

[0060] 1. Adjusting legs; 2. Base; 3. Tray; 4. Clamping plate; 5. Positioning coordinate mark; 6. Anchor screw; 7. Clamping screw; 8. Vertical positioning mark; 9. Horizontal positioning mark; 10. Positioning slide; 11. Positioning pointer; 12. Positioning rod; 13. Positioning scale; 14. Butterfly nut; 15. Tightening groove. DETAILED DESCRIPTION

[0061] The present application will be described in detail below with reference to the accompanying drawings and in conjunction with embodiments. Each example is provided by way of explanation of the present application and does not limit the present application. In fact, it will be clear to those skilled in the art that modifications and variations may be made in the present application without departing from the scope or spirit of the present application. For example, a feature shown or described as a part of an embodiment may be used in another embodiment to produce yet another embodiment. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the embodiments of the present invention should belong to the scope of protection of the embodiments of the present invention.

[0062] At present, when the geometric morphology and roughness of rock structural surfaces are measured by optical technology, first, the sample containing the structural surface is placed on the workbench, and the camera vertically shoots the complete surface of the structural surface; then, the formed point cloud data is preprocessed in the processing software to form a preliminary image; finally, the point cloud data file is imported into the data processing software to calculate the roughness of different types and directions.

[0063] Among them, after optically scanning the geometric morphology of the structural surface, it is necessary to establish a system for the obtained point cloud data and calculate the roughness. However, when using image studio to actually establish a system for point cloud data, the point selection and establishment is still to subjectively select two points on the structural surface to connect them into a straight line to establish a coordinate system. There is a lack of a standard system establishment process, which makes the established coordinate system inaccurate and cannot guarantee the consistency of the coordinate system each time.

[0064] In addition, the existing methods mainly characterize the structural surface fluctuation characteristics from three aspects: fluctuation height, fluctuation angle and fluctuation anisotropy. Different characterization methods are used for different fluctuation indicators. However, in the existing research, only one feature of the fluctuation morphology is described, resulting in a significant gap between the quantitative description method and the actual fluctuation characteristics.

[0065] Therefore, when measuring the geometric morphology and roughness of rock structural surfaces, the existing technology mainly has the following technical problems: First, the inclination angles of the structural surface on the sample and the horizontal plane are different, and there is a lack of a complete mechanical leveling device to assist in adjusting the angle of the structural surface to be parallel to the horizontal plane, so as to ensure the complete acquisition of the geometric morphology of the structural surface and the accurate measurement of the roughness; Second, there are obvious differences in the shapes of samples in different rock mechanics experiments, and there is a lack of geometric and efficient uniform adjustment devices; Third, when using image studio to establish a coordinate system for the scanned sample, there is a lack of a reliable basis for establishing the system to help strictly establish an XY coordinate system that is perpendicular to each other and parallel to the horizontal plane.

[0066] Based on this, the embodiment of the present application provides a device for accurately acquiring the geometric morphology of a rock structural surface, which is used to assist in locating the undulating structural surface of a test sample when optically scanning the undulating structural surface of the test sample. Figures 1 to 5 As shown, the device for accurately acquiring the geometric morphology of the rock structure surface includes: a base 2, a tray 3 and a clamp. The tray 3 is rotatably connected to the base 2, and the clamp is installed on the upper surface of the tray 3. By rotating the axis (first axis) of the tray 3 rotatably connected to the base 2, the inclination angle of the upper surface of the tray 3 relative to the base 2 is adjusted, thereby adjusting the inclination angle of the undulating structure surface of the sample to be tested placed on the upper surface of the tray 3 relative to the scanning lens of the optical scanning, until the undulating structure surface is facing the scanning lens; the sample to be tested is placed on the upper surface of the tray 3, and is clamped by the clamp to fix the sample to be tested on the upper surface of the tray 3, so as to effectively avoid the scanning error of the undulating structure surface caused by the movement of the sample to be tested during the optical scanning process.

[0067] At the same time, a positioning coordinate mark 5 is provided on the fixture, and the positioning coordinate mark 5 includes at least three positioning points located in the same plane, and at least three positioning points form rectangular coordinates in the plane; wherein, the plane where at least three positioning points are located is parallel to the upper surface of the tray 3, so that, during optical scanning, at least three positioning points can be used to assist in establishing a unified coordinate system for the geometric morphology point cloud data obtained by optical scanning, thereby ensuring that the different multiple geometric morphology point cloud data obtained during the optical scanning of the undulating structural surface remain consistent when the coordinate system is established, realizing the standardized establishment of different multiple geometric morphology point cloud data, ensuring the output accuracy of the geometric morphology point cloud data of the undulating structural surface, and thereby improving the calculation accuracy of the roughness of the undulating structural surface.

