Heating device for aging test of crimping type IGBT (Insulated Gate Bipolar Translator) device

By designing a heating device and rotation mechanism for crimped IGBT devices, the problem of uneven heat receiving in the aging test is solved, and uniform heating and rotation of the IGBT devices are achieved, improving the accuracy of the test results and heating efficiency.

CN119511018AActive Publication Date: 2025-02-25BEIJING YUEXIN TECH CO LTD
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Patent Information

Application Number
CN202411721544.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-28
Publication Date
2025-02-25
Estimated Expiration
2044-11-28

AI Technical Summary

Technical Problem

The crimped IGBT device is not accurate enough due to uneven heat during aging tests, and the experimental error is large.

Method used

A crimped IGBT device aging test heating device is designed, including a heating assembly and a rotating mechanism. The heating assembly heats the IGBT device evenly through the heater and the heating coil. The rotating mechanism drives the driving wheel and the driven wheel through the No. 2 motor to mesh, driving the IGBT device to continuously rotate to achieve uniform heating. In addition, an arc-shaped thermal conductor plate is provided in the inner wall of the housing to concentrate heat.

Benefits of technology

Through uniform heating and rotation mechanism, the IGBT device can be heated evenly, improve the accuracy of test results, reduce experimental errors, and improve heating efficiency through arc-shaped thermal conductor plates.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention is suitable for the field of IGBT device aging test, and provides a crimping type IGBT device aging test heating device comprising a housing, a heating assembly arranged in the housing, a placing table arranged on one side of the heating assembly, and an electric telescopic member arranged between the placing table and the inner end surface of the housing; a clamping mechanism is arranged on one side of the placing table, the clamping mechanism can clamp and fix the IGBT device, the clamping mechanism is connected with a rotating mechanism, and the rotating mechanism can drive the IGBT device to rotate continuously. A heating assembly and a heater are started to heat an IGBT device through a heating coil, meanwhile, a rotating mechanism is started, in the rotating mechanism, a second motor is started, the second motor drives a driving wheel to rotate, the driving wheel drives a connecting rod to rotate through meshing with a driven wheel, the connecting rod drives the IGBT device to continuously rotate through an arc-shaped clamp, and therefore the IGBT device is evenly heated.
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Description

Technical Field

[0001] The invention belongs to the field of IGBT device aging test, and in particular relates to a heating device for pressing type IGBT device aging test. Background Art

[0002] IGBT, insulated gate bipolar transistor, is a composite fully controlled voltage-driven power semiconductor device composed of a bipolar transistor and an insulated gate field effect transistor. It has the advantages of high input impedance of metal oxide semiconductor field effect transistor and low conduction voltage drop of power transistor. GTR has low saturation voltage drop and large current density, but large driving current; MOSFET has very low driving power and fast switching speed, but large conduction voltage drop and low current density. IGBT combines the advantages of the above two devices, with low driving power and low saturation voltage drop. It is very suitable for use in converter systems with DC voltage of 600V and above, such as AC motors, inverters, switching power supplies, lighting circuits, traction drives and other fields.

[0003] A heating test is required during the aging test of press-fit IGBT devices. However, since the IGBT devices are easily heated unevenly during the test, the test results are not accurate enough, resulting in large experimental errors.

[0004] In order to avoid the above technical problems, it is necessary to provide a heating device for aging test of a crimped IGBT device to overcome the above defects in the prior art. Summary of the invention

[0005] The purpose of the present invention is to provide a heating device for aging test of crimped IGBT devices, aiming to solve the problem that heating test is required during aging test of crimped IGBT devices, but since IGBT devices are easily heated unevenly during test, the test results are not accurate enough, resulting in large experimental errors.

[0006] The present invention is implemented as follows: a heating device for aging test of a crimped IGBT device comprises a housing and also comprises: A heating component is arranged in the shell, a placing table is arranged on one side of the heating component, and an electric telescopic member is arranged between the placing table and the inner end surface of the shell; A clamping mechanism is provided on one side of the placement table, and the clamping mechanism can clamp and fix the IGBT device. The clamping mechanism is connected to a rotating mechanism, and the rotating mechanism can drive the IGBT device to rotate continuously.

[0007] According to a further technical solution, the clamping mechanism comprises a left sliding frame, a right sliding frame, a driving assembly and a clamp assembly; A mechanism cavity is provided in the shell, and the left sliding frame and the right sliding frame are both slidably connected to the side walls of the mechanism cavity. The driving assembly can drive the left sliding frame and the right sliding frame to move relative to or towards each other. The left sliding frame and the right sliding frame are both connected to a clamp assembly, and the clamp assembly is used to clamp and limit the IGBT device.

