Hot-swappable test module and test system using it

A test system and test module technology, applied in the direction of electronic circuit testing, etc., can solve the problem that the protection circuit cannot be tested separately, and achieve the effect of helping standardization and reducing work burden

Active Publication Date: 2018-08-10
SHENXUN COMP KUNSHAN +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, after the electronic device is assembled, since the protection circuit is generally embedded on the circuit board of the electronic device or directly integrated with other circuit components, the protection circuit usually cannot be tested separately

Method used

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  • Hot-swappable test module and test system using it
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Embodiment Construction

[0027] In order to make the content of the present disclosure easier to understand, the following specific embodiments are taken as examples in which the present disclosure can indeed be implemented. In addition, wherever possible, components / members / steps with the same reference numerals are used in the drawings and embodiments to represent the same or similar parts.

[0028] figure 1 It is a functional block diagram of a test system according to an embodiment of the present invention. Please refer to figure 1 , the testing system 100 includes an electronic device 110 and a testing module 120 . Wherein, the electronic device 110 is, for example, any type of electronic device such as a desktop computer, a notebook computer, a tablet computer, a personal digital assistant (PDA), a smart phone, a portable music player, a liquid crystal TV, or a projector. .

[0029] In this embodiment, the electronic device 110 includes a functional circuit 112 and a protection circuit 114 ....

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Abstract

The invention provides a hot-pluggable test module and a test system with same. The test system comprises an electronic device and a test module. The electronic device comprises a functional circuit and a protecting circuit. The protecting circuit is coupled with the functional circuit. The protecting circuit detects the operation state information of the functional circuit for obtaining a testing signal. Furthermore when the level of the testing signal exceeds a critical value, the protecting circuit generates a protection starting signal. The test module is coupled with the electronic device in a hot-pluggable manner. The test module adjusts the testing signal in a testing mode for making the level of the testing signal exceed the critical value. Furthermore the test module determines whether the protecting circuit is in a normal operation state based on the protection starting signal which is transmitted from the protecting circuit.

Description

【Technical field】 [0001] The present invention relates to a testing technology of an electronic device, and in particular to a hot-swappable testing module for testing a protection circuit of an electronic device and a testing system using the same. 【Background technique】 [0002] In order to prevent the electronic device from being damaged due to the hardware characteristics of the internal circuit components that cannot withstand extreme working conditions (such as high temperature, high current or high voltage) under some special / abnormal operating conditions (such as heavy load operation or internal circuit short circuit, etc.) Damage or failure of the electronic device, so usually in the design of the electronic device, a protection circuit is provided to detect the above-mentioned possible special / abnormal operation conditions. When the protection circuit detects that the operation of the electronic device has reached a specific critical state (such as temperature, cur...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 李垂宪林鑫志
Owner SHENXUN COMP KUNSHAN
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