Spectrum Spectrum Ball Head Bottom Measurement Device

Abstract

The present application relates to the field of LED testing, and provides a bottom measuring device of a spectrometer ball head, including a dividing plate, a defect detection component, a first positioning component, a second positioning component and a testing component; a plurality of placement tables for placing workpieces are evenly spaced along the circumference of the dividing plate, and the dividing plate can rotate along its own axis direction, so that the workpiece located on the placement table moves to the testing station; the defect detection component is used to detect defects on the workpiece before it arrives at the testing station; the first positioning component is used to clamp and limit the workpiece for visual inspection; the testing component includes a bottom measuring module and an integrating sphere, and the bottom measuring module is used to contact the workpiece at the testing station and make the workpiece emit light; the integrating sphere is used to test the luminous workpiece; the second positioning component is used to clamp and limit the workpiece at the testing station. The present application solves the problem that the workpiece cannot be accurately positioned.

Description

Technical Field

[0001] The present application relates to the field of LED testing, and in particular to a spectrometer ball head bottom testing device. Background Art

[0002] The ball head bottom test mechanism of the spectrometer is an important part specially designed for testing bottom electrode components such as ball head LED chips. By making the energized probe contact the pins of the component, the component will emit light and the optical parameters will be tested.

[0003] The component is usually placed on a support with holes, and the probe passes through the holes on the support and contacts the pins of the component. When performing parameter testing, the component is usually pressed by a pressure plate with holes to prevent the probe from lifting the component or the component from shifting during testing.

[0004] However, although the pressure plate can limit the component, it cannot accurately position the component. The placement of the component on the support seat may deviate, thereby affecting the detection result. Summary of the invention

[0005] In order to solve the problem that the workpiece cannot be accurately positioned, the present application provides a spectrometer ball head bottom measurement device.

[0006] The present application provides a spectrometer ball head bottom measurement device that adopts the following technical solution:

[0007] A spectrometer ball head bottom measurement device, comprising:

[0008] The indexing plate has a plurality of placement tables for placing workpieces evenly spaced along the circumference, and the indexing plate can rotate along its own axis direction, so that the workpiece located on the placement table moves to the testing station.

[0009] A defect detection component is used to detect defects on the workpiece before it arrives at the testing station.

[0010] The first positioning assembly is used to clamp and limit the workpiece undergoing visual inspection.

[0011] The testing component comprises a bottom testing module and an integrating sphere. The bottom testing module is used to contact the workpiece at the testing station and make the workpiece emit light; the integrating sphere is used to test the luminous workpiece.

[0012] The second positioning assembly is used to clamp and limit the workpiece at the testing station.

[0013] By adopting the above technical solution, the spectrometer ball head bottom measurement device can realize automatic detection of workpieces and improve detection efficiency and positioning accuracy. Specifically:

[0014] The design of the indexing plate enables the workpiece to be automatically and orderly moved to the testing station, reducing manual operations and improving production efficiency.

[0015] The defect detection component performs pre-inspection before the workpiece arrives at the test station to ensure the quality of the workpiece entering the subsequent test phase and avoid invalid testing.

[0016] The first positioning component clamps and limits the workpiece undergoing visual inspection to ensure stability and reliability during the inspection process and reduce misjudgment caused by changes in the workpiece position.

[0017] The second positioning component clamps and limits the workpiece at the test station to ensure that the position of the workpiece is fixed during the test and to avoid measurement errors caused by the movement of the workpiece.

[0018] Preferably, the first positioning assembly comprises a positioning drive unit, two first slide rails and two clamping claws.

[0019] The two first slide rails are parallel to each other, and the two clamping claws are slidably arranged on the two first slide rails in a one-to-one correspondence.

[0020] The two clamping jaws are both connected to the positioning drive unit, and the positioning drive unit is used to drive the clamping jaws to slide along the direction of the first slide rail, so that the two clamping jaws are moved closer to or farther away from each other.

