Photovoltaic cell performance in-situ high-throughput characterization device and method

Abstract

The invention belongs to the technical field of photovoltaic measurement, and particularly relates to a photovoltaic cell performance in-situ high-throughput characterization device and method. The device comprises a control unit, a J-V testing system, a microscopic steady-state photoluminescence / transient fluorescence imaging system, a multi-external-field control system and a high-throughput sample cavity, the high-throughput sample cavity is fixedly arranged on a two-dimensional translation table, and the two-dimensional translation table is fixedly arranged on a large-stroke linear displacement table; the high-throughput sample cavity comprises a sample chamber, a plurality of sample accommodating positions are arranged in the sample chamber, a quartz glass cover used for sealing the sample chamber is arranged above the sample chamber, and an air inlet used for adjusting humidity and atmosphere is formed in the cavity wall of the high-throughput sample cavity; according to the invention, various parameters of the photovoltaic cell can be measured, the measurement efficiency is high, and the device is simple in structure.

Description

Technical Field

[0001] The present invention belongs to the technical field of photovoltaic measurement, and in particular relates to an in-situ high-throughput characterization device and method for photovoltaic cell performance. Background Art

[0002] In recent years, new high-efficiency photovoltaic cell technologies such as perovskites and organic photovoltaics have been widely studied, and stability is a major challenge hindering commercialization. Water, oxygen, temperature, ultraviolet rays, and device operating voltage will have a certain impact on the stability of the device. In-situ real-time detection of the comprehensive photoelectric performance of photovoltaic devices is of great significance. There are already some in-situ testing devices and methods in the prior art, such as Chinese patent CN201811342609.1, which involves a device for detecting perovskite films using photoluminescence, including a photoluminescence monitoring device and a detection and analysis system. By monitoring the performance parameters of the perovskite film during the production process, the reaction process is controlled, and the repeatability of the production of each batch of perovskite film is improved; Chinese patent CN202211367660.4 discloses an in-situ detection device and method for the crystallization state during the operation of a perovskite cell, which can realize the detection of perovskite photovoltaic cells at different temperatures and different Detection of corresponding changes in the real-time coupling of the film structure and the current-voltage characteristic curve during the working process under the same atmosphere conditions; Chinese patent CN202211205101.3 describes an in-situ monitoring method and system for the mechanism of an all-inorganic perovskite solar cell. A laser light source is used to irradiate and scan the Raman spectrum of the solar cell in a working state, while collecting the Raman spectrum and testing the photovoltaic performance of the battery. The obtained Raman spectrum and the corresponding IV volt-ampere characteristic curve are subjected to data processing and analysis to achieve in-situ real-time characterization of the internal interface of the all-inorganic perovskite solar cell.

[0003] However, the above-mentioned measurement devices in the prior art all have the disadvantages of single measurement parameters, limited control over external field conditions, and inability to achieve comprehensive testing under superposition of multiple external field conditions. In addition, under multiple test requirements, samples cannot be tested in parallel, resulting in low test efficiency. Therefore, it is necessary to provide an in-situ high-throughput characterization device for photovoltaic cell performance to improve sample measurement efficiency. Summary of the invention

[0004] In order to solve the technical problems of single measurement parameters and low measurement efficiency of measurement devices in the prior art, the present invention proposes an in-situ high-throughput characterization device and method for photovoltaic cell performance, so as to realize integrated JV test, microscopic steady-state photoluminescence imaging test, and microscopic transient fluorescence imaging test, and obtain relevant optical and electrical parameter information of photovoltaic cells.

[0005] In order to solve the above technical problems, the technical solution adopted by the present invention is: an in-situ high-throughput characterization device for photovoltaic cell performance, comprising: a control unit, a JV test system, a microscopic steady-state photoluminescence / transient fluorescence imaging system, a multi-field control system and a high-throughput sample chamber, wherein the high-throughput sample chamber is fixedly arranged on a two-dimensional translation stage, and the two-dimensional translation stage is fixedly arranged on a large-stroke linear displacement stage;

[0006] The high-throughput sample chamber comprises a sample chamber, a plurality of sample accommodating positions are arranged in the sample chamber, a quartz glass cover for sealing the sample chamber is arranged above the sample chamber, and an air inlet for adjusting humidity and atmosphere is arranged on the wall of the high-throughput sample chamber;

[0007] The long-stroke linear translation stage is used to move the high-throughput sample cavity to the JV testing system or the microscopic steady-state photoluminescence / transient fluorescence imaging system; the JV testing system is used to perform parallel JV testing on all samples to be tested to obtain their electrical parameters, and the microscopic steady-state photoluminescence / transient fluorescence imaging system is used to measure the microscopic steady-state photoluminescence spectrum and transient fluorescence spectrum of the samples to be tested; the two-dimensional translation stage is used to two-dimensionally move the high-throughput sample cavity so that the photovoltaic cell test area therein is aligned with the measurement position; the multi-external field control system is used to control the temperature, light, humidity and atmosphere in the high-throughput sample cavity, and the JV testing system is also used to control the voltage of the sample in the high-throughput sample cavity.

