Sample table clamping groove applied to preparation cavity of freezing scanning electron microscope
By designing a detachable sample table slot device, the problem of observation and sublimation in cryo-scanning electron microscope cannot be performed simultaneously, achieving time and cost savings, and improving work efficiency.
Patent Information
- Application Number
- CN202421227963.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-30
- Publication Date
- 2025-02-18
- Estimated Expiration
- 2034-05-30
AI Technical Summary
The existing cryo-scanning electron microscope cannot be synchronized with observation and sublimation because the cryo-scanning electron microscope is on the same horizontal line, resulting in waste of time and high operating costs.
A device including a carrier plate, a bracket layer and a sample table slot is designed, and fixed to the preparation chamber by bolts and gaskets, providing a detachable sample table slot structure to realize the transfer and synchronous processing of the sample table.
Through transit, observation and sublimation can be carried out simultaneously, shortening time, saving costs and improving efficiency.
Smart Images
Figure CN222507527U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of experimental equipment, in particular to a sample stage card slot used in a preparation cavity of a cryo-scanning electron microscope. Background Art
[0002] Cryo-SEM is developed by adding a freezing sample stage slot, ultra-low temperature freezing sample preparation and transmission system to a conventional scanning electron microscope. It is a microscopic analysis platform that can directly characterize water-containing samples such as microorganisms, plants and animals, hydrogels, and emulsions. The operating process of cryo-SEM is usually to stick the water-containing sample on the sample stage, freeze and fix it with liquid nitrogen slush, transfer it to the freezing sample stage slot of the preparation chamber for sublimation and coating, and finally transfer it to the freezing sample stage slot of the sample chamber for observation by vacuum. Sublimation occupies an important position in cryo-SEM technology. It is directly related to the observation effect of the image and the correct interpretation of the image. The setting of sublimation temperature and time needs to consider the sample preparation method, water content and softness of the sample. The setting values of different types of samples vary greatly, and some sublimation times are as long as 1 hour. The observation time is related to the number of samples and the tester. The general observation time is 1 to 3 hours. The sublimation and observation of samples not only takes time, but also consumes liquid nitrogen and nitrogen to maintain the low temperature environment. The preparation chamber and sample chamber of the cryo-scanning electron microscope are independent of each other, and sublimation and observation do not interfere with each other. However, in the existing cryo-scanning electron microscope, the frozen sample stage slot of the preparation chamber and the frozen sample stage slot of the sample chamber are on the same horizontal line. If a sample stage is placed in the frozen sample stage slot of the preparation chamber, the sample stage of the sample chamber cannot be taken out, and observation and sublimation cannot be carried out simultaneously, which not only wastes time, but also has high operating costs and low work efficiency. Utility Model Content
[0003] The utility model aims to overcome the above-mentioned deficiencies of the prior art and provide a sample stage card slot used in a preparation chamber of a cryo-scanning electron microscope.
[0004] The utility model is realized through the following technical scheme: a sample stage slot applied to a preparation chamber of a cryo-scanning electron microscope, comprising a carrying plate, a bracket layer and a sample stage slot, wherein the bracket layer is mounted on the carrying plate, the sample stage slot is mounted on the bracket layer, and the carrying plate is provided with a mounting hole.
[0005] The device is fixed on the preparation chamber by means of bolts and gaskets penetrating the mounting holes on the carrier plate; the sample stage slot is used to fix the sample stage, and the bracket layer provides support for the sample stage slot; the setting of the mounting holes allows the device to be detachably mounted on the preparation chamber; the bolts and gaskets are used to fix the device to avoid damage to the equipment when placing and removing the sample stage.
[0006] The support layer includes a first plane, a second plane and a third plane, the first plane is parallel to the supporting plate; a group of pairs of side edges of the first plane are respectively connected to one side edge of the second plane and one side edge of the third plane, the other side edge of the second plane is connected to the supporting plate, and the other side edge of the third plane is connected to the supporting plate.
[0007] The second plane forms an angle of 45 to 90 degrees with the bearing plate, and the third plane forms an angle of 45 to 90 degrees with the bearing plate.
[0008] The support layer includes a support surface and four support columns. The four corners of the support surface are respectively connected to the upper ends of the four support columns, and the lower ends of the support columns are fixed on the bearing plate.
[0009] The layer height of the first plane is 19-23 mm.
[0010] The first plane is a rectangular parallelepiped structure, the length of the top surface of which is 30-68 mm and the width is 26 mm.
[0011] The thickness of the bearing plate is 1-5 mm.
[0012] There are two mounting holes, namely a first mounting hole and a second mounting hole. The first mounting hole has the same structure as the second mounting hole, and the diameter thereof is 4-7 mm.