[0021] By adopting the above technical solution, the first positioning component of the spectrometer ball head bottom measurement device can achieve accurate clamping and limiting of the workpiece, ensuring that the workpiece remains stable during defect detection and avoiding inaccurate detection results due to changes in the position of the workpiece. At the same time, the movement of the clamping claw is controlled by the positioning drive unit, so that the clamping force is controllable, effectively protecting the workpiece from damage.

[0022] Preferably, the positioning drive unit comprises a first mounting frame, a first motor, a first rotating block, two transmission columns and two bearings.

[0023] The first motor is disposed on the first mounting frame and connected to the first rotating block.

[0024] One of the transmission columns is rotatably connected to the first rotating block via one of the bearings, and the other transmission column is rotatably connected to the first rotating block via another of the bearings.

[0025] The two bearings are both slidably connected to the first rotating block.

[0026] One of the transmission posts is connected to one of the clamping jaws, and the other transmission post is connected to the other clamping jaw.

[0027] By adopting the above technical solution, the first motor in the positioning drive unit drives the two transmission columns to move through the first rotating block, thereby realizing the synchronous movement of the two clamps toward or away from each other, ensuring that the clamps can confine the workpiece to the test station, thereby improving the clamping accuracy and reliability.

[0028] Preferably, the first positioning assembly further includes a first photoelectric sensor and a first blocking sheet.

[0029] The first blocking sheet is connected to one of the clamping jaws, and when the two clamping jaws approach or move away from each other, the first photoelectric sensor switches between the first state and the second state.

[0030] In the first state, the first blocking sheet is located between the emitter and the receiver of the first photosensor and blocks the light emitted by the emitter of the first photosensor.

[0031] In the second state, the first blocking sheet does not block light emitted by the emitter of the first photosensor.

[0032] By adopting the above technical solution, the first positioning component can not only realize the clamping limit of the workpiece, but also add the first photoelectric sensor and the first blocking plate, which can monitor the position state of the clamp in real time during the action of the clamp, ensure that the clamp is accurately in place, and improve the positioning accuracy and reliability. Specifically:

[0033] The first photoelectric sensor and the first blocking plate are used together to determine whether the clamping jaws have reached a predetermined position by the state change of the first photoelectric sensor (first state and second state) when the clamping jaws approach or move away from each other, thereby avoiding damage to the workpiece or loose clamping caused by over-clamping or loosening of the clamping jaws.

[0034] Preferably, the bottom test module includes a test drive unit, a second mounting frame, a second slide rail, a connecting frame and a probe.

[0035] The second slide rail is vertically arranged on the second mounting frame, the connecting frame is slidably arranged on the second slide rail, and the probe is arranged on the connecting frame.

[0036] The test drive unit is connected to the connecting frame and is used to drive the connecting frame to slide along the direction of the second slide rail.

[0037] By adopting the above technical solutions, the bottom test module can achieve precise vertical movement, ensure stable contact between the probe and the workpiece, and improve the accuracy and reliability of the test. Specifically:

[0038] The test drive unit is used in conjunction with the connecting frame, so that the connecting frame can slide accurately along the direction of the second slide rail, ensuring that the probe can contact the workpiece at a predetermined position, thereby avoiding test errors caused by position deviation.

[0039] Preferably, the test driving unit includes a second motor, a second rotating block and a connecting rod.

[0040] The second motor is connected to the second rotating block and is used to drive the second rotating block to rotate.

[0041] One end of the connecting rod is rotatably connected to the second rotating block, and the other end is rotatably connected to the connecting frame. The connecting portion between the connecting rod and the second rotating block is eccentrically arranged compared to the rotating axis of the second rotating block.

[0042] By adopting the above technical solution, the second motor drives the second rotating block to rotate, thereby driving the connecting rod to move, so that the connecting frame slides up and down along the direction of the second slide rail, achieving precise contact and separation between the probe and the workpiece, thereby improving the degree of automation and accuracy of the test process.

[0043] Preferably, the bottom detection module further includes a second photoelectric sensor and a second blocking sheet.

[0044] The second blocking piece is connected to the connecting frame, and when the connecting frame slides along the direction of the second slide rail, the second photoelectric sensor switches between the third state and the fourth state.

