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Tool for solid state disk chip RDT test

A solid-state hard disk and chip technology, applied in faulty hardware testing methods, error detection/correction, detection of faulty computer hardware, etc. clamping effect

Pending Publication Date: 2022-01-07
深圳市固浦斯电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] (1) When injecting the test program into the solid-state hard disk chip, it is necessary to connect the external interface with the solid-state hard disk chip, but the existing fixed tooling for testing is poor in stability, and it is easy to cause the solid-state hard disk chip to shift after being subjected to external force , thus affecting the test results
[0005] (2) The existing solid-state hard disk chip RDT test can only test a single solid-state hard disk chip, which has poor efficiency and cannot effectively improve the test efficiency

Method used

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  • Tool for solid state disk chip RDT test
  • Tool for solid state disk chip RDT test
  • Tool for solid state disk chip RDT test

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Embodiment Construction

[0036] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0037] refer to figure 1 , a solid-state hard disk chip RDT test tooling, including a sealed casing 1, a flipping device 2, a fixing device 3 and a detection device 4, the inside of the sealed casing 1 is provided with a flipping device 2, and the flipping device 2 is provided with a fixing device Device 3, the inside of the sealed casing 1 is provided with a detection device 4; during specific work, the RDT test of the solid-state hard disk chip is mainly to ...

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Abstract

The invention provides a tool for RDT testing of a solid state disk chip, and relates to the technical field of chip testing, the tool comprises a sealed shell, a turnover device, a fixing device and a detection device, the turnover device is arranged in the sealed shell, the fixing device is arranged on the turnover device, the detection device is arranged in the sealed shell, and the detection device is arranged on the turnover device. In addition, the invention can solve the following problems: a, when a test program is injected into the solid state disk chip, an external interface needs to be butted with the solid state disk chip, but an existing fixing tool for testing is poor in stability, so that the solid state disk chip is easy to deviate after being subjected to an external force, and the test result is influenced. And b, only a single solid state disk chip can be tested during the RDT test of the existing solid state disk chip, the efficiency is poor, and the test efficiency cannot be effectively improved.

Description

technical field [0001] The invention relates to the technical field of chip testing, and specifically provides a solid-state hard disk chip RDT tooling for testing. Background technique [0002] Solid-state drives, also known as solid-state drives, are hard drives made of solid-state electronic memory chip arrays. The entire solid-state drive is composed of electronic chips and circuit boards. It is widely used in military, vehicle, industrial control, video surveillance, network monitoring, network Terminals, electric power, medical care, aviation, navigation equipment and many other fields, so the quality requirements for solid-state drives are particularly strict. RDT detection. [0003] RDT test, also known as reliability display test, is a test used to measure and evaluate the reliability level of products. The existing RDT test for solid-state hard disk chips is mainly through the operator to place the solid-state hard disk chip to be tested in a designated test area....

Claims

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Application Information

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IPC IPC(8): G06F11/22
CPCG06F11/2205G06F11/2273
Inventor 罗炳根黄飞
Owner 深圳市固浦斯电子有限公司
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