Current self-calibration circuit and method suitable for multi-channel combination measuring

An automatic calibration, circuit technology, applied in the direction of adjusting electrical variables, control/regulating systems, instruments, etc., can solve the problem of wasting chip area and achieve the effect of improving accuracy

Inactive Publication Date: 2017-10-24
BEIJING TONGFANG MICROELECTRONICS
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  • Abstract
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  • Application Information

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Problems solved by technology

In addition, this method will also be affected by the input offset of the operational amplifier 21 and the mismatch of the current mirror circuit 22. Usually, in order to reduce the influence of these two non-ideal factors on the accuracy of the reference current, the area of ​​the relevant device will be increased, so that Will waste chip area

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  • Current self-calibration circuit and method suitable for multi-channel combination measuring
  • Current self-calibration circuit and method suitable for multi-channel combination measuring
  • Current self-calibration circuit and method suitable for multi-channel combination measuring

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Embodiment Construction

[0020] Such as image 3 As shown, it is a schematic block diagram of a multi-channel parallel measurement current automatic calibration circuit and method proposed by the present invention; this multi-channel parallel measurement current automatic calibration circuit and calibration method is specifically manifested in that the external test environment generates a reference current circuit 32. Chips to be calibrated 31_1 / 31_2...31_N, the external test environment generates a reference current circuit 32, and N channels of reference currents matching the number of chips to be tested form a total reference current IREF×N, N chips to be calibrated are connected in parallel to the external test The environment produces the output port of the reference current circuit 32, and the reference current input to each chip to be calibrated is first connected to the input port of the current balance circuit 33, and the output port of the current balance circuit 33 is connected to one end o...

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Abstract

The invention discloses a current self-calibration circuit and method suitable for multi-channel combination measurement. A reference current is generated by an external testing environment, added to the current self-calibration circuit and then matched with the number N of to-be-measured chips to form a total reference current. Meanwhile, the output port of the reference current is connected to the current input branch circuit of each chip, the N to-be-measured chips are connected to the output port of the total reference current in parallel, and the self-calibration circuit of the N to-be-measured chips is formed. According to the technical scheme, the influence of the discrete degree between the chips with the same wafers on the current distribution is reduced, the current self-calibration circuit and method are not affected by the chip discrete degree between different batches of wafers or the chip discrete degree between different wafers of the same batch, and the current self-calibration precision is improved during the multi-channel combination measurement.

Description

technical field [0001] The invention relates to the field of integrated circuits, in particular to a current automatic calibration circuit and method suitable for multi-channel parallel measurement. Background technique [0002] In the modern analog and mixed-signal integrated circuit industry, there is a certain degree of dispersion in the same current parameters of different chips. Therefore, it is necessary to calibrate all current parameters during the test phase, especially the current automatic calibration circuit efficiency and Accuracy directly affects the overall cost of the chip. [0003] Single current automatic calibration circuit such as figure 1 As shown, it is composed of a reference current generating circuit 11 , a current to be measured generating circuit 12 , a current comparison circuit 13 , and a current to be measured gear control circuit 14 . The control signal A obtained by comparing the reference current IREF generated by the reference current gene...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): G05F1/56
CPCG05F1/56
Inventor武晓伟解辰马文远陈凝
OwnerBEIJING TONGFANG MICROELECTRONICS