[0045] In the third state, the probe is in contact with the workpiece, and the second blocking sheet is located between the emitter and the receiver of the second photoelectric sensor and blocks the light emitted by the emitter of the second photoelectric sensor.

[0046] In the fourth state, the probe is not in contact with the workpiece, and the second blocking sheet does not block the emitter of the second photoelectric sensor.

[0047] By adopting the above technical solution, the combination of the second photoelectric sensor and the second blocking sheet can monitor the contact state between the probe and the workpiece in real time. When the probe contacts the workpiece, the second blocking sheet will block the light of the second photoelectric sensor, making it in the third state, thereby accurately judging that the probe has contacted the workpiece; when the probe does not contact the workpiece, the second blocking sheet will not block the light of the second photoelectric sensor, making it in the fourth state, thereby ensuring that the probe does not contact the workpiece. This design improves the reliability and accuracy of the test process and avoids test errors caused by misjudgment.

[0048] Preferably, the side wall of the placement table has a plurality of planes facing different directions.

[0049] The bottom measuring module also includes a third photoelectric sensor, which is arranged on the connecting frame. When the connecting frame slides along the direction of the second slide rail, the third photoelectric sensor switches between a fifth state and a sixth state.

[0050] In the fifth state, the light emitted by the emitter of the third photoelectric sensor can be emitted by one of the planes of the side walls of the placement table corresponding to the workpiece located at the testing station, and received by the receiver of the third photoelectric sensor.

[0051] In the sixth state, the light emitted by the emitter of the third photoelectric sensor passes through the top of the placement table corresponding to the workpiece located at the testing station.

[0052] By adopting the above technical solution, the side wall of the placement table is designed to have multiple planes facing different directions. In the fifth state, the light emitted by the emitter of the third photoelectric sensor can be reflected back by one of the planes of the side wall of the placement table corresponding to the workpiece located at the test station and received by the receiver. Conversely, by whether the receiver receives the reflected light, it can be determined whether the placement table has deviated, thereby helping to determine whether the workpiece is at the test station.

[0053] When the placement table does not deviate, as the third photoelectric sensor moves with the connecting frame, in the sixth state, the light emitted by the emitter of the third photoelectric sensor will not be blocked by the placement table. On the contrary, whether the light emitted by the emitter of the third photoelectric sensor is blocked by the placement table can help determine the top height of the placement table, thereby adjusting the position of the probe more accurately.

[0054] Preferably, the spectrometer ball head bottom measurement device also includes a blanking component.

[0055] The feeding assembly comprises a nozzle and a feeding pipe. The feeding pipe is arranged obliquely. The nozzle is arranged toward the end of the feeding pipe with a higher height. The nozzle is used to spray a medium so as to push the workpiece into the feeding pipe.

[0056] By adopting the above technical solution, the setting of the unloading component enables the workpiece to be automatically unloaded after the test is completed, thereby improving the detection efficiency; the design of the nozzle and the unloading tube ensures that the workpiece can be pushed into the unloading tube accurately and quickly, avoiding the tediousness and errors of manual operation, and at the same time, the inclined unloading tube uses gravity to further ensure the smooth transportation of the workpiece.

[0057] Preferably, there are multiple blanking assemblies, and the multiple blanking assemblies are evenly spaced and arranged along the circumferential direction with the rotation axis of the dividing plate as the center axis.

[0058] By adopting the above technical solution, after the workpiece is inspected, it can be discharged from different discharge pipes according to different quality grades, so that workpieces of different quality grades can be distinguished.

[0059] In summary, the present application includes at least one of the following beneficial technical effects:

[0060] 1. The rotating design of the indexing plate allows the workpieces to be inspected one by one, significantly improving the inspection efficiency;

[0061] 2. The first positioning assembly and the second positioning assembly respectively clamp and limit the workpiece at the visual inspection and test stations, effectively solving the problem that the workpiece cannot be accurately positioned, resulting in errors in the inspection results. BRIEF DESCRIPTION OF THE DRAWINGS

[0062] Figure 1 It is a schematic diagram of the three-dimensional structure of the spectrometer ball head bottom measurement device provided in this application.

