Server component testing method, device and equipment and nonvolatile storage medium
By building a historical server component test database and optimizing configuration parameters, the problem of extended server component performance testing cycle is solved, automated testing and configuration recommendations are realized, and labor and time costs are reduced.
Patent Information
- Application Number
- CN202411388186.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-30
- Publication Date
- 2025-01-03
AI Technical Summary
In the face of server components of various models and capacity, it is difficult for the prior art to efficiently conduct performance testing and bottleneck analysis, resulting in extended test cycles and increased time and labor costs.
By building a historical server component test database, query the historical test data of the components to be tested. If there is a test data, the result will be output directly. Otherwise, the configuration parameters will be optimized and the secondary test will be conducted until the component passes the performance test or the recommended configuration parameters.
It realizes automated testing of server components and performance bottleneck analysis, saves testers time and costs, and ensures timely meeting user needs.
Smart Images
Figure CN119248613A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of servers, and in particular to a server component testing method, device, equipment and non-volatile storage medium. Background Art
[0002] As the demand for business data processing in various industries increases, the requirements for server configuration, quantity and quality are also growing. A single model of server needs to adapt different server components to meet different performance requirements to meet the business scenarios of user testing, operation and maintenance, and implementation. Therefore, it is necessary to perform performance tests on server components of different types, models and capacities on the server model, and compare the actual performance values with the performance standard values in the input source to confirm whether they meet the standards.
[0003] Faced with numerous server models and various server components, each time a server user has a need to apply a certain server component to a certain server model, a corresponding performance test needs to be performed. If the performance test passes, the test cycle ends. If the test fails, the test engineer needs to analyze the cause, which greatly increases the time and labor costs and delays the test cycle.
[0004] How to improve the efficiency of server component performance testing and bottleneck analysis and shorten the testing cycle of server components is a technical problem that technical personnel in this field need to solve. Summary of the invention
[0005] The purpose of the present invention is to provide a server component testing method, device, equipment and non-volatile storage medium, which are used to improve the efficiency of server component performance testing and bottleneck analysis and shorten the test cycle of the server component.
[0006] In order to solve the above technical problems, the present invention provides a server component testing method, comprising: Build a historical server component test database; Receiving information of a server component to be tested that is required to be added to a target server model, and querying test data of the server component to be tested from the historical server component test database; If data that the server component to be tested has passed the performance test on the target server model is queried, the test result that the server component to be tested has passed the performance test is output; otherwise, the performance test of the server component to be tested under the current configuration environment of the target server model is performed; If the server component to be tested passes the performance test under the current configuration environment, then output the test result that the server component to be tested passes the performance test; otherwise, optimize the associated configuration parameters of the target server model corresponding to the server component to be tested, and perform the performance test of the server component to be tested under the optimized configuration environment of the target server model; If the server component to be tested passes the performance test under the optimized configuration environment, the test result indicating that the server component to be tested passes the performance test is output; otherwise, the recommended server configuration parameters corresponding to the server component to be tested are output.
[0007] On the one hand, build a historical server component test database, including: Collecting historical test data of one or more server components on the server model according to historical test data of at least one server model; If the historical test data shows that the server component has passed the test on the server model, the historical test data is stored in the historical server component test database; otherwise, it is not stored.
[0008] On the other hand, if the historical test data indicates that the server component has passed the test on the server model, storing the historical test data in the historical server component test database includes: If there are multiple historical test data of the server component that have passed the test on the server model, only the historical test data corresponding to the minimum server configuration of the server model is stored in the historical server component test database.
[0009] On the other hand, optimizing the associated configuration parameters of the server component to be tested in the corresponding target server model includes: Determining factors affecting the performance of the server component to be tested; If, under the current configuration environment of the target server model, the associated configuration parameter corresponding to the influencing factor has not reached an upper limit, determining that the associated configuration parameter is an adjustable configuration parameter; The adjustable configuration parameters are selected for optimization.
[0010] On the other hand, selecting the adjustable configuration parameters for optimization includes: All of the adjustable configuration parameters are optimized to the upper limit of the target server model.
[0011] On the other hand, outputting the recommended server configuration parameters corresponding to the server component to be tested includes: Based on the differences between the performance test result parameters of the server component to be tested under the current configuration environment of the target server model and the performance test result parameters of the server component to be tested under the optimized configuration environment of the target server model, as well as the historical test data of the server component to be tested, determine and output the recommended server configuration parameters corresponding to the server component to be tested.
