Microwave-laser mixing plasma detection system

A detection system and plasma technology, applied in the field of detection systems, can solve the problems of increased detection difficulty and insufficient lower detection limit.

Inactive Publication Date: 2017-05-31
TOPLUMEN LASER TECH BEIJING CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, there are certain problems in traditional plasma detection, for example, the detection limit is not low enough, resulting in the minimum detection limit of many elements being higher than the national standard value, which makes it more difficult for the comprehensive promotion of plasma detection to food safety and environmental detection

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  • Microwave-laser mixing plasma detection system

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Embodiment Construction

[0023] In order to further understand the features, technical means, and achieved specific objectives and functions of the present invention, and to analyze the advantages and spirit of the present invention, the present invention will be further described through the following examples.

[0024] The invention proposes a design scheme of a plasma detection system, and provides a method for lower element content in detection substances.

[0025] The structural diagram of the example of the present invention is referring to attached figure 1 .

[0026] The invention patent mainly consists of seven parts: light source module (1), microwave module (2), sample module (3), control module (4), detection module (5), logic module (6) and display module (7).

[0027] This patent aligns the light source module (1), microwave module (2) and detection module (5) through the control module (4) to achieve time-sharing control and cooperation to complete the corresponding functions. The cont...

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Abstract

The invention discloses a microwave-laser mixing plasma detection system which combines microwave and laser plasma stimulating and detecting technologies. The microwave-laser mixing plasma detection system is a system which can independently complete detection of element and substance component contents. The detection system mainly comprises a light source module, a microwave module, a sample module, a control module, a detection module, a logic module and a display module, wherein the logic module is connected with the control module, the detection module and the display module; the control module controls the light source module, the microwave module and the detection module; the microwave module emits microwaves to stimulate plasmas, and then the light source module carries out secondary plasma stimulation; in the whole process, the microwave module continuously outputs the microwaves to prolong the life of the plasmas; the detection module transmits information to the logic module; after being processed, the information is displayed on the display module. The microwave-laser mixing plasma detection system is higher in detection precision and lower in detection lower limit, and a detected sample does not need to be preprocessed.

Description

technical field [0001] The invention belongs to a detection system, and in particular relates to a detection system which enhances plasma detection through microwave laser mixing. Background technique [0002] Plasma detection, which is a kind of spectral detection technology that has gradually emerged in recent years by measuring the induced plasma spectrum on the surface of a substance, is a kind of atomic emission spectroscopy. Plasma technology is so far the only known technique capable of detecting spectra of all elements in any environment; also in various sample forms in solid, liquid, powder, gas form. At the same time, the plasma detection technology has many advantages such as fast measurement speed, remote non-contact measurement, and simple system structure. Based on the many advantages and versatility of plasma detection technology, some people call it a "universal" detection technology. [0003] At the same time, it cannot analyze multiple elements at the sam...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/63
Inventor 不公告发明人
Owner TOPLUMEN LASER TECH BEIJING CO LTD
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