[0013] The sample stage slot includes a positioning plate, a baffle and a pair of positioning clips with the same structure and opposite positions; the positioning clip is an arc-shaped plate, the lower end of which is fixed to the positioning plate, and the upper end of which extends upwardly and obliquely toward the space between the two positioning clips; the baffle is installed on the positioning plate, and the two positioning clips and the positioning plate form a slot with a rectangular structure having a top opening and a side opening.
[0014] The positioning card forms the long side of the bottom of the sample stage slot, which is 26mm in length; the distance between the bottoms of the two positioning card members forms the wide side of the bottom of the sample stage slot, which is 20mm in length; the distance between the tops of the two positioning card members forms the wide side of the top of the sample stage slot, which is 15mm in length; the height of the sample stage slot is 7mm.
[0015] Compared with the prior art, the advantages of the utility model are: the device has a simple structure, is easy to install and easy to operate; the device is installed in the sample stage slot of the cryo-scanning electron microscope preparation chamber, and can transfer the sample stage that has been sublimated in the cryo-sample stage slot in advance. Through transfer, observation and sublimation are carried out simultaneously, which shortens time, saves costs and improves efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1It is a schematic diagram of the structure of an embodiment of the utility model;
[0017] Figure 2 It is a schematic diagram of the structural decomposition of an embodiment of the utility model;
[0018] Figure 3 It is a structural schematic diagram of another angle of the embodiment of the utility model;
[0019] Figure 4 This is a schematic diagram of the structure decomposition from another angle of the embodiment of the utility model;
[0020] Figure 5 It is a schematic diagram of the structure of the sample stage card slot in an embodiment of the utility model.
[0021] The meanings of the reference numerals in the figure are: 1. load-bearing plate; 2. bracket layer; 3. sample stage slot; 4. first mounting hole; 5. second mounting hole. DETAILED DESCRIPTION
[0022] The content of the utility model is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.
[0023] Example
[0024] See also Figures 1 to 5 , which is a sample stage slot 3 used in a cryo-scanning electron microscope preparation chamber, comprising a carrier plate 1, a bracket layer 2 and a sample stage slot 3, wherein the bracket layer 2 is mounted on the carrier plate 1, the sample stage slot 3 is mounted on the bracket layer 2, and the carrier plate 1 is provided with a mounting hole.
[0025] The device is fixed on the preparation chamber by means of bolts and gaskets penetrating the mounting holes on the carrier plate 1; the sample stage slot 3 is used to fix the sample stage, and the bracket layer 2 provides support for the sample stage slot 3; the setting of the mounting holes allows the device to be detachably mounted on the preparation chamber; the bolts and gaskets are used to fix the device to avoid damage to the equipment when placing and removing the sample stage.
[0026] The support layer 2 includes a first plane, a second plane and a third plane. The first plane is parallel to the supporting plate 1. A group of pairs of side edges of the first plane are respectively connected to one side edge of the second plane and one side edge of the third plane. The other side edge of the second plane is connected to the supporting plate 1, and the other side edge of the third plane is connected to the supporting plate 1.
[0027] The second plane forms an angle of 45 to 90 degrees with the bearing plate 1 , and the third plane forms an angle of 45 to 90 degrees with the bearing plate 1 .
[0028] There is another design scheme for the support layer 2. The support layer 2 includes a support surface and four support columns. The four corners of the support surface are respectively connected to the upper ends of the four support columns, and the lower ends of the support columns are fixed on the bearing plate 1.
[0029] The layer height of the first plane is 19 to 23 mm.
[0030] The first plane is a rectangular parallelepiped structure, the length of the top surface of which is 30-68 mm and the width is 26 mm.
[0031] The thickness of the carrying plate 1 is 1-5 mm.
[0032] There are two mounting holes, namely a first mounting hole 4 and a second mounting hole 5. The first mounting hole 4 and the second mounting hole 5 have the same structure, and their diameters are 4-7 mm.
[0033] The sample stage slot 3 includes a positioning plate, a baffle and a pair of positioning clips with the same structure and relative positions; the positioning clip is an arc-shaped plate, the lower end of which is fixed on the positioning plate, and the upper end of which extends upwardly and obliquely toward the space between the two positioning clips; the baffle is installed on the positioning plate, and the two positioning clips and the positioning plate form a slot with a rectangular structure having a top opening and a side opening.
[0034] The positioning card forms the long side of the bottom of the sample stage slot 3, which is 26mm long; the distance between the bottoms of the two positioning card forms the wide side of the bottom of the sample stage slot 3, which is 20mm long; the distance between the tops of the two positioning card forms the wide side of the top of the sample stage slot 3, which is 15mm long; the height of the sample stage slot 3 is 7mm.
[0035] The device is fixed on the preparation chamber by respectively penetrating the first mounting hole 4 and the second mounting hole 5 on the carrier plate 1 through the original bolts and gaskets on the preparation chamber of the cryo-scanning electron microscope.
[0036] A method for using a sample stage slot 3 in a cryo-scanning electron microscope preparation chamber to achieve simultaneous observation and sublimation, comprising the following steps:
[0037] Step 1: Transfer the sample stage with the sample attached and frozen to the frozen sample stage slot of the cryo-scanning electron microscope preparation chamber for sublimation and coating, and then vacuum transfer it to the frozen sample stage slot of the sample chamber for observation.
[0038] Step 2: During the observation process, the second sample stage with the sample attached and frozen is transferred to the frozen sample stage slot of the cryo-SEM preparation chamber for sublimation.
[0039] Step 3: After the observation of the first sample stage is completed, the sublimated sample stage placed on the preparation chamber frozen sample stage slot is first transferred to the sample stage slot 3 of this embodiment, and then the sample stage that has been observed on the sample chamber frozen sample stage slot is taken out.
[0040] Step 4: The sublimated sample stage placed on the sample stage slot 3 of this embodiment is transferred to the frozen sample stage slot of the preparation chamber for coating, and then vacuum transferred to the frozen sample stage slot of the sample chamber for observation.
[0041] The freezing sample stage slot in the above steps is the original freezing sample stage slot on the freezing scanning electron microscope system.
[0042] By using the sample stage slot 3, a sample stage that has been sublimated in advance on the frozen sample stage slot can be transferred, so that observation and sublimation can be carried out simultaneously, which shortens the time, saves costs and improves efficiency.
[0043] The above detailed description is a specific description of a feasible embodiment of the utility model. The embodiment is not intended to limit the patent scope of the utility model. Any equivalent implementation or modification that does not deviate from the utility model should be included in the patent scope of this case.
Claims
1. A sample stage slot for a cryo-scanning electron microscope preparation chamber, characterized in that: The invention comprises a bearing plate, a support layer and a sample stage slot, wherein the support layer is mounted on the bearing plate, the sample stage slot is mounted on the support layer, and the bearing plate is provided with a mounting hole.
2. The sample stage slot for use in a cryo-scanning electron microscope preparation chamber according to claim 1, characterized in that: The support layer includes a first plane, a second plane and a third plane, the first plane is parallel to the supporting plate; a group of pairs of side edges of the first plane are respectively connected to one side edge of the second plane and one side edge of the third plane, the other side edge of the second plane is connected to the supporting plate, and the other side edge of the third plane is connected to the supporting plate.
3. The sample stage slot for use in a cryo-scanning electron microscope preparation chamber according to claim 2, characterized in that: The second plane forms an angle of 45 to 90 degrees with the bearing plate, and the third plane forms an angle of 45 to 90 degrees with the bearing plate.
4. The sample stage slot for use in a cryo-scanning electron microscope preparation chamber according to claim 1, characterized in that: The support layer includes a support surface and four support columns. The four corners of the support surface are respectively connected to the upper ends of the four support columns, and the lower ends of the support columns are fixed on the bearing plate.
5. The sample stage slot for use in a cryo-scanning electron microscope preparation chamber according to claim 2, characterized in that: The layer height of the first plane is 19-23 mm.
6. The sample stage slot for use in a cryo-scanning electron microscope preparation chamber according to claim 2, characterized in that: The first plane is a rectangular parallelepiped structure, the length of the top surface of which is 30-68 mm and the width is 26 mm.
7. The sample stage slot for use in a cryo-scanning electron microscope preparation chamber according to claim 1, characterized in that: The thickness of the bearing plate is 1-5 mm.
8. The sample stage slot for use in a cryo-scanning electron microscope preparation chamber according to claim 1, characterized in that: There are two mounting holes, namely a first mounting hole and a second mounting hole. The first mounting hole has the same structure as the second mounting hole, and the diameter thereof is 4-7 mm.
9. The sample stage slot for use in a cryo-scanning electron microscope preparation chamber according to claim 1, characterized in that: The sample stage slot includes a positioning plate, a baffle and a pair of positioning clips with the same structure and opposite positions; the positioning clip is an arc-shaped plate, the lower end of which is fixed to the positioning plate, and the upper end of which extends upwardly and obliquely toward the space between the two positioning clips; the baffle is installed on the positioning plate, and the two positioning clips and the positioning plate form a slot with a rectangular structure having a top opening and a side opening.
10. The sample stage slot for use in a cryo-scanning electron microscope preparation chamber according to claim 9, characterized in that: The positioning card forms the long side of the bottom of the sample stage slot, which is 26mm in length; the distance between the bottoms of the two positioning card members forms the wide side of the bottom of the sample stage slot, which is 20mm in length; the distance between the tops of the two positioning card members forms the wide side of the top of the sample stage slot, which is 15mm in length; the height of the sample stage slot is 7mm.