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A method for processing integrated circuit test data

A technology of testing data and integrated circuits, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems of low efficiency in calculating changes, lack of data processing, error-prone and other problems, so as to avoid human errors and reduce The effect of reducing manual workload and improving work efficiency

Active Publication Date: 2016-02-10
BEIJING MXTRONICS CORP +1
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  • Abstract
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AI Technical Summary

Problems solved by technology

[0006] The technical problem of the present invention is: to overcome the deficiencies of the prior art, to provide a processing method for integrated circuit test data, to solve the problem of manually extracting data and calculating the variation of test items during the production process of integrated circuits Low efficiency, error-prone, and integrated circuit test equipment does not have the problem of such data processing

Method used

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  • A method for processing integrated circuit test data
  • A method for processing integrated circuit test data
  • A method for processing integrated circuit test data

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Embodiment Construction

[0029] The present invention provides a method capable of extracting corresponding test item data in different test data files and calculating the change amount, especially for the actual needs of different test links of the same device, which can perform data extraction and change amount of various test items Calculating, and judging whether to pass or not according to the set limit value, belongs to the technical field of integrated circuit testing, and is applicable to the production mode of integrated circuit testing data recording. According to the method, the test item data required in the specified data file is extracted according to the integrated circuit device number, and the variation and the discrimination limit are calculated.

[0030] The steps of the inventive method are as follows:

[0031] A method for processing integrated circuit test data, characterized in that it comprises the following steps:

[0032] (1) The IC chips of the batch to be tested are tested...

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Abstract

The invention discloses a processing method of integrated circuit testing data. Calculation and discretion of corresponding test item variation quantity are carried out on any two files according to appointed test items, vibration quantity limitation and limitation units. Two appointed files are searched automatically according to recorded parameters to generate a corresponding test item variation quantity aggregate report form of all devices, and the corresponding test item variation quantity aggregate report form is judged according to limitation value. If some items are not qualified, a non-qualified report form is automatically generated. According to the processing method of the integrated circuit testing data, working time is greatly shortened, accuracy of variation quantity calculation is improved, working efficiency is improved, and the problem that no corresponding data analyzing tool exists in the field of integrated circuit testing is solved.

Description

technical field [0001] The invention relates to a processing method for integrated circuit test data, which belongs to the technical field of integrated circuit test and is suitable for the production mode of integrated circuit test data recording. Background technique [0002] In the production process of high-level integrated circuits, the integrated circuit obtains a unique serial number after the packaging is completed. When testing in the test links after various reliability tests or other required test links, it is carried out according to the unique serial number initially obtained. data record. The performance of integrated circuits is not only judged by test data, but also the amount of data variation plays an important role in judging device performance. Solving the calculation problem of the test value variation of corresponding test items of any two batches of test data can play a further role in confirming the discrimination of integrated circuit performance. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/30
Inventor 张小孟李鑫刘利新练滨浩姚全斌
Owner BEIJING MXTRONICS CORP
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