Supercharge Your Innovation With Domain-Expert AI Agents!

Component and a test device of the component, method for producing said configuration and use of the same

A checker and component technology, applied in the field of checker devices, can solve problems such as improper setting of antenna and oscillation circuit, undetectable signal, weak signal, etc.

Inactive Publication Date: 2011-11-23
SIEMENS AG
View PDF1 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It is also possible that the antenna and oscillating circuit are incorrectly set up relative to each other, so that only a weak signal or no signal is detected at all

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Component and a test device of the component, method for producing said configuration and use of the same
  • Component and a test device of the component, method for producing said configuration and use of the same
  • Component and a test device of the component, method for producing said configuration and use of the same

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] The device 1 consists of an assembly 2 in the form of a heat shield 20 and a checker 3 for detecting the deterioration 4 of the assembly 2 ( figure 1 and 2 ). The inspector 3 has an electrical conductor structure 33 coated on the surface section 23 of the heat shield 20 . The surface section 23 is remote from the inner cavity 5 of the combustion chamber of the gas turbine. The electrical conductor structures 33 are located on the outside of the heat shield 20 .

[0038] The checker 3 has an oscillation circuit 31 and an oscillation circuit 32 . The oscillation circuit 31 and the other oscillation circuit 32 are connected to form a total oscillation circuit 30 . For this purpose, the capacitor 311 of the oscillator circuit 31 is connected in parallel with the other capacitor 321 of the other oscillator circuit 32 ( Figure 4 ). It produces a total oscillating circuit 30 with a measurable total resonant signal whose total resonant frequency f 0 The capacitance of t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a configuration (1) of a component (2) and at least one test device (3) for recording a degradation (4, 40) of said component. Said test device has at least one electric oscillating circuit (31) and the component and oscillating circuit are interconnected in such a way that the degradation of the component causes a degradation (41) of the oscillating circuit and a modification of a detectable resonant signal of the oscillating circuit. The configuration is characterised in that the test device has at least one additional oscillating circuit (32) comprising an additional detectable resonant signal and that the oscillating circuit and the additional oscillating circuit are coupled to form a comprehensive oscillating circuit (30) comprising a detectable comprehensiveresonant signal that differs from the resonant signal and the additional resonant signal. The inventive component is for example a heat shield (20) of a combustion chamber in a gas turbine. The oscillating circuits are connected in parallel. Different high-frequency signals are received for an intact oscillating circuit and for a degraded oscillating circuit. The oscillating circuit consists of abrittle ceramic conductive material. A crack (degradation) in the heat shield continues as a crack in the oscillating circuit. The measuring signal received permits the degradation of the component to be reliably detected.

Description

technical field [0001] The invention relates to a device for a component and at least one checker for detecting the aging of the component, wherein the checker has at least one oscillator circuit and the component and the oscillator circuit are connected to each other in such a way that the aging of the component causes the aging of the oscillator circuit and Therefore, the measurable resonance signal of the oscillating circuit is changed. The invention also relates to a method for manufacturing the device and a method for verifying the reliability performance of components using the device. Background technique [0002] For example DE 102 23 985 A1 discloses a device of the type described. This component is a ceramic heat shield used in the combustion chamber of a gas turbine. The combustion chamber of a gas turbine has an inner cavity and a casing surrounding the inner cavity. Fossil fuel is burned in the inner cavity of the combustion chamber. The maximum temperature ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N27/24G01N3/06
CPCG01N2203/0226G01N27/24G01N3/066
Inventor N·范德拉格
Owner SIEMENS AG
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com