Double-pulse testing device
By designing a convenient dual-pulse test device, the rotatable housing and guide rail are used to achieve convenient installation and disassembly of the module under test, and the inductor isolates inductive interference, solving the trouble of disassembly and inaccurate test results in the prior art. Problem, improving the accuracy and safety of test results.
Patent Information
- Application Number
- CN202420469581.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-11
- Publication Date
- 2025-01-03
- Estimated Expiration
- 2034-03-11
AI Technical Summary
The existing IGBT dual pulse testing method requires multiple fasteners, which is troublesome to disassemble and assemble and the test environment is unsafe, resulting in inaccurate test results.
A dual pulse test device is designed, using a rotatable housing and support plate, which can facilitate the installation and disassembly of the module under test through the guide rail, and an inductor is installed on the support plate to isolate inductive interference and reduce stray inductance.
The disassembly and assembly process of the module under test is simplified, the accuracy of the test results is improved, and the safety of the test environment is ensured.
Smart Images
Figure CN222299737U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of pulse testing, in particular to a double pulse testing device. Background Art
[0002] IGBT (Insulated Gate Bipolar Transistor) is a modular semiconductor product that is packaged by IGBT (Insulated Gate Bipolar Transistor chip) and FWD (Diode chip) through a specific circuit bridge. The standard for judging whether the design of its driving circuit is good or not is to conduct some tests on it, and then check whether the waveform obtained by the test meets a correct standard or a reasonable range, so as to verify whether the circuit is designed correctly or whether the pre-measurement is satisfied. Therefore, before using IGBT, in order to verify whether the parameters and performance of IGBT meet the requirements, it is necessary to perform a double pulse test on IGBT. However, the existing IGBT double pulse test method requires the IGBT module to be installed on the test device by screws, and there are many fasteners used. It is troublesome to disassemble and assemble the IGBT module, and the safety of the test environment cannot be guaranteed. Since there is no shielding barrier to the reactance, the test results are not accurate enough. Utility Model Content
[0003] In view of the above problems, the utility model provides a double pulse testing device to overcome at least one disadvantage.
[0004] The technical solution adopted by the utility model is as follows: a double pulse testing device, including a shell and a module to be tested, a first side door is rotatably provided on one side of the shell, and a second side door is rotatably provided on the other side of the shell, a support plate is provided inside the shell, and the support plate is provided with a guide rail that slides with the bottom of the module to be tested, the guide rail extends from the first side door to the second side door, and an inductor is installed on the side of the support plate away from the module to be tested.
[0005] Optionally, the shell includes a top plate, a bottom plate, a front door and a rear door, and the top plate, the bottom plate, the front door, the rear door, the first side door, the second side door and the support columns together form a cavity for accommodating the module to be tested, and one side of the support plate is connected to the front door, and the other side of the support plate is connected to the back.
[0006] Optionally, it also includes multiple support columns, which are arranged in parallel, and the front door, rear door, first side door, and second side door are respectively arranged between two of the support columns, one side of the first side door and one side of the second side door are respectively rotatably connected to the support columns, the surrounding walls of the top plate are respectively connected to the tops of the support columns, and the surrounding walls of the bottom plate are respectively connected to the bottoms of the support columns.
[0007] Optionally, the front door includes a movable door, a first fixed door and a second fixed door, one end of the movable door is rotatably connected to the first fixed door, and a gap for the wiring harness to pass through is provided between the other end of the movable door and the second fixed door.
[0008] Optionally, the movable door is provided with a transparent observation window.
[0009] Optionally, a data box is installed on the side of the first side door facing the support plate, and a button, an indicator light, a voltage indicator meter and a voltage regulator meter are arranged above the data box.
[0010] Optionally, the first side door, the second side door and the movable door are all provided with reinforcing ribs.
[0011] Optionally, a limit rod is provided at one end of the module under test away from the second side door, and a limit block movably abutting against the limit rod is provided on the inner side of the support column.
[0012] Optionally, the module under test is provided with a laminated copper busbar, which includes a test positive busbar, a test midpoint busbar and a test negative busbar arranged in sequence, and insulating paper is provided between the test positive busbar and the test midpoint busbar, and between the test midpoint busbar and the test negative busbar.
[0013] Optionally, the support column is a nine-fold profile, a movable caster is provided at the bottom of the support column, a warning light is provided at the top of the shell, and a plurality of holes for installing a capacitor pool are provided at one end of the module under test close to the second side door.
[0014] The utility model has the following beneficial effects: when installing, the first side door or the second side door is opened, and the module to be tested is pushed into the housing along the guide rail; when disassembling, the module to be tested is pulled out of the housing along the guide rail, which is convenient for disassembly and assembly of the module to be tested or maintenance and replacement of equipment. The laminated busbar reduces stray inductance, ensures the switching characteristics of the IGBT and the interference of the inductor is isolated by the support plate, and improves the accuracy of the test results. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 A schematic diagram of the structure of a double pulse test device proposed in an embodiment of the utility model;
[0016] Figure 2 A schematic diagram of a support column of a double pulse test device according to an embodiment of the present utility model;
[0017] Figure 3 A schematic diagram of a guide rail of a double pulse test device proposed in an embodiment of the present utility model.