[0063] Figure 2 It is a top view of the spectrometer ball head bottom measurement device provided in this application.

[0064] Figure 3 It is a structural schematic diagram of the first positioning component of the spectrometer ball head bottom measurement device provided in the present application.

[0065] Figure 4 This application provides Figure 3 A magnified schematic diagram of center A.

[0066] Figure 5 It is a structural schematic diagram of the bottom measurement module of the bottom measurement device of the spectrometer ball head provided in this application.

[0067] Figure 6 This application provides Figure 5 A magnified schematic diagram of point B in the middle.

[0068] Figure 7 It is a structural schematic diagram of the dividing plate of the spectrometer ball head bottom measurement device provided in the present application.

[0069] Figure 8 This application provides Figure 7 Enlarged schematic diagram of point C in the middle.

[0070] Fig. 9 It is a partial schematic diagram of the spectrometer ball head bottom measurement device provided in this application.

[0071] Description of reference numerals:

[0072] 1. Indexing plate; 11. Placement table;

[0073] 2. Defect detection component;

[0074] 3. First positioning assembly; 31. Positioning drive unit; 311. First mounting frame; 312. First motor; 313. First rotating block; 314. Transmission column; 315. Bearing; 32. First slide rail; 33. Clamping claw; 34. First photoelectric sensor; 35. First blocking sheet;

[0075] 4. The second positioning component;

[0076] 5. Test assembly; 51. Bottom test module; 511. Test drive unit; 5111. Second motor; 5112. Second rotating block; 5113. Connecting rod; 512. Second mounting bracket; 513. Second slide rail; 514. Connecting bracket; 515. Probe; 516. Second photoelectric sensor; 517. Second blocking sheet; 518. Third photoelectric sensor; 52. Integrating sphere;

[0077] 6. Feeding assembly; 61. Nozzle; 62. Feeding pipe;

[0078] 200. Workpiece. DETAILED DESCRIPTION

[0079] The following combination Figures 1 to 9 This application is described in further detail.

[0080] Example 1

[0081] like Figure 1 and Figure 2 As shown, an embodiment of the present application discloses a spectrometer ball head bottom measurement device, including a dividing plate 1, a defect detection component 2, a first positioning component 3, a second positioning component 4 and a testing component 5.

[0082] The indexing plate 1 is provided with a plurality of placement tables 11 for placing the workpieces 200 at even intervals along the circumferential direction. The indexing plate 1 can rotate along its own axis direction, so that the workpiece 200 located on the placement table 11 moves to the testing station.

[0083] The defect detection component 2 is used to detect defects on the workpiece 200 before it arrives at the testing station.

[0084] The first positioning assembly 3 is used to clamp and limit the workpiece 200 that undergoes visual inspection.

[0085] The testing assembly 5 includes a bottom testing module 51 and an integrating sphere 52 . The bottom testing module 51 is used to contact the workpiece 200 at the testing station and make the workpiece 200 emit light; the integrating sphere 52 is used to test the luminous workpiece 200 .

[0086] The second positioning assembly 4 is used to clamp and limit the workpiece 200 at the testing station.

[0087] Specifically, the indexing plate 1 can be made of high-strength stainless steel material with good wear resistance and corrosion resistance. The indexing plate 1 can be driven by a servo motor to achieve precise step rotation, ensuring that each workpiece 200 can accurately reach the test station.

[0088] like Figure 1 and Figure 2 As shown, the defect detection component 2 may include a high-resolution industrial camera and corresponding image processing software to achieve high-precision photography of the surface of the workpiece 200. For example, a CCD (charge coupled device) camera may be used, equipped with a high-brightness LED light source, to ensure that a clear image can be obtained even under low light conditions. The image processing software may use edge detection algorithms and grayscale analysis algorithms to effectively identify tiny defects on the surface of the workpiece 200, such as scratches, cracks, etc. The defect detection component 2 can be used to detect defects on the workpiece 200 before it arrives at the test station, thereby avoiding the detection of optical parameters of the workpiece 200 with appearance defects and avoiding wasting time.