[0008] The microscopic steady-state photoluminescence / transient fluorescence imaging system comprises: a first laser, a second laser, a spectroscope, a photomultiplier detector, a spectroscopic component, a camera, a CCD, and a time-correlated single-photon counter. The continuous laser output by the first laser or the pulsed laser output by the second laser is incident vertically on the surface of the sample to be tested in the sample chamber after passing through the spectroscope. The light emitted from the surface of the sample to be tested is divided into three beams by the spectroscopic component, one of which is received by the photomultiplier tube, another is received by the CCD, and the third is received by the camera.

[0009] When measuring the photoluminescence spectrum, the time-correlated single photon counter is used to generate the photoluminescence spectrum according to the time interval between the photoluminescence detected by the CCD and the continuous laser output by the first laser; when measuring the transient fluorescence spectrum, the time-correlated single photon counter is used to generate the transient fluorescence spectrum according to the time interval between the fluorescence photons detected by the photomultiplier detector and the pulsed laser output by the second laser.

[0010] The photovoltaic cell performance in-situ high-throughput characterization device further includes a two-dimensional translation stage scanning controller, and the two-dimensional translation stage scanning controller is used to control the movement of the two-dimensional translation stage;

[0011] The camera is used to observe the sample surface morphology, and the control module is used to control the movement of the two-dimensional translation stage through the two-dimensional translation stage scanning controller according to the camera image so that the photovoltaic cell in the high-throughput sample chamber aligns its test area with the measurement position.

[0012] The first laser is a continuous laser, and the second laser is a picosecond pulse laser.

[0013] The JV test system includes: an illumination control module, a shutter, and a solar simulator. The illumination control module is used to control the solar simulator to emit a continuous spectrum to illuminate the sample in the high-throughput sample chamber, and the shutter is used to control the solar simulator to perform a light-dark cycle.

[0014] The multi-field control system includes a temperature control module, a humidity control module and an atmosphere control module;

[0015] The high-throughput sample chamber is provided with a temperature and humidity sensor, a first circuit board and a second circuit board, the first circuit board is provided with a plurality of sample accommodating positions, and a peltier element is provided at the bottom; a spring-loaded gold pin that cooperates with the sample to be tested is provided on the outer side of the sample accommodating position; the first circuit board is also provided with a first FPC cable; the second circuit board is provided with a second FPC cable and a horn interface connected to the second FPC cable; the horn interface is used to connect to the JV test system; the first FPC cable is connected to the second FPC cable, thereby realizing the electrical connection between the sample to be tested and the JV test system;

[0016] The output end of the temperature and humidity sensor is connected to the input ends of the temperature control module and the humidity control module, and the output end of the temperature control module is connected to the peltier element;

[0017] A first pipe and a second pipe are arranged on the vent hole on the high-throughput sample chamber, the first pipe is used to connect the dry gas pipeline, the second pipe is used to connect the water vapor, and the output ends of the atmosphere control module and the humidity control module are respectively connected to the pressure valves on the first pipe and the second pipe, so as to control the atmosphere pressure and humidity in the high-throughput sample chamber.

[0018] The photovoltaic cell performance in-situ high-throughput characterization device comprises a plurality of high-throughput sample chambers, each of which is fixedly arranged on the two-dimensional translation stage, and the two-dimensional translation stage is an XY precision displacement stage with a stepping distance less than 100 nm.

[0019] In addition, the present invention also provides a method for in-situ high-throughput characterization of photovoltaic cell performance, which is implemented based on the device and includes the following steps:

[0020] Step 1: Control the long-stroke linear translation stage to move the high-throughput sample chamber to the measurement position of the microscopic steady-state photoluminescence / transient fluorescence imaging system or the JV test system;

[0021] Step 2: Set the external field conditions in the sample cavity and perform measurements using a microscopic steady-state photoluminescence / transient fluorescence imaging system or a JV test system;

[0022] The method of moving to the measurement area of ​​the microscopic steady-state photoluminescence / transient fluorescence imaging system for measurement is as follows:

[0023] Step 2.1.1: Control the movement of the two-dimensional translation stage to align the sample to be tested with the laser spot of the microscopic steady-state photoluminescence / transient fluorescence imaging system; obtain the steady-state photoluminescence spectrum and transient fluorescence spectrum of the sample through the microscopic steady-state photoluminescence / transient fluorescence imaging system;

[0024] Step 2.1.2: Control the movement of the two-dimensional platform to align other samples to be measured with the laser spot of the microscopic steady-state photoluminescence / transient fluorescence imaging system, and repeat the measurement until the steady-state photoluminescence spectra and transient fluorescence spectra of all samples are obtained;

[0025] The method for moving to the measurement area of ​​the JV test system for measurement is as follows:

[0026] Step 2.2.1: Control the movement of the two-dimensional platform to achieve alignment between the high-throughput sample chamber and the measurement area of ​​the JV test system;

[0027] Step 2.2.2: Set the lighting conditions and measurement conditions, and control the JV test system to perform the test;

[0028] Step 2.2.3: Calculate the electrical parameters of the sample to be tested based on the test results of the JV test system.

