Product accelerated degradation test scheme design method based on engineering experience

Abstract

A product accelerated degradation test scheme design method based on engineering experience includes the following steps that constraint conditions of conducting test design are determined, wherein the constraint conditions comprise test time, test sample sizes and test expenses, and the test expenses have a whole restraining relationship with the test time, the test sample sizes and test frequency; prior information of an accelerated degradation test is determined, wherein the prior information is obtained according to the engineering experience, design criteria and similar product information and through finite element analysis and product diagnostic test analysis; a design scope of corresponding test design elements is given according to engineering principles and corresponding calculation empirical formulas, wherein the design scope comprises test stress level numbers, stress levels, the test sample sizes, the test time and the test period of the test; corresponding test design alternative schemes are constructed on the basis of the calculation results, and the accelerated degradation test scheme is determined according to the engineering experience and an implement difficulty level.

Description

technical field [0001] The invention proposes a product accelerated degradation test scheme design method based on engineering experience, which belongs to the reliability technical field of accelerated test design. Background technique [0002] With the development of modern science and technology, the improvement of industrial level, and the continuous development of reliability technology, more and more products have the characteristics of high reliability and long life. The manufacturing costs of such products are relatively high, which determines that the total sample size that can be invested in accelerated change tests is usually small. However, its own life level is relatively high, and the design life is as long as several years. How to evaluate its life index with high precision based on the test data of a small number of samples in a short test time, on the one hand, puts forward the information utilization rate of the evaluation method. On the other hand, it als...

AI Technical Summary

Problems solved by technology

The production and manufacturing costs of such products are relatively high, which determines that the total sample size that can be invested in the accelerated change test is usually small

However, its own life level is relatively high, and the design life is as long as several years....

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