[0018] The marks in the accompanying drawings are: 1. first side door; 2. second side door; 3. module under test; 301. limit rod; 302. laminated copper busbar; 4. support plate; 401. guide rail; 5. top plate; 6. bottom plate; 7. front door; 701. movable door; 702. first fixed door; 703, 703, second fixed door; 704. transparent observation window; 705. gap; 8. rear door; 9. support column; 901. limit block; 10. data box; 11. reinforcement rib; 12. movable casters; 13. capacitor pool; 14. warning light; 15. inductor. DETAILED DESCRIPTION
[0019] The utility model is described in detail below in conjunction with the accompanying drawings.
[0020] like Figure 1 and 3 As shown, a double pulse test device includes a shell and a module under test 3, a first side door 1 is rotatably provided on one side of the shell, a second side door 2 is rotatably provided on the other side of the shell, a support plate 4 is provided inside the shell, the support plate 4 is provided with a guide rail 401 that slides with the bottom of the module under test 3, the guide rail 401 extends from the first side door 1 to the second side door 2, and an inductor is installed on the side of the support plate 4 away from the module under test 3. When installing, open the first side door 1 or the second side door 2, push the module under test 3 into the shell along the guide rail 401, and when disassembling, pull the module under test 3 out of the shell along the guide rail 401, so as to facilitate the disassembly and assembly of the module under test 3 or the maintenance and replacement of the equipment. The inductor is located below the support plate, and the support plate isolates the inductor and the module under test, which can minimize the interference of the inductor on the IGBT.
[0021] In this embodiment, if Figure 1 and 2 As shown, the housing includes a top plate 5, a bottom plate 6, a front door 7 and a rear door 8. The top plate 5, the bottom plate 6, the front door 7, the rear door 8, the first side door 1, the second side door 2 and the support column 9 together form a cavity for accommodating the module 3 under test. One side of the support plate 4 is connected to the front door 7, and the other side of the support plate 4 is connected to the rear. The front door 7 is arranged opposite to the rear door 8, the first side door 1 is arranged opposite to the second side door 2, and the support plate 4 is fixedly connected to the front door 7 and the rear door 8 respectively.
[0022] In this embodiment, if Figure 1 and 2As shown, it also includes a plurality of support columns 9, which are arranged in parallel, and the front door 7, the rear door 8, the first side door 1, and the second side door 2 are respectively arranged between two of the support columns 9, and one side of the first side door 1 and one side of the second side door 2 are respectively rotatably connected to the support columns 9, and the surrounding walls of the top plate 5 are respectively connected to the top of the support columns 9, and the surrounding walls of the bottom plate 6 are respectively connected to the bottom of the support columns 9. In this embodiment, the number of the support columns 9 is four, and the four support columns 9 are arranged in a rectangular shape.
[0023] In this embodiment, if Figure 1 As shown, the front door 7 includes a movable door 701, a first fixed door 702 and a second fixed door. One end of the movable door 701 is rotatably connected to the first fixed door 702, and a gap 705 for the wire harness to pass through is provided between the other end of the movable door 701 and the second fixed door. The movable door 701 is convenient for the staff to test the wiring. The gap 705 is not completely sealed to facilitate the test wiring and prevent the test wire harness from being crushed during the opening and closing of the movable door 701.
[0024] In this embodiment, if Figure 1 As shown, the movable door 701 is provided with a transparent observation window 704. Through the transparent window, the tester can immediately understand the specific situation inside the housing and take timely response operations, thereby preventing the IGBT from exploding during the test and causing injuries to the staff.
[0025] In this embodiment, if Figure 1 As shown, a data box 10 is installed on the side of the first side door 1 facing the support plate 4. A button, an indicator light, a voltage indicator and a voltage regulator are arranged on the top of the data box 10. The data box 10 can be convenient for storing data and for the staff to check. There are three buttons in this embodiment, namely, the charging start button, the upper bus discharge start button, and the lower bus discharge start button. The voltage regulator is used to adjust the line voltage, and the voltage indicator can read the line voltage in the cabinet in real time.
[0026] In this embodiment, if Figure 1 As shown, the first side door 1, the second side door 2 and the movable door are all provided with reinforcing ribs 11. The reinforcing ribs 11 enhance the strength of the first side door 1, the second side door 2 and the movable door to prevent deformation.