[0008] A further technical solution is that the driving assembly includes a No. 1 motor, a rack and a gear, the left sliding frame and the right sliding frame are both fixedly provided with a rack, the No. 1 motor is fixedly connected to the inner wall of the mechanism cavity, the gear is fixedly connected to the output shaft of the No. 1 motor, and the gear is meshed with both sections of the rack.

[0009] According to a further technical solution, the clamp assembly includes a limit clamp, a guide rod, a threaded sleeve, a spring and an arc clamp; One end of the left sliding frame is rotatably connected to a connecting rod, one end of the connecting rod is fixedly connected to a limit clamp, one end of the right sliding frame is rotatably connected to a limit clamp, the limit clamp is slidably connected to a guide rod, one end of the guide rod is threadedly connected to a threaded sleeve, the other end of the guide rod is fixedly connected to an arc clamp, and the outer side of the guide rod is sleeved with a spring.

[0010] According to a further technical solution, the rotating mechanism includes a second motor, a driving wheel and a driven wheel; The No. 2 motor is fixedly connected to the left sliding frame, the driving wheel is fixedly connected to the output shaft of the No. 2 motor, the driven wheel is fixedly connected to the connecting rod, and the driving wheel and the driven wheel are meshed.

[0011] According to a further technical solution, the heating assembly includes a heater and a heating coil, the heater and the heating coil are both fixedly connected to the inner end surface of the shell, and the heating coil is connected to the heater.

[0012] According to a further technical solution, an arc-shaped heat conducting plate is fixedly provided on the inner wall of the shell.

[0013] According to a further technical solution, the limit clamp is arc-shaped, and both ends of the limit clamp are fixedly connected with rubber heads.

[0014] Compared with the prior art, the beneficial effects of the present invention are as follows: The present invention provides a heating device for aging test of a crimped IGBT device. The heating component is started, and the heater heats the IGBT device through the heating coil. At the same time, the rotating mechanism is started. In the rotating mechanism, the No. 2 motor is started, and the No. 2 motor drives the driving wheel to rotate. The driving wheel drives the connecting rod to rotate by meshing with the driven wheel. The connecting rod drives the IGBT device to rotate continuously through the arc clamp, so that the IGBT device is evenly heated. The present invention provides a heating device for aging test of a press-fit IGBT device, wherein the inner wall of the shell is fixedly provided with an arc-shaped heat-conducting plate, and the heat is concentrated to the IGBT device through the arc-shaped heat-conducting plate, thereby increasing the heating efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a structural schematic diagram of the present invention; Figure 2 for Figure 1 Schematic diagram of the enlarged structure of the A area in the middle; Figure 3 for Figure 1 Schematic diagram of the enlarged structure of the middle B area; Figure 4 is a schematic diagram of the structure of the fixture assembly; Figure 5 Schematic diagram of the structure of the arc-shaped heat conducting plate.

[0016] In the accompanying drawings: 1. Shell; 2. Heating component; 21. Heater; 22. Heating coil; 3. Placement table; 4. Electric telescopic part; 5. Clamping mechanism; 51. Left sliding frame; 52. Right sliding frame; 53. Driving component; 531. Motor No. 1; 532. Rack; 533. Gear; 54. Clamp assembly; 541. Limit clamp; 542. Guide rod; 543. Threaded sleeve; 544. Spring; 545. Arc clamp; 55. Connecting rod; 6. Rotating mechanism; 61. Motor No. 2; 62. Driving wheel; 63. Driven wheel; 6. Rotating mechanism; 61. Motor No. 2; 62. Driving wheel; 63. Driven wheel; 7. Mechanism cavity; 8. Arc heat conduction plate; 9. Rubber head. DETAILED DESCRIPTION

[0017] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0018] The specific implementation of the present invention is described in detail below in conjunction with specific embodiments.

[0019] like Figure 1-Figure 5 As shown, a heating device for aging test of a press-fit IGBT device provided by the present invention includes a housing 1 and also includes: A heating component 2 is arranged in the housing 1, a placing table 3 is arranged on one side of the heating component 2, and an electric telescopic member 4 is arranged between the placing table 3 and the inner end surface of the housing 1; A clamping mechanism 5 is disposed on one side of the placement platform 3 , and the clamping mechanism 5 can clamp and fix the IGBT device. The clamping mechanism 5 is connected to a rotating mechanism 6 , and the rotating mechanism 6 can drive the IGBT device to rotate continuously.

[0020] When in use, the IGBT device is placed on the placement table 3, and the clamping mechanism 5 is started to clamp and fix the IGBT device, and then the electric telescopic member 4 is controlled to lower its height; The heating component 2 is started to heat the IGBT device, and the rotating mechanism 6 is started at the same time. The rotating mechanism 6 can drive the IGBT device to rotate continuously, so that the IGBT device is heated evenly.

