Capability level analysis method and device, electronic equipment and storage medium

An analysis method and capability technology, applied in the field of data analysis, can solve problems such as big blindness

Pending Publication Date: 2020-12-04
滕德群
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, since job seekers in the prior art mostly conduct ability level analysis based on their own subjective judgments, there is a large blindness

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Capability level analysis method and device, electronic equipment and storage medium
  • Capability level analysis method and device, electronic equipment and storage medium
  • Capability level analysis method and device, electronic equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0048] figure 1 It is a schematic flowchart of the ability level analysis method provided in Embodiment 1 of the present application. The ability level analysis method in this embodiment can be executed by electronic devices with ability level analysis functions, such as computers, servers, and mobile terminals. like figure 1 As shown, the ability level analysis method of this embodiment includes:

[0049]S101. Obtain target parameters of the user, where the target parameters include at least one of the following parameters: target profession, target industry, and target enterprise.

[0050] In this step, since different professions, industries, or enterprises have different requirements for user capabilities, in order to improve the accuracy of analysis of user capability levels, it is necessary to obtain user target parameters first.

[0051] In this embodiment, for job seekers, the target parameters are used to reflect the user's job search goals, such as the industry tha...

Embodiment 2

[0077] In the above-mentioned first embodiment, before obtaining the user's target parameters, it should also include the process of constructing the capability level analysis model. A specific embodiment will describe the process of constructing the capability level analysis model below.

[0078] Figure 5 A schematic flow chart of the ability level analysis method provided in Example 2 of the present application, such as Figure 5 As shown, in this embodiment, for each capability level analysis model, its construction process includes:

[0079] S201. Obtain initial capability level evaluation parameters.

[0080] In this step, the ability level evaluation parameters are related parameters used to quantitatively describe the user's ability level. Depending on the ability level analysis model to be established, the selection of ability level evaluation parameters may also be different.

[0081] In a possible implementation, the ability level evaluation parameters include: abil...

Embodiment 3

[0094] Figure 8 Schematic diagram of the structure of the capability level analysis device provided in Example 3 of the present application, such as Figure 8 As shown, the ability level analysis device 10 in this embodiment includes:

[0095] An acquisition module 11 and a processing module 12.

[0096] The obtaining module 11 is used to obtain the target parameters of the user, and the target parameters include at least one of the following parameters: target profession, target industry and target enterprise;

[0097] The processing module 12 is configured to determine the user's target capability level analysis model from a plurality of preset candidate capability level analysis models according to the target parameter; according to the target capability level analysis model, the user's capability Levels are analyzed to determine the user's ability level.

[0098] Optionally, the target capability level analysis model includes target capability dimensions, the weight of...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The embodiment of the invention provides a capability level analysis method and device, electronic equipment and a storage medium. According to the capability level analysis method and device, the electronic equipment and the storage medium provided by the embodiment of the invention, the target parameters of a user are acquired, and the target parameters comprise at least one of the following parameters: a target profession, a target industry and a target enterprise; the target ability level analysis model of the user is determined from a plurality of preset candidate ability level analysis models according to the target parameters; the ability level of the user is analyzed according to the target ability level analysis model; the ability level of the user is determined; quantitative andpersonalized analysis of the ability level of the user is realized; the user experience is improved; the user is helped to carry out objective self-ability level positioning.

Description

technical field [0001] The embodiments of the present application relate to the technical field of data analysis, and in particular to a capability level analysis method, device, electronic equipment, and storage medium. Background technique [0002] Ability improvement is an important issue that most people have to face in their study, work and life. Whether it is a job seeker or a college student, it is necessary to clearly position their own ability level and understand their own ability and expectation to engage in a career or expect to enter a company The gap between the school's ability requirements is critical to the success of the promotion. [0003] Taking job seekers as an example, in order to meet the needs of job seekers, the existing technology provides a large number of job hunting network platforms and job hunting lectures, etc., so that job seekers can quickly understand the ability requirements of the target position, so as to combine their own actual situat...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06F16/903G06Q10/10
CPCG06Q10/06393G06Q10/1053G06Q10/06398G06F16/90335
Inventor 滕德群汪潇陈秋雨张曌璐王明睿杨天硕
Owner 滕德群
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap