Automated testing method and system of DUT basic test

An automated testing and basic technology, applied in the computer field, can solve the problems of incomplete realization of basic functions, more time invested by testers, and high test difficulty, so as to improve test efficiency, shorten test cycle, and reduce work difficulty.

Inactive Publication Date: 2017-09-01
PHICOMM (SHANGHAI) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Although the above solution solves some problems of the existing technology to a certain extent, it has not fully realized the automation of testing for basic functions, and still requires a lot of time spent by testers, and there are still problems such as low testing efficiency and high testing difficulty

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  • Automated testing method and system of DUT basic test

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Embodiment 1

[0038] Such as figure 1 As shown, the automated testing method of the DUT basic test of the present embodiment comprises the following steps:

[0039] The tester connects the DUT to the system used for testing;

[0040] After connecting the DUT to the test system, enter the DUT project name, and check the automated test cases to be tested and start the system;

[0041] Specifically, the test system has multiple automated test case options for testers to choose from, so the tester only needs to check the option to be tested among the multiple automated test case options, and can only check one option, or Check multiple options, depending on the test needs.

[0042] Of course, the test system can also be provided with an input box, and the tester can also input the keyword of the automated test case to be tested in the input box, so that the corresponding options of the test case input by the tester can be highlighted or prioritized among many options. It is displayed for eas...

Embodiment 2

[0088] This embodiment is similar to the embodiment, the difference is that this embodiment discloses an automated testing system for DUT basic testing based on an automated testing method for DUT basic testing.

[0089] Specifically, the automated testing system for DUT basic testing includes an interactive module and an automatic testing module that interacts with testers. Testers input the DUT project name, test cases to be tested, and set up the system through the interactive module;

[0090] Furthermore, the automatic test module includes a first version test module and a repair version test module. The first version test module tests all the functions of the DUT once, and the repair version test module tests the bugs from the previous test again.

[0091] The system of this embodiment can help testers improve test efficiency, can automatically test items, reduce tester's work difficulty, improve test efficiency, shorten test cycle, and reduce product cost.

[0092] The s...

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Abstract

The present invention provides an automated testing method of the DUT basic test. The method comprises: S1: automatically connecting to a version management server, entering the DUT version path according to the DUT project name to obtain the latest version of the DUT, and downloading the latest version to the local path; S2: opening the DUT WEB page, entering the upgrade page, and importing the latest version to the upgrade page to carry out upgrade on the DUT; S3: running the test case on the DUT, sending the test results to the corresponding terminal, if the test passes, ending the operation, and if the test fails, executing step S4; S4: keeping a wait for state within a preset period of time, and repeating steps S1 and S2 after the wait for state is ended; and S5: testing the failed item in the previous test to verify the bug fix, and if the test fails, continuing to execute step S4. Advantages of the method provided by the present invention are that: efficiency is improved, the test cycle is shortened and costs are reduced.

Description

technical field [0001] The invention belongs to the field of computers, and in particular relates to an automatic testing method and system for DUT basic testing. Background technique [0002] DUT refers to the device under test, the device under test. Usually, DTU contains various functions, which need to be verified by peripheral test referrals. At present, the disease function test for each item of DUT is a manual test, which requires testers to test these basic functions over and over again for each item, which takes up a lot of testing time and affects testers to do more in-depth tests on the items, and There are also shortcomings such as high test cost and inability to test parallel DUTs. [0003] In order to solve the above technical problems, people have carried out long-term exploration. The Chinese patent discloses a solution for full-speed, parallel DUT testing [application number: CN201180036990.9]. The system includes: a configurable integrated circuit IC, whic...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/263
CPCG06F11/263
Inventor 朱渊
Owner PHICOMM (SHANGHAI) CO LTD
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