[0068] Here, the direction of the axis of the rotational connection between the tray 3 and the base 2 is defined as the first direction, the direction perpendicular to the first direction in the plane parallel to the upper surface of the tray 3 and passing through the axis of the rotational connection between the tray 3 and the base 2 is defined as the second direction, and the normal direction of the plane parallel to the upper surface of the tray 3 and passing through the axis of the rotational connection between the tray 3 and the base 2 is defined as the third direction. In the embodiment of the present application, the directions of the rectangular coordinates formed by at least three positioning points are the first direction and the second direction, respectively.

[0069] In the present application, the base 2 adopts a flat plate structure, and a plurality of adjustment legs 1 are rotatably mounted on the lower surface of the base 2, wherein the axis (second axis) of the rotational connection between the adjustment leg 1 and the base 2 extends along the second direction. Specifically, four mounting grooves are evenly distributed on the lower surface of the base 2, and an adjustment leg 1 is rotatably mounted in each mounting groove. By adjusting the rotation of the adjustment leg 1 around the second axis, the angle between the adjustment leg 1 and the base 2 is adjusted, and then combined with the adjustment of the angle between the tray 3 and the base 2, a compound adjustment of the inclination angle of the undulating structural surface of the sample to be tested placed on the tray 3 is achieved to meet the optical scanning of the undulating structural surface of the sample to be tested along different cutting directions. It should be noted that the adjustment leg 1 can be rotated and folded around the second axis and retracted into the mounting groove.

[0070] The inclination angle of the base 2 can be adjusted by adjusting the angle between the adjusting leg 1 and the base 2; at the same time, each adjusting leg 1 can be extended and moved autonomously, and then, after the inclination angle of the base 2 is adjusted to a predetermined position, the different extension and contraction amounts of the multiple adjusting legs 1 can be adjusted to achieve support for the base 2 at different inclination angles, thereby ensuring the stability of the base 2 and making the inclination angle of the base 2 relative to the scanning lens remain unchanged during the optical scanning process, thereby reducing the optical scanning error and improving the accuracy of the geometric morphology point cloud data obtained by the optical scanning.

[0071] In the present application, the sample to be tested placed on the upper surface of the tray 3 is clamped by a fixture, wherein the fixture can move back and forth along the first direction on the tray 3 to accommodate samples to be tested of different sizes. Specifically, a dovetail-shaped slide groove is provided on the tray 3 along the first direction, and a dovetail-shaped slide rail matching the dovetail-shaped slide groove is provided on the fixture. Through the cooperation of the dovetail-shaped slide rail and the dovetail-shaped slide groove, the position of the fixture on the tray 3 is adjusted to achieve the clamping of the sample to be tested. Among them, there are two matching dovetail grooves and dovetail rails, that is, two dovetail grooves are arranged in parallel along the second direction on the upper surface of the tray 3, and two dovetail rails are arranged in parallel along the second direction on the bottom surface of the fixture; through the cooperation of the two groups of dovetail grooves and dovetail rails arranged in parallel, the displacement of the fixture along the second direction during the clamping of the test sample is effectively reduced, avoiding the difference in the acquired geometric morphology point cloud data caused by the displacement change of the test sample during the optical scanning process, and improving the accuracy of the geometric morphology point cloud data acquired by the optical scanning.

[0072] When the clamp is adjusted to clamp the sample to be tested, the anchor screw 6 threadedly connected to the clamp is rotated so that the end surface of the anchor screw 6 presses against the upper surface of the tray 3, so that the clamp has a tendency to move upward relative to the tray 3, and the clamp and the tray 3 are mutually pressed and fixed. Specifically, a pressing boss is provided on the side of the clamp, and a threaded through hole is provided on the pressing boss along the third direction, and the anchor screw 6 is threadedly connected in the threaded through hole.

[0073] In a specific example, the clamp includes a clamping plate 4 and a clamping adjustment assembly. There are two clamping plates 4, and both clamping plates 4 are slidably mounted on a dovetail slide groove through a dovetail slide rail, and can move along a first direction to adjust the relative spacing between the two clamping plates 4. Clamping light holes penetrating along the first direction are respectively provided at both ends of the clamping plate 4. In the clamping adjustment assembly, both ends of the clamping screw 7 pass through the clamping light holes directly opposite to each other on the two clamping plates 4, and an adjusting nut is threadedly connected to one end of the clamping screw 7 extending outward from the clamping plate 4. Furthermore, by rotating the two adjusting nuts threadedly connected at both ends of the clamping screw 7, the clamping and fixing of the two clamping plates 4 is achieved.

[0074] Here, two clamping light holes are arranged in parallel at each end of the clamping plate 4 along the third direction, that is, each end of the clamping plate 4 is adjusted and fixed by two clamping rods (each clamping rod is adapted to two adjusting nuts), thereby not only effectively improving the clamping ability of the clamping plate 4 to clamp the test sample, but also further enhancing the overall stability of the clamping plate 4, further avoiding the displacement of the test sample during the optical scanning process.

[0075] In the present application, different positioning marks are used to position and clamp the test samples of different shapes and different inclination angles. In a specific application scenario, a vertical positioning mark 8 perpendicular to the upper surface of the tray 3 is provided on the clamping plate 4, and the vertical positioning mark 8 is used to match the vertical positioning symbol on the test sample to adjust the first inclination angle of the undulating structural surface of the test sample. For example, a vertical positioning hole is opened on the clamping plate 4 as the vertical positioning mark 8; when the test sample is a semi-cylinder sectioned along the axial direction, the axial section of the semi-cylinder is the undulating structural surface to be optically scanned. When the semi-cylinder is clamped, a vertical positioning symbol perpendicular to the undulating structural surface is provided on the end face of the semi-cylinder (for example, the normal of the undulating structural surface is marked on the end face of the semi-cylinder), so that the vertical positioning symbol coincides with the vertical positioning hole (vertical positioning mark 8). At this time, the parallelism of the undulating structural surface of the semi-cylinder and the upper surface of the tray 3 can be ensured.

[0076] In another specific application scenario, a transverse positioning mark 9 is also provided on the upper surface of the tray 3, wherein the transverse positioning mark 9 extends along the second direction and is perpendicular to the vertical positioning mark 8, and is used to match the transverse positioning symbol on the sample to be tested, so as to adjust the second inclination angle of the undulating structural surface of the sample to be tested. For example, the center line of the upper surface of the tray 3 along the second direction is used as the transverse positioning mark 9, and the sample to be tested is an obliquely split semi-cylinder, and the center line of the cross-sectional surface (undulating structural surface) of the obliquely split semi-cylinder is used as the transverse positioning symbol; when the obliquely split semi-cylinder is clamped, the center line of the cross-sectional surface of the obliquely split semi-cylinder is aligned with the center line of the upper surface of the tray 3 along the second direction, and by adjusting the clamping between the tray 3 and the base 2, the inclination angle (second inclination angle) of the undulating structural surface of the obliquely split semi-cylinder can be adjusted, so that the undulating structural surface of the obliquely split semi-cylinder faces the scanning lens.

[0077] Before fixing the test sample, measure the angle (first angle) of the section surface (undulating structure surface) on the test sample relative to the horizontal plane, clamp the test sample on the upper surface of the tray 3, and adjust the clamping between the tray 3 and the base 2 so that the angle (second angle) of the tray 3 relative to the horizontal plane is equal to the angle (first angle) of the section surface (undulating structure surface) relative to the horizontal plane, thereby effectively ensuring that the undulating structure surface is facing the scanning lens.

[0078] When adjusting the angle of the tray 3 relative to the horizontal plane, the angle between the tray 3 and the horizontal plane is adjusted by means of the positioning scale 13 installed on the base 2. Specifically, a positioning pointer 11 is provided on the positioning scale 13, and a top rod is provided on the tray 3. The positioning pointer 11 is connected to the positioning rod 12 and can move along the positioning slide 10 on the positioning scale 13; then, the relative position of the positioning pointer 11 and the positioning rod 12 is used to determine the rotation angle between the tray 3 and the base 2, so as to adjust the angle between the tray 3 and the horizontal plane.

[0079] In a specific example, the positioning scale 13 is arc-shaped, and the center of the arc is located on the first axis; at the same time, the positioning pointer 11 is fixed to the positioning slot 10 by a butterfly nut 14. When the positioning pointer 11 needs to be adjusted to move along the positioning slot 10, the butterfly nut 14 is loosened; when the positioning pointer 11 is adjusted to a predetermined angle, the butterfly nut 14 is tightened to fix the positioning pointer 11.

[0080] In this embodiment, the positioning rod 12 is a threaded rod, which is threadedly connected to a threaded hole arranged along the first direction at one end of the tray 3 away from the first axis, and the outer side surface of the end of the threaded rod extending out of the threaded hole and close to the positioning scale 13 is tangent to the positioning pointer 11. Specifically, the positioning pointer 11 is an L-shaped structure, and the upper surface of the structural plate facing the threaded rod in the L-shaped structure is connected to the outer side wall of the threaded rod; thereby, when adjusting the position of the positioning pointer 11 on the positioning scale 13, the tray 3 can be driven to rotate around the first axis by the threaded rod, so as to adjust the angle of the tray 3 relative to the base 2.

[0081] The end of the threaded rod facing the positioning scale 13 matches the pre-tightening groove provided on the positioning scale 13, so that after the rotation angle of the tray 3 relative to the base 2 is determined by the positioning pointer 11, the threaded rod is rotated to make the threaded rod abut against the bottom surface of the top tightening groove 15. Specifically, a rubber pad is also provided in the pre-tightening groove, and the relative friction force of the end of the threaded rod is increased by the rubber pad, so that the relative friction between the threaded rod and the positioning scale 13 is increased, and the fixation between the tray 3 and the positioning scale 13 is further enhanced, and the rotation displacement of the tray 3 around the first axis during the optical scanning process is effectively avoided, and the error of the geometric morphology point cloud data of the undulating structural surface obtained by optical scanning is reduced.

[0082] In the present application, a damping sheet is provided at the rotation connection between the tray 3 and the base 2, thereby increasing the vibration damping between the tray 3 and the base 2. Specifically, a rubber damping sheet is arranged in the mounting hole corresponding to the first axis on the base 2 to increase the rotation damping between the tray 3 and the base 2, further ensuring that during the optical scanning process, the tray 3 will not rotate relative to the base 2, thereby reducing the error of the geometric morphology point cloud data of the undulating structural surface obtained by optical scanning.

[0083] In the present application, the sample to be tested may be in the shape of a cube, a cuboid, a cylinder, etc., and the undulating structural surface may be an oblique section, an oblique splitting surface, an axial section, etc. By adjusting the relative angle between the support leg 1 and the base 2, and the coordinated adjustment of the relative angle between the base 2 and the tray 3, the adjustment of the undulating structural surfaces with different inclination angles is achieved, so that the undulating structural surface can always face the scanning lens, satisfying the scanning of the undulating structural surfaces with different inclination angles, ensuring the integrity of the undulating structural surface morphology acquisition, and reducing the data error of multiple geometric morphology point cloud data acquired by optical scanning.

[0084] After obtaining multiple geometric morphology point cloud data of the undulating structural surface of the sample to be tested, the geometric morphology fine quantification method of the rock structural surface provided in the embodiment of the present application is used to achieve the quantification of the overall undulation, structural hierarchy and anisotropic roughness of the undulating structural surface. Specifically, Figure 6 , Figure 7 As shown in FIG. 1 , the method for finely quantifying the geometric morphology of the rock structure surface includes:

[0085] Step S101, automatically stitching, optimizing and merging the acquired multiple geometric morphology point cloud data of the undulating structural surface of the sample to be tested, and encapsulating the obtained synthetic point cloud data to obtain a synthetic mesh surface of the undulating structural surface.

[0086] In the prior art, on the one hand, rock-like materials are used to be processed into structural surfaces with certain geometric morphologies through molds, but the rock-like materials used cannot normally restore the mechanical properties of rocks; on the other hand, structural surfaces with different geometric morphologies are obtained through three-point bending tests, splitting tests or direct shear tests, but due to the randomness of the tests, structural surfaces with exactly the same geometric morphology cannot be obtained, and thus the repeatability of the experiments and the conduct of parallel experiments cannot be ensured.

[0087] In this regard, in this application, before optical scanning of the test sample, based on three-dimensional optical scanning technology and CNC engraving technology, structural surface samples with different geometric morphologies (undulating structural surfaces with different geometric morphologies) are prepared and numerically expressed. Specifically, the preparation of the structural surface is completed by rock engraving equipment to ensure the consistency and repeatability of the test and avoid uncontrollable factors of rock materials.

[0088] Then, use a brush to sweep away the debris and mud particles on the surface of the sample to be tested, and spray the developer on the undulating structure surface to facilitate scanning and identification. When spraying the developer, keep a distance of 20cm to 30cm from the undulating structure surface of the sample to be tested to ensure that the spraying is uniform and the thickness is moderate to avoid covering the surface undulation characteristics of the undulating structure surface.

[0089] Next, fix the sample to be tested on the tray with a clamp, and ensure that the sample to be tested is firm and stable without shaking to avoid data splicing failure. Place the clamped sample to be tested within the range of the scanning lens, and use a 3D scanner (for example, the industrial-grade 3D scanning system VTOP200T) that mainly includes high-pixel digital cameras, grating projectors and other optical components, data processing units, etc. to scan the undulating structure surface of the sample to be tested according to The single-frame measurement accuracy is used to scan and obtain multiple geometric morphology point cloud data of the undulating structural surface; and multiple scans are performed by rotating the angle of the test sample or raising and lowering the height of the test sample to splice and synthesize the complete structural surface morphology.

[0090] After obtaining multiple geometric morphology point cloud data of the undulating structural surface, the point cloud data can be automatically spliced, optimized, and fused through the post-processing software of the 3D scanner (for example, the industrial-grade 3D scanning system VTOP200T) to obtain synthetic point cloud data; then, the synthetic point cloud data is packaged to obtain the synthetic grid surface of the undulating structural surface. Finally, the noise data outside the undulating structural surface is deleted to obtain a scanning surface that is completely consistent with the surface morphology of the undulating structural surface of the sample to be tested.

[0091] Step S102: Cover the synthetic grid surface of the undulating structure surface with covering units of different sizes to determine the overall fractal dimension of the undulating structure surface. , and the fractal dimension of the undulating structural surface under the cover units of different sizes , in order to obtain the optimal covering unit of the undulating structural surface.

[0092] When evaluating the undulation of an undulating structural surface through fractal theory, the size of the covering unit plays a decisive role in the evaluation result. When the size of the covering unit is large, the accuracy of describing the undulation of the undulating structural surface decreases; when the size of the covering unit is very large, the undulating morphology of the undulating structural surface does not show fractal properties. Therefore, only when the size of the covering unit tends to zero, the overall fractal dimension of the undulating structural surface is a real dimension. However, in reality, it is impossible for the size of the covering unit to tend to zero. Based on this, when calculating the morphology of the undulating structural surface, the present application first uses different side length sizes. The squares cover the synthetic mesh surface and calculate the coverage area The number of covered grids in the grid is calculated according to the covering unit size and the number of covered grids, according to the formula:

[0093]

[0094] Determining the overall fractal dimension of the undulating structural surface , and the fractal dimension of the undulating structural surface under the cover units of different sizes In the formula, For size When the covering unit covers the synthetic grid surface of the undulating structure surface, the total number of covering grids; For size When the covering unit covers the synthetic grid surface of the undulating structure surface, the total number of covering grids; For size The rough surface area of ​​the undulating structure under the covering unit, For size The projected area of ​​the rough surface of the undulating structure under the covering unit.

[0095] Then, by comparing the fractal dimensions of the undulating structural surface under the covering units of different sizes The overall fractal dimension of the undulating structural surface ,when When , we define the fractal dimension The corresponding covering unit is the optimal covering unit.

[0096] Step S103: According to the size The area of ​​the undulating structure surface under the optimal coverage unit and the corresponding projected area , determine the fractal fluctuation coefficient of the undulating structural surface ; and, based on size The roughness probability of the undulating structure surface in both positive and negative directions under different viewing angles under the optimal coverage unit , the anisotropic coefficient of the undulating structural surface is obtained .

[0097] Based on fractal theory, when using fractal dimension to describe the undulating morphology of undulating structural surfaces, due to the small range of fractal dimension, even for structural surfaces with large undulations, the fractal dimension has a small difference, and it is impossible to intuitively describe the undulating morphology of undulating structural surfaces. The optimal coverage unit of the optimal coverage unit defines the area of ​​the undulating structure surface under the optimal coverage unit and the corresponding projected area The ratio of the projected area (fractal fluctuation coefficient) is used to describe the overall fluctuation of the undulating structural surface in two dimensions, and to quantify the fluctuation characteristics of the undulating structural surface more intuitively. It is the projection area of ​​the undulating structural surface on the horizontal plane.

[0098] Specifically, according to the formula:

[0099]

[0100] Determine the fractal relief coefficient of the undulating structural surface In the formula, ; For size The total number of covering grids when the optimal covering unit covers the synthetic grid surface of the undulating structure surface; For the The area of ​​the covered grid.

[0101] The magnitude of the undulation of the undulating structural surface mainly reflects the geometric characteristics of the undulating structural surface, and the geometric characteristics of the undulating structural surface can better reflect the mechanical properties of the undulating structural surface, and the mechanical properties of the undulating structural surface are mainly manifested in its shear strength. Based on this, in this application, the anisotropy coefficient is defined as Describe the shear strength of the undulating structural surface. Specifically, according to the formula:

[0102]

[0103] Determine the anisotropic pass coefficient of the undulating structural surface In the formula, For size The optimal coverage unit under the undulating structure surface in both positive and negative directions at the apparent inclination angle The roughness probability under the optimal coverage unit is the roughness probability with an apparent inclination angle less than 90 degrees along the shear direction under the optimal coverage unit. Here, the apparent inclination angle is the inclination angle formed between the unit undulation (micro-convex or concave) on the undulating structural surface and its shear surface.

[0104] Among them, according to the formula:

[0105]

[0106] Determine the apparent inclination angle of the undulating structural surface in both the positive and negative directions The roughness probability under ; In the formula, For size When the optimal covering unit covers the synthetic grid surface of the undulating structure surface, the The area of ​​the covered grid; For size When the optimal covering unit of the undulating structure surface is covered by the synthetic grid surface, the total coverage area of ​​the covered grid. It should be noted that in both positive and negative directions, The area of ​​the covered grid It may be the same or different.

[0107] Step S104: According to the determined boundary coverage unit of the undulating structural surface, the undulating structural surface is separated into first-order undulation and second-order undulation levels, and the structural hierarchy passing coefficient of the undulating structural surface is calculated according to the undulation level separation result. .

[0108] Based on the fractal theory, the fractal description of the undulating solution structure surface is carried out, and the fractal fluctuation coefficient is used The overall undulation characteristics of the undulating structural surface are described, but the structural hierarchy of the undulating structural surface cannot be described. However, in fact, there are both first-order undulations and second-order undulations in the undulating structural surface, and there are significant structural hierarchy characteristics. Based on this, in this application, the structural hierarchy is defined by the coefficient Provide a structural hierarchical description of the undulating structural surface.