[0089] like Figure 1 , Figure 3 and Figure 4 As shown, the first positioning assembly 3 includes a positioning drive unit 31 , two first slide rails 32 and two clamping claws 33 .

[0090] The two first slide rails 32 are parallel to each other. The two clamping jaws 33 are slidably disposed on the two first slide rails 32 in a one-to-one correspondence. Both the two clamping jaws 33 are connected to the positioning drive unit 31 .

[0091] The positioning drive unit 31 includes a first mounting frame 311 , a first motor 312 , a first rotating block 313 , two transmission columns 314 and two bearings 315 .

[0092] The two first slide rails 32 are both arranged on the first mounting frame 311. The first motor 312 is arranged on the first mounting frame 311 and connected to the first rotating block 313; one of the transmission columns 314 is rotatably connected to the first rotating block 313 through a bearing 315, and the other transmission column 314 is rotatably connected to the first rotating block 313 through another bearing 315; both bearings 315 are slidably connected to the first rotating block 313; one of the transmission columns 314 is connected to one of the clamping jaws 33, and the other transmission column 314 is connected to the other clamping jaw 33.

[0093] The first motor 312 drives the first rotating block 313 to rotate, thereby moving the two transmission columns 314. During the movement of the transmission column 314, the clamping jaws 33 connected thereto can be driven to slide along the direction of the first slide rail 32. When the workpiece 200 follows the indexing plate 1 to move to the detection area of ​​the defect detection component 2, the first motor 312 drives the first rotating block 313 to rotate, so that the two clamping jaws 33 move closer to or farther from each other, thereby clamping the workpiece 200 in the detection area of ​​the defect detection component 2. The workpiece 200 is clamped by the clamping jaws 33, so that the placement position of the workpiece 200 on the placement table 11 is finely adjusted to ensure that the CCD camera can obtain a clear and complete image.

[0094] Furthermore, the first positioning assembly 3 also includes a first photoelectric sensor 34 and a first blocking sheet 35 .

[0095] The first photoelectric sensor 34 is disposed on the first mounting frame 311. The first blocking piece 35 is connected to one of the clamping jaws 33. When the two clamping jaws 33 move closer to or farther from each other, the first blocking piece 35 moves with the clamping jaws 33, so that the first photoelectric sensor 34 switches between the first state and the second state.

[0096] In the first state, the first blocking sheet 35 is located between the emitter and the receiver of the first photosensor 34 , and blocks the light emitted by the emitter of the first photosensor 34 .

[0097] In the second state, the first blocking sheet 35 does not block the light emitted by the emitter of the first photosensor 34 .

[0098] According to the state change of the first photoelectric sensor 34, the position of the clamping jaws 33 can be determined. For example, it can be set that in the first state, the two clamping jaws 33 of the first positioning component 3 do not clamp the workpiece 200 in the detection area of ​​the defect detection component 2, and in the second state, the two clamping jaws 33 of the first positioning component 3 clamp the workpiece 200 in the detection area of ​​the defect detection component 2. Therefore, it is possible to determine whether the clamping jaws 33 have clamped the workpiece 200 according to the state of the first photoelectric sensor 34, so as to achieve accurate positioning of the workpiece 200, and also avoid problems such as damage to the workpiece 200 or unreliable clamping caused by excessive or insufficient clamping force of the clamping jaws 33 on the workpiece 200.

[0099] After the defect detection is completed, the workpiece 200 follows the indexing plate 1 to move to the test workpiece 200, and then the second positioning component 4 clamps and limits the workpiece 200 at the test station to prevent the workpiece 200 from moving during the test. The structure of the second positioning component 4 can refer to the structure of the first positioning component 3.

[0100] like Figure 1 , Figure 5and Figure 6 As shown, the bottom test module 51 of the test assembly 5 includes a test drive unit 511 , a second mounting frame 512 , a second slide rail 513 , a connecting frame 514 and a probe 515 .

[0101] The second slide rail 513 is vertically disposed on the second mounting frame 512 , the connecting frame 514 is slidably disposed on the second slide rail 513 , the probe 515 is disposed on the connecting frame 514 ; and the test driving unit 511 is connected to the connecting frame 514 .

[0102] The test drive unit 511 includes a second motor 5111, a second rotating block 5112 and a connecting rod 5113. The second motor 5111 is connected to the second rotating block 5112 and is used to drive the second rotating block 5112 to rotate. One end of the connecting rod 5113 is rotatably connected to the second rotating block 5112, and the other end is rotatably connected to the connecting frame 514. The connection portion between the connecting rod 5113 and the second rotating block 5112 is eccentrically arranged compared to the rotation axis of the second rotating block 5112.

[0103] When the second motor 5111 drives the second rotating block 5112 to rotate, the connecting rod 5113 drives the connecting frame 514 to slide along the direction of the second slide rail 513, thereby lifting the probe 515. When the probe 515 rises, it can contact the pins at the bottom of the workpiece 200 located on the test station, thereby making the workpiece 200 emit light.

[0104] The integrating sphere 52 of the test assembly 5 is located above the test station. A diffuse reflection coating and an optical detector are provided inside the integrating sphere 52. The light emitted by the workpiece 200 enters the integrating sphere 52 and undergoes diffuse reflection to form a uniform light field. Then, an optical detector such as a photodiode converts the light signal into an electrical signal, and then the optical parameters are analyzed based on the electrical signal.

[0105] Furthermore, the bottom detection module 51 also includes a second photoelectric sensor 516 and a second blocking sheet 517 .

[0106] The second photoelectric sensor 516 is disposed on the second mounting frame 512. The second blocking piece 517 is connected to the connecting frame 514. When the connecting frame 514 slides along the direction of the second slide rail 513, the second photoelectric sensor 516 switches between the third state and the fourth state.

[0107] In the third state, the probe 515 is in contact with the workpiece 200 , and the second blocking sheet 517 is located between the emitter and the receiver of the second photoelectric sensor 516 , and blocks the light emitted by the emitter of the second photoelectric sensor 516 .

[0108] In the fourth state, the probe 515 is not in contact with the workpiece 200 , and the second blocking sheet 517 does not block the emitter of the second photoelectric sensor 516 .

[0109] According to the state of the second photoelectric sensor 516 , it is possible to determine whether the probe 515 has reached a position where it can contact the workpiece 200 , thereby ensuring that the testing process can be carried out stably.

[0110] like Figure 1 , Figure 7 and Figure 8 As shown, the spectrometer ball head bottom measuring device also includes a blanking component 6.

[0111] The feeding assembly 6 includes a nozzle 61 and a feeding pipe 62 . The feeding pipe 62 is arranged at an angle. The nozzle 61 is arranged toward the higher end of the feeding pipe 62 . The nozzle 61 is used to spray a medium to push the workpiece 200 into the feeding pipe 62 .

[0112] Specifically, after the workpiece 200 is inspected, the dividing plate 1 drives the workpiece 200 to move between the nozzle 61 and the discharge pipe 62. The nozzle 61 is connected to an air pump, so that the nozzle 61 can blow the inspected workpiece 200 into the discharge pipe 62 by spraying gas, thereby quickly completing the discharge.

[0113] Furthermore, there are multiple blanking assemblies 6, and the multiple blanking assemblies 6 are evenly spaced and arranged along the circumferential direction with the rotation axis of the dividing plate 1 as the central axis.

[0114] A plurality of trays for accommodating workpieces 200 of different quality grades are placed around the indexing plate 1. The plurality of unloading components 6 correspond to the plurality of trays one by one, and the lower ends of the unloading pipes 62 of the unloading components 6 are connected to the corresponding trays. After the workpieces 200 are tested, they can be moved to the position of the corresponding unloading component 6 according to the quality grade, and flow into the trays of the corresponding grade through the corresponding unloading pipes 62, so as to quickly complete the classification of workpieces 200 of different quality grades.