[0012] On the other hand, optimizing the associated configuration parameters of the target server model corresponding to the server component to be tested includes: Determine an associated server component on the target server model that is associated with the server component to be tested, and determine configuration parameters of the associated server component as the associated configuration parameters; Checking current configuration parameters of the associated server component and corresponding configuration parameter ranges; If the current configuration parameter does not reach the upper limit of the corresponding configuration parameter range, determining that the current configuration parameter is an adjustable configuration parameter; Optimizing each of the adjustable configuration parameters to the upper limit of the corresponding configuration parameter range; outputting the recommended server configuration parameters corresponding to the server component to be tested, including: Querying the historical server component test database for target historical data associated with the server component to be tested that has passed the performance test; If the target historical data is found, then the optimized configuration parameter range of the associated configuration parameter is obtained from the target historical data; If the target historical data is not found, generating the optimized configuration parameter range according to the difference between the performance test result parameters of the server component to be tested under the current configuration environment of the target server model and the performance test result parameters of the server component to be tested under the optimized configuration environment of the target server model; The recommended server configuration parameters are outputted using the optimized configuration parameter range.
[0013] In order to solve the above technical problems, the present invention also provides a server component testing device, comprising: A database construction unit, used for constructing a history server component test database; A receiving unit, configured to receive information of a server component to be tested that is required to be added to a target server model, and query test data of the server component to be tested from the historical server component test database; A primary testing unit, used to perform a performance test on the server component to be tested under the current configuration environment of the target server model; an analysis and optimization unit, configured to optimize the associated configuration parameters of the target server model corresponding to the server component to be tested if the server component to be tested fails the performance test under the current configuration environment of the target server model; A secondary testing unit, used to perform a performance test on the server component to be tested in an optimized configuration environment of the target server model; a configuration recommendation unit, configured to determine a recommended server configuration parameter corresponding to the server component to be tested if the server component to be tested fails the performance test under the optimized configuration environment of the target server model; The output unit is used to output the test result of the server component to be tested passing the performance test when it is queried that the data of the server component to be tested passing the performance test on the target server model or the server component to be tested passes the performance test under the current configuration environment of the target server model, or the server component to be tested passes the performance test under the current configuration environment, or the server component to be tested passes the performance test under the optimized configuration environment; when the server component to be tested fails to pass the performance test under the optimized configuration environment, output the recommended server configuration parameters corresponding to the server component to be tested.
[0014] In order to solve the above technical problems, the present invention also provides a server component testing device, comprising: Memory for storing computer programs; The processor is used to execute the computer program, and when the computer program is executed by the processor, the steps of the server component testing method as described in any one of the above items are implemented.
[0015] In order to solve the above technical problems, the present invention also provides a non-volatile storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of the server component testing method as described in any one of the above items are implemented.
[0016] The server component testing method provided by the present invention has the beneficial effect of constructing a historical server component testing database, so that when it is necessary to test the server component to be tested that is added to the target server model, if the corresponding historical test data that has passed the test can be queried from the historical server component testing database, no further testing is required. If no historical test data that has passed the test is queried, it is necessary to test again, and when the performance test fails, the result of failing the performance test is not directly output, but the associated configuration parameters of the target server model corresponding to the server component to be tested are optimized and then a secondary test is performed. If the server component to be tested fails the secondary test, the recommended server configuration parameters corresponding to the server component to be tested are output again, so as to realize automated performance bottleneck analysis and configuration recommendation based on the automated testing of the server component, save the time of testers for repeated exploration, retesting, and analysis, reduce labor costs, and ensure timely satisfaction of user needs.
[0017] The server component testing device, equipment and non-volatile storage medium provided by the present invention have the above-mentioned beneficial effects, which will not be described in detail here. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] In order to more clearly illustrate the embodiments of the present invention or the technical solutions of the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0019] Figure 1 A flow chart of a server component testing method provided by an embodiment of the present invention; Figure 2 A flow chart of another server component testing method provided by an embodiment of the present invention; Figure 3 A flowchart of optimizing the association configuration of a hard disk provided by an embodiment of the present invention; Figure 4 A configuration recommendation flow chart for a hard disk provided by an embodiment of the present invention; Figure 5 A schematic diagram of the structure of a server component testing device provided by an embodiment of the present invention; Figure 6 A schematic structural diagram of a server component testing device provided by an embodiment of the present invention. DETAILED DESCRIPTION
[0020] The core of the present invention is to provide a server component testing method, device, equipment and non-volatile storage medium, which are used to improve the efficiency of server component performance testing and bottleneck analysis and shorten the test cycle of server components.
[0021] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0022] With the booming development of the Internet industry and the increasing demand for business data processing in various industries, the requirements for server configuration, quantity and quality in various industries have also increased. Since the server architecture is fixed, a single model server needs to adapt different components to meet different performance requirements for various and different input sources of server components to be tested, in order to meet the business scenarios of user testing, operation and maintenance, and implementation. For server manufacturers, it is necessary to perform performance tests on components of different types, models, and capacities on the model server, and compare the actual performance values with the performance standard values in the input source to confirm whether they meet the standards.
[0023] Faced with numerous server models, various server components, and various sources of performance input, the server manufacturer's manpower and time costs will be greatly increased if the test engineer actually tests a specific server component to determine the actual performance value; or if the component fails the performance test, it will replace the component, which will delay the demand delivery cycle. When the design and architecture of a certain server have been highly fixed in the product development stage, when the input source of the component to be tested is determined, and when the required model is determined, the actual performance value of the server component on this server model can be obtained accurately and quickly, which will greatly improve the output efficiency of the server manufacturer and greatly improve the user's satisfaction with the timeliness of demand.
[0024] At present, for a certain model of server, when the input source is determined, that is, the server component to be tested is determined, the test engineer needs to perform actual test operations on the component, summarize the test results, and feedback to the relevant person in charge. In order to improve the test efficiency, the relevant field has implemented an automated test method. However, when a certain server component fails the performance test on a certain server model, the test engineer is required to analyze the factors affecting the performance and perform the model performance test again by optimizing these factors. In practice, there are often many factors that affect the performance of server components on the server. It will greatly increase the time and manpower costs for the test engineer to check these factors one by one; if all the influencing factors are checked, the performance of the component cannot be improved due to the influence of the server model's motherboard itself, which will lead to the disabling of components, cancellation or change of requirements, and delays in delivery cycles.
[0025] To solve the above problems, the embodiment of the present invention provides a server component testing solution, which aims to quickly and accurately obtain the performance of a specified server component on a specified model server, and when the performance fails to meet the standard, the system automatically analyzes the performance test bottleneck factors and optimizes the test environment. After all factors are checked and optimized, if the performance still fails to meet the standard, the recommended server configuration parameters that can make the component performance meet the standard are automatically recommended.
[0026] Based on the above architecture, the server component testing method provided by the embodiment of the present invention is described below with reference to the accompanying drawings.
[0027] Figure 1 A flow chart of a server component testing method provided by an embodiment of the present invention.
[0028] like Figure 1 As shown, the embodiment of the present invention provides a server component testing method including: S101: Building a historical server component test database; S102: receiving information of a server component to be tested that is required to be added to a target server model, and querying test data of the server component to be tested from a historical server component test database; S103: if data that the server component to be tested has passed the performance test on the target server model is found, then the test result that the server component to be tested has passed the performance test is output; otherwise, the performance test of the server component to be tested under the current configuration environment of the target server model is performed; S104: If the server component to be tested passes the performance test under the current configuration environment, output the test result that the server component to be tested passes the performance test; otherwise, optimize the associated configuration parameters of the target server model corresponding to the server component to be tested, and perform the performance test of the server component to be tested under the optimized configuration environment of the target server model; S105: If the server component to be tested passes the performance test under the optimized configuration environment, output the test result that the server component to be tested passes the performance test; otherwise, output the recommended server configuration parameters corresponding to the server component to be tested.
[0029] In a specific implementation, the server component testing method provided in an embodiment of the present invention can be applied to a test system including a target server model. The test system can include only the target server model or another test host. The steps of the server component testing method provided in an embodiment of the present invention can be performed by the target server model or the test host.
[0030] For S101, when developing and testing each server model, a large number of server components will be tested, that is, server components of different types, types, and specifications. The historical test data of these server components on different server models can be summarized into a historical server component test database.
[0031] In some optional implementations of the embodiments of the present invention, constructing a historical server component test database in S101 may include: collecting historical test data of one or more server components on a server model based on historical test data of at least one server model; if the historical test data shows that the server component has passed the test on the server model, storing the historical test data in the historical server component test database, otherwise not storing the historical test data. That is, to improve the query efficiency before the subsequent server component performance test, only the historical test data that has passed the performance test may be stored in the historical server component test database.
[0032] For cost considerations, users tend to achieve the required performance at a lower cost. If the historical test data is that the server component has passed the test on the server model, the historical test data will be stored in the historical server component test database, which may include: if there are multiple historical test data of the server component that have passed the test on the server model, only the historical test data of the lowest server configuration of the corresponding server model will be stored in the historical server component test database. For example, if there are multiple historical test data of the server component that have passed the test on the server model, the historical test data of the configuration with the worst signal link and the most likely to fail to meet the performance standard but passed the performance test can be stored in the historical server component test database. When the performance of the component in the worst link can meet the standard, other configurations of the server model can be covered according to the test strategy.
[0033] In some other optional implementations of the embodiments of the present invention, constructing a historical server component test database in S101 may also include: storing historical test data of each server component that has passed the test on multiple server models and historical test data that has not passed the test in the historical server component test database. The server component test method provided by the embodiments of the present invention may also include: if historical test data of the server component to be tested that has not passed the test under the current configuration environment of the target server model is queried in the historical server component test database, directly entering the step of executing the performance test of the server component to be tested under the current configuration environment of the target server model.
[0034] For S103, if the data of the server component to be tested passing the performance test on the target server model is queried in the historical server component test database, there is no need to perform the performance test on the server component to be tested again, and the test can be completed by outputting the test result that the server component to be tested passed the performance test. Otherwise, the performance test of the server component to be tested under the current configuration environment of the target server model is performed again. This saves the test time of the server component to be tested on the target server model.
[0035] For S104, if no data is found that the server component to be tested has passed the performance test on the target server model, it is necessary to perform a performance test of the server component to be tested under the current configuration environment of the target server model. This is a test of the server component to be tested on the target server model.
[0036] When performing performance testing on the server component to be tested, the corresponding test script is called according to the type of the server component to be tested to execute automated testing, and the test result parameters are evaluated according to preset performance qualification indicators. According to the preset test qualification evaluation conditions, it is determined whether the server component to be tested has passed or failed the performance test on the target server model.
[0037] If the server component to be tested fails the performance test under the current configuration environment of the target server model, the optimization of the associated configuration parameters of the target server model corresponding to the server component to be tested is performed. For example, the server's high-speed serial computer expansion bus (peripheral component interconnect express, PCIe) link can be optimized, the frequency of the central processing unit can be increased, and the cache of the storage controller called can be increased.
[0038] Then, a performance test of the server component to be tested is performed in the optimized configuration environment of the target server model, which is a secondary test of the server component to be tested on the target server model.
[0039] The secondary test may be performed once or more times according to the configuration parameter optimization space and optimization strategy of the target server model.
[0040] For S105, if the server component to be tested passes the performance test under the optimized configuration environment, the test result that the server component to be tested passes the performance test is output. Further, the server component testing method provided by the embodiment of the present invention may also include: outputting optimized associated configuration parameters corresponding to the optimized configuration environment.
[0041] If the server component to be tested fails the performance test under the optimized configuration environment, the recommended server configuration parameters corresponding to the server component to be tested are output. Specifically, the recommended server configuration parameters corresponding to the influencing factors can be output based on the historical test data of the server component to be tested.
[0042] The server component testing method provided by the embodiment of the present invention constructs a historical server component testing database, so that when it is necessary to test the server component to be tested that is added to the target server model, if the corresponding historical test data that has passed the test can be queried from the historical server component testing database, no further testing is required. If the historical test data that has passed the test is not queried, it is necessary to test again. When the performance test fails, the result of failing the performance test is not directly output, but the associated configuration parameters of the target server model corresponding to the server component to be tested are optimized and then a secondary test is performed. If the server component to be tested fails the secondary test, the recommended server configuration parameters corresponding to the server component to be tested are output again, so as to realize automated performance bottleneck analysis and configuration recommendation based on the automated testing of the server component, save the time of testers for repeated exploration, retesting, and analysis, reduce labor costs, and ensure timely satisfaction of user needs.
[0043] Based on the above embodiment, the embodiment of the present invention continues to explain the steps of optimizing the server configuration and recommending configuration parameters.
[0044] In the server component testing method provided in an embodiment of the present invention, optimizing the associated configuration parameters of the server component to be tested in the corresponding target server model in S104 may include: determining the influencing factors that affect the performance of the server component to be tested; if the associated configuration parameters corresponding to the influencing factors under the current configuration environment of the target server model have not reached the upper limit, determining that the associated configuration parameters are adjustable configuration parameters; and selecting the adjustable configuration parameters for optimization.
[0045] That is, when the server component to be tested fails the test under the current configuration environment of the target server model, the pre-deployed analysis and optimization unit can be called to analyze the factors affecting the performance of the server component to be tested and provide key configuration parameter optimization strategies.
[0046] In a specific implementation, the correspondence between server components and influencing factors can be pre-stored, and the correspondence can be pre-entered by the tester or obtained based on relevant information about the server components. These factors that affect component performance are also certain, including the motherboard link, the CPU and memory's own performance impact, the cache size of the storage controller, the switch setting of the hard disk cache, etc. Through the analysis of these influencing factors, such as the CPU resources are not fully utilized due to the small number of CPU threads, the hard disk cache is not turned on, resulting in insufficient preheating during the hard disk performance test, etc., these unfavorable factors are optimized, including but not limited to increasing the number of threads, binding the CPU, and increasing the hard disk preheating time.
[0047] In some optional implementations of the embodiments of the present invention, if there are multiple influencing factors for the server component to be tested, selecting associated configuration parameters from the adjustable configuration parameters for optimization may include selecting some of the influencing factors for optimization. For example, one influencing factor may be started and optimized one by one to achieve fine-grained adjustment of the overall server configuration, thereby finding the minimum configuration of the server component to be tested that can pass the performance test on the target server model.
[0048] In some other optional implementations of the embodiments of the present invention, selecting adjustable configuration parameters for optimization may also include: optimizing all adjustable configuration parameters to the upper limit of the target server model. That is, by optimizing all adjustable configuration parameters to the upper limit of the target server model at one time, it is possible to quickly find out that the server component to be tested cannot pass the performance test on the target server model. Accordingly, only one secondary test may be performed. If the server component to be tested fails the performance test under the optimized configuration environment, the result that the server component to be tested cannot pass the performance test on the current server model can be quickly obtained.
[0049] In some other optional implementations of the embodiments of the present invention, outputting recommended server configuration parameters corresponding to the server component to be tested in S105 may also include: determining and outputting recommended server configuration parameters corresponding to the server component to be tested based on differences between performance test result parameters of the server component to be tested in the current configuration environment of the target server model and performance test result parameters of the server component to be tested in the optimized configuration environment of the target server model, as well as historical test data of the server component to be tested.
[0050] That is to say, when the secondary test fails, the configuration recommendation unit is started to query the historical server component test database for the server component to be tested to obtain a server configuration that can pass the performance test. The server configuration can be a configuration combination of the server component to be tested and other server components on the target server model.
[0051] Figure 2 A flowchart of another server component testing method provided by an embodiment of the present invention.
[0052] On the basis of the above-mentioned embodiment, in the server component testing method provided in the embodiment of the present invention, after entering the testing phase of the server component to be tested, as shown in FIG. Figure 2 As shown, the information of the server component to be tested is input into the historical server component test database. If the data of the server component to be tested passing the performance test on the target server model can be matched, it is determined that the server component to be tested has passed the test; if the data of the server component to be tested passing the performance test on the target server model cannot be matched, the test unit is called once to execute the performance test of the server component to be tested in the optimized configuration environment of the target server model.
[0053] If the server component to be tested passes the first test, it is determined that the server component to be tested passes the test. If the server component to be tested does not pass the first test, the analysis and optimization unit is called to optimize the associated configuration parameters of the server component to be tested in the target server model. Then the secondary test unit is called to perform a performance test of the server component to be tested in the optimized configuration environment of the target server model.
[0054] Optimizing the associated configuration parameters of the target server model corresponding to the server component to be tested in S104 may include: determining the associated server component on the target server model that is associated with the server component to be tested, and determining that the configuration parameters of the associated server component are associated configuration parameters; checking the current configuration parameters of the associated server component and the corresponding configuration parameter range; if the current configuration parameters do not reach the upper limit of the corresponding configuration parameter range, determining that the current configuration parameters are adjustable configuration parameters; and optimizing each adjustable configuration parameter to the upper limit of the corresponding configuration parameter range.
[0055] Outputting the recommended server configuration parameters corresponding to the server component to be tested in S105 may include: querying the target historical data that has passed the performance test and is associated with the server component to be tested from the historical server component test database; if the target historical data is queried, obtaining the optimized configuration parameter range of the associated configuration parameters from the target historical data; if the target historical data is not queried, generating the optimized configuration parameter range based on the difference between the performance test result parameters of the server component to be tested under the current configuration environment of the target server model and the performance test result parameters of the server component to be tested under the optimized configuration environment of the target server model; and outputting the recommended server configuration parameters with the optimized configuration parameter range.
[0056] like Figure 2As shown, if the server component to be tested passes the secondary test, it is determined that the server component to be tested passes the test. If the server component to be tested does not pass the secondary test, the configuration recommendation unit is called to execute the step of outputting the recommended server configuration parameters corresponding to the server component to be tested according to the performance test results of the server component to be tested under the optimized configuration environment of the target server model.
[0057] The specific implementation of the embodiments of the present invention can refer to the introduction of the above embodiments.
[0058] On the basis of the above embodiments, the embodiments of the present invention are described by taking the server component to be tested as a hard disk as an example.
[0059] Figure 3 A flowchart of optimizing the association configuration of a hard disk provided by an embodiment of the present invention; Figure 4 A flowchart of a hard disk configuration recommendation provided by an embodiment of the present invention.
[0060] In the embodiment of the present invention, when the server component to be tested is a hard disk to be tested, S102 is executed to input the code of the hard disk to be tested into the historical server component test database for comparison. If no matching result is found, a test unit is started for testing.
[0061] The test unit is called once, that is, under the current configuration environment of the target server model (CPU / memory / storage link actually used by the server), the hard disk to be tested with the input requirements is used to perform 1024K performance continuous read and write tests and 128K performance random read and write tests.
[0062] Complete a test of the hard disk to be tested. If the test passes, the test result is directly output. If the test fails, enter the analysis and optimization unit.
[0063] The analysis and optimization unit can analyze, judge and optimize from the following three aspects: Figure 3 shown.
[0064] Detect the server motherboard link of the target server model and check which central processor controls the hard disks including the hard disk to be tested. The hard disks can be evenly distributed among different central processors. That is, the resources of the central processor can be reallocated by binding the non-uniform memory access (NUMA) technology of the central processor. This avoids the situation where the performance test of a few hard disks occupies most of the resources of the central processor when not bound, resulting in the actual performance of these few hard disks far exceeding the performance standard value and the performance of other hard disks far falling short of the performance standard, causing the actual performance data of the same hard disk installed in different slots (Slot) of the hard disk backplane to be uneven.
[0065] Detect CPU and memory related parameters. If the hard disk performance is affected by the CPU main frequency, call the CPU overclocking function to increase the CPU performance multiples and expand the CPU resources through CPU overclocking; change the CPU power consumption setting from automatic (Auto) to manual (Manual), and ensure the maximum CPU performance by matching the power consumption of the current CPU; turn off some CPU functions that have no effect on the hard disk performance test but occupy other resources, so that the CPU resources fully match the performance test; detect the actual operating frequency of the memory to determine whether the memory is running at the highest frequency.
[0066] Detect the input and output cache size of the storage controller of the target server model, and analyze whether the storage controller cache has been fully called during the hard disk performance test; optimize the read and write strategy by detecting the hard disk's own read / write strategy, that is, set the hard disk read / write mode to on / off, whether to call the hard disk cache, etc.
[0067] When the work of the analysis and optimization unit is completed, the secondary test unit is called to perform performance test on the hard disk to be tested again.
[0068] When the work of the secondary test unit is completed, if the test passes, the test result is directly output. If the test fails, the configuration recommendation unit is called. The component data in the configuration recommendation unit matches the historical server component test database of the server model, and contains all components that have passed the test. Combining the performance test results and influencing factors of the hard disk twice, by judging different influencing factors, the configuration recommendation can be made in the following ways: If the performance of the hard disk to be tested is affected by the performance of the central processor itself, a central processor with better performance than the central processor currently used in the actual test of the target server model is recommended; if the performance of the hard disk to be tested is affected by the performance of the memory itself in the current test configuration, the memory with better specifications such as main frequency, rank number, number of particles, and capacity is captured in the historical server component test database for recommendation; if the performance of the hard disk to be tested is affected by the cache size of the current storage controller itself (except for the onboard controller, the onboard controller is located on the motherboard, the server motherboard is single and fixed, and cannot be replaced), the storage controller with larger cache in the component library can be recommended, and the configuration recommendation list is output, and the process ends.
[0069] like Figure 4 As shown, the test-compliant components recommended by the recommended configuration unit may not be single. For example, the interval of the highest specification central processor to the lowest specification central processor, the interval of the highest specification memory to the lowest specification memory, and the interval of the highest specification storage controller to the lowest specification storage controller that can enable the hard disk to pass the performance test on the target server model can be recommended in sequence, and then a configuration recommendation list can be output.
[0070] In addition, we can also comprehensively consider the user's actual usage scenarios, server configuration production and shipping costs, and the degree of maintainability, so that we can provide it to users for their own matching.
[0071] On the basis of the above embodiments, the embodiments of the present invention are described by taking the server component to be tested as a network card as an example.
[0072] In the embodiment of the present invention, when the server component to be tested is a network card to be tested, S102 is executed to input the code of the network card to be tested into the historical server component test database for comparison. If no matching result is found, a test unit is started for testing.
[0073] Calling the test unit once means calling the network performance test tool (Netperf) to perform performance testing under the current configuration environment of the target server model (CPU / memory / storage link actually used by the server) and the hard disk to be tested with the input requirements.
[0074] Complete a test of the hard disk to be tested. If the test passes, the test result is directly output. If the test fails, enter the analysis and optimization unit.
[0075] The analysis and optimization unit can judge whether the network card performance test fails to meet the standard due to the performance of the central processor itself, or the uneven allocation of high-speed serial computer expansion bus link resources, etc., based on the number of central processor cores, non-uniform memory access, frequency, high-speed serial computer expansion bus link connection mode, network card rate and bandwidth reaching the maximum design standard, etc.; the corresponding influencing factors can be optimized by enabling central processor overclocking, binding the network card to the corresponding central processor link, etc.
[0076] When the work of the analysis and optimization unit is completed, the secondary test unit is called to perform performance testing on the network card to be tested again.
[0077] When the work of the secondary test unit is completed, if the test passes, the test result is directly output. If the test fails, the configuration recommendation unit is called. The subsequent steps are similar to the configuration recommendation steps for the hard disk to be tested in the above embodiment.
[0078] It should be noted that in the embodiments of the server component testing method of the present invention, some of the steps or features can be ignored or not executed. The hardware or software functional modules divided for the convenience of description are not the only implementation form of the server component testing method provided in the embodiments of the present invention.
[0079] The above describes in detail various embodiments corresponding to the server component testing method. On this basis, the present invention also discloses a server component testing device, equipment, non-volatile storage medium and computer program product corresponding to the above method.
[0080] Figure 5 A schematic structural diagram of a server component testing device provided by an embodiment of the present invention.
[0081] like Figure 5 As shown, the server component testing device provided by the embodiment of the present invention includes: A database construction unit 501 is used to construct a history server component test database; The receiving unit 502 is used to receive information about the server component to be tested that needs to be added to the target server model, and query the test data of the server component to be tested from the historical server component test database; A primary testing unit 503 is used to perform a performance test on the server component to be tested under the current configuration environment of the target server model; The analysis and optimization unit 504 is used to optimize the associated configuration parameters of the target server model corresponding to the server component to be tested if the server component to be tested fails the performance test under the current configuration environment of the target server model; A secondary testing unit 505 is used to perform a performance test on the server component to be tested in an optimized configuration environment of the target server model; A configuration recommendation unit 506, configured to determine a recommended server configuration parameter corresponding to the server component to be tested if the server component to be tested fails the performance test under the optimized configuration environment of the target server model; The output unit 507 is used to output the test result of the server component to be tested passing the performance test when the data of the server component to be tested passing the performance test on the target server model is queried, or the server component to be tested passes the performance test under the current configuration environment of the target server model, or the server component to be tested passes the performance test under the current configuration environment, or the server component to be tested passes the performance test under the optimized configuration environment; when the server component to be tested fails to pass the performance test under the optimized configuration environment, output the recommended server configuration parameters corresponding to the server component to be tested.
