Leakage dependent online process variation tolerant technique for internal static storage node

Abstract

A device is disclosed for providing compensation current continuously to compensate for leakage current at the node of an electrical circuit, such as a chip. The device includes a dummy storage cell, a single staged current mirror circuit and a non reconfigurable keeper circuit. The keeper can be used to compensate for a wide range of leakage corners where the internal storage is located. The adaptive keeper circuit not only increases the robustness of the storage node against leakage caused by process variation but also improves the overall performance of the static storage device connected to the node.

Description

CROSS REFERENCE TO RELATED PATENT APPLICATION[0001]The present application relates to Application Serial No. (RPS9 20060191US); “Automatic Self-Adaptive Keeper System With Current Sensor For Real-Time / on Line Compensation For Leakage Current Variations”; Filed Jul. 3, 2007; Inventor: Zhibin Cheng and assigned to the assignee of the present invention. The referenced patent application is incorporated in its entirety in the present application.BACKGROUND OF THE INVENTION[0002]1. Technical Field[0003]The present invention generally relates to integrated circuits and in particular to leakage current in integrated circuits. Still more particular, the present invention relates to compensation of leakage current in integrated circuits.[0004]2. Description of Related Art[0005]The use of keeper circuit arrangements to compensate for leakage current at an internal node of a storage device is well known in the prior art. For example, U.S. Pat. Nos. 6,844,750 B2, 7,002,375 B2 U.S. published pa...

AI Technical Summary

Benefits of technology

[0008]The keeper system of the present invention provides online protection that holds the internal storage node (protected node) with optimal compensation strength against leakage. The keeper system also provides on line compensation for leakage resulting from all process variation corners. The keeper system and techniques can also be used as a burn-in keeper. Burn-in tests are done at elevated temperatures and supply voltage conditions which lead to a large increase leakage current in storage circuits such as a wide MUX latch circuit to be described in great detail herein after. This increases the need for utilizing strong keeper to ensure the functionality during the test where weaker keepers can be used in normal operational conditions.

Problems solved by technology

Although, these circuit arrangements work well for intended purposes they share a common set of design characteristics which are not necessarily desirable for some situations or use.

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