[0021] In the embodiment of the present invention, as a preferred embodiment of the present invention, the clamping mechanism 5 includes a left sliding frame 51, a right sliding frame 52, a driving assembly 53 and a clamp assembly 54; A mechanism cavity 7 is provided in the housing 1, and the left sliding frame 51 and the right sliding frame 52 are both slidably connected to the side walls of the mechanism cavity 7. The driving assembly 53 can drive the left sliding frame 51 and the right sliding frame 52 to move relative to or towards each other. The left sliding frame 51 and the right sliding frame 52 are both connected to a clamp assembly 54, and the clamp assembly 54 is used to clamp and limit the IGBT device.

[0022] In the clamping mechanism 5 , the driving assembly 53 drives the left sliding frame 51 and the right sliding frame 52 to move relative to each other, and the left sliding frame 51 and the right sliding frame 52 clamp and limit the IGBT device through the clamp assembly 54 .

[0023] In the embodiment of the present invention, as a preferred embodiment of the present invention, the driving assembly 53 includes a No. 1 motor 531, a rack 532 and a gear 533, the left sliding frame 51 and the right sliding frame 52 are both fixedly provided with a rack 532, the No. 1 motor 531 is fixedly connected to the inner wall of the mechanism cavity 7, the gear 533 is fixedly connected to the output shaft of the No. 1 motor 531, and the gear 533 is meshed with the two sections of the rack 532.

[0024] In the driving assembly 53 , the first motor 531 is started, and the first motor 531 drives the gear 533 to rotate. The gear 533 meshes with the rack 532 , thereby driving the left sliding frame 51 and the right sliding frame 52 to move relative to each other.

[0025] In the embodiment of the present invention, as a preferred embodiment of the present invention, the clamp assembly 54 includes a limit clamp 541, a guide rod 542, a threaded sleeve 543, a spring 544 and an arc clamp 545; One end of the left sliding frame 51 is rotatably connected to a connecting rod 55, one end of the connecting rod 55 is fixedly connected to a limit clamp 541, one end of the right sliding frame 52 is rotatably connected to a limit clamp 541, the limit clamp 541 is slidably connected to a guide rod 542, one end of the guide rod 542 is threadedly connected to a threaded sleeve 543, the other end of the guide rod 542 is fixedly connected to an arc clamp 545, and a spring 544 is sleeved on the outer side of the guide rod 542.

[0026] In the clamp assembly 54 , the limit clamp 541 drives the arc clamp 545 to clamp and fix the IGBT device. Under the action of the spring 544 , the arc clamp 545 elastically clamps the IGBT device. The threaded sleeve 543 is rotated and moves along the guide rod 542 , thereby adjusting the preload force of the spring 544 .

[0027] In the embodiment of the present invention, as a preferred embodiment of the present invention, the rotating mechanism 6 includes a second motor 61, a driving wheel 62 and a driven wheel 63; The second motor 61 is fixedly connected to the left sliding frame 51 , the driving wheel 62 is fixedly connected to the output shaft of the second motor 61 , the driven wheel 63 is fixedly connected to the connecting rod 55 , and the driving wheel 62 and the driven wheel 63 are meshed.

[0028] In the rotating mechanism 6 , the second motor 61 is started, the second motor 61 drives the driving wheel 62 to rotate, the driving wheel 62 drives the connecting rod 55 to rotate by meshing with the driven wheel 63 , and the connecting rod 55 drives the IGBT device to rotate continuously through the arc clamp 545 .

[0029] In an embodiment of the present invention, as a preferred embodiment of the present invention, the heating component 2 includes a heater 21 and a heating coil 22, and the heater 21 and the heating coil 22 are both fixedly connected to the inner end surface of the outer shell 1, and the heating coil 22 is connected to the heater 21.

[0030] In the heating assembly 2 , the heater 21 heats the IGBT device via the heating coil 22 .

[0031] In the embodiment of the present invention, as a preferred embodiment of the present invention, the inner wall of the housing 1 is fixedly provided with an arc-shaped heat-conducting plate 8, and the heat is concentrated to the IGBT device through the arc-shaped heat-conducting plate 8.

[0032] In the embodiment of the present invention, as a preferred embodiment of the present invention, the limiting clamp 541 is arc-shaped, and both ends of the limiting clamp 541 are fixedly connected with rubber heads 9, and the rubber heads 9 increase the fit of the arc-shaped clamp 545 when connected.