[0027] In this embodiment, if Figure 2 As shown, a limit rod 301 is provided at one end of the module under test 3 away from the second side door 2, and a limit block 901 is provided inside the support column 9 to movably abut against the limit rod 301. The support column 9 here refers to the support column 9 installed with the first side door 1. When the module under test 3 is pushed into the housing along the guide rail 401 and moves close to the position of the first side door 1, the limit rod 301 and the limit block 901 abut against each other to prevent the laminated copper bus 302 from being damaged due to excessive pushing of the module under test 3.
[0028] In this embodiment, if Figure 2 As shown, the module 3 under test is provided with a laminated copper busbar 302, and the laminated copper busbar 302 includes a test positive busbar, a test midpoint busbar and a test negative busbar arranged in sequence, and insulating paper is provided between the test positive busbar and the test midpoint busbar, and between the test midpoint busbar and the test negative busbar. The module 3 under test is mainly composed of the IGBT under test, a module driver board, a copper busbar, etc. The module driver board is composed of a DC power supply, a circuit breaker, a contactor, a voltage regulator, a transformer, a rectifier bridge, a capacitor pool, etc. to form a power supply circuit to supply energy to the IGBT. In high-power equipment, there will be a certain amount of stray inductance in the ordinary busbar during the power-on process, but the stray inductance will also affect the IGBT switching characteristics, resulting in reduced test accuracy. The laminated busbar reduces the stray inductance and ensures the IGBT switching characteristics.
[0029] In this embodiment, if Figure 2 As shown, the support column 9 is a nine-fold profile, and a movable caster 12 is provided at the bottom of the support column 9. The nine-fold profile refers to a profile formed by nine roll formings, and has a stronger supporting capacity. The movable caster 12 facilitates the movement of the double pulse test device. A warning light is provided on the top of the shell to remind the staff that the cabinet is in a high-pressure environment when working, to avoid hidden dangers caused by carelessness, and to improve the safety factor of the staff. The end of the module under test close to the second side door is provided with a plurality of holes for installing capacitor cells, which can meet the replacement needs of capacitor cells of different sizes and improve adaptability.
[0030] The above description is only a preferred embodiment of the utility model, and does not limit the patent protection scope of the utility model. Any equivalent structural transformation made using the contents of the utility model specification and drawings, directly or indirectly used in other related technical fields, is also included in the protection scope of the utility model.
Claims
1. A double pulse test device, characterized in that: It includes a shell and a module under test, wherein a first side door is rotatably provided on one side of the shell, and a second side door is rotatably provided on the other side of the shell, a support plate is provided inside the shell, and the support plate is provided with a guide rail that slides with the bottom of the module under test, and the guide rail extends from the first side door to the second side door, and an inductor is installed on the side of the support plate away from the module under test.
2. The double pulse test device according to claim 1, characterized in that: The shell includes a top plate, a bottom plate, a front door and a rear door. The top plate, the bottom plate, the front door, the rear door, the first side door, the second side door and the support column together form a cavity for accommodating the module to be tested. One side of the support plate is connected to the front door, and the other side of the support plate is connected to the rear door.
3. The double pulse test device according to claim 2, characterized in that: It also includes a plurality of support columns, which are arranged in parallel, and the front door, the rear door, the first side door, and the second side door are respectively arranged between two of the support columns, one side of the first side door and one side of the second side door are respectively rotatably connected to the support columns, the surrounding walls of the top plate are respectively connected to the tops of the support columns, and the surrounding walls of the bottom plate are respectively connected to the bottoms of the support columns.
4. The double pulse test device according to claim 2, characterized in that: The front door comprises a movable door, a first fixed door and a second fixed door. One end of the movable door is rotatably connected to the first fixed door, and a gap for the wiring harness to pass through is provided between the other end of the movable door and the second fixed door.
5. The double pulse test device according to claim 4, characterized in that: The movable door is provided with a transparent observation window.
6. The double pulse test device according to claim 1, characterized in that: A data box is installed on the side of the first side door facing the support plate. A button, an indicator light, a voltage indicator and a voltage regulator are arranged above the data box.
7. The double pulse test device according to claim 4, characterized in that: The first side door, the second side door and the movable door are all provided with reinforcing ribs.
8. The double pulse test device according to claim 3, characterized in that: A limiting rod is provided at one end of the tested module away from the second side door, and a limiting block movably abutting against the limiting rod is provided on the inner side of the supporting column.
9. The double pulse test device according to claim 1, characterized in that: The module under test is provided with a laminated copper busbar, which includes a test positive busbar, a test midpoint busbar and a test negative busbar arranged in sequence, and insulating paper is provided between the test positive busbar and the test midpoint busbar, and between the test midpoint busbar and the test negative busbar.
10. The double pulse test device according to claim 3, characterized in that: The support column is a nine-fold profile, a movable caster is provided at the bottom of the support column, a warning light is provided on the top of the shell, and a plurality of holes for installing a capacitor pool are provided at one end of the module under test close to the second side door.