[0115] Example 2

[0116] The difference between this embodiment and the first embodiment is that the placement table 11 and the bottom measuring module 51 are improved.

[0117] like Figure 1 , Figure 5 and Fig. 9 As shown, specifically, the side wall of the placement platform 11 has a plurality of planes facing different directions.

[0118] The bottom detection module 51 further includes a third photoelectric sensor 518, which is disposed on the connecting frame 514. The light emitted by the emitter of the third photoelectric sensor 518 is in the horizontal direction. When the connecting frame 514 slides along the direction of the second slide rail 513, the third photoelectric sensor 518 switches between the fifth state and the sixth state.

[0119] In the fifth state, the light emitted by the emitter of the third photoelectric sensor 518 can be reflected by one of the planes of the side walls of the placement table 11 corresponding to the workpiece 200 located at the testing station, and received by the receiver of the third photoelectric sensor 518 .

[0120] In the sixth state, the light emitted by the emitter of the third photoelectric sensor 518 passes through the top of the placement table 11 corresponding to the workpiece 200 located at the testing station.

[0121] Specifically, when the third photoelectric sensor 518 follows the connection frame 514 to rise to the height of the placement table 11, the light emitted by the transmitter of the third photoelectric sensor 518 can be irradiated on the side wall of the placement table 11. At this time, if the placement table 11 is in the target position (directly below the test station), the light can be reflected back by one of the planes of the side walls of the placement table 11 that is directly opposite to the third photoelectric sensor 518, and received by the receiver of the third photoelectric sensor 518. On the contrary, if the receiver does not receive the reflected light, it indicates that the placement table 11 is likely not to be accurately moved to the target position. According to the state of the third photoelectric sensor 518, it can help determine whether the placement table 11 is accurately moved to the target position in the horizontal direction, and then help to achieve accurate positioning of the placement table 11 and the workpiece 200.

[0122] When the placement table 11 is at the target position, the receiver of the third photoelectric sensor 518 in the fifth state can receive the reflected light. At this time, the third photoelectric sensor 518 further rises with the connecting frame 514, and the third photoelectric sensor 518 reaches the sixth state. The light emitted by the transmitter of the third photoelectric sensor 518 will not be blocked by the placement table 11, so the third photoelectric sensor 518 will not receive the reflected light. Therefore, according to the height of the third photoelectric sensor 518, the receiver will not receive the reflected light, so that the top height of the placement table 11 can be judged, that is, according to the state of the third photoelectric sensor 518, it can help to judge the top height of the placement table 11, which is convenient for fine control of the lifting and lowering of the probe 515, avoiding the difference in the top height of different placement tables 11 due to the size difference of different placement tables 11, and then causing the problem of excessive or insufficient rise of the probe 515.

[0123] Furthermore, the third photoelectric sensor 518 can be used to adjust the height of each placement table 11 to ensure that each workpiece 200 is at the same height during testing.

[0124] Finally, the other structures and beneficial effects of this embodiment are the same as those of Embodiment 1, and thus will not be described in detail here.