[0029] In step 2, the external field conditions set in the sample chamber include: at least one of applied voltage, light, humidity, temperature, and atmosphere;

[0030] In step 2.2.3, the electrical parameters calculated include: open circuit voltage (V oc ), short circuit current (J sc ), fill factor (FF), and photoelectric conversion efficiency (PCE).

[0031] In step 2.1.1, the specific method for achieving laser spot alignment is:

[0032] Step 2.1.11: Obtain a sample surface photo and perform image recognition to obtain the positions of the laser spot and the sample in the image;

[0033] Step 2.1.12: Calculate the deviation between the laser spot and the sample measurement area according to the pixel conversion, and determine whether it is greater than the set threshold. If so, control the two-dimensional translation stage to perform reverse movement compensation;

[0034] Step 2.1.13: Return to step 2.2.11, reacquire the sample surface photo and perform image recognition until the deviation value between the laser spot and the sample measurement area is less than the threshold.

[0035] Compared with the prior art, the present invention has the following beneficial effects:

[0036] 1. The present invention provides an in-situ high-throughput characterization device and method for photovoltaic cell performance. The JV test system and the microscopic steady-state photoluminescence / transient fluorescence imaging system are realized in parallel through a long-stroke linear translation stage, overcoming the technical difficulties of incompatibility of various measurement systems and inability to measure simultaneously, realizing integrated JV test, microscopic steady-state photoluminescence imaging test, and microscopic transient fluorescence imaging test, and obtaining relevant optical and electrical parameter information of photovoltaic cells;

[0037] 2. The present invention transforms the high-throughput sample chamber so that it can not only measure multiple photovoltaic samples in parallel, thereby improving the measurement efficiency, but also the temperature, humidity, atmosphere, and voltage conditions of the samples in the high-throughput sample chamber can be controlled, thereby achieving comprehensive control of field test conditions and improving test convenience and test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 A schematic diagram of the structure of an in-situ high-throughput characterization device for photovoltaic cell performance provided in Example 1 of the present invention;

[0039] Figure 2 This is a schematic diagram of the structure of a high-throughput sample chamber in Embodiment 1 of the present invention;

[0040] Figure 3 Schematic diagram of the structure of the microscopic steady-state photoluminescence / transient fluorescence imaging system in Embodiment 1 of the present invention; Figure 3 In the figure, the dotted line is the optical path and the solid line is the circuit;

[0041] Figure 4 is a schematic diagram of the layout of the first circuit board in the first embodiment of the present invention;

[0042] Figure 5 is a schematic diagram of the layout of the second circuit board in the first embodiment of the present invention;

[0043] Figure 6 This is a schematic diagram of the process of an in-situ high-throughput characterization method for photovoltaic cell performance provided in the second embodiment of the present invention. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all the embodiments; based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0045] Embodiment 1

[0046] like Figure 1 As shown, Embodiment 1 of the present invention provides an in-situ high-throughput characterization device for photovoltaic cell performance, comprising: a control unit, a JV testing system, a microscopic steady-state photoluminescence / transient fluorescence imaging system, a multi-field control system and a high-throughput sample chamber, wherein the high-throughput sample chamber is fixedly arranged on a two-dimensional translation stage, and the two-dimensional translation stage is fixedly arranged on a large-stroke linear displacement stage.

[0047] like Figure 2 As shown, in this embodiment, the high-throughput sample chamber includes a sample chamber 1, and a plurality of sample accommodating positions are arranged in the sample chamber 1, each of which can hold a sample, and multiple sample accommodating positions can improve the measurement efficiency. A quartz glass cover 2 for sealing the sample chamber 1 is arranged above the sample chamber 1, and the laser and light outside the sample chamber 1 act on the sample through the quartz glass cover, and an air inlet 3 for adjusting the humidity and atmosphere is arranged on the wall of the high-throughput sample chamber.

[0048] Specifically, in this embodiment, the large-stroke linear translation stage is used to move the high-throughput sample chamber to the JV testing system or the microscopic steady-state photoluminescence / transient fluorescence imaging system; the JV testing system is used to perform JV testing on the sample to be tested to obtain its electrical parameters, and the microscopic steady-state photoluminescence / transient fluorescence imaging system is used to measure and obtain the microscopic steady-state photoluminescence / transient fluorescence spectrum of the sample to be tested; the two-dimensional translation stage is used to two-dimensionally move the high-throughput sample chamber so that the photovoltaic cell test area therein is aligned with the measurement position; the multi-external field control system is used to control the illumination, temperature, humidity and atmosphere in the high-throughput sample chamber, and the JV testing system is also used to control the voltage of the sample in the high-throughput sample chamber.

