Application method of integrated circuit test device

Abstract

The invention discloses an application method of an integrated circuit test device. The integrated circuit test device is provided with temperature sensors which are arranged at different positions ina shell and used for sensing the temperature in an integrated circuit; when the temperature of the integrated circuit needs to be tested, an acquisition port is formed in the corresponding position of the to-be-tested integrated circuit, switches are turned on, the sensors transmit the detected temperature to each test module, the tested temperature can be transmitted to a monitoring terminal ofan operator in real time in a wireless mode, and the operator can compare and monitor the temperature. The safety is guaranteed, the manufacturing cost is low, the protection effect is remarkably enhanced, and the overall firmness and the connection reliability are greatly improved.

Description

technical field [0001] The invention relates to the technical field of control, and more specifically, relates to a method for using integrated circuit testing equipment. Background technique [0002] Integrated circuit (IC) is a kind of miniature electronic device or component. Since the integrated circuit encapsulates the required various components and wiring interconnections in a small space, it puts forward quite strict requirements on the internal temperature of the space. . When the temperature of the integrated circuit device is too high, it is very easy to break down, and if it is not handled properly, it will easily cause serious safety, information and even economic accidents. In response to these problems, the current integrated circuit system lacks effective and reasonable temperature testing equipment, which has caused great hidden dangers to the integrated circuit and its information security. Therefore, in view of this situation, it is urgent to develop an i...

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