Claims

1. A spectrometer ball head bottom measurement device, characterized in that: include: A dividing plate (1), wherein a plurality of placement tables (11) for placing workpieces (200) are evenly spaced along the circumference of the dividing plate (1), and the dividing plate (1) is capable of rotating along its own axis, so that the workpiece (200) located on the placement table (11) moves to a testing station; A defect detection component (2) used to detect defects on the workpiece (200) before it arrives at the testing station; A first positioning component (3) used for clamping and limiting the workpiece (200) to be visually inspected; A testing assembly (5) comprising a bottom testing module (51) and an integrating sphere (52), wherein the bottom testing module (51) is used to contact the workpiece (200) located at the testing station and make the workpiece (200) emit light; and the integrating sphere (52) is used to test the luminous workpiece (200); A second positioning assembly (4) used for clamping and limiting the workpiece (200) at the testing station; The first positioning assembly (3) comprises a positioning drive unit (31), two first slide rails (32) and two clamping claws (33); The two first slide rails (32) are parallel to each other, and the two clamping claws (33) are slidably disposed on the two first slide rails (32) in a one-to-one correspondence; The two clamping jaws (33) are both connected to the positioning drive unit (31), and the positioning drive unit (31) is used to drive the clamping jaws (33) to slide along the direction of the first slide rail (32), so that the two clamping jaws (33) are moved closer to or farther away from each other; The positioning drive unit (31) comprises a first mounting frame (311), a first motor (312), a first rotating block (313), two transmission columns (314) and two bearings (315); The first motor (312) is disposed on the first mounting frame (311) and connected to the first rotating block (313); One of the transmission columns (314) is rotationally connected to the first rotating block (313) via one of the bearings (315), and the other transmission column (314) is rotationally connected to the first rotating block (313) via another of the bearings (315); The two bearings (315) are both slidably connected to the first rotating block (313); One of the transmission columns (314) is connected to one of the clamping jaws (33), and the other transmission column (314) is connected to the other clamping jaw (33); The first positioning component (3) further comprises a first photoelectric sensor (34) and a first blocking sheet (35); The first blocking sheet (35) is connected to one of the clamping jaws (33), and when the two clamping jaws (33) move closer to or farther from each other, the first photoelectric sensor (34) switches between a first state and a second state; In the first state, the first blocking sheet (35) is located between the transmitter and the receiver of the first photoelectric sensor (34), and blocks the light emitted by the transmitter of the first photoelectric sensor (34); In the second state, the first blocking sheet (35) does not block the light emitted by the emitter of the first photosensor (34); The bottom test module (51) comprises a test drive unit (511), a second mounting frame (512), a second slide rail (513), a connecting frame (514) and a probe (515); The second slide rail (513) is vertically arranged on the second mounting frame (512), the connecting frame (514) is slidably arranged on the second slide rail (513), and the probe (515) is arranged on the connecting frame (514); The test drive unit (511) is connected to the connecting frame (514), and is used to drive the connecting frame (514) to slide along the direction of the second slide rail (513); The side wall of the placement platform (11) has a plurality of planes facing in different directions; The bottom detection module (51) further comprises a third photoelectric sensor (518), wherein the third photoelectric sensor (518) is arranged on the connecting frame (514), and when the connecting frame (514) slides along the direction of the second slide rail (513), the third photoelectric sensor (518) switches between a fifth state and a sixth state; In the fifth state, light emitted by the transmitter of the third photoelectric sensor (518) can be reflected by one of the planes of the side wall of the placement table (11) corresponding to the workpiece (200) located at the test station, and is received by the receiver of the third photoelectric sensor (518); In the sixth state, light emitted by the emitter of the third photoelectric sensor (518) passes through the top of the placement table (11) corresponding to the workpiece (200) located at the testing station.

2. The spectrometer ball head bottom measurement device according to claim 1, characterized in that: The test drive unit (511) comprises a second motor (5111), a second rotating block (5112) and a connecting rod (5113); The second motor (5111) is connected to the second rotating block (5112) and is used to drive the second rotating block (5112) to rotate; One end of the connecting rod (5113) is rotatably connected to the second rotating block (5112), and the other end is rotatably connected to the connecting frame (514); a connection portion between the connecting rod (5113) and the second rotating block (5112) is eccentrically arranged relative to a rotation axis of the second rotating block (5112).

3. The spectrometer ball head bottom measurement device according to claim 1, characterized in that: The spectrometer ball head bottom measurement device also includes a blanking component (6); The material discharge assembly (6) comprises a nozzle (61) and a material discharge pipe (62); the material discharge pipe (62) is arranged at an angle; the nozzle (61) is arranged toward a higher end of the material discharge pipe (62); the nozzle (61) is used to spray a medium so as to push the workpiece (200) into the material discharge pipe (62).

4. The spectrometer ball head bottom measurement device according to claim 3, characterized in that: The number of the blanking assemblies (6) is multiple, and the multiple blanking assemblies (6) are arranged evenly spaced along the circumferential direction with the rotation axis of the indexing plate (1) as the central axis.

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