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Bus capacitance aging test method, device, computer equipment and storage medium

A technology for bus capacitance and aging testing, applied in the field of servo drive, can solve the problem of inaccurate bus capacitance aging test results

Active Publication Date: 2020-12-08
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Based on this, it is necessary to provide a bus capacitor aging test method, device, computer equipment and storage medium for the above-mentioned problem of inaccurate aging test results of bus capacitors

Method used

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  • Bus capacitance aging test method, device, computer equipment and storage medium
  • Bus capacitance aging test method, device, computer equipment and storage medium
  • Bus capacitance aging test method, device, computer equipment and storage medium

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Embodiment Construction

[0044] In order to make the purpose, technical solution and advantages of the present application clearer, the implementation manners of the present application will be further described in detail below in conjunction with the accompanying drawings.

[0045] Servo drive, also known as "servo amplifier" or "servo controller", is a device for controlling servo motors. Servo drives generally achieve high-precision transmission control through position control, speed control, and torque control. The servo drive is equipped with a servo drive circuit, which is used to realize the electrical control function of the servo drive.

[0046] The existing servo drive circuit generally includes a finishing filter circuit, a bus capacitor, a power drive circuit and a control circuit. Among them, the control circuit includes a microprocessor, and the microprocessors of the current mainstream servo drives all use digital signal processors. The digital signal processor integrates a special i...

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Abstract

The invention discloses a bus capacitor aging test method and device, computer equipment and a storage medium in the technical field of servo drive. The bus capacitor aging test method comprises the following steps: controlling a servo drive circuit to consume power when a bus capacitor is charged, periodically controlling the power drive circuit to stop running in the power consumption process of the servo drive circuit, controlling the discharging circuit to discharge the bus capacitor, and controlling the capacitor detection circuit to acquire voltage data of the bus capacitor in the discharging process; for the voltage data collected each time, determining the capacitance value of the bus capacitor according to the voltage data; and determining an aging test result of the bus capacitor according to the capacitance value of the bus capacitor determined each time. In the working process of the servo drive circuit, the aging test of the bus capacitor is periodically carried out, andthe aging test of the bus capacitor is carried out in the actual working scene of the servo drive circuit, so that the test result of the aging test is more accurate.

Description

technical field [0001] The present application relates to the technical field of servo drives, in particular to a bus capacitance aging test method, device, computer equipment and storage medium. Background technique [0002] The servo drive circuit is a common drive system in the field of automated production. The servo drive circuit absorbs the high pulse current at the bus end of the servo drive circuit through the bus capacitor to ensure the safety of the servo drive circuit. During the operation of the servo drive circuit, due to the large change in the load of the servo motor and the frequent acceleration and deceleration, the impact on the bus capacitor is relatively strong, resulting in the aging of the bus capacitor. Therefore, it is necessary to perform an aging test on the bus capacitor to obtain the bus capacitor Aging results, and according to the aging results of the bus capacitors, the aging faults of the bus capacitors are predicted. [0003] In the prior ar...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R27/26
CPCG01R27/2605G01R31/003
Inventor 王远航王春辉周健黄创绵李小兵孟苓辉丁小健梁超陆树汉董成举杨剑锋刘文威
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST