Display panel, display device and test element

Abstract

The invention discloses a display panel, a display device and a test element. The display panel comprises a substrate; the isolation structure is arranged on one side of the substrate in the thickness direction, and the isolation structure comprises a first isolation part; the first electrode layer comprises a first electrode, and the first electrode is in lap joint with the first isolation part; the test element comprises a first conductive part, a second conductive part, a connecting electrode, a first test terminal and a second test terminal, the first conductive part and the second conductive part are arranged at an interval, a test space is formed between the first conductive part and the second conductive part, and the connecting electrode is arranged in the test space and is in lap joint with the first conductive part and the second conductive part; the first test terminal is connected with the first conductive part, and the second test terminal is connected with the second conductive part. According to the display panel provided by the invention, the lap resistance of the isolation structure and the first electrode can be conveniently judged.

Description

Technical Field

[0001] The present application belongs to the field of display technology, and in particular, relates to a display panel, a display device and a test element. Background Art

[0002] Flat display panels such as organic light emitting diode (OLED) panels are widely used in various consumer electronic products such as mobile phones, televisions, personal digital assistants, digital cameras, laptops, desktop computers, etc. due to their advantages of high image quality, power saving, thin body and wide application range, becoming the mainstream in display devices. In some OLED display panels, an isolation structure light-emitting part is often set between sub-pixels, and the cathode in each sub-pixel is electrically connected to the isolation structure. If the resistance of the cathode and the isolation structure in the display panel is too high, the working performance of the display panel will be reduced. Summary of the invention

[0003] The embodiments of the present application provide a display panel, a display device and a test element, which are intended to facilitate determination of the overlap resistance between a cathode and an isolation structure.

[0004] An embodiment of the first aspect of the present application provides a display panel, which includes: a substrate; an isolation structure, arranged on one side of the substrate in the thickness direction, the isolation structure including a first isolation portion; a first electrode layer, including a first electrode, the first electrode overlapping the first isolation portion; a test element, including a first conductive portion, a second conductive portion, a connecting electrode, a first test terminal and a second test terminal, the first conductive portion and the second conductive portion are arranged at an interval, a test space is formed between the first conductive portion and the second conductive portion, the connecting electrode is arranged in the test space and overlaps the first conductive portion and the second conductive portion, the first test terminal is connected to the first conductive portion, and the second test terminal is connected to the second conductive portion.

[0005] According to the implementation of the first aspect of the present application, the first conductive portion and the second conductive portion are both provided in the same layer and material as the isolation structure, and the connecting electrode is provided in the same layer and material as the first electrode.

[0006] According to any of the aforementioned embodiments of the first aspect of the present application, the isolation structure also includes a second isolation portion arranged on the side of the first isolation portion facing away from the substrate, and the projection of the first isolation portion in the thickness direction is located within the projection of the second isolation portion in the thickness direction.

[0007] According to any of the aforementioned embodiments of the first aspect of the present application, a third conductive portion is provided on the side of the first conductive portion facing away from the substrate, and a projection of the first conductive portion in the thickness direction is located within a projection of the third conductive portion in the thickness direction.

[0008] According to any of the aforementioned embodiments of the first aspect of the present application, the third conductive portion and the second isolation portion are provided in the same layer and with the same material.

[0009] According to any of the aforementioned embodiments of the first aspect of the present application, a fourth conductive portion is provided on the side of the second conductive portion facing away from the substrate, and a projection of the second conductive portion in the thickness direction is located within a projection of the fourth conductive portion in the thickness direction.

[0010] According to any of the aforementioned embodiments of the first aspect of the present application, the fourth conductive portion and the second isolation portion are provided in the same layer and with the same material.

[0011] According to any of the aforementioned embodiments of the first aspect of the present application, the second conductive portion is arranged around at least a portion of the first conductive portion.

[0012] According to any of the aforementioned embodiments of the first aspect of the present application, the connecting electrode is arranged around at least a portion of the first conductive portion.

[0013] According to any of the aforementioned embodiments of the first aspect of the present application, the second conductive portion is arranged in a closed ring shape around the first conductive portion, and the connecting electrode is arranged in a closed ring shape around the first conductive portion.

[0014] According to any of the aforementioned embodiments of the first aspect of the present application, the first isolation portion encloses a first opening, and the first electrode is disposed in the first opening.

[0015] According to any of the aforementioned embodiments of the first aspect of the present application, the first conductive portion has a first contour line on the side facing the test space, and a shape formed by the first contour line is the same as a projection shape of the first opening in the thickness direction, and / or the second conductive portion has a second contour line on the side facing the test space, and a shape formed by the second contour line is the same as a projection shape of the first opening in the thickness direction.

[0016] According to any of the aforementioned embodiments of the first aspect of the present application, the first opening has a first perimeter, the length of the first contour line is greater than or equal to 0.5 times the first perimeter, and the length of the first contour line is less than or equal to 1 times the first perimeter, and / or the sum of the lengths of the first contour line and the second contour line is greater than or equal to 2 times the first perimeter, and the sum of the lengths of the first contour line and the second contour line is less than or equal to 3 times the first perimeter.

[0017] According to any of the aforementioned embodiments of the first aspect of the present application, the sum of the overlapping area between the first conductive part and the connecting electrode and the overlapping area between the second conductive part and the connecting electrode is the first area, and within a first opening, the overlapping area between the first isolation part and the first electrode is the second area, the first area is equal to the second area, or the first area is twice the second area.

[0018] According to any of the aforementioned embodiments of the first aspect of the present application, the display panel also includes a circuit layer located on one side of the substrate, the circuit layer includes a first conductive layer, the test element also includes a first connecting portion arranged on the first conductive layer, the first connecting portion is connected to the first conductive portion via a hole, and the first test terminal is connected to the first conductive portion through the first connecting portion, and / or, the circuit layer also includes a second conductive layer, the test element also includes a second connecting portion arranged on the second conductive layer, the second connecting portion is connected to the second conductive portion via a hole, and the second test terminal is connected to the second conductive portion through the second connecting portion.

[0019] According to any of the aforementioned embodiments of the first aspect of the present application, a projection of the first connecting portion in the thickness direction at least partially overlaps with a projection of the first conductive portion in the thickness direction.

[0020] According to any of the aforementioned embodiments of the first aspect of the present application, a projection of the second connecting portion in the thickness direction at least partially overlaps with a projection of the second conductive portion in the thickness direction.

[0021] According to any of the aforementioned embodiments of the first aspect of the present application, the circuit layer also includes a source and / or a drain, the display panel also includes a second electrode arranged on the side of the first electrode facing the substrate, the source and / or the drain is arranged on the first conductive layer, and the second conductive layer is located between the second electrode and the first conductive layer, or the source and / or the drain is arranged on the second conductive layer, and the first conductive layer is located between the second electrode and the second conductive layer.

[0022] According to any of the aforementioned embodiments of the first aspect of the present application, the first conductive layer is located on a side of the second conductive layer away from the first electrode layer in the thickness direction, the test element includes a first connecting part, a second connecting part, and a third connecting part arranged on the second conductive layer, the third connecting part is spaced apart from the second connecting part and is connected to the first conductive part via a hole, and the first connecting part is connected to the third connecting part via a hole.

[0023] According to any of the aforementioned embodiments of the first aspect of the present application, the second connecting portion is arranged around at least a portion of the third connecting portion.

[0024] According to any of the aforementioned embodiments of the first aspect of the present application, the second connecting portion is arranged in a closed ring shape around the third connecting portion.

[0025] According to any of the aforementioned embodiments of the first aspect of the present application, a projection of the third connecting portion in the thickness direction at least partially overlaps with a projection of the first conductive portion in the thickness direction.

[0026] According to any of the aforementioned embodiments of the first aspect of the present application, a light-emitting functional layer is provided on the side of the first electrode layer facing the substrate in the thickness direction, and a virtual light-emitting functional layer is provided on the side of the connecting electrode facing the substrate in the thickness direction, and the light-emitting functional layer and the virtual light-emitting functional layer are provided in the same layer and with the same material.

[0027] According to any of the aforementioned embodiments of the first aspect of the present application, the light-emitting functional layer includes a plurality of light-emitting parts arranged on the side of the first electrode facing the substrate, the number of test elements is multiple, and the virtual light-emitting functional layer includes a plurality of virtual light-emitting parts arranged in the test space, and the light-emitting color of at least some of the virtual light-emitting parts is the same as the light-emitting color of at least some of the light-emitting parts.

[0028] According to any of the aforementioned embodiments of the first aspect of the present application, the cross-sectional area of ​​the first isolation portion gradually decreases in a direction away from the substrate.

[0029] According to any of the aforementioned embodiments of the first aspect of the present application, in a direction away from the substrate, a cross-sectional area of ​​the first conductive portion and / or the second conductive portion gradually decreases.

[0030] According to any of the aforementioned embodiments of the first aspect of the present application, the number of the first test terminals is more than two, and the number of the second test terminals is more than two.

[0031] An embodiment of the second aspect of the present application further provides a display device, comprising a display panel of any of the above-mentioned embodiments of the first aspect.

[0032] An embodiment of the third aspect of the present application also provides a test element, including: a first conductive part; a second conductive part; a connecting electrode, arranged in a test space formed by the first conductive part and the second conductive part, the connecting electrode overlapping the first conductive part and the second conductive part; a first test terminal, connected to the first conductive part; a second test terminal, connected to the second conductive part, wherein the first conductive part and the second conductive part are arranged in the same layer and material.

[0033] According to an implementation scheme of the third aspect of the present application, a third conductive portion is provided on one side of the first conductive portion, and a projection of the first conductive portion in the thickness direction is located within a projection of the third conductive portion in the thickness direction; and / or a fourth conductive portion is provided on one side of the second conductive portion, and a projection of the second conductive portion in the thickness direction is located within a projection of the fourth conductive portion in the thickness direction.

[0034] According to any of the aforementioned embodiments of the third aspect of the present application, the second conductive portion is arranged around at least a portion of the first conductive portion.

[0035] According to any of the aforementioned embodiments of the third aspect of the present application, the connecting electrode is arranged around at least a portion of the first conductive portion.

[0036] According to any of the aforementioned embodiments of the third aspect of the present application, the second conductive portion is arranged in a closed ring shape around the first conductive portion, and the connecting electrode is arranged in a closed ring shape around the first conductive portion.

[0037] According to any of the aforementioned embodiments of the third aspect of the present application, the test element also includes a first connecting portion located on one side of the first conductive portion in the thickness direction, the first connecting portion is connected to the first conductive portion via, and the first test terminal is connected to the first conductive portion through the first connecting portion, and / or the test element also includes a second connecting portion located on one side of the second conductive portion in the thickness direction, the second connecting portion is connected to the second conductive portion via, and the second test terminal is connected to the second conductive portion through the second connecting portion.

[0038] According to any of the aforementioned embodiments of the third aspect of the present application, a projection of the first connecting portion in the thickness direction at least partially overlaps with a projection of the first conductive portion in the thickness direction.

[0039] According to any of the aforementioned embodiments of the third aspect of the present application, a projection of the second connecting portion in the thickness direction at least partially overlaps with a projection of the second conductive portion in the thickness direction.

[0040] According to any of the aforementioned embodiments of the third aspect of the present application, the test element includes a first connecting part, a second connecting part and a third connecting part, the third connecting part and the second connecting part are in the same layer and material and are arranged at intervals, the third connecting part is connected to the first conductive part via a via, the first connecting part is located on a side of the third connecting part away from the first conductive part in the thickness direction, and the first connecting part is connected to the third connecting part via a via.

[0041] According to any of the aforementioned embodiments of the third aspect of the present application, the second connecting portion is arranged around at least a portion of the third connecting portion.

[0042] According to any of the aforementioned embodiments of the third aspect of the present application, the second connecting portion is arranged in a closed ring shape around the third connecting portion.

[0043] According to any of the aforementioned embodiments of the third aspect of the present application, a projection of the third connecting portion in the thickness direction at least partially overlaps with a projection of the first conductive portion in the thickness direction.

[0044] In the display panel provided in the embodiment of the present application, the display panel includes a substrate, an isolation structure, a first electrode layer and a test element. The isolation structure can be used to isolate a plurality of first electrodes. By arranging the first electrode to overlap with the first isolation portion of the isolation structure, the plurality of first electrodes can be interconnected to form a surface electrode through the conductive layer. The test element includes a first conductive part, a second conductive part, a connecting electrode, a first test terminal and a second test terminal. The connecting electrode is arranged in a test space formed by the first conductive part and the second conductive part, and the connecting electrode is overlapped with the first conductive part and the second conductive part, so that the first conductive part can be electrically connected to the second conductive part through the connecting electrode, so that when the first test terminal is connected to the first conductive part and the second test terminal is connected to the second conductive part, the first test terminal and the second test terminal can test the overlap resistance between the first conductive part and the connecting electrode and the overlap resistance between the second conductive part and the connecting electrode, and the overlap relationship between the first conductive part and the second conductive part and the connecting electrode can simulate the overlap relationship between the first isolation part and the first electrode, that is, there is no need to directly connect the relevant test terminals on the isolation structure or the first electrode to test the resistance, so that the overlap resistance between the first isolation part and the first electrode can be determined by testing the overlap resistance between the first conductive part and the connecting electrode and testing the overlap resistance between the second conductive part and the connecting electrode, which is conducive to timely debugging the overlap resistance between the cathode and the isolation structure and reducing the occurrence of display panel production accidents. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments of the present application will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0046] Figure 1 is a structural schematic diagram of a display panel provided in an embodiment of the present application;

[0047] Figure 2 is a schematic structural diagram of a first conductive portion, a second conductive portion, and a connecting electrode provided in an embodiment of the present application;

[0048] Figure 3 The embodiment of this application provides Figure 1 A partial enlarged cross-sectional view at position I in the middle;

[0049] Figure 4 Another embodiment of the present application provides Figure 1 A partial enlarged cross-sectional view at position I in the middle;

[0050] Figure 5 Another embodiment of the present application provides Figure 1 A partial enlarged cross-sectional view at position I in the middle;

[0051] Figure 6 Another embodiment of the present application provides Figure 1 A partial enlarged cross-sectional view at position I in the middle;

[0052] Figure 7 is a schematic diagram of a partial structure of a first conductive layer provided in an embodiment of the present application;

[0053] Figure 8 is a schematic diagram of a partial structure of a second conductive layer provided in an embodiment of the present application;

[0054] Fig. 9 is a schematic diagram of a partial structure of a first insulating layer provided in an embodiment of the present application;

[0055] Fig.10 is a schematic diagram of a partial structure of a second insulating layer provided in an embodiment of the present application;

[0056] Fig.11 It is a partial cross-sectional view of a test element provided in an embodiment of the present application.

[0057] Description of reference numerals:

[0058] 10. Display panel;

[0059] 100, substrate; 110, first conductive layer; 111, first connecting portion; 120, second conductive layer; 121, second connecting portion; 122, third connecting portion; 130, third conductive layer; 140, transistor; 141, source; 142, drain; 143, gate; 150, first insulating layer; 151, first via hole; 160, second insulating layer; 161, second via hole; 162, third via hole; 163, insulating opening;

[0060] 200, pixel definition layer; 210, pixel definition portion; 220, pixel opening;

[0061] 300, light-emitting functional layer; 310, light-emitting portion;

[0062] 400, first electrode layer; 410, first electrode;

[0063] 500, isolation structure; 500a, first opening; 510, first isolation part; 520, second isolation part;

[0064] 600, a second electrode;

[0065] 700, test element; 700a, first current terminal; 700b, first voltage test terminal; 700c, second current terminal; 700d, second voltage test terminal; 710, first conductive part; 711, first contour line; 720, second conductive part; 721, second contour line; 730, test space; 740, connection electrode; 750, virtual light-emitting function layer; 751, virtual light-emitting part; 760, third conductive part; 770, fourth conductive part;

[0066] AA, display area;

[0067] NA, non-display area;

[0068] Z, thickness direction. DETAILED DESCRIPTION

[0069] The features and exemplary embodiments of various aspects of the present application will be described in detail below. In order to make the purpose, technical solutions and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only configured to explain the present application and are not configured to limit the present application. For those skilled in the art, the present application can be implemented without the need for some of these specific details. The following description of the embodiments is only to provide a better understanding of the present application by illustrating the examples of the present application.

[0070] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the statement "include..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0071] It should be understood that when describing the structure of a component, when a layer or a region is referred to as being "on" or "over" another layer or another region, it may mean that it is directly on the other layer or another region, or that other layers or regions are included between it and the other layer or another region. Moreover, if the component is turned over, the layer or a region will be "below" or "beneath" another layer or another region.

[0072] In order to better understand the present application, various embodiments of a display panel, a display device and a test element will be described below with reference to the accompanying drawings.

[0073] Figure 1 is a schematic structural diagram of a display panel 10 provided in an embodiment of the present application, Figure 2 is a schematic structural diagram of a first conductive portion 710, a second conductive portion 720 and a connecting electrode 740 provided in an embodiment of the present application, Figure 3 The embodiment of this application provides Figure 1 The local enlarged cross-sectional view at I in the middle. The Z direction in the figure is the thickness direction.

[0074] like Figures 1 to 3 As shown, an embodiment of the first aspect of the present application provides a display panel 10, which includes a substrate 100, an isolation structure 500, a first electrode layer 400, and a test element 700. The isolation structure 500 is arranged on one side of the substrate 100 in the thickness direction Z, and the isolation structure 500 includes a first isolation portion 510; the first electrode layer 400 includes a first electrode 410, and the first electrode 410 overlaps with the first isolation portion 510; the test element 700 includes a first conductive portion 710, a second conductive portion 720, a connecting electrode 740, a first test terminal, and a second test terminal. The first conductive portion 710 and the second conductive portion 720 are arranged at intervals, and a test space 730 is formed between the first conductive portion 710 and the second conductive portion 720. The connecting electrode 740 is arranged in the test space 730 and overlaps with the first conductive portion 710 and the second conductive portion 720. The first test terminal is connected to the first conductive portion 710, and the second test terminal is connected to the second conductive portion 720.

[0075] In the display panel 10 provided in the embodiment of the present application, the display panel 10 includes a substrate 100, an isolation structure 500, a first electrode layer 400, and a test element 700. The isolation structure 500 can be used to arrange a plurality of first electrodes 410 at intervals. By arranging the first electrode 410 to overlap the first isolation portion 510 of the isolation structure 500, the plurality of first electrodes 410 can be interconnected to form a surface electrode through a conductive layer.

[0076] The test element 700 includes a first conductive part 710, a second conductive part 720, a connecting electrode 740, a first test terminal and a second test terminal. The connecting electrode 740 is arranged in a test space 730 formed by the first conductive part 710 and the second conductive part 720, and the connecting electrode 740 is overlapped with the first conductive part 710 and the second conductive part 720, so that the first conductive part 710 can be electrically connected to the second conductive part 720 through the connecting electrode 740, so that when the first test terminal is connected to the first conductive part 710 and the second test terminal is connected to the second conductive part 720, the first test terminal and the second test terminal can test the overlap resistance between the first conductive part 710 and the connecting electrode 740 and the second conductive part 720. The overlap resistance between the second conductive part 720 and the connecting electrode 740, and the overlap relationship between the first conductive part 710 and the second conductive part 720 and the connecting electrode 740 can simulate the overlap relationship between the first isolation part 510 and the first electrode 410, that is, there is no need to directly connect the relevant test terminals on the isolation structure 500 or the first electrode 410 to test the resistance, so that the overlap resistance between the first isolation part 510 and the first electrode 410 can be determined by testing the overlap resistance between the first conductive part 710 and the connecting electrode 740 and testing the overlap resistance between the second conductive part 720 and the connecting electrode 740, which is conducive to timely debugging the overlap resistance between the cathode and the isolation structure 500, and reducing the occurrence of production accidents of the display panel 10.

[0077] Optionally, the first conductive portion 710 and the second conductive portion 720 are both provided at the same layer and with the same material as the first isolation portion 510 , and the connecting electrode 740 is provided at the same layer and with the same material as the first electrode 410 .

[0078] By setting the first conductive part 710 and the second conductive part 720 to be on the same layer and made of the same material as the first isolation part 510, and setting the connecting electrode 740 to be on the same layer and made of the same material as the first electrode 410, the overlapping relationship between the first conductive part 710 and the second conductive part 720 and the connecting electrode 740 can better simulate the overlapping relationship between the first isolation part 510 and the first electrode 410, so as to more accurately judge the overlapping resistance between the first isolation part 510 and the first electrode 410.

[0079] Optionally, the display panel 10 may include a display area AA and a non-display area NA, the isolation structure 500 and the first electrode 410 may be disposed in the display area AA, and the test element 700 may be disposed in the non-display area NA.

[0080] Optionally, the first isolation portion 510 may enclose a first opening 500 a , and the first electrode 410 may be disposed in the first opening 500 a .

[0081] In some optional embodiments, a light-emitting functional layer 300 is provided on the side of the first electrode layer 400 facing the substrate 100 in the thickness direction Z, and a virtual light-emitting functional layer 750 is provided on the side of the connecting electrode 740 facing the substrate 100 in the thickness direction Z, and the light-emitting functional layer 300 and the virtual light-emitting functional layer 750 are provided in the same layer and with the same material.

[0082] Among them, the light-emitting functional layer 300 and the virtual light-emitting functional layer 750 may include a hole injection layer (HIL), a hole transport layer (HTL), a light-emitting structure, an electron injection layer (EIL) and an electron transport layer (ETL).

[0083] In these optional embodiments, the light-emitting display of the display panel 10 can be achieved by arranging a light-emitting functional layer 300 on the side of the first electrode layer facing the substrate 100, and by arranging the light-emitting functional layer 300 on the side of the connecting electrode 740 facing the substrate 100, and arranging the light-emitting functional layer 300 and the virtual light-emitting functional layer 750 in the same layer and with the same material, the virtual light-emitting functional layer 750 can be prepared together with the light-emitting functional layer 300, and the simulation effect of the overlapping relationship between the first conductive portion 710 and the second conductive portion 720 and the connecting electrode 740 on the overlapping relationship between the first electrode 410 and the first isolation portion 510 is further improved.

[0084] Optionally, the isolation structure 500 is disposed between the light-emitting devices of each sub-pixel. For example, the isolation structure 500 may be used to separate the first electrode layer 400 and the light-emitting functional layer 300 of each sub-pixel.

[0085] There are many ways to set the materials of the first isolation part 510, the first conductive part 710 and the second conductive part 720. Optionally, the materials of the first isolation part 510, the first conductive part 710 and the second conductive part 720 may include metal materials, so that the first isolation part 510, the first conductive part 710 and the second conductive part 720 have better conductivity, so that the multiple first electrodes 410 can be interconnected through the first isolation part 510 to form a whole-surface electrode.

[0086] like Figure 2 As shown, there are also various ways to set the shapes of the first isolation portion 510, the first conductive portion 710, and the second conductive portion 720. In some optional embodiments, the cross-sectional area of ​​the first isolation portion 510 gradually decreases in the direction away from the substrate 100. In some optional embodiments, the cross-sectional area of ​​the first conductive portion 710 and / or the second conductive portion 720 gradually decreases in the direction away from the substrate 100.

[0087] In these optional embodiments, by gradually reducing the cross-sectional area of ​​the first isolation portion 510 in the direction away from the substrate 100, the first isolation portion 510 can have a larger size at one end close to the substrate 100 to facilitate contact with the first electrode 410, so as to increase the overlap area between the first electrode 410 and the first isolation portion 510, thereby facilitating the reduction of the overlap resistance between the first electrode 410 and the first isolation portion 510. By gradually reducing the cross-sectional area of ​​the first conductive portion 710 and / or the second conductive portion 720 in the direction away from the substrate 100, the first conductive portion 710 and / or the second conductive portion 720 can have a larger size at one end close to the substrate 100 to facilitate contact with the connecting electrode 740, so as to increase the overlap area between the connecting electrode 740 and the first conductive portion 710 and / or the second conductive portion 720, so as to better simulate the overlap relationship between the first electrode 410 and the first isolation portion 510, thereby facilitating the determination of the overlap resistance between the first electrode 410 and the first isolation portion 510.

[0088] Optionally, the isolation structure 500 also includes a second isolation portion 520 arranged on the side of the first isolation portion 510 facing away from the substrate 100, and the projection of the first isolation portion 510 in the thickness direction Z can be located within the projection of the second isolation portion 520 in the thickness direction Z, so that when the light-emitting functional layer 300 and the first electrode layer 400 are evaporated, the second isolation portion 520 can block at least part of the material used to prepare the light-emitting functional layer 300 and the material used to prepare the first electrode layer 400, so that the light-emitting functional layer 300 and the first electrode layer 400 in the adjacent first opening 500a are not easily directly contacted and connected, thereby realizing the isolation effect of the isolation structure 500 on the light-emitting functional layer 300 and the first electrode layer 400, and there is no need to set a high-precision metal mask (Fine Metal Mask, FMM) when evaporating the light-emitting functional layer 300 and the first electrode layer 400, thereby reducing the production cost of the display panel 10.

[0089] Optionally, a third conductive portion 760 may be provided on the side of the first conductive portion 710 facing away from the substrate 100, and the projection of the first conductive portion 710 in the thickness direction Z may be located within the projection of the third conductive portion 760 in the thickness direction Z. Optionally, a fourth conductive portion 770 may be provided on the side of the second conductive portion 720 facing away from the substrate 100, and the projection of the second conductive portion 720 in the thickness direction Z may be located within the projection of the fourth conductive portion 770 in the thickness direction Z.

