Fail-Safe Circuits TRIZ Cases

A monitor signal injected between series switches enables independent state detection and fault signaling in safety interrupter circuits.

Automatic FPGA configuration reload corrects soft errors in power grid protection equipment with minimal downtime and no visible reboot.

Tracks gate and well voltages across 3.3V, 2.5V, and 1.8V domains to keep I/O pads fail-safe during power fluctuations.

Dynamic gate control and pull-down switching enable cross-voltage signal transfer while blocking leakage when one power domain is off.

Parity control and monitoring flip-flops detect partial reset anomalies and trigger a full reset to protect secure device operation.

A floating-pin-tolerant CMOS buffer enables false-entry-free trim/test access on low-pin-count ICs while preventing through-current.

Segmented multi-bit scan chains generate parity through shared flip-flops, cutting error-tree area and setup time in safety-critical cores.

A supply detector and failsafe circuit tri-state IO paths during power-up and power-down to prevent PAD leakage and conduction current.

A protection circuit monitors KNX transmission output and instantly cuts resistor current during permanent short-circuits to prevent overheating.

NoC-based partitioning lets programmable SoC subsystems run independently, improving resource sharing, reconfiguration, and data isolation.

A coupling-capacitor CMOS buffer enables false-entry-free trim and test access on low-pin ICs while blocking through-current and protecting NVM reliability.

User-defined NoC data paths and isolated SoC partitions let multiple applications run concurrently while improving area and power efficiency.

Built-in monitoring codes let memory write mode registers be checked for defects quickly, without complex external readout steps.

Isolation circuitry biases the PFET body and gate during power-down to block forward bias, unwanted current draw, and bus interference.

Parallel FPGA channels use error detection, data replay, self-test, and selective reconfiguration to correct reversible errors without service interruption.

Selective scan-path routing and phased clock supply prevent timing errors across clock domains while keeping ATPG capture accurate.

Programmable NoC paths and platform control let one IC share logic and processors across tenants while preserving isolation, power, and area efficiency.

Bi-residue modular arithmetic detects single event upsets in combinatory logic with lower area and energy overhead than redundancy.

A level-shifted De-MOS output interface blocks reverse current and protects thin-oxide transistors across wide legacy supply voltages.

A programmable NoC links logic and processors with user-defined data paths, improving IC flexibility, area use, and power efficiency.

A test clock and comparator detect missed measurement pulses in battery-powered multiturn encoders, preserving accurate revolution counts.

Local control in sectorized FPGA blocks enables parallel configuration, simpler support functions, and faster error correction.

Delayed dual sampling compares two latch outputs to catch longer transient and timing faults without triggering false alarms.

Feedback from each flip-flop verifies reset and scan control signals, detecting force-0 and force-1 attacks and triggering alarms.

When watchdog resets cannot clear SEL faults, controlled power cycling restores microprocessor operation and flags repeated restart events for maintenance.

A monitor circuit detects storage mismatches, refreshes only faulty elements, and blocks hard-error refresh loops without CPU dependence.

Current-source fail-safe biasing stabilizes inactive differential lines over long cables without interfering with active drivers.

Interlocked half-latches across four storage nodes resist single-node upsets, improving soft error robustness with low leakage power.

Independent safety sub-systems and redundant channels keep SoC safety communication active when one channel or subsystem fails.

Time-offset clock comparison detects noise-pulse errors in digital IC pipelines without full duplication, preserving performance and limiting area growth.

A radiation-hardened die or interposer monitors non-hardened ICs, enabling fault replacement and lower-cost soft-error resilience.

Bipolar resistive memory saves and restores logic output during power cuts, preserving data integrity while reducing standby energy use.

Independent reset of processing and programmable logic domains contains power faults, prevents data corruption, and preserves operation.

Bitwise comparison and selective write-back correct soft errors in memory frames, reducing full reconfiguration and power use.

Spare logic regions and interconnects replace defective multi-die logic groups, improving yield and preserving signal routing.

Flip-flop pattern checking confirms reset assertion and can auto-trigger reset to prevent incorrect initialization and unauthorized feature enablement.

Complementary core and outer nodes restore upset states after radiation transients, boosting SRAM reliability without DICE-level leakage.

Three nominally equivalent data channels and voting logic filter radiation-induced transients in integrated circuits without major area or complexity penalties.

Majority-voted storage cells use mismatch detection and monitored refresh to correct soft errors and stop hard-error refresh loops.

Interlocked core and outer nodes restore upset states after radiation-induced disturbances while keeping leakage paths low in SRAM and flip-flops.

Series-connected transistors and encoded address-line redundancy keep demultiplexers working despite short and open defects.

BJT switching with PFET current bleeding and limiting hardens logic inverters against ionizing-radiation leakage and signal spikes.

A fail-safe device uses a self-biased drive block to actuate switches without external components.

Parallel comparison branches and dual series switches cut off avionics power when signals indicate ground status, preventing unintended activation.

A fail-safe circuit uses a flip-flop mask to control a switch via external signals during microcomputer resets.

A self-biased circuit generates stable bias voltages to isolate P-type transistors from power fluctuations.