Method and device for testing coil device

Abstract

The embodiment of the invention provides a method and device for testing a coil device. The method includes the steps of selecting the coil device to be tested, and presetting a testing strategy; initializing a testing device set, selecting testing instruments from the testing device set according to the testing strategy, and testing the coil device to be tested through the selected testing instruments. The device comprises the testing device set, an upper computer and a control circuit module, wherein the testing device set comprises the multiple testing instruments, the upper computer is used for selecting the coil device to be tested, presetting the testing strategy, initializing the testing device set and testing the coil device to be tested through the selected testing instruments, and the control circuit module is used for selecting the testing instruments from the testing device set according to the testing strategy.

Description

technical field [0001] The invention relates to the technical field of electronic circuit equipment, in particular to a coil equipment testing method and device. Background technique [0002] Coil equipment is a common component in current electronic circuit systems, such as inductors or transformers, which are wound with coils, all belong to the category of coil equipment. For the electrical performance test of coil equipment, the following test items are routinely included: inductance, capacitance, DC resistance, quality factor, no-load voltage, no-load current, impedance, transformation ratio, insulation resistance and insulation withstand voltage, etc. [0003] Usually, the testing of coil equipment in the prior art often chooses the following methods: [0004] Different test items can be tested with corresponding test instruments, and test results need to be manually recorded during the test process; and when switching test items or test objects, it is also necessary t...

AI Technical Summary

Problems solved by technology

[0006] The defect of the existing technology is that the scheme of manual recording of test results and manual switching of testing instruments is inefficient, has high requirements for testers, and a large number of human operations are prone to errors and poor stability; the scheme of using test circuits for testing Among them, the accuracy of the test circuit is not as good as that of professional test instruments, so the accuracy is relatively poor

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