[0090] The third conductive part 760 and the fourth conductive part 770 can block at least part of the material used to prepare the virtual light-emitting functional layer 750 and the material used to prepare the connecting electrode 740, so that the virtual light-emitting functional layer 750 and the connecting electrode 740 in the adjacent test holes 730 are not easily directly contacted and connected. In addition, the self-resistance of the first conductive part 710 and the third conductive part 760 can be closer to the self-resistance of the isolation structure 500, and the self-resistance of the second conductive part 720 and the fourth conductive part 770 can be closer to the self-resistance of the isolation structure 500, so as to improve the simulation effect of the overlapping relationship between each conductive part and the connecting electrode 740 on the overlapping relationship between the first electrode 410 and the isolation structure 500.

[0091] Among them, the third conductive part 760 can be set in the same layer and material as the second isolation part 520, and the fourth conductive part 770 can also be set in the same layer and material as the second isolation part 520, so as to further improve the simulation effect of the overlapping relationship between the first conductive part 710 and the second conductive part 720 and the connecting electrode 740 on the overlapping relationship between the first electrode 410 and the first isolation part 510.

[0092] In some optional embodiments, the light-emitting functional layer 300 includes a plurality of light-emitting portions 310 disposed on the side of the first electrode 410 facing the substrate 100, the number of test elements 700 is multiple, and the virtual light-emitting functional layer 750 includes a plurality of virtual light-emitting portions 751 disposed in the test space 730, and the light-emitting color of at least some of the virtual light-emitting portions 751 is the same as the light-emitting color of at least some of the light-emitting portions 310.

[0093] Optionally, there are multiple first openings 500 a , and the light emitting portion 310 may be located in the first openings 500 a .

[0094] Optionally, among the multiple light-emitting portions 310, at least some of the light-emitting portions 310 emit different light colors. For example, at least some of the light-emitting portions 310 may emit red light, at least some of the light-emitting portions 310 may emit green light, at least some of the light-emitting portions 310 may emit blue light, etc. The present application does not specifically limit the light-emitting color of the light-emitting portion 310.

[0095] In these optional embodiments, by setting the luminous color of at least part of the virtual luminous portion 751 to be the same as the luminous color of at least part of the luminous portion 310, the luminous color of each virtual luminous portion 751 can be the same as the luminous color of each luminous portion 310. For example, when at least part of the luminous portion 310 emits red light, at least part of the virtual luminous portion 751 can emit red light. For another example, when at least part of the luminous portion 310 emits green light, at least part of the virtual luminous portion 751 can emit green light. For another example, when at least part of the luminous portion 310 emits blue light, at least part of the virtual luminous portion 751 can emit blue light. Each luminous portion 310 with different luminous colors can have a virtual luminous portion 751 corresponding to its luminous color, so as to further improve the simulation effect of the overlapping relationship between the first conductive portion 710 and the second conductive portion 720 and the connecting electrode 740 on the overlapping relationship between the first electrode 410 and the first isolation portion 510.

[0096] Optionally, the display panel 10 may further include a pixel definition layer 200 disposed on a side of the substrate 100 in the thickness direction Z facing the isolation structure 500, the pixel definition layer 200 includes a pixel defining portion 210 and a pixel opening 220, and a plurality of pixel openings 220 may be distributed at intervals, wherein the isolation structure 500 may be disposed on a side of the pixel defining portion 210 facing away from the substrate 100, the projection of the first pixel opening 220 in the thickness direction Z may be located within the projection of the first opening 500a in the thickness direction Z, and the light-emitting portion 310 and at least a portion of the first electrode 410 may be located within the pixel opening 220.

[0097] Optionally, the display panel 10 may further include a second insulating layer 160 disposed on a side of the substrate 100 facing the first conductive portion 710 and the second conductive portion 720 .

[0098] Optionally, the dummy light emitting portion 751 and the connecting electrode 740 may be directly disposed on the side of the second insulating layer 160 away from the substrate. Optionally, an insulating opening 163 may be further disposed on the second insulating layer 160 to accommodate the dummy light emitting portion 751 and at least part of the connecting electrode 740 to reduce the thickness of the display panel 10.

[0099] Optionally, the second insulating layer may be provided at the same layer and with the same material as the pixel definition layer.

[0100] In the embodiments of the present application, the number and type of the first test terminals and the second test terminals are various. In some optional embodiments, the number of the first test terminals is more than two, and the number of the second test terminals is more than two. Optionally, the number of the first test terminals is the same as the number of the second test terminals.

[0101] In these optional embodiments, by setting a plurality of first test terminals and second test terminals, the first test terminals and the second test terminals can be used to measure multiple values ​​between the first conductive part 710, the second conductive part 720 and the connecting electrode 740. For example, they can be used to measure the current value and the voltage value between the first conductive part 710, the second conductive part 720 and the connecting electrode 740 to obtain the lap resistance between the first conductive part 710 and the connecting electrode 740 and the lap resistance between the second conductive part 720 and the connecting electrode 740.

[0102] In some optional embodiments, one of the two or more first test terminals is a current terminal and the other is a voltage test terminal, and one of the two or more second test terminals is a current terminal and the other is a voltage test terminal.

[0103] In these optional embodiments, at least part of the first test terminals and at least part of the second test terminals are set as current terminals, so that part of the first test terminals and part of the second test terminals can provide current to the first conductive part 710, the connecting electrode 740 and the second conductive part 720, and the value of the current can be a preset current value, so as to form an electric circuit with a preset current value between the first conductive part 710, the connecting electrode 740 and the second conductive part 720. Specifically, the current terminal can be used as an interface for connecting to an external power source, that is, the external power source can be connected to the current terminal, so as to generate an electric circuit with a preset current value between the first conductive part 710, the connecting electrode 740 and the second conductive part 720 through the current terminal.

[0104] By using at least part of the first test terminal and at least part of the second test terminal as voltage test terminals, part of the first test terminal and part of the second test terminal can be used to measure the voltage between the first conductive part 710, the connecting electrode 740 and the second conductive part 720. Specifically, the voltage test terminal can be used as an interface connected to a voltage measuring device, that is, the voltage measuring device can be connected to the voltage test terminal to test the voltage value of the electrical circuit composed of the first conductive part 710, the connecting electrode 740 and the second conductive part 720.

[0105] Therefore, after knowing that the current between the first conductive part 710, the connecting electrode 740 and the second conductive part 720 is a preset current value and knowing the voltage between the first conductive part 710, the connecting electrode 740 and the second conductive part 720, the sum of the overlapping resistance between the first conductive part 710 and the connecting electrode 740 and the overlapping resistance between the second conductive part 720 and the connecting electrode 740 can be obtained, that is, if the overlapping resistance between the first conductive part 710 and the connecting electrode 740 is the first resistance and the overlapping resistance between the second conductive part 720 and the connecting electrode 740 is the second resistance, by setting the first test terminal and the second test terminal, the sum of the first resistance and the second resistance can be obtained.

[0106] Optionally, in a test element 700, the sum of the overlap area between the first conductive portion 710 and the connection electrode 740 and the overlap area between the second conductive portion 720 and the connection electrode 740 may be the first area. Optionally, in a first opening 500a, the overlap area between the first isolation portion 510 and the first electrode 410 is the second area. By obtaining the sum of the first resistance and the second resistance, and according to the size relationship between the first area and the second area, the overlap resistance between the first isolation portion 510 and the first electrode 410 can be obtained more accurately.

[0107] In these optional embodiments, there are many ways to set the size relationship between the first area and the second area. Optionally, the first area can be set equal to the second area, that is, the sum of the overlapping areas of the connecting electrode 740 and the first conductive part 710 and the second conductive part 720 in a test element 700 can be equal to the overlapping area between the first isolation part 510 and the first electrode 410 in a first opening 500a, so that the overlapping resistance between the first isolation part 510 and the first electrode 410 is equal to the sum of the first resistance and the second resistance.

[0108] Optionally, the first area may be set to be twice the second area, so that the sum of the first resistance and the second resistance is twice the lap resistance between the first isolation portion 510 and the first electrode 410 .

[0109] In the embodiment of the present application, there are many ways to set the shapes of the first conductive part 710 and the second conductive part 720. Optionally, the shapes of the first conductive part 710 and the second conductive part 720 can be set according to the shape of the first opening 500a to improve the simulation effect of the overlapping relationship between the first conductive part 710 and the second conductive part 720 and the connecting electrode 740 on the overlapping relationship between the first electrode 410 and the first isolation part 510.

[0110] like Figure 3 As shown, in some optional embodiments, the second conductive part 720 is arranged around at least a portion of the first conductive part 710, so that the test space 730 formed by the first conductive part 710 and the second conductive part 720 can be annular or an unclosed annular, similar to the annular shape of the first isolation part 510 that encloses the first opening 500a.

