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Surface defect determination device, appearance inspection device, and program

A technology for discriminating devices and defects, applied in measurement devices, optical testing flaws/defects, instruments, etc., can solve problems such as discriminating surface defects, and achieve the effects of high defect detection, simplified inference processing, and improved resolution

Pending Publication Date: 2022-04-15
KONICA MINOLTA INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, the invention described in Patent Document 1 is based on the premise that the object to be inspected is stationary. For example, it is impossible to detect surface defects by inspecting a conveyor driven by a roller, which is difficult to control stationary while moving the conveyor belt.

Method used

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  • Surface defect determination device, appearance inspection device, and program
  • Surface defect determination device, appearance inspection device, and program
  • Surface defect determination device, appearance inspection device, and program

Examples

Experimental program
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Embodiment Construction

[0083] Embodiments of the present invention will be described below based on the drawings.

[0084] [Structure of Appearance Inspection Device]

[0085] figure 1 It is a configuration diagram showing an appearance inspection device according to an embodiment of the present invention. Such as figure 1 As shown, the appearance inspection apparatus includes a line sensor 1, two lighting devices 2a, 2b, a lighting control unit 8 for controlling each lighting device 2a, 2b, a line sensor control unit 9 for controlling the line sensor 1, and a conveyor for transporting the object 5 to be inspected. Drums 3, 3, a drum encoder 4 for detecting the imaging position of the object 5 to be inspected, a display device 6, a computer 10, and a conveyance drum controller 11 for controlling the rotational speed of the conveyance drum 3 in order to control the conveyance speed of the object 5 to be inspected, etc. .

[0086] The computer 10 processes images captured by the line sensor 1 to p...

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PUM

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Abstract

The invention provides a surface defect determination device, an appearance inspection device, and a program. The present invention is provided with: an image acquisition means (10) that, while moving an object (5) to be inspected relative to illumination devices (2a, 2b) and a line sensor (1) disposed at different positions, switches one by one illumination light from each illumination device to irradiate the object to be inspected, and, when switching the illumination light from each illumination device to irradiate the object to be inspected, acquires an image of the object to be inspected, each time the illumination light from each illumination device is switched; the image capturing unit receives reflected light from an object to be inspected through a line sensor and captures the reflected light, thereby acquiring a plurality of images in a state in which the positions of the images are shifted by the switching amount of the illumination light. An alignment means (10) for aligning the acquired images corresponding to the respective illumination devices; and a determination means (10) for determining a surface defect of the object to be inspected from the image aligned by the alignment means.

Description

technical field [0001] The present invention relates to a surface defect discriminating device for discriminating surface defects of inspected objects such as products and parts having a surface having a strong specular reflection property, an appearance inspection device and a program including the surface defect discriminating device. Background technique [0002] Scratches on the surface of products, parts spoil the appearance. Furthermore, when there are irregularities caused by scratches or the like on a film-forming plate used for producing a thin film such as a film, the irregularities are transferred to the manufactured thin film and become defects of the thin film. [0003] Therefore, an appearance inspection device for detecting surface defects of various products, parts, film-forming sheets, and the like has been proposed. [0004] For example, Patent Document 1 discloses a technique in which a component is imaged while switching light sources in multiple directi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G01N21/01
CPCG01N21/892G01N21/8901G01N21/8851G06T7/0004G01N2021/8854G01N2021/8887
Inventor 原田孝仁阿部芳久山田正之
Owner KONICA MINOLTA INC