Test method and device based on Mock and server
A test method and test device technology, applied in software test/debugging, instrumentation, error detection/correction, etc., can solve problems such as data loss, inaccurate test results, and inability of the next-level service module to truly reflect performance, etc., to achieve The effect of accurate test results
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0071] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.
[0072] The Mock-based testing method and device of the embodiment of the present invention will be described below with reference to the accompanying drawings.
[0073] figure 1 It is a schematic flow chart of a mock-based testing method provided by an embodiment of the present invention. Such as figure 1 As shown, the Mock-based testing method includes the following steps:
[0074] S101. Receive a data request for acquiring test data sent by a target interface; the data request carries a service identifier for identifying a s...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com