[0049] Specifically, Figure 3As shown, in this embodiment, the microscopic steady-state photoluminescence / transient fluorescence imaging system includes: a first laser, a second laser, a first spectroscope 5, a photomultiplier detector, a spectroscopic component, a camera, a CCD, and a time-correlated single-photon counter. The laser light output by the first laser or the second laser passes through the first spectroscope 5 and is vertically incident on the surface of the sample to be tested in the sample chamber. The photoluminescence formed on the surface of the sample to be tested is divided into three beams by the spectroscopic component, one of which is received by the photomultiplier tube, another is received by the CCD, and the third is received by the camera.

[0050] Specifically, the light splitting component includes a second beam splitter 4 and a third beam splitter 6, wherein the second beam splitter 4 is arranged between the first beam splitter 5 and the sample, and splits the light emitted by the sample to be tested into two beams, the first beam is received by the camera after being reflected by the second beam splitter 4, and the camera can obtain a morphological photo of the sample surface. The second beam is transmitted by the first beam splitter and then split into two beams by the third beam splitter 6, one of which is received by the photomultiplier detector after being transmitted by the third beam splitter 6, and the other is received by the CCD after being reflected by the third beam splitter.

[0051] Specifically, Figure 3 As shown, when the steady-state photoluminescence spectrum is measured, the first laser output by the first laser is a continuous laser, which is incident on and focused on the sample surface after passing through the first beam splitter and the second beam splitter, and the photoluminescence generated on the sample surface is incident on the CCD for reception after passing through the second beam splitter, the first beam splitter, and the third beam splitter in sequence; the time-correlated single-photon counter is used to generate a steady-state photoluminescence spectrum according to the time interval between the photoluminescence detected by the CCD and the first laser; as shown Figure 3 As shown, when measuring the transient fluorescence spectrum, the second laser output by the second laser is a pulsed laser, which is incident on and focused on the sample surface after passing through the first beam splitter and the second beam splitter, and the fluorescence photons generated on the sample surface are incident on the photomultiplier detector after passing through the second beam splitter, the first beam splitter, and the third beam splitter in sequence, and are received by the photomultiplier detector. The time-correlated single photon counter is used to generate a transient fluorescence spectrum according to the time interval between the fluorescence photons detected by the photomultiplier detector and the second laser.

[0052] Furthermore, a focusing lens and a filter 7 are provided between the third beam splitter and the sample to be measured. The filter 7 is used to filter out stray light, and the focusing lens is used to converge the laser onto the sample surface.

[0053] Specifically, in this embodiment, the first laser is a continuous light laser, the first laser wavelength of which is 450nm, and the second laser is a picosecond pulse laser, the second laser wavelength of which is 405nm. In addition, the wavelengths of the first laser and the second laser can also be selected from other wavelengths as needed.

[0054] Furthermore, in this embodiment, a two-dimensional translation stage scanning controller is also included, and the two-dimensional translation stage scanning controller is used to control the movement of the two-dimensional translation stage; the camera is used to observe the surface morphology of the sample, and the control module is used to control the movement of the two-dimensional translation stage through the two-dimensional translation stage scanning controller based on the image of the camera so that the photovoltaic cell in the high-throughput sample chamber aligns its test area with the measurement position.

[0055] Furthermore, if Figure 1 As shown, the JV test system includes: an illumination control module, a shutter, and a solar simulator. The illumination control module is used to control the solar simulator to emit a continuous spectrum to illuminate the sample in the high-throughput sample chamber, and the shutter is used to control the solar simulator to perform light-dark cycles. In addition, the JV test system also includes measurement electronic equipment and a voltage control module. The voltage control module is connected to the high-throughput sample chamber through a data line, thereby controlling the voltage of the sample to be tested, and realizing the switching of the sample's short circuit, open circuit, constant voltage, and MPPT tracking mode.

[0056] The solar simulator is a light source composed of a high-power, high-density LED array. The spot size is greater than 80mm, the effective size of the A-level spot is 80mm, and the light intensity is 0-210mW / cm 2 (2.1sun) can be adjusted continuously at will. The heat dissipation of LED light source is high-power air cooling to ensure service life and light stability. The spectrum is from 400-800nm, continuous spectrum. Other solar simulators or light sources can also be selected as needed to adjust the illumination intensity and band of the sample. The shutter set by the system can run a light-dark cycle on the sample cavity, and the duration of the illumination and dark phases can be controlled. Continuous JV scanning can be performed under light-dark cycle conditions, constant voltage JV scanning under illumination conditions, or MPPT tracking JV scanning under illumination conditions.