[0111] Optionally, the connecting electrode 740 is arranged around at least a portion of the first conductive part 710, so that the shape of the overlapping area between the connecting electrode 740 and the first conductive part 710 and the second conductive part 720 can be more similar to the shape of the overlapping area between the first electrode 410 and the first isolation part 510, so as to enhance the simulation effect of the overlapping relationship between the first conductive part 710, the second conductive part 720 and the connecting electrode 740 on the overlapping relationship between the first electrode 410 and the first isolation part 510.

[0112] Optionally, the second conductive part 720 is arranged in a closed ring shape around the first conductive part 710, and the connecting electrode 740 is arranged in a closed ring shape around the first conductive part 710. Since the overlapping area between the first electrode 410 and the first isolation part 510 is often in a ring shape, the second conductive part 720 is arranged in a closed ring shape around the first conductive part 710, and the connecting electrode 740 is arranged in a closed ring shape around the first conductive part 710, so that the overlapping area between the connecting electrode 740 and the first conductive part 710 and the second conductive part 720 can be in a ring shape, so as to improve the simulation effect of the overlapping relationship between the first conductive part 710, the second conductive part 720 and the connecting electrode 740 on the overlapping relationship between the first electrode 410 and the first isolation part 510.

[0113] Optionally, the first conductive portion 710 has a first contour line 711 on the side facing the test space 730, and a shape enclosed by the first contour line 711 is the same as a projection shape of the first opening 500a in the thickness direction Z, and / or the second conductive portion 720 has a second contour line 721 on the side facing the test space 730, and a shape enclosed by the second contour line 721 is the same as a projection shape of the first opening 500a in the thickness direction Z.

[0114] In these optional embodiments, the shape formed by the first contour line 711 is set to be the same as the projection shape of the first opening 500a in the thickness direction Z, so that the shape of the overlapping area between the first conductive part 710 and the connecting electrode 740 can be similar to the overlapping shape between the first isolation part 510 and the first electrode 410, so as to improve the simulation effect of the overlapping relationship between the first conductive part 710 and the connecting electrode 740 on the overlapping relationship between the first electrode 410 and the first isolation part 510. The shape formed by the second contour line 721 is set to be the same as the projection shape of the first opening 500a in the thickness direction Z, so that the shape of the overlapping area between the second conductive part 720 and the connecting electrode 740 can be similar to the overlapping shape between the first isolation part 510 and the first electrode 410, so as to improve the simulation effect of the overlapping relationship between the second conductive part 720 and the connecting electrode 740 on the overlapping relationship between the first electrode 410 and the first isolation part 510.

[0115] Optionally, the first opening 500a has a first perimeter, the length of the first contour line 711 is greater than or equal to 0.5 times the first perimeter, and the length of the first contour line 711 is less than or equal to 1 times the first perimeter, and / or the sum of the lengths of the first contour line 711 and the second contour line 721 is greater than or equal to 2 times the first perimeter, and the sum of the lengths of the first contour line 711 and the second contour line 721 is less than or equal to 3 times the first perimeter.

[0116] By reasonably setting the relationship between the length of the first contour line 711 and the length of the second contour line 721 and the first perimeter of the first opening 500a, the first area can be preferably set to be greater than or equal to twice the second area, so that the sum of the first resistance and the second resistance is greater than or equal to twice the overlap resistance between the first isolation portion 510 and the first electrode 410. When the measured sum of the first resistance and the second resistance is smaller, it can better represent that the overlap resistance between the first isolation portion 510 and the first electrode 410 is smaller. When the measured sum of the first resistance and the second resistance happens to be a bad overlap resistance value, the actual overlap resistance between the first isolation portion 510 and the first electrode 410 may also be smaller than the bad overlap resistance. This allows the operator to determine the accurate overlap resistance through further testing, thereby improving the manufacturing yield of the display panel.

[0117] In these optional embodiments, the projection shape of the first opening 500a in the thickness direction Z has various shapes. Optionally, the projection shape of the first opening 500a in the thickness direction Z may be a polygon such as a triangle or a quadrilateral, or a shape with curved edges such as an arc edge. Optionally, the projection shape of the first opening 500a in the thickness direction Z may be a symmetrical shape or an asymmetrical shape.

[0118] Figure 4 Another embodiment of the present application provides Figure 1 A partial enlarged cross-sectional view at point I in the middle.

[0119] like Figure 4 As shown, in some optional embodiments, the display panel 10 also includes a circuit layer located on one side of the substrate 100, the circuit layer includes a first conductive layer 110, the test element 700 also includes a first connecting portion 111 arranged on the first conductive layer 110, the first connecting portion 111 is connected to the first conductive portion 710 through a via, and the first test terminal is connected to the first conductive portion 710 through the first connecting portion 111, and / or, the circuit layer also includes a second conductive layer 120, the test element 700 also includes a second connecting portion 121 arranged on the second conductive layer 120, the second connecting portion 121 is connected to the second conductive portion 720 through a via, and the second test terminal is connected to the second conductive portion 720 through the second connecting portion 121.

[0120] In these optional embodiments, the first connecting portion 111 is connected to the first conductive portion 710 through a via hole, and the first test terminal is connected to the first conductive portion 710 through the first connecting portion 111, so that the wiring structure for connecting the first test terminal and the first conductive portion 710 can have a certain extension length in the thickness direction Z, so that the wiring structure can more fully utilize the space of the substrate 100 in the thickness direction Z, so as to better distribute the wiring area in different layer structures of the substrate 100, so as to reduce the wiring area on the layer structure where the first conductive portion 710 is located when the first test terminal is connected to the first conductive portion 710, thereby improving the space utilization rate of the display panel 10. Similarly, by providing a second connecting portion 121 connected to the second conductive portion 720 through a via, and the second test terminal being connected to the second conductive portion 720 through the second connecting portion 121, the wiring structure used to connect the second test terminal and the second conductive portion 720 can have a certain extension length in the thickness direction Z, so that the wiring structure can more fully utilize the space of the substrate 100 in the thickness direction Z, so as to better distribute the wiring area in different layer structures of the substrate 100, so as to reduce the wiring area on the layer structure where the first conductive portion 710 is located when the second test terminal is connected to the second conductive portion 720, thereby improving the space utilization rate of the display panel 10.

[0121] In some optional embodiments, a projection of the first connecting portion 111 in the thickness direction Z at least partially overlaps a projection of the first conductive portion 710 in the thickness direction Z to facilitate via connection between the first connecting portion 111 and the first conductive portion 710 .

[0122] In some optional embodiments, a projection of the second connecting portion 121 in the thickness direction Z at least partially overlaps a projection of the second conductive portion 720 in the thickness direction Z to facilitate via connection between the second connecting portion 121 and the second conductive portion 720 .

[0123] like Figure 4 As shown, optionally, the substrate 100 also includes a transistor 140, and the transistor 140 may include a source 141, a drain 142 and a gate 143. The circuit layer may also include a third conductive layer located on the side of the first conductive layer 110 and the second conductive layer 120 away from the first electrode layer 400. The gate 143 may be arranged in the third conductive layer, and the setting positions of the source 141 and the drain 142 may be set according to the relative position relationship between the first conductive layer 110 and the second conductive layer 120.

[0124] Optionally, the display panel 10 further includes a second electrode 600 disposed on the side of the first electrode 410 facing the substrate 100. The number of the second electrode 600 may be multiple, and the multiple second electrodes 600 may be disposed corresponding to each first opening 500a. For example, each second electrode 600 is located on the side of the light-emitting portion 310 facing the substrate 100 in each first opening 500a. Optionally, the second electrode 600 and the first electrode 410 interact to drive the light-emitting functional layer 300 to emit light. One of the first electrode 410 and the second electrode 600 is an anode, and the other is a cathode. The embodiment of the present application is described by taking the second electrode 600 as an anode and the first electrode 410 as a cathode.

[0125] like Figure 4 As shown, there are multiple ways to set the relative position relationship between the first conductive layer 110 and the second conductive layer 120. In some embodiments, the second conductive layer 120 may be located on the side of the first conductive layer 110 away from the first electrode layer 400. Optionally, the source electrode 141 and / or the drain electrode 142 may be disposed in the second conductive layer 120, and the first conductive layer 110 is located between the second electrode 600 and the second conductive layer 120. Optionally, the source electrode 141 and / or the drain electrode 142 may be disposed in the same layer and the same material as the second connecting portion 121, so as to facilitate the processing and manufacturing of the display panel 10.

[0126] Figure 5 Another embodiment of the present application provides Figure 1 A partial enlarged cross-sectional view at point I in the middle.

[0127] like Figure 5 As shown, in other embodiments, the first conductive layer 110 may be located on the side of the second conductive layer 120 away from the first electrode layer. Optionally, the source electrode 141 and / or the drain electrode 142 may be disposed on the first conductive layer 110, and the second conductive layer 120 is located between the second electrode 600 and the first conductive layer 110. Optionally, the source electrode 141 and / or the drain electrode 142 may be disposed in the same layer and the same material as the first connecting portion 111, so as to facilitate the processing and manufacturing of the display panel 10.

[0128] In other embodiments, the second conductive layer 120 may not be located between the second electrode 600 and the first conductive layer 110. Optionally, the second electrode 600 may be arranged in the second conductive layer 120, so that the second electrode 600 can be arranged in the same layer and material as the second connecting portion 121 to facilitate the processing and manufacturing of the display panel 10.

[0129] For ease of description, the following embodiments are described by taking the example that the first conductive layer 110 is located on the side of the second conductive layer 120 away from the first electrode layer, and the second conductive layer 120 is located between the second electrode 600 and the first conductive layer 110 .

[0130] Figure 6Another embodiment of the present application provides Figure 1 A partial enlarged cross-sectional view at point I in the middle.

[0131] like Figure 6 As shown, in this embodiment, the substrate 100 includes a first conductive layer 110 and a second conductive layer 120, the first conductive layer 110 is located on the side of the second conductive layer 120 away from the first electrode layer 400 in the thickness direction Z, the test element 700 includes a first connecting portion 111, a second connecting portion 121 and a third connecting portion 122 arranged on the second conductive layer 120, the third connecting portion 122 is spaced apart from the second connecting portion 121 and is connected to the first conductive portion 710 via a hole, and the first connecting portion 111 is connected to the third connecting portion 122 via a hole.

[0132] By providing the third connection part between the first connection part 111 and the first conductive part 710, and the first connection part 111 is connected to the first conductive part 710 through the third connection part 122, the resistance between the first connection part 111 and the first conductive part 710 is reduced. It is also convenient to connect the first connection part 111 to the first conductive part 710. By providing the third connection part 122 and the second connection part 121 at intervals, the third connection part 122 is not likely to be short-circuited with the second connection part 121, thereby improving the test accuracy of the test element 700.

[0133] Optionally, the first test terminal may be disposed on the first conductive layer 110 to facilitate the connection between the first test terminal and the first connecting portion 111 .

[0134] Optionally, the second test terminal may be disposed on the second conductive layer 120 to facilitate the connection between the second test terminal and the second connecting portion 121 .

[0135] Optionally, the third connecting portion 122 may be provided in the same layer and with the same material as the second connecting portion 121 , so as to facilitate the processing and manufacturing of the display panel 10 .

[0136] In some optional embodiments, a projection of the third connecting portion 122 in the thickness direction Z at least partially overlaps a projection of the first conductive portion 710 in the thickness direction Z, so as to facilitate via connection between the third connecting portion 122 and the first conductive portion 710 .

[0137] Optionally, a projection of the third connecting portion 122 in the thickness direction Z at least partially overlaps with a projection of the first connecting portion 111 in the thickness direction Z, so that the third connecting portion 122 is connected to the via hole of the first connecting portion 111 .

[0138] like Figure 6As shown, in these optional embodiments, a first insulating layer 150 is arranged between the first conductive layer 110 and the second conductive layer 120, and a first via hole 151 is arranged on the first insulating layer 150 and penetrates in the thickness direction Z, so that the first connecting part 111 can be connected to the third connecting part 122 through the via hole.

[0139] Optionally, at least part of the third connecting portion 122 may be located in the first via hole 151 , that is, when preparing the third connecting portion 122 , part of the material of the third connecting portion 122 may flow into the first via hole 151 to achieve a via hole connection between the first connecting portion 111 and the third connecting portion 122 .

[0140] Optionally, a projection of the first via hole 151 in the thickness direction Z is located within a projection of the first connecting portion 111 and the third connecting portion 122 in the thickness direction Z.

[0141] In these optional embodiments, a second insulating layer 160 is arranged between the second conductive layer 120 and the first conductive part 710 and the second conductive part 720, and a second via 161 and a third via 162 are arranged on the second insulating layer 160 and penetrate the second conductive part 720 in the thickness direction Z, so that the second connecting part 121 can be connected to the second conductive part 720 through the second via 161, and the third connecting part 122 can be connected to the first conductive part 710 through the third via 162.

[0142] Optionally, at least part of the second conductive part 720 may be located in the second via hole 161 , that is, when preparing the second conductive part 720 , part of the material of the second conductive part 720 may flow into the second via hole 161 to achieve a via hole connection between the second connecting part 121 and the second conductive part 720 .

[0143] Optionally, the projection of the second via hole 161 in the thickness direction Z is located within the projection of the second connecting portion 121 and the second conductive portion 720 in the thickness direction Z.

[0144] Optionally, at least part of the first conductive part 710 may be located in the third via hole 162 , that is, when preparing the first conductive part 710 , part of the material of the first conductive part 710 may flow into the third via hole 162 to achieve a via hole connection between the third connecting part 122 and the first conductive part 710 .

[0145] Optionally, a projection of the third via hole 162 in the thickness direction Z is located within a projection of the third connecting portion 122 and the first conductive portion 710 in the thickness direction Z.

[0146] Figure 7 It is a schematic diagram of the local structure of the first conductive layer 110 provided in an embodiment of the present application.

[0147] like Figure 7As shown, the first test terminal may include a first current terminal 700a and a first voltage test terminal 700b connected to the first connecting portion 111. The first current terminal 700a is used to be connected to an external power source so as to generate an electric circuit with a preset current value between the first conductive portion 710, the second conductive portion 720 and the connecting electrode 740. The first voltage test terminal 700b is used to be connected to a voltage meter so as to measure the voltage between the first conductive portion 710, the connecting electrode 740 and the second conductive portion 720.

[0148] Figure 8 It is a schematic diagram of the partial structure of the second conductive layer 120 provided in an embodiment of the present application.

[0149] like Figure 8 As shown, the second test terminal may include a second current terminal 700c and a second voltage test terminal 700d connected to the second connecting portion 121. The second current terminal 700c is used to be connected to an external power source so as to generate an electric circuit with a preset current value between the first conductive portion 710, the connecting electrode 740 and the second conductive portion 720. The second voltage test terminal 700d is used to be connected to a voltage meter so as to measure the voltage between the first conductive portion 710, the connecting electrode 740 and the second conductive portion 720.

[0150] Optionally, after being connected to an external power supply, the first current terminal 700a connected to the first connecting part 111 and the second current terminal 700c connected to the second connecting part 121 can generate an electrical circuit with a preset current value between the first connecting part 111, the third connecting part 122, the first conductive part 710, the connecting electrode 740, the second conductive part 720 and the second connecting part 121.

[0151] Optionally, after the first voltage test terminal 700b connected to the first connecting part 111 and the second voltage test terminal 700d connected to the second connecting part 121 are connected to a voltage tester, the voltage tester can measure the voltage value of the electrical circuit composed of the first connecting part 111, the third connecting part 122, the first conductive part 710, the connecting electrode 740, the second conductive part 720 and the second connecting part 121.

[0152] Since the self-resistance of the first connecting part 111, the third connecting part 122, the first conductive part 710, the connecting electrode 740, the second conductive part 720 and the second connecting part 121 can be ignored, by presetting the current value and the measured voltage value, the sum of the overlapping resistance between the first conductive part 710 and the connecting electrode 740 and the overlapping resistance between the second conductive part 720 and the connecting electrode 740 can be obtained, that is, the sum of the first resistance and the second resistance can be obtained.

[0153] like Figure 8As shown, in some optional embodiments, the second connecting portion 121 is arranged around at least a portion of the third connecting portion 122, so that the second connecting portion 121 can have a larger size to reduce the resistance when the second test terminal is connected to the second conductive portion 720 through the second connecting portion 121, thereby reducing the influence of the second connecting portion 121's own resistance on the test result.

[0154] Optionally, the second connecting portion 121 is arranged in a closed ring shape around the third connecting portion 122 to further enable the second connecting portion 121 to have a larger size, so as to reduce the resistance when the second test terminal is connected to the second conductive portion 720 through the second connecting portion 121 .

[0155] Fig. 9 is a schematic diagram of a partial structure of the first insulating layer 150 provided in an embodiment of the present application, Fig.10 It is a schematic diagram of the partial structure of the second insulating layer 160 provided in an embodiment of the present application.

[0156] like Fig. 9 and Fig.10 As shown, the present application does not limit the number of the first via hole 151, the second via hole 161, and the third via hole 162. Optionally, the number of the first via hole 151 may be one. Optionally, the number of the second via hole 161 and the third via hole 162 may be multiple.

[0157] In these optional embodiments, the third via hole 162 may be disposed around at least a portion of the first via hole 151 , and the second via hole 161 may be disposed around at least a portion of the third via hole 162 , so as to improve space utilization of the display panel 10 .

[0158] The embodiment of the second aspect of the present application further provides a display device, comprising the display panel 10 of any of the above-mentioned first aspect embodiments. Since the display device provided by the embodiment of the second aspect of the present application comprises the display panel 10 of any of the above-mentioned first aspect embodiments, the display device provided by the embodiment of the second aspect of the present application has the beneficial effects of the display panel 10 of any of the above-mentioned first aspect embodiments, which will not be described in detail here.

[0159] The display device in the embodiments of the present application includes but is not limited to mobile phones, personal digital assistants (PDAs), tablet computers, e-books, televisions, access control systems, smart landline phones, consoles, and other devices with display functions.

[0160] Fig.11 It is a partial cross-sectional view of a test element 700 provided in an embodiment of the present application.

[0161] like Fig.11As shown, the embodiment of the third aspect of the present application further provides a test element 700, the test element 700 includes a first conductive part 710, a second conductive part 720, a connecting electrode 740, a first test terminal and a second test terminal. The connecting electrode 740 is arranged in a test space 730 enclosed by the first conductive part 710 and the second conductive part 720, and the connecting electrode 740 overlaps the first conductive part 710 and the second conductive part 720; the first test terminal is connected to the first conductive part 710; the second test terminal is connected to the second conductive part 720, wherein the first conductive part 710 and the second conductive part 720 are arranged in the same layer and the same material.

[0162] In this embodiment, the test element 700 provided in the embodiment of the third aspect of the present application may be the test element 700 in the display panel 10 provided in any of the embodiments of the first aspect. Optionally, the test element 700 provided in the embodiment of the third aspect of the present application may be the test element 700 obtained by cutting the display panel 10 provided in any of the embodiments of the first aspect, that is, the test element 700 provided in the embodiment of the present application can be used to test the lap resistance between the first isolation portion 510 of the isolation structure 500 and the first electrode 410 in the display panel 10. Therefore, the test element 700 provided in the embodiment of the third aspect of the present application can have the beneficial effects of the test element 700 in the display panel 10 in any of the embodiments of the first aspect, which will not be repeated here.

[0163] Optionally, a third conductive part 760 may be provided on the side facing away from the first conductive part 710, and the projection of the first conductive part 710 in the thickness direction Z may be located within the projection of the third conductive part 760 in the thickness direction Z. Optionally, a fourth conductive part 770 may also be provided on one side of the second conductive part 720, and the projection of the second conductive part 720 in the thickness direction Z may be located within the projection of the fourth conductive part 770 in the thickness direction Z.

[0164] In the embodiment of the present application, there are many ways to set the shapes of the first conductive part 710 and the second conductive part 720. In some optional embodiments, the second conductive part 720 is arranged around at least a portion of the first conductive part 710, so that the test space 730 enclosed by the first conductive part 710 and the second conductive part 720 can be annular or unclosed, similar to the annular shape of the first isolation part 510 enclosing the first opening 500a.

[0165] Optionally, the connecting electrode 740 is arranged around at least a portion of the first conductive part 710, so that the shape of the overlapping area between the connecting electrode 740 and the first conductive part 710 and the second conductive part 720 can be more similar to the shape of the overlapping area between the first electrode 410 and the first isolation part 510, so as to enhance the simulation effect of the overlapping relationship between the first conductive part 710, the second conductive part 720 and the connecting electrode 740 on the overlapping relationship between the first electrode 410 and the first isolation part 510.

[0166] Optionally, the second conductive part 720 is arranged in a closed ring shape around the first conductive part 710, and the connecting electrode 740 is arranged in a closed ring shape around the first conductive part 710. Since the overlapping area between the first electrode 410 and the first isolation part 510 is often in a ring shape, the second conductive part 720 is arranged in a closed ring shape around the first conductive part 710, and the connecting electrode 740 is arranged in a closed ring shape around the first conductive part 710, so that the overlapping area between the connecting electrode 740 and the first conductive part 710 and the second conductive part 720 can be in a ring shape, so as to improve the simulation effect of the overlapping relationship between the first conductive part 710, the second conductive part 720 and the connecting electrode 740 on the overlapping relationship between the first electrode 410 and the first isolation part 510.

[0167] Optionally, a dummy light-emitting functional layer 750 is provided on one side of the connecting electrode 740 facing the substrate 100 in the thickness direction Z.

[0168] Optionally, the display panel 10 may further include a second insulating layer 160 disposed on a side of the substrate 100 facing the first conductive portion 710 and the second conductive portion 720 , and an insulating opening 163 is disposed on the second insulating layer 160 to accommodate the dummy light emitting portion 751 and at least part of the connecting electrode 740 .

[0169] In some optional embodiments, the test element 700 also includes a first connecting portion 111 located on one side of the first conductive portion 710 in the thickness direction Z, the first connecting portion 111 is connected to the first conductive portion 710 through a via hole, and the first test terminal is connected to the first conductive portion 710 through the first connecting portion 111, and / or, the test element 700 also includes a second connecting portion 121 located on one side of the second conductive portion 720 in the thickness direction Z, the second connecting portion 121 is connected to the second conductive portion 720 through a via hole, and the second test terminal is connected to the second conductive portion 720 through the second connecting portion 121.

[0170] In these optional embodiments, the first connecting portion 111 is connected to the first conductive portion 710 through a via hole, and the first test terminal is connected to the first conductive portion 710 through the first connecting portion 111, so that the wiring structure for connecting the first test terminal and the first conductive portion 710 can have a certain extension length in the thickness direction Z, so that the wiring structure can more fully utilize the space in the thickness direction Z, so as to better distribute the wiring area in different layer structures, so as to reduce the wiring area on the layer structure where the first conductive portion 710 is located when the first test terminal is connected to the first conductive portion 710, thereby improving the space utilization rate of the test element 700. Similarly, by providing a second connecting portion 121 connected to the second conductive portion 720 through a via, and the second test terminal being connected to the second conductive portion 720 through the second connecting portion 121, the wiring structure used to connect the second test terminal and the second conductive portion 720 can have a certain extension length in the thickness direction Z, so that the wiring structure can more fully utilize the space in the thickness direction Z, so as to better distribute the wiring area in different layer structures, so as to reduce the wiring area on the layer structure where the first conductive portion 710 is located when the second test terminal is connected to the second conductive portion 720, thereby improving the space utilization rate of the test element 700.

[0171] In some optional embodiments, a projection of the first connecting portion 111 in the thickness direction Z at least partially overlaps a projection of the first conductive portion 710 in the thickness direction Z to facilitate via connection between the first connecting portion 111 and the first conductive portion 710 .

[0172] In some optional embodiments, a projection of the second connecting portion 121 in the thickness direction Z at least partially overlaps a projection of the second conductive portion 720 in the thickness direction Z to facilitate via connection between the second connecting portion 121 and the second conductive portion 720 .

[0173] In some optional embodiments, the test element 700 includes a first connecting part 111, a second connecting part 121 and a third connecting part 122. The third connecting part 122 and the second connecting part 121 are made of the same layer and material and are spaced apart. The third connecting part 122 is connected to the first conductive part 710 via a hole. The first connecting part 111 is located on a side of the third connecting part 122 that is away from the first conductive part 710 in the thickness direction Z. The first connecting part 111 is connected to the third connecting part 122 via a hole.

[0174] By providing the third connection part between the first connection part 111 and the first conductive part 710, and the first connection part 111 is connected to the first conductive part 710 through the third connection part 122, the resistance between the first connection part 111 and the first conductive part 710 is reduced. It is also convenient to connect the first connection part 111 to the first conductive part 710. By providing the third connection part 122 and the second connection part 121 at intervals, the third connection part 122 is not likely to be short-circuited with the second connection part 121, thereby improving the test accuracy of the test element 700.

[0175] In some optional embodiments, the second connecting portion 121 is arranged around at least a portion of the third connecting portion 122, so that the second connecting portion 121 can have a larger size to reduce the resistance when the second test terminal is connected to the second conductive portion 720 through the second connecting portion 121, thereby reducing the influence of the resistance of the second connecting portion 121 itself on the test results.

[0176] In some optional embodiments, the second connecting portion 121 is arranged in a closed ring around the third connecting portion 122 to further enable the second connecting portion 121 to have a larger size to reduce the resistance when the second test terminal is connected to the second conductive portion 720 through the second connecting portion 121 .

[0177] In some optional embodiments, a projection of the third connecting portion 122 in the thickness direction Z at least partially overlaps a projection of the first conductive portion 710 in the thickness direction Z, so as to facilitate via connection between the third connecting portion 122 and the first connecting portion 111 .

[0178] According to the embodiments of the present application as above, these embodiments do not describe all the details in detail, nor do they limit the invention to specific embodiments. Obviously, many modifications and changes can be made based on the above description. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present application, so that those skilled in the art can make good use of the present application and the modifications based on the present application. The present application is only limited by the claims and their full scope and equivalents.

Claims

1. A display panel, It is characterized in that include: substrate; An isolation structure, disposed on one side of the substrate in a thickness direction, the isolation structure comprising a first isolation portion; A first electrode layer, comprising a first electrode, wherein the first electrode overlaps the first isolation portion; A test element includes a first conductive part, a second conductive part, a connecting electrode, a first test terminal and a second test terminal. The first conductive part and the second conductive part are arranged at an interval, and a test space is formed between the first conductive part and the second conductive part. The connecting electrode is arranged in the test space and overlaps the first conductive part and the second conductive part. The first test terminal is connected to the first conductive part, and the second test terminal is connected to the second conductive part.

2. The display panel according to claim 1, It is characterized in that The first conductive portion and the second conductive portion are both provided in the same layer and material as the first isolation portion, and the connecting electrode is provided in the same layer and material as the first electrode; Preferably, the isolation structure further comprises a second isolation portion provided on a side of the first isolation portion away from the substrate, and a projection of the first isolation portion in the thickness direction is located within a projection of the second isolation portion in the thickness direction; Preferably, a third conductive portion is provided on a side of the first conductive portion facing away from the substrate, and a projection of the first conductive portion in the thickness direction is located within a projection of the third conductive portion in the thickness direction; Preferably, the third conductive portion and the second isolation portion are provided in the same layer and with the same material; Preferably, a fourth conductive portion is provided on a side of the second conductive portion facing away from the substrate, and a projection of the second conductive portion in the thickness direction is located within a projection of the fourth conductive portion in the thickness direction; Preferably, the fourth conductive portion and the second isolation portion are provided in the same layer and with the same material.

3. The display panel according to claim 1, It is characterized in that The second conductive portion is disposed around at least a portion of the first conductive portion; Preferably, the connecting electrode is arranged around at least a portion of the first conductive portion; Preferably, the second conductive part is arranged around the first conductive part in a closed ring shape, and the connecting electrode is arranged around the first conductive part in a closed ring shape; Preferably, the first isolation portion encloses a first opening, and the first electrode is disposed in the first opening; Preferably, the first conductive portion has a first contour line on a side facing the test space, and a shape enclosed by the first contour line is the same as a projection shape of the first opening in the thickness direction, and / or the second conductive portion has a second contour line on a side facing the test space, and a shape enclosed by the second contour line is the same as a projection shape of the first opening in the thickness direction; Preferably, the first opening has a first perimeter, the length of the first contour line is greater than or equal to 0.5 times the first perimeter, and the length of the first contour line is less than or equal to 1 times the first perimeter, and / or the sum of the lengths of the first contour line and the second contour line is greater than or equal to 2 times the first perimeter, and the sum of the lengths of the first contour line and the second contour line is less than or equal to 3 times the first perimeter; Preferably, the sum of the overlapping area between the first conductive part and the connecting electrode and the overlapping area between the second conductive part and the connecting electrode is a first area, and within one of the first openings, the overlapping area between the first isolating part and the first electrode is a second area, and the first area is equal to the second area, or the first area is twice the second area.

4. The display panel according to claim 1, wherein the display panel further comprises a circuit layer located on one side of the substrate, the circuit layer comprises a first conductive layer, the test element further comprises a first connecting portion disposed on the first conductive layer, the first connecting portion is connected to the first conductive portion via a via hole, and the first test terminal is connected to the first conductive portion through the first connecting portion. And / or, the circuit layer further includes a second conductive layer, the test element further includes a second connecting portion provided on the second conductive layer, the second connecting portion is connected to the second conductive portion via a via hole, and the second test terminal is connected to the second conductive portion through the second connecting portion; Preferably, a projection of the first connecting portion in the thickness direction at least partially overlaps with a projection of the first conductive portion in the thickness direction; Preferably, a projection of the second connecting portion in the thickness direction at least partially overlaps with a projection of the second conductive portion in the thickness direction; Preferably, the circuit layer further includes a source electrode and / or a drain electrode, and the display panel further includes a second electrode arranged on a side of the first electrode facing the substrate. The source and / or the drain are arranged in the first conductive layer, and the second conductive layer is located between the second electrode and the first conductive layer, or the source and / or the drain are arranged in the second conductive layer, and the first conductive layer is located between the second electrode and the second conductive layer.

5. The display panel according to claim 4, wherein the first conductive layer is located on a side of the second conductive layer away from the first electrode layer in the thickness direction. The test element comprises the first connecting portion, the second connecting portion and a third connecting portion provided on the second conductive layer, the third connecting portion is spaced apart from the second connecting portion and connected to the first conductive portion via hole, and the first connecting portion is connected to the third connecting portion via hole; Preferably, the second connecting portion is arranged around at least a portion of the third connecting portion; Preferably, the second connecting portion is arranged in a closed ring around the third connecting portion; Preferably, a projection of the third connecting portion in the thickness direction at least partially overlaps with a projection of the first conductive portion in the thickness direction.

6. The display panel according to any one of claims 1 to 5, It is characterized in that A light-emitting functional layer is provided on a side of the first electrode layer facing the substrate in the thickness direction, a virtual light-emitting functional layer is provided on a side of the connecting electrode facing the substrate in the thickness direction, and the light-emitting functional layer and the virtual light-emitting functional layer are provided in the same layer and with the same material; Preferably, the light-emitting functional layer includes a plurality of light-emitting parts arranged on the side of the first electrode facing the substrate, the number of the test elements is multiple, the virtual light-emitting functional layer includes a plurality of virtual light-emitting parts arranged in the test space, and the light-emitting color of at least some of the virtual light-emitting parts is the same as the light-emitting color of at least some of the light-emitting parts; Preferably, in a direction away from the substrate, the cross-sectional area of ​​the first isolation portion gradually decreases; Preferably, in a direction away from the substrate, a cross-sectional area of ​​the first conductive portion and / or the second conductive portion gradually decreases.

7. The display panel according to any one of claims 1 to 5, It is characterized in that The number of the first test terminals is two or more, and the number of the second test terminals is two or more.

8. A display device, It is characterized in that Comprising the display panel as claimed in any one of claims 1 to 7.

9. A test element, It is characterized in that include: a first conductive portion; a second conductive portion; A connecting electrode is disposed in a test space formed between the first conductive part and the second conductive part, and the connecting electrode overlaps the first conductive part and the second conductive part; A first test terminal connected to the first conductive portion; a second test terminal connected to the second conductive portion; Wherein, the first conductive part and the second conductive part are provided in the same layer and the same material.

10. The test element according to claim 9, It is characterized in that A third conductive portion is disposed on one side of the first conductive portion, and a projection of the first conductive portion in the thickness direction is located within a projection of the third conductive portion in the thickness direction; And / or, a fourth conductive portion is disposed on one side of the second conductive portion, and a projection of the second conductive portion in the thickness direction is located within a projection of the fourth conductive portion in the thickness direction.

11. The test element according to claim 9, It is characterized in that The second conductive portion is disposed around at least a portion of the first conductive portion; Preferably, the connecting electrode is arranged around at least a portion of the first conductive portion; Preferably, the second conductive part is arranged around the first conductive part in a closed ring shape, and the connecting electrode is arranged around the first conductive part in a closed ring shape.

12. The test element according to claim 9, It is characterized in that The test element further includes a first connecting portion located on one side of the first conductive portion in the thickness direction, the first connecting portion is connected to the first conductive portion via hole, and the first test terminal is connected to the first conductive portion through the first connecting portion. And / or, the test element further includes a second connecting portion located at one side of the second conductive portion in the thickness direction, the second connecting portion is connected to the second conductive portion via hole, and the second test terminal is connected to the second conductive portion through the second connecting portion; Preferably, a projection of the first connecting portion in the thickness direction at least partially overlaps with a projection of the first conductive portion in the thickness direction; Preferably, a projection of the second connecting portion in the thickness direction at least partially overlaps with a projection of the second conductive portion in the thickness direction; Preferably, the test element comprises the first connecting portion, the second connecting portion and the third connecting portion, the third connecting portion and the second connecting portion are in the same layer and material and are arranged at intervals, the third connecting portion is connected to the first conductive portion via a hole, the first connecting portion is located on a side of the third connecting portion away from the first conductive portion in the thickness direction, and the first connecting portion is connected to the third connecting portion via a hole; Preferably, the second connecting portion is arranged around at least a portion of the third connecting portion; Preferably, the second connecting portion is arranged in a closed ring around the third connecting portion; Preferably, a projection of the third connecting portion in the thickness direction at least partially overlaps with a projection of the first conductive portion in the thickness direction.

Images