[0109] The size of the covering unit affects the calculation of the fractal dimension and the description of the undulating morphology of the undulating structural surface. When the size of the covering unit gradually decreases, the macroscopic undulation morphology contained in the undulating structural surface becomes more and more refined; when the size of the covering unit decreases to a certain value, the undulating structural surface begins to include micro-convex components. At this time, the size of the covering unit is the separation (boundary) index of the macroscopic undulation and micro-convexity of the undulating structural surface. Therefore, by determining the boundary covering unit, different undulation levels of the undulating structural surface can be separated, namely, first-order undulation (macroscopic undulation morphology) and second-order undulation (micro-convexity).

[0110] By calculating the fractal dimension of each undulating structural surface under different size covering units ,draw Then, according to the relationship curve between The relationship curve between and determines the boundary coverage unit of the undulating structural surface. For size The rough surface area of ​​the undulating structure surface under the covering unit, For size The projection area of ​​the rough surface of the undulating structure surface under the covering unit.

[0111] Then, in the case of a size greater than The overall fractal dimension of the undulating structural surface is calculated within the boundary coverage unit. Fractal dimensions of undulating structural surfaces under covering units of different sizes ,Sure The covering unit at this time is the optimal covering unit of the primary undulating structure in the undulating structure surface ( ). In less than size The overall fractal dimension of the undulating structural surface is calculated within the boundary coverage unit. Fractal dimensions of undulating structural surfaces under covering units of different sizes ,Sure The covering unit at this time is the optimal covering unit of the secondary undulating structure in the undulating structure surface ( ).

[0112] In this application, the roughness coefficient is defined as Quantitatively describe the undulating structure of different undulation levels of the undulating structural surface. Specifically, according to the formula:

[0113]

[0114] Determine the roughness coefficient of different levels of undulation on the undulating structural surface ; In the formula, For size When the synthetic grid surface of the undulating structure surface is covered by the covering unit, the first The area of ​​the covered grid; For size When the covering unit covers the synthetic grid surface of the undulating structural surface, the total coverage area of ​​the covering grids corresponding to different undulation levels.

[0115] That is to say, is the roughness coefficient of each covering grid under the limit covering unit size, which is used to describe the fluctuation of each covering grid in the undulating structural surface under the limit covering unit; when the size of the covering unit is greater than When, for example, the optimal covering unit of the first-order undulating structure ( ),definition Quantitatively describe the roughness of each covering network whose fluctuation is greater than the limit fluctuation in the undulating structure surface, that is, quantitatively describe the roughness of the first-order undulating structure; similarly, when the size of the covering unit is smaller than When, for example, the optimal covering unit of the first-order undulating structure ( ),definition The roughness of each covering network whose undulation is smaller than the limit undulation in the undulating structure surface is quantitatively described, that is, the roughness of the second-order undulating structure is quantitatively described.

[0116] In the shear characteristics of the undulating structure surface, its mechanical properties are mainly controlled by the first-order undulating structure, and the second-order undulating structure has a weak influence. Based on this, in this application, the first-order undulating structure and the second-order undulating structure are separated and quantified, and the structural hierarchy coefficient for describing the structural hierarchy of the undulating structure surface is determined by determining the size of the optimal covering unit describing the first-order undulating structure and the second-order undulating structure. .

[0117] Specifically, according to the formula:

[0118]

[0119] Determine the structural hierarchy of the undulating structural surface through the coefficient .

[0120] In the formula, is the maximum roughness coefficient in the first-order undulating structural surface, is the minimum roughness coefficient in the first-level undulating structural surface; is the maximum roughness coefficient in the secondary undulating structure surface, is the minimum roughness coefficient in the secondary undulating structure surface, is the single-side size of the optimal covering unit of the first-level undulating structural surface, is the single-side size of the optimal covering unit of the secondary undulating structure surface, The single side size of the bounding cover unit.

[0121] Step S105: According to the fractal fluctuation coefficient of the undulating structural surface , anisotropic transmission coefficient , structural hierarchy coefficient , determine the geometric morphology parameters of the undulating structural surface .

[0122] Finally, the fractal fluctuation coefficient describing the overall fluctuation of the undulating structural surface is , the structural hierarchy coefficient describing the structural hierarchy of the undulating structural surface , and the anisotropic coefficient describing the shear properties of the undulating structural surface , calculate the geometric parameters of the undulating structural surface Specifically, according to the formula:

[0123]

[0124] Determine the geometric parameters of the undulating structural surface In the formula, is the fractal fluctuation coefficient of the undulating structural surface, is the anisotropic transmission coefficient of the undulating structural surface, It is the structural hierarchy passing coefficient of the undulating structural surface.

[0125] Therefore, the geometric morphology of the undulating decoupled strand surface is described based on the fractal theory, the optimal covering unit is determined by the fractal dimension of the undulating structural surface, and the area of ​​the undulating structural surface under the optimal covering unit is determined by the fractal dimension of the undulating structural surface. and the corresponding projected area , and obtain the fractal fluctuation coefficient that describes the overall fluctuation of the undulating structural surface ; By determining the boundary covering units of the first-order undulation structure and the second-order undulation structure of the undulating structural surface, and defining the roughness coefficient to quantify the roughness of different undulation levels of the undulating structural surface, a hierarchical description of different undulation units is achieved; at the same time, the structural hierarchy coefficient of the undulating structural surface is used The effects of the first-order and second-order undulation structures in the undulating structural surface on the shear characteristics are described, and the control effect of the first-order and second-order undulations on the shear behavior of the rock structural surface and the anisotropy of the rock structural surface are quantified.

[0126] In the description of the present invention, it is to be understood that the terms “center”, “longitudinal”, “lateral”, “length”, “width”, “thickness”, “up”, “down”, “front”, “back”, “left”, “right”, “vertical”, “horizontal”, “top”, “bottom”, “inside”, “outside”, “clockwise”, “counterclockwise”, “axial”, “radial”, “circumferential”, etc., indicating orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0127] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0128] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral one; it can be a mechanical connection, an electrical connection, or communication with each other; it can be a direct connection, or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0129] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0130] In the present invention, the terms "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" mean that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0131] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A device for accurately acquiring the geometric morphology of a rock structure surface, characterized in that: When optically scanning the undulating structure surface of the sample to be tested, the acquisition device is used to assist in locating the undulating structure surface, and the acquisition device includes: Base; A tray is rotatably mounted on the base; a positioning rod is provided on the tray and a dovetail-shaped slide groove is provided through the tray along a first direction; the positioning rod is a threaded rod and is threadedly connected to the tray along the first direction; A clamp is installed on the upper surface of the tray and is used to clamp the sample to be tested placed on the upper surface of the tray. The clamp is provided with a dovetail slide rail matching the dovetail slide groove, and the clamp is threadedly connected with an anchor screw, so that after the clamp clamps the sample to be tested, the anchor screw is rotated to tighten the clamp and the tray against each other; A positioning scale is installed on the base and is provided with a positioning pointer; the positioning pointer is in contact with the positioning rod and can move along the positioning slide groove on the positioning scale to determine the rotation angle between the tray and the base; the end of the threaded rod facing the positioning scale matches the top tightening groove provided on the positioning scale, so that after the rotation angle between the tray and the base is determined by the positioning pointer, the threaded rod is rotated to make the threaded rod abut against the bottom surface of the top tightening groove; The tray can rotate around an axis extending along the first direction and rotatably connected to the base, so as to adjust the undulating structure surface of the sample to be tested to face the scanning lens of the optical scanning; The fixture is provided with positioning coordinate marks, and the positioning coordinate marks include at least three positioning points located in the same plane, the plane where the at least three positioning points are located is parallel to the upper surface of the tray, and at least three positioning points form rectangular coordinates in the same plane, which are used to establish a unified coordinate system of the geometric morphology point cloud data acquired by the optical scanning; A plurality of adjustment legs are rotatably mounted on the lower surface of the base; the adjustment legs can be telescopically moved, and the inclination angle of the base relative to the scanning lens is adjusted by adjusting the different telescopic amounts of the plurality of adjustment legs; the axis of the rotational connection between the adjustment legs and the base extends along a second direction; the second direction is perpendicular to the first direction; a damping sheet is provided at the rotational connection between the tray and the base, for increasing the rotational damping between the tray and the base; The clamp comprises: a clamping plate and a clamping adjustment assembly; There are two clamping plates, and both of the two clamping plates are slidably mounted on the dovetail slide groove through the dovetail slide rail and can move along the first direction to adjust the relative distance between the two clamping plates; clamping light holes penetrating along the first direction are respectively provided at both ends of the clamping plate; The clamping adjustment assembly comprises: a clamping screw and an adjusting nut; the two ends of the clamping screw respectively pass through the clamping light holes directly facing the two clamping plates; there are two adjusting nuts, which are respectively threadedly connected to the two ends of the clamping screw and the parts extending out of the outside of the two clamping plates; The clamping plate is also provided with a vertical positioning mark perpendicular to the upper surface of the tray, and the vertical positioning mark is used to match the vertical positioning symbol on the sample to be tested to adjust the first inclination angle of the undulating structural surface of the sample to be tested; A transverse positioning mark is provided on the upper surface of the tray, and the transverse positioning mark is perpendicular to the vertical positioning mark and perpendicular to the first direction; the transverse positioning mark is used to match the transverse positioning symbol on the sample to be tested to adjust the second inclination angle of the undulating structural surface of the sample to be tested.

