Pen mark feature computer quantification and comparison assisted analysis system
An auxiliary analysis and computer technology, applied in computer components, calculations, instruments, etc., can solve problems such as low efficiency and accuracy of pen marks, development of pen mark inspection technology and limitations in wide application, difficulty in making identification conclusions, etc., to achieve The effect of improving efficiency and accuracy and avoiding information errors
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[0022] The invention includes an image import module, an image processing module, a quantitative feature statistics analysis module, and a measurement comparison module.
[0023] The image import module uses the Scanline function to read the image pixels of the inspection material; the Scanline function is an efficient method for reading pixels provided by Delphi, which is much faster than the general pixel reading function Pixels, especially for the comparison and analysis of pen mark features It takes too long to use the Pixels function to complete the image translation and rotation functions required by the system, so this system uses the Scanline function to perform pixel operations.
[0024] The image processing module performs binarization, contour extraction, reverse color picking, brightness adjustment and contrast processing on the imported inspection material image.
[0025] The quantitative feature statistical analysis module counts the area and perimeter of...
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