[0082] It should be noted that in each implementation of the server component testing device provided by the embodiment of the present invention, the division of units is only a logical functional division, and other division methods can be used. The connection method between different units can be electrical, mechanical or other connection methods. The separated units can be located in the same physical location or distributed on multiple network nodes. Each unit can be implemented in the form of hardware or in the form of a software functional unit. That is, part or all of the units provided by the embodiment of the present invention can be selected according to actual needs and the corresponding connection method or integration method can be adopted to achieve the purpose of the embodiment of the present invention.
[0083] Since the embodiments of the apparatus part correspond to the embodiments of the method part, please refer to the description of the embodiments of the method part for the embodiments of the apparatus part, which will not be repeated here.
[0084] Figure 6 A schematic structural diagram of a server component testing device provided by an embodiment of the present invention.
[0085] like Figure 6 As shown, the server component testing device provided by the embodiment of the present invention includes: a memory 610, used to store a computer program 611; a processor 620, used to execute the computer program 611, and when the computer program 611 is executed by the processor 620, the steps of the server component testing method provided by any of the above embodiments are implemented.
[0086] Among them, the processor 620 may include one or more processing cores, such as a 3-core processor, an 8-core processor, etc. The processor 620 may be implemented in at least one hardware form of digital signal processing (DSP), field-programmable gate array (FPGA), and programmable logic array (PLA). The processor 620 may also include a main processor and a coprocessor. The main processor is a processor for processing data in the awake state, also known as a central processing unit (CPU); the coprocessor is a low-power processor for processing data in the standby state. In some embodiments, the processor 620 may be integrated with a graphics processing unit (GPU), which is responsible for rendering and drawing the content to be displayed on the display screen. In some embodiments, the processor 620 may also include an artificial intelligence (AI) processor, which is used to process computing operations related to machine learning.
[0087] The memory 610 may include one or more non-volatile storage media, which may be non-transitory. The memory 610 may also include a high-speed random access memory, and a non-volatile memory, such as one or more disk storage devices, flash memory storage devices. In this embodiment, the memory 610 is at least used to store the following computer program 611, wherein the computer program 611, after being loaded and executed by the processor 620, can implement the relevant steps in the server component testing method disclosed in any of the aforementioned embodiments. In addition, the resources stored in the memory 610 may also include an operating system 612 and data 613, etc., and the storage method may be temporary storage or permanent storage. Among them, the operating system 612 may be Windows or other types of operating systems. The data 613 may include, but is not limited to, the data involved in the above method.
[0088] In some embodiments, the server component testing device may further include a display screen 630 , a power supply 640 , a communication interface 650 , an input / output interface 660 , a sensor 670 , and a communication bus 680 .
[0089] Those skilled in the art will understand that Figure 6 The structure shown in the figure does not constitute a limitation of the server component testing device, and may include more or fewer components than shown in the figure.
[0090] The server component testing device provided in the embodiment of the present invention includes a memory and a processor. When the processor executes the program stored in the memory, it can implement the steps of the server component testing method provided in the above embodiment, and the effect is the same as above.
[0091] An embodiment of the present invention provides a non-volatile storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of the server component testing method provided in any one of the above embodiments can be implemented.
[0092] The non-volatile storage medium may include: a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, and other media that can store program codes.
[0093] For the introduction of the non-volatile storage medium provided in the embodiment of the present invention, please refer to the above method embodiment, and the effect thereof is the same as the server component testing method provided in the embodiment of the present invention, and the present invention will not elaborate on it here.
[0094] An embodiment of the present invention provides a computer program product, including a computer program, which, when executed by a processor, implements the steps of the server component testing method provided in any one of the above embodiments.
[0095] For an introduction to the computer program product provided by the embodiment of the present invention, please refer to the above method embodiment, and the effect thereof is the same as the server component testing method provided by the embodiment of the present invention, and the present invention will not elaborate on it here.
[0096] The server component testing method, device, equipment and non-volatile storage medium provided by the present invention are introduced in detail above. The various embodiments in the specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same and similar parts between the various embodiments can be referenced to each other. For the devices, equipment, non-volatile storage media and computer program products disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the description is relatively simple, and the relevant parts can be referred to the method part description. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present invention, the present invention can also be improved and modified in a number of ways, and these improvements and modifications also fall within the scope of protection of the present invention.
[0097] It should also be noted that, in this specification, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprise", "include" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the statement "comprises a ..." does not exclude the presence of other identical elements in the process, method, article or device including the element.
Claims
1. A server component testing method, characterized in that: include: Build a historical server component test database; Receiving information of a server component to be tested that is required to be added to a target server model, and querying test data of the server component to be tested from the historical server component test database; If data that the server component to be tested has passed the performance test on the target server model is queried, the test result that the server component to be tested has passed the performance test is output; otherwise, the performance test of the server component to be tested under the current configuration environment of the target server model is performed; If the server component to be tested passes the performance test under the current configuration environment, then output the test result that the server component to be tested passes the performance test; otherwise, optimize the associated configuration parameters of the target server model corresponding to the server component to be tested, and perform the performance test of the server component to be tested under the optimized configuration environment of the target server model; If the server component to be tested passes the performance test under the optimized configuration environment, the test result indicating that the server component to be tested passes the performance test is output; otherwise, the recommended server configuration parameters corresponding to the server component to be tested are output.
2. The server component testing method according to claim 1, characterized in that: Build a history server component test database, including: Collecting historical test data of one or more server components on the server model according to historical test data of at least one server model; If the historical test data shows that the server component has passed the test on the server model, the historical test data is stored in the historical server component test database; otherwise, it is not stored.
3. The server component testing method according to claim 2, characterized in that: If the historical test data indicates that the server component has passed the test on the server model, storing the historical test data in the historical server component test database includes: If there are multiple historical test data of the server component that have passed the test on the server model, only the historical test data corresponding to the minimum server configuration of the server model is stored in the historical server component test database.
4. The server component testing method according to claim 1, characterized in that: Optimizing the associated configuration parameters of the server component to be tested in the corresponding target server model includes: Determining factors affecting the performance of the server component to be tested; If, under the current configuration environment of the target server model, the associated configuration parameter corresponding to the influencing factor has not reached an upper limit, determining that the associated configuration parameter is an adjustable configuration parameter; The adjustable configuration parameters are selected for optimization.
5. The server component testing method according to claim 4, characterized in that: The adjustable configuration parameters are selected for optimization, including: All of the adjustable configuration parameters are optimized to the upper limit of the target server model.
6. The server component testing method according to claim 1, characterized in that: Outputting recommended server configuration parameters corresponding to the server component to be tested, including: Based on the differences between the performance test result parameters of the server component to be tested under the current configuration environment of the target server model and the performance test result parameters of the server component to be tested under the optimized configuration environment of the target server model, as well as the historical test data of the server component to be tested, determine and output the recommended server configuration parameters corresponding to the server component to be tested.
7. The server component testing method according to claim 1, characterized in that: Optimizing the associated configuration parameters of the target server model corresponding to the server component to be tested, including: Determine an associated server component on the target server model that is associated with the server component to be tested, and determine configuration parameters of the associated server component as the associated configuration parameters; Checking current configuration parameters of the associated server component and corresponding configuration parameter ranges; If the current configuration parameter does not reach the upper limit of the corresponding configuration parameter range, determining that the current configuration parameter is an adjustable configuration parameter; Optimizing each of the adjustable configuration parameters to the upper limit of the corresponding configuration parameter range; Outputting recommended server configuration parameters corresponding to the server component to be tested, including: Querying the historical server component test database for target historical data associated with the server component to be tested that has passed the performance test; If the target historical data is found, then the optimized configuration parameter range of the associated configuration parameter is obtained from the target historical data; If the target historical data is not found, generating the optimized configuration parameter range according to the difference between the performance test result parameters of the server component to be tested under the current configuration environment of the target server model and the performance test result parameters of the server component to be tested under the optimized configuration environment of the target server model; The recommended server configuration parameters are outputted using the optimized configuration parameter range.
8. A server component testing device, characterized in that: include: A database construction unit, used for constructing a history server component test database; A receiving unit, configured to receive information of a server component to be tested that is required to be added to a target server model, and query test data of the server component to be tested from the historical server component test database; A primary testing unit, used to perform a performance test on the server component to be tested under the current configuration environment of the target server model; an analysis and optimization unit, configured to optimize the associated configuration parameters of the target server model corresponding to the server component to be tested if the server component to be tested fails the performance test under the current configuration environment of the target server model; A secondary testing unit, used to perform a performance test on the server component to be tested in an optimized configuration environment of the target server model; a configuration recommendation unit, configured to determine a recommended server configuration parameter corresponding to the server component to be tested if the server component to be tested fails the performance test under the optimized configuration environment of the target server model; an output unit, for outputting a test result of the server component to be tested passing the performance test when data that the server component to be tested passes the performance test on the target server model or the server component to be tested passes the performance test under the current configuration environment of the target server model or the server component to be tested passes the performance test under the current configuration environment or the server component to be tested passes the performance test under the optimized configuration environment is queried; When the server component to be tested fails the performance test under the optimized configuration environment, the recommended server configuration parameters corresponding to the server component to be tested are output.
9. A server component testing device, characterized in that: include: Memory for storing computer programs; A processor is used to execute the computer program, and when the computer program is executed by the processor, the steps of the server component testing method according to any one of claims 1 to 7 are implemented.
10. A non-volatile storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the server component testing method according to any one of claims 1 to 7 are implemented.