[0033] Working principle: When in use, the IGBT device is placed on the placement table 3, and the No. 1 motor 531 is started. The No. 1 motor 531 drives the gear 533 to rotate. The gear 533 engages with the rack 532, thereby driving the left sliding frame 51 and the right sliding frame 52 to move relative to each other. The left sliding frame 51 and the right sliding frame 52 clamp and limit the IGBT device through the arc clamp 545. The limit clamp 541 drives the arc clamp 545 to clamp and fix the IGBT device. Under the action of the spring 544, the arc clamp 545 elastically clamps the IGBT device; the threaded sleeve 543 is rotated, and the threaded sleeve 543 moves along the guide rod 542, thereby adjusting the preload force of the spring 544, and then the electric telescopic member 4 is controlled to lower its height; The heating assembly 2 is started, and the heater 21 heats the IGBT device through the heating coil 22. At the same time, the rotating mechanism 6 is started. In the rotating mechanism 6, the second motor 61 is started, and the second motor 61 drives the driving wheel 62 to rotate. The driving wheel 62 drives the connecting rod 55 to rotate by meshing with the driven wheel 63. The connecting rod 55 drives the IGBT device to rotate continuously through the arc clamp 545, so that the IGBT device is evenly heated. The inner wall of the housing 1 is fixedly provided with an arc-shaped heat-conducting plate 8 , and the heat is concentrated to the IGBT device through the arc-shaped heat-conducting plate 8 .

[0034] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

[0035] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. A heating device for aging test of a crimped IGBT device, comprising a housing (1), characterized in that: Also includes: A heating component (2) is arranged in the outer shell (1); a placement table (3) is arranged on one side of the heating component (2); and an electric telescopic member (4) is arranged between the placement table (3) and the inner end surface of the outer shell (1); A clamping mechanism (5) is provided on one side of the placement platform (3), and the clamping mechanism (5) is capable of clamping and fixing the IGBT device; the clamping mechanism (5) is connected to a rotating mechanism (6), and the rotating mechanism (6) is capable of driving the IGBT device to rotate continuously.

2. The heating device for aging test of a press-fit IGBT device according to claim 1, characterized in that: The clamping mechanism (5) comprises a left sliding frame (51), a right sliding frame (52), a driving assembly (53) and a clamp assembly (54); A mechanism cavity (7) is provided in the housing (1); the left sliding frame (51) and the right sliding frame (52) are both slidably connected to the side wall of the mechanism cavity (7); the driving assembly (53) is capable of driving the left sliding frame (51) and the right sliding frame (52) to move relative to or towards each other; the left sliding frame (51) and the right sliding frame (52) are both connected to a clamp assembly (54); the clamp assembly (54) is used to clamp and limit the IGBT device.

3. The heating device for aging test of a press-fit IGBT device according to claim 2, characterized in that: The driving assembly (53) comprises a No. 1 motor (531), a rack (532) and a gear (533); the left sliding frame (51) and the right sliding frame (52) are both fixedly provided with a rack (532); the No. 1 motor (531) is fixedly connected to the inner wall of the mechanism cavity (7); the gear (533) is fixedly connected to the output shaft of the No. 1 motor (531); and the gear (533) is meshed with the two sections of the rack (532).

4. The heating device for aging test of a press-fit IGBT device according to claim 2, characterized in that: The clamp assembly (54) comprises a limit clamp (541), a guide rod (542), a threaded sleeve (543), a spring (544), and an arc clamp (545); One end of the left sliding frame (51) is rotatably connected to a connecting rod (55), one end of the connecting rod (55) is fixedly connected to a limiting clamp (541), one end of the right sliding frame (52) is rotatably connected to a limiting clamp (541), the limiting clamp (541) is slidably connected to a guide rod (542), one end of the guide rod (542) is threadedly connected to a threaded sleeve (54), the other end of the guide rod (542) is fixedly connected to an arc-shaped clamp (545), and a spring (544) is sleeved outside the guide rod (542).

5. The heating device for aging test of a press-fit IGBT device according to claim 4, characterized in that: The rotating mechanism (6) comprises a second motor (61), a driving wheel (62) and a driven wheel (63); The second motor (61) is fixedly connected to the left sliding frame (51), the driving wheel (62) is fixedly connected to the output shaft of the second motor (61), the driven wheel (63) is fixedly connected to the connecting rod (55), and the driving wheel (62) and the driven wheel (63) are meshed.

6. The heating device for aging test of a press-fit IGBT device according to claim 1, characterized in that: The heating component (2) comprises a heater (21) and a heating coil (22); the heater (21) and the heating coil (22) are both fixedly connected to the inner end surface of the housing (1); and the heating coil (22) is connected to the heater (21).

7. The heating device for aging test of a press-fit IGBT device according to claim 1, characterized in that: The inner wall of the outer shell (1) is fixedly provided with an arc-shaped heat conducting plate (8).

8. The heating device for aging test of a press-fit IGBT device according to claim 4, characterized in that: The limiting clamp (541) is arc-shaped, and both ends of the limiting clamp (541) are fixedly connected to rubber heads (9).

Citation Information

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