[0057] Specifically, in this embodiment, Figure 1 As shown, the multi-field control system includes a temperature control module, a humidity control module and an atmosphere control module. The high-throughput sample chamber is provided with a temperature and humidity sensor, a first circuit board and a second circuit board, such as Figure 4 As shown, four sample receiving positions 9 are arranged on the first circuit board, and a peltier element is arranged at the bottom of the first circuit board; a plurality of spring-loaded gold pins 10 are arranged outside the sample receiving positions to match the sample to be tested; and a first FPC cable 11 connected to the spring-loaded gold pin circuit is also arranged on the first circuit board. If there are four batteries in each sample receiving position 9, four spring-loaded gold pins 10 are arranged on both sides of the sample receiving position 9 to connect the positive and negative electrodes of each battery respectively. The temperature and humidity sensor can be located at the center between each sample receiving position 9.

[0058] like Figure 5 As shown, the second circuit board is provided with a second FPC cable 12 and a plurality of horn interfaces 13 connected to the second FPC cable; each of the horn interfaces 13 is used to connect to the JV test system; the first FPC cable is connected to the second FPC cable, thereby realizing the electrical connection between the sample to be tested and the JV test system; the output end of the temperature and humidity sensor is connected to the input end of the temperature control module and the humidity control module, and the output end of the temperature control module is connected to the peltier element. In addition, the illumination control module of the JV test system also forms one of the external field parameter control modules of the high-throughput sample chamber. By controlling the output intensity and band of the solar simulator through the illumination control module, the external field illumination intensity and band of the sample can be adjusted.

[0059] Specifically, the sample chamber is connected to the measurement electronics via a small computer system interface (SCSI) cable, which controls the voltage of the sample in the chamber: MPPT, short circuit, open circuit, and constant voltage. In constant voltage mode, the voltage can only be set between 0V and V oc The value between .

[0060] In addition, in this embodiment, a first pipe and a second pipe are provided on the vent hole on the high-throughput sample chamber, the first pipe is used to connect the dry gas pipeline, and the second pipe is used to connect the bubbling bottle. The water vapor generated by the bubbling bottle enters through the second pipe to adjust the humidity in the chamber, and the output ends of the atmosphere control module and the humidity control module are respectively connected to the pressure valves on the first pipe and the second pipe to control the atmosphere pressure and humidity in the high-throughput sample chamber.

[0061] Furthermore, if Figure 2 As shown, a heat exhaust fan 8 is also provided at the bottom of the high-throughput sample chamber to exhaust the heat generated by the peltier element to ensure rapid temperature control. The humidity control module can specifically be a mass flow controller (MFC), and the high-throughput sample chamber controls the relative humidity through water vapor and dry gas pipelines, wherein the wet line flow introduces moisture through a bubbling bottle, and the mass flow controller controls the humidity environment in the chamber by adjusting the flow rate on the first pipeline. In addition, an exhaust port is also provided on the other side of the high-throughput sample chamber opposite to the air inlet 3.

[0062] Furthermore, in this embodiment, the control unit is a computer, which is electrically connected to the JV test system, the microscopic steady-state photoluminescence / transient fluorescence imaging system, the multi-field control system, the two-dimensional translation stage and the long-stroke linear displacement stage through a data line to achieve centralized control of each system. Specifically, the control unit can achieve laser output control of the microscopic steady-state photoluminescence / transient fluorescence imaging system, data acquisition of the time-correlated single photon counter, test process control of the JV test system, temperature, atmosphere, humidity control of the multi-field control system, and sample voltage control, as well as motion control of the two-dimensional translation stage and the long-stroke linear displacement stage.

[0063] Furthermore, a photovoltaic cell performance in-situ high-throughput characterization device of this embodiment includes a plurality of high-throughput sample chambers, each of which is fixedly arranged on the two-dimensional translation stage, and the two-dimensional translation stage is an XY precision translation stage with a stepping distance less than 100 nm. The optical information of different sample chambers, different samples, and different regions can be obtained through the two-dimensional translation stage.

[0064] In this embodiment, the long-stroke linear translation stage can control the moving direction of L high-throughput sample chambers. Each sample chamber can accommodate M devices with N solar cells, and M×N individual solar cells can be measured in parallel. Further, through the long-stroke linear translation stage, L×M×N individual solar cells can be traversed. Optionally, L=4, M=4, N=6, and 96 independent solar cells can be traversed and measured through the long-stroke linear translation stage. Different field test conditions can be applied to each sample chamber. When one sample chamber needs maintenance, the other parts can still operate. The temperature, humidity, atmosphere, illumination, and voltage conditions of the sample in the chamber can be controlled. At the same time, the long-stroke linear translation stage can realize JV testing by moving a specific sample chamber to the illumination control module and to the microscopic steady-state photoluminescence / transient fluorescence imaging system to realize microscopic steady-state photoluminescence imaging testing and microscopic transient fluorescence imaging testing, realizing the parallel operation of the two test systems.

[0065] Embodiment 2

[0066] like Figure 6 As shown, the second embodiment of the present invention provides an in-situ high-throughput characterization method for photovoltaic cell performance, which is implemented based on the device described in the first embodiment and includes the following steps:

[0067] Step 1: Control the long-stroke linear translation stage to move the high-throughput sample chamber to the measurement position of the microscopic steady-state photoluminescence / transient fluorescence imaging system or the JV test system;

[0068] Step 2: Set the external field conditions in the sample chamber, and perform measurements using a microscopic steady-state photoluminescence / transient fluorescence imaging system or a JV test system; in step 2, the external field conditions in the sample chamber set include: at least one of applied voltage, light, humidity, temperature, gas type and pressure.

[0069] Specifically, the method of moving to the measurement area of ​​the microscopic steady-state photoluminescence / transient fluorescence imaging system for measurement is as follows:

[0070] Step 2.1.1: Control the movement of the two-dimensional translation stage to align the sample to be tested with the laser spot of the microscopic steady-state photoluminescence / transient fluorescence imaging system; obtain the steady-state photoluminescence spectrum and transient fluorescence spectrum of the sample through the microscopic steady-state photoluminescence / transient fluorescence imaging system;

[0071] Step 2.1.2: Control the movement of the two-dimensional platform to align other samples to be tested with the laser spot of the microscopic steady-state photoluminescence / transient fluorescence imaging system, and repeat the measurement until the steady-state photoluminescence spectra and transient fluorescence spectra of all samples are obtained.

[0072] The optical band gap is calculated by PL spectrum (photoluminescence spectrum) (optical band gap is defined as the peak position of PL signal); the calculation formula is:

[0073]

[0074] Therefore, the sample absorption coefficient A can be obtained bb , where h is Planck's constant, ω is the angular frequency, c is the fitting variable, and E U The optical band gap and absorption coefficient can be derived from the PL spectrum, and then the information from the spectrum of many points can be used to generate an image.

[0075] TRPL spectroscopy (transient fluorescence spectroscopy) can be used to study carrier radiative recombination. The lifetime can be calculated through TRPL spectroscopy. First, the fluorescence intensity image is obtained using the following formula:

[0076] y(t)=A1*exp(-tτ1)+A2*exp(-tτ2)+y0; (2)

[0077] y(t) represents the fluorescence dynamics process, where τ1 is the fast decay time, τ2 is the slow decay time, A1 and A2 are the corresponding relative amplitudes, y0 is a constant, and t is time. The average fluorescence lifetime image is then obtained by the following formula:

[0078]

[0079] Where τ represents the carrier lifetime.

[0080] In step 2.1.1, the specific method for achieving laser spot alignment is:

[0081] Step 2.1.11: Obtain a sample surface photo and perform image recognition to obtain the positions of the laser spot and the sample in the image;

[0082] Step 2.1.12: Calculate the deviation between the laser spot and the sample measurement area according to the pixel conversion, and determine whether it is greater than the set threshold. If so, control the two-dimensional translation stage to perform reverse movement compensation;

[0083] Step 2.1.13: Return to step 2.2.11, reacquire the sample surface photo and perform image recognition until the deviation value between the laser spot and the sample measurement area is less than the threshold.

[0084] Specifically, the method of moving to the measurement area of ​​the JV test system for measurement is as follows:

[0085] Step 2.2.1: Control the movement of the two-dimensional translation stage to align the high-throughput sample cavity with the measurement area of ​​the JV test system, i.e., its illumination area;

[0086] Step 2.2.2: Set the lighting conditions and measurement conditions, and control the JV test system to perform the test;

[0087] Step 2.2.3: Calculate the electrical parameters of the sample to be tested based on the test results of the JV test system.

[0088] Specifically, in step 2.2.3, the electrical parameters calculated include: open circuit voltage (V oc ), short circuit current (J sc ), fill factor (FF), and photoelectric conversion efficiency (PCE).

[0089] The JV test is to route a single solar cell to a source measurement unit (SMU) through measurement electronics. The SMU unit contains multiple channels and can perform parallel current density-voltage scans (JV scans) on each solar cell at the same time. The scan curve is passed to the computer to obtain the open circuit voltage, short circuit current density, fill factor, photoelectric conversion efficiency and other electrical parameters of the test sample.

[0090] Step 3: Determine whether there are other measurements. If so, control the long-stroke linear translation stage to move to the corresponding position. If not, end the measurement.

