Method and system for testing dispersed configuration of programs

Abstract

The invention relates to a method and a system for testing the dispersed configuration of. The automatic testing system comprises a computer mainframe, a first testing instrument and a second testing instrument which are in communication connection mutually. The testing method comprises the following steps that: according to a test project, a testing mother program is edited on the computer mainframe, wherein the testing mother program comprises a first testing project subprogram and a second testing project subprogram; the computer mainframe respectively transmits the first testing project subprogram and the second testing project subprogram to the first testing instrument and the second testing instrument; the first testing instrument executes the first testing project subprogram to test an object to be tested and sends a trigger signal to the second testing instrument when the trigger condition is met; and when receiving the trigger signal, the second testing instrument executes the second testing project subprogram to test the object to be tested.

Description

technical field [0001] The invention relates to a testing method, in particular to a testing method in which testing programs are distributed and configured. Background technique [0002] see figure 1 , figure 1 It is a schematic diagram of a testing system in the prior art. The test system 100 includes a computer host 11 , a first test instrument 12 and a second test instrument 13 , and the first test instrument 12 and the second test instrument 13 are respectively connected to the computer host 11 by communication. [0003] A test program (not shown) is stored in the main computer 11, and this test program is composed of test items one by one, wherein, some test items are used for the first test instrument 12 to execute for the object to be tested (Figure 1). not shown) for testing, while other test items are used for execution by the second testing instrument 13 to test the object to be tested. [0004] see figure 2 , figure 2 It is a schematic diagram of the firs...

AI Technical Summary

Problems solved by technology

If the above-mentioned test process requires partial adjustment, such as modifying the test items of the first test instrument 12, it is still necessary to issue instructions through the computer host 11 to change the first test instrument 12, so compared with the most original test process It can be said that there is no advantage at all, so this test process is only suitable for testing the same type of DUT, not suitable for the test environment that needs to change the test items

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