2. A method for finely quantifying the geometric morphology of a rock structural surface, characterized in that: The device for accurately acquiring the geometric morphology of a rock structural surface according to claim 1 is used to assist in positioning the sample to be tested, so as to acquire multiple geometric morphology point cloud data of the undulating structural surface of the sample to be tested by optical scanning; the method comprises: Step S101, automatically splicing, optimizing and fusing the acquired multiple geometric morphology point cloud data of the undulating structural surface of the sample to be tested, and encapsulating the obtained synthetic point cloud data to obtain a synthetic mesh surface of the undulating structural surface; Step S102: Cover the synthetic mesh surface of the undulating structure surface with covering units of different sizes to determine the overall fractal dimension of the undulating structure surface. , and the fractal dimensions of the undulating structural surface under the covering units of different sizes , so as to obtain the optimal covering unit of the undulating structural surface; Step S103: According to the size The area of ​​the undulating structure surface under the optimal coverage unit and the corresponding projected area , determine the fractal fluctuation coefficient of the undulating structural surface ; And, based on size The roughness probability of the undulating structure surface under the optimal coverage unit at different viewing angles in both the positive and negative directions , the anisotropic coefficient of the undulating structural surface is obtained ; Step S104: According to the determined boundary coverage unit of the undulating structural surface, the undulating structural surface is separated into first-order undulation and second-order undulation, and the structural hierarchy coefficient of the undulating structural surface is calculated according to the undulation level separation result. ; Step S105: according to the fractal fluctuation coefficient of the undulating structural surface , anisotropic transmission coefficient , structural hierarchy coefficient , determine the geometric morphology parameters of the undulating structural surface .

3. The method for finely quantifying the geometric morphology of rock structural surfaces according to claim 2, characterized in that: In step S102, according to the formula: ； Determine the overall fractal dimension of the undulating structural surface , and the fractal dimension of the undulating structural surface ; In the formula, For size When the covering unit covers the synthetic mesh surface of the undulating structure surface, the total number of covering meshes; For size When the covering unit covers the synthetic mesh surface of the undulating structure surface, the total number of covering meshes; For size The rough surface area of ​​the undulating structure surface under the covering unit, For size The projection area of ​​the rough surface of the undulating structure surface under the covering unit.

4. The method for finely quantifying the geometric morphology of rock structural surfaces according to claim 2, characterized in that: In step S103, according to the formula: ； Determine the fractal relief coefficient of the undulating structural surface ; In the formula, ; For size The total number of covered grids when the optimal covering unit covers the synthetic grid surface of the undulating structure surface; For the The area of ​​the covered grid; According to the formula: ； Determine the anisotropy coefficient of the undulating structure surface ; In the formula, For size The optimal coverage unit of the undulating structure surface in both positive and negative directions has an apparent inclination angle of The roughness probability under .

5. The method for finely quantifying the geometric morphology of rock structural surfaces according to claim 2, characterized in that: In step S104, according to , and determine the boundary coverage unit of the undulating structural surface; wherein, For size The rough surface area of ​​the undulating structure surface under the covering unit, For size The projection area of ​​the rough surface of the undulating structure surface under the covering unit; In larger size The overall fractal dimension of the undulating structure surface is calculated within the boundary coverage unit. and the fractal dimension of the undulating structure surface under the covering unit of different sizes ,Sure The covering unit at the time is the optimal covering unit of the primary undulating structure in the undulating structure surface; In less than size The overall fractal dimension of the undulating structure surface is calculated within the boundary coverage unit. and the fractal dimension of the undulating structure surface under the covering unit of different sizes ,Sure The covering unit at this time is the optimal covering unit of the secondary undulating structure in the undulating structure surface.

6. The method for finely quantifying the geometric morphology of rock structural surfaces according to claim 5, characterized in that: According to the formula: ； Determine the roughness coefficient of different undulation levels of the undulating structural surface ; In the formula, For size When the covering unit covers the synthetic mesh surface of the undulating structure surface, the first The area of ​​the covered grid; For size When the covering unit covers the synthetic grid curved surface of the undulating structural surface, the total coverage area of ​​the covering grid corresponding to different undulation levels.

7. The method for finely quantifying the geometric morphology of rock structural surfaces according to claim 6, characterized in that: According to the formula: ； Determine the structural hierarchy of the undulating structural surface through the coefficient ; In the formula, is the maximum roughness coefficient in the primary undulating structure surface, is the minimum roughness coefficient in the primary undulating structural surface; is the maximum roughness coefficient in the secondary undulating structure surface, is the minimum roughness coefficient in the secondary undulating structure surface, is the single-side size of the optimal covering unit of the primary undulating structural surface, is the single-side size of the optimal covering unit of the secondary undulating structural surface, is the single side size of the boundary covering unit; According to the formula: ； Determine the geometrical parameters of the undulating structural surface ; In the formula, is the fractal fluctuation coefficient of the undulating structural surface, is the anisotropic transmission coefficient of the undulating structural surface, is the structural hierarchy passing coefficient of the undulating structural surface.

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