[0091] In summary, the present invention provides an in-situ high-throughput characterization device and method for photovoltaic cell performance, which integrates high-throughput multi-field sample aging, multi-channel parallel JV testing, and microscopic steady-state photoluminescence / transient fluorescence imaging functions into a high-throughput characterization test system. The present invention provides multiple field aging conditions, that is, comprehensive test conditions under controllable voltage, light, temperature, atmosphere type, gas pressure, and humidity. The use of a large-stroke linear translation stage can control the movement of multiple sample cavities, and at the same time, a specific sample cavity can be moved to a different test system to achieve JV testing under different lighting conditions and microscopic steady-state photoluminescence / transient fluorescence imaging testing under different laser sources. At the same time, the testing of different areas of the photovoltaic cell is achieved through an X-precision two-dimensional translation stage, providing a guarantee for achieving high-throughput testing. The device of the invention realizes high-throughput testing of multiple devices including JV characterization, microscopic surface characterization, and photoluminescence spectrum characterization. Through the JV test system, continuous JV scanning under light-dark cycle conditions or JV scanning under illumination conditions or short MPPT scanning under illumination conditions are realized to obtain optical parameters such as open circuit voltage, short circuit current density, filling factor, photoelectric conversion efficiency, etc.; through the microscopic steady-state photoluminescence / transient fluorescence imaging system, photoluminescence spectrum characterization is realized, and the microscopic surface characterization of the device is realized through the bright field camera, and the optical band gap and absorption coefficient are obtained through microscopic steady-state photoluminescence imaging; through microscopic transient fluorescence imaging test, carrier lifetime, fluorescence intensity image, and fluorescence lifetime image are obtained. The open circuit voltage, short circuit current density, filling factor, photoelectric conversion efficiency, carrier lifetime, optical band gap, absorption coefficient, fluorescence intensity and fluorescence lifetime related parameter information are obtained from the above tests. Therefore, the present invention can not only realize the measurement of various performance parameters of photovoltaic cells, but also has high measurement efficiency.

[0092] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A photovoltaic cell performance in-situ high-throughput characterization device, characterized in that: include: A control unit, a JV test system, a microscopic steady-state photoluminescence / transient fluorescence imaging system, a multi-field control system and a high-throughput sample chamber, wherein the high-throughput sample chamber is fixedly arranged on a two-dimensional translation stage, and the two-dimensional translation stage is fixedly arranged on a long-stroke linear displacement stage; The high-throughput sample chamber comprises a sample chamber (1), a plurality of sample accommodating positions are arranged in the sample chamber (1), a quartz glass cover (2) for sealing the sample chamber (1) is arranged above the sample chamber (1), and an air inlet (3) for adjusting humidity and atmosphere is arranged on the wall of the high-throughput sample chamber; The long-stroke linear translation stage is used to move the high-throughput sample cavity to the JV testing system or the microscopic steady-state photoluminescence / transient fluorescence imaging system; the JV testing system is used to perform parallel JV testing on all samples to be tested to obtain their electrical parameters, and the microscopic steady-state photoluminescence / transient fluorescence imaging system is used to measure the microscopic steady-state photoluminescence spectrum and transient fluorescence spectrum of the samples to be tested; the two-dimensional translation stage is used to two-dimensionally move the high-throughput sample cavity so that the photovoltaic cell test area therein is aligned with the measurement position; the multi-external field control system is used to control the temperature, light, humidity and atmosphere in the high-throughput sample cavity, and the JV testing system is also used to control the voltage of the sample in the high-throughput sample cavity.

2. The in-situ high-throughput characterization device for photovoltaic cell performance according to claim 1, characterized in that: The microscopic steady-state photoluminescence / transient fluorescence imaging system comprises: a first laser, a second laser, a spectroscope, a photomultiplier detector, a spectroscopic component, a camera, a CCD, and a time-correlated single-photon counter. The continuous laser output by the first laser or the pulsed laser output by the second laser is incident vertically on the surface of the sample to be tested in the sample chamber after passing through the spectroscope. The light emitted from the surface of the sample to be tested is divided into three beams by the spectroscopic component, one of which is received by the photomultiplier tube, another is received by the CCD, and the third is received by the camera. When measuring the photoluminescence spectrum, the time-correlated single photon counter is used to generate the photoluminescence spectrum according to the time interval between the photoluminescence detected by the CCD and the continuous laser output by the first laser; when measuring the transient fluorescence spectrum, the time-correlated single photon counter is used to generate the transient fluorescence spectrum according to the time interval between the fluorescence photons detected by the photomultiplier detector and the pulsed laser output by the second laser.

3. The in-situ high-throughput characterization device for photovoltaic cell performance according to claim 2, characterized in that: Also included is a two-dimensional translation stage scanning controller, the two-dimensional translation stage scanning controller is used to control the movement of the two-dimensional translation stage; The camera is used to observe the sample surface morphology, and the control module is used to control the movement of the two-dimensional translation stage through the two-dimensional translation stage scanning controller according to the camera image so that the photovoltaic cell in the high-throughput sample chamber aligns its test area with the measurement position.

4. The in-situ high-throughput characterization device for photovoltaic cell performance according to claim 2, characterized in that: The first laser is a continuous laser, and the second laser is a picosecond pulse laser.

5. The in-situ high-throughput characterization device for photovoltaic cell performance according to claim 1, characterized in that: The JV test system includes: an illumination control module, a shutter, and a solar simulator. The illumination control module is used to control the solar simulator to emit a continuous spectrum to illuminate the sample in the high-throughput sample chamber, and the shutter is used to control the solar simulator to perform a light-dark cycle.

6. The in-situ high-throughput characterization device for photovoltaic cell performance according to claim 1, characterized in that: The multi-field control system includes a temperature control module, a humidity control module and an atmosphere control module; The high-throughput sample chamber is provided with a temperature and humidity sensor, a first circuit board and a second circuit board, the first circuit board is provided with a plurality of sample accommodating positions, and a peltier element is provided at the bottom; a spring-loaded gold pin that cooperates with the sample to be tested is provided on the outer side of the sample accommodating position; the first circuit board is also provided with a first FPC cable; the second circuit board is provided with a second FPC cable and a horn interface connected to the second FPC cable; the horn interface is used to connect to the JV test system; the first FPC cable is connected to the second FPC cable, thereby realizing the electrical connection between the sample to be tested and the JV test system; The output end of the temperature and humidity sensor is connected to the input ends of the temperature control module and the humidity control module, and the output end of the temperature control module is connected to the peltier element; A first pipe and a second pipe are arranged on the vent hole on the high-throughput sample chamber, the first pipe is used to connect the dry gas pipeline, the second pipe is used to connect the water vapor, and the output ends of the atmosphere control module and the humidity control module are respectively connected to the pressure valves on the first pipe and the second pipe, so as to control the atmosphere pressure and humidity in the high-throughput sample chamber.

7. The in-situ high-throughput characterization device for photovoltaic cell performance according to claim 1, characterized in that: It comprises a plurality of high-throughput sample chambers, each of which is fixedly arranged on the two-dimensional translation stage, and the two-dimensional translation stage is an XY precision displacement stage with a stepping distance less than 100 nm.

8. A method for in-situ high-throughput characterization of photovoltaic cell performance, characterized in that: The device according to any one of claims 1 to 7 is implemented, comprising the following steps: Step 1: Control the long-stroke linear translation stage to move the high-throughput sample chamber to the measurement position of the microscopic steady-state photoluminescence / transient fluorescence imaging system or the JV test system; Step 2: Set the external field conditions in the sample cavity and perform measurements using a microscopic steady-state photoluminescence / transient fluorescence imaging system or a JV test system; The method of moving to the measurement area of ​​the microscopic steady-state photoluminescence / transient fluorescence imaging system for measurement is as follows: Step 2.1.1: Control the movement of the two-dimensional translation stage to align the sample to be tested with the laser spot of the microscopic steady-state photoluminescence / transient fluorescence imaging system; obtain the steady-state photoluminescence spectrum and transient fluorescence spectrum of the sample through the microscopic steady-state photoluminescence / transient fluorescence imaging system; Step 2.1.2: Control the movement of the two-dimensional platform to align other samples to be measured with the laser spot of the microscopic steady-state photoluminescence / transient fluorescence imaging system, and repeat the measurement until the steady-state photoluminescence spectra and transient fluorescence spectra of all samples are obtained; The method for moving to the measurement area of ​​the JV test system for measurement is as follows: Step 2.2.1: Control the movement of the two-dimensional platform to achieve alignment between the high-throughput sample chamber and the measurement area of ​​the JV test system; Step 2.2.2: Set the lighting conditions and measurement conditions, and control the JV test system to perform the test; Step 2.2.3: Calculate the electrical parameters of the sample to be tested based on the test results of the JV test system.

9. The in-situ high-throughput characterization method for photovoltaic cell performance according to claim 8, characterized in that: In step 2, the external field conditions set in the sample chamber include: at least one of applied voltage, light, humidity, temperature, and atmosphere; In step 2.2.3, the electrical parameters calculated include: open circuit voltage, short circuit current, fill factor, and photoelectric conversion efficiency.

10. The in-situ high-throughput characterization method for photovoltaic cell performance according to claim 8, characterized in that: In step 2.1.1, the specific method for achieving laser spot alignment is: Step 2.1.11: Obtain a sample surface photo and perform image recognition to obtain the positions of the laser spot and the sample in the image; Step 2.1.12: Calculate the deviation between the laser spot and the sample measurement area according to the pixel conversion, and determine whether it is greater than the set threshold. If so, control the two-dimensional translation stage to perform reverse movement compensation; Step 2.1.13: Return to step 2.2.11, reacquire the sample surface photo and perform image recognition until the deviation value between the laser spot and the sample measurement area is less than the threshold.

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