Tool for solid state disk chip RDT test

A solid-state hard disk and chip technology, applied in faulty hardware testing methods, error detection/correction, detection of faulty computer hardware, etc. clamping effect

Pending Publication Date: 2022-01-07
深圳市固浦斯电子有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] (1) When injecting the test program into the solid-state hard disk chip, it is necessary to connect the external interface with the solid-state hard disk chip, but the existing fixed tooling for testing is poor in stability, and it is easy to cause the solid-state hard d

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Tool for solid state disk chip RDT test
  • Tool for solid state disk chip RDT test
  • Tool for solid state disk chip RDT test

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0036] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0037] see figure 1 , a solid state hard disk chip RDT test tooling, including a sealing shell 1, a turning device 2, a fixing device 3 and a detecting device 4, the sealing shell 1 is provided with a turning device 2 inside, and the turning device 2 is provided with a fixing device Device 3, a detection device 4 is arranged inside the sealed casing 1; during the specific work, the RDT test of the solid-state hard disk chip is mainly ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a tool for RDT testing of a solid state disk chip, and relates to the technical field of chip testing, the tool comprises a sealed shell, a turnover device, a fixing device and a detection device, the turnover device is arranged in the sealed shell, the fixing device is arranged on the turnover device, the detection device is arranged in the sealed shell, and the detection device is arranged on the turnover device. In addition, the invention can solve the following problems: a, when a test program is injected into the solid state disk chip, an external interface needs to be butted with the solid state disk chip, but an existing fixing tool for testing is poor in stability, so that the solid state disk chip is easy to deviate after being subjected to an external force, and the test result is influenced. And b, only a single solid state disk chip can be tested during the RDT test of the existing solid state disk chip, the efficiency is poor, and the test efficiency cannot be effectively improved.

Description

technical field [0001] The invention relates to the technical field of chip testing, and specifically provides a solid-state hard disk chip RDT tooling for testing. Background technique [0002] Solid-state drives, also known as solid-state drives, are hard drives made of solid-state electronic memory chip arrays. The entire solid-state drive is composed of electronic chips and circuit boards. It is widely used in military, vehicle, industrial control, video surveillance, network monitoring, network Terminals, electric power, medical care, aviation, navigation equipment and many other fields, so the quality requirements for solid-state drives are particularly strict. RDT detection. [0003] RDT test, also known as reliability display test, is a test used to measure and evaluate the reliability level of products. The existing RDT test for solid-state hard disk chips is mainly through the operator to place the solid-state hard disk chip to be tested in a designated test area....

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F11/22
CPCG06F11/2205G06F11/2273
Inventor 罗炳根黄飞
Owner 深圳市固浦斯电子有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap