Automatic switching control system and test method for control board burning test mode

Abstract

This invention relates to the fields of circuit and automatic control technology, and particularly to an automatic switching control system and testing method for control board programming and testing modes. The system includes: a driver board comprising an MCU minimum system circuit one, a DC-DC circuit one, and an SWD circuit; a tooling board comprising an MCU minimum system circuit two, a DC-DC circuit two, a program programming switching circuit, a program programming control circuit, and a pin connector; and host computer software including a USB communication serial port, program programming test code, test control selection, and factory code programming. This invention can simultaneously perform hardware testing and factory program programming of the control board, meeting the requirements for automated programming and testing of control boards.

Description

Technical Field

[0001] The present invention relates to the technical field of circuits and automatic control, and in particular to an automatic switching control system and a testing method for a control board burning test mode. Background Art

[0002] Many smart electronic products on the market currently use embedded design solutions, using various MCUs as the main control chips. The core parts of this type of embedded products mainly include hardware design solutions and embedded software development. Among them, the hardware design solution forms a hardware product through processing and manufacturing, and embedded development designs the application control program required by customers. Before the hardware product leaves the factory, there are two key steps: first, it is necessary to test whether the hardware product is qualified, and then burn the control program.

[0003] There are two main solutions for factory testing of embedded products. One is that the terminal program of the embedded product includes the test program of the hardware product. The other is to first burn the test program to the hardware product, and then burn the control program of the hardware product after the test passes. In actual production, the second test solution is more commonly used. First, burn the hardware test program to ensure the production quality of the hardware product, and then burn the hardware control program and send it to the next link for finished product assembly.

[0004] However, in actual production testing, the following problems still exist for the second test solution:

[0005] (1) From the time a hardware product is processed at the production center to the time it is sent to the finished product assembly center, it is necessary to undergo two separate processes: hardware testing and burning of factory programs. According to the existing design scheme, this requires two independent burning and testing operations. This is not conducive to reducing production costs or improving production efficiency.

[0006] (2) During the hardware test and function test of the same hardware product, there are problems such as transportation, shelving, and storage. Such operations undoubtedly increase the risk of failure for the hardware product. This will reduce the test pass rate after the whole machine is assembled and increase the probability of disassembly and rework. Summary of the invention

[0007] The purpose of the present invention is to provide an automatic switching control system and test method for a control board burning test mode. According to a hardware board (hereinafter referred to as a driver board or a control board), a corresponding tooling board is designed, combined with the development of a host computer program to form a complete design scheme. The present invention can simultaneously realize hardware testing of the control board and factory program burning, meeting the automatic burning test requirements of the control board.

[0008] The principle of this technical solution:

[0009] (1) Design a driver board (control board), specifically including MCU minimum system circuit 1, DC-DC circuit 1, SWD circuit and other circuit modules. The core of the present invention is to realize the automatic switching of the burning test of the test program and the factory program in its main control MCU.

[0010] (2) Design a tooling board, which includes MCU minimum system circuit 2, DC-DC circuit 2, program burning switching circuit, program burning control circuit, ejector pin socket, and other circuit modules. The hardware design of the tooling board needs to meet the automatic switching of the test program and factory program for the control board.

[0011] (3) Design a host computer software (program), which includes a USB communication serial port, burning test code, checking test controls, burning factory code, and other modules, to realize the automatic switching requirements between the test program and the factory program of the control board at the software level.

[0012] In order to solve the above technical problems, the present invention provides the following technical solutions:

[0013] An automatic switching control system for a control board burning test mode, comprising:

[0014] Driver board, including MCU minimum system circuit 1, DC-DC circuit 1 and SWD circuit;

[0015] The tooling board is connected to the driving board through an ejector pin; it includes a second MCU minimum system circuit, a second DC-DC circuit, a program burning switching circuit, a program burning control circuit and an ejector pin socket;

[0016] The upper computer software is connected to the tooling board via USB; it includes a USB communication serial port, burning test code, checking test controls and burning factory code.

[0017] Preferably, the main chip U21 of the MCU minimum system circuit 1 adopts STM32F407VET6, and the peripheral circuit is connected according to the recommended circuit in the chip manual. Among them, 1uf C90-C97 filter capacitors are connected in parallel between 3.3V and DGND; the 6th, 11th, 19th, 21st, 22nd, 28th, 50th, 75th, and 100th pins of the chip U21 are connected to the 3.3V power supply, and the 10th, 20th, 27th, 74th, and 99th pins of the chip U21 are connected to DGND; the 12th and 13th pins of the chip U21 are connected to the 8M crystal oscillator Y2, and the two sides of the crystal oscillator Y2 are connected in parallel with 22pf capacitors C77, capacitors C78, ​​and 1M resistors R185, and the input end of the 13th pin of the chip U21 is added with pull-up resistors R186 and filter capacitors C79, and the 72nd and 76th pins of the chip U21 are programming pins.

[0018] Preferably, the DC-DC circuit is used to realize 24V to 5V and 3.3V voltage conversion, and the output voltage is used to power various functional circuits in the driver board; wherein, POWER1 is a 24V access socket, L0 is a common mode inductor, F1 is a resettable fuse, D1 is a rectifier diode, D2 is a Schottky diode (voltage regulator), D3 is a transient suppression diode, U1 is a power conversion chip, U3 is a linear voltage stabilizing power supply chip, L1 is an inductor, C1, C4, C5, C6, C8, C9 are chip capacitors, C2, C3 are electrolytic capacitors, and R4, R6, R7, R8, R10, R11 are chip resistors.

[0019] Preferably, the SWD interface in the SWD circuit is used to burn the test program and the factory program into the driver board IC; wherein P2 is the SWD burning socket, pin 1 is connected in series with a 51R resistor R136 and then connected to the IC pin PA13-SWDIO, pin 3 is connected in series with a 51R resistor R135 and then connected to the IC pin PA14-SWCLK, a 10K resistor R134 is connected in series between pins 2 and 3, pin 4 is connected to the power supply voltage 3.3V, and pin 5 is left floating.

[0020] Preferably, the main chip U20 of the MCU minimum system circuit 2 adopts STM32F407VET6, and the peripheral circuit is connected according to the recommended circuit in the chip manual. Among them, 1uf C50-C57 filter capacitors are connected in parallel between the 3.3V power supply and DGND, and the 6th, 11th, 19th, 21st, 22nd, 28th, 50th, 75th and 100th pins of the chip U20 are connected to the 3.3V power supply, and the 10th, 20th, 27th, 74th and 99th pins of the chip U20 are connected to the ground DGND; the 12th and 13th pins of the chip U20 are connected to the 8M crystal oscillator Y1, and the two sides of the crystal oscillator Y1 are connected in parallel with 22pf capacitors C63, capacitors C69 and 1M resistors R155, and the input end of the 13th pin of the chip U20 is added with pull-up resistors R154 and filter capacitors C70, and the 72nd and 76th pins of the chip U20 are burned. Write port, pin 7 (SLBC) of chip U20 is the factory program burning control pin, and pin 5 (SLAC) of chip U20 is the test program burning control pin; pins 95 and 96 (ASTAT1\2) of chip U20 are the test program burning JTAG circuit pins, and pins 97 and 98 (BSTAT1\2) of chip U20 are the factory program burning JTAG circuit pins, SLQH controls the program burning switching circuit, SLAC controls the test program burning circuit, and SLBC controls the factory program burning circuit. Pins 49 and 73 of chip U20 are respectively connected in series with a 0.1uf capacitor C66 and capacitor C68 and then grounded to DGND.

[0021] Preferably, the DC-DC circuit 2 is used to realize 24V to 5V and 3.3V voltage conversion, and the output voltage is used to power various functional circuits in the tooling board, wherein X2 is a 24V access socket, L1 is a common mode inductor, F1 is a self-recovering fuse, D1 is a Schottky diode, D2 is a transient suppression diode, D3 is a light emitting diode, D4 ​​is a Schottky diode, U1 is a power conversion chip, U2 is a linear voltage stabilizing power supply chip, L2 is an inductor, C1, C3, C4, C5, C6, C7 are chip capacitors, C2, C8 are electrolytic capacitors, and R1, R2, R3, R4, R5, R6, R9 are chip resistors.

[0022] Preferably, the program burning switching circuit includes:

[0023] SLQH is the microcontroller drive signal, R61 is a current limiting resistor, connected to the base of transistor Q3; R62 is a pull-down resistor, connected to the base and emitter of transistor Q3 and then grounded; the collector of transistor Q3 is connected to the current limiting resistor R50; C23 and R43 are connected in parallel between pin 1 and pin 3 of optocoupler U1; pin 1 of optocoupler U1 is connected to a 5V power supply, pin 6 is connected in series with R41 and then connected to a +24V power supply, pin 4 is connected to the base of transistor Q2, and pull-down resistor R54 is connected to the base of transistor Q2. Connected between pin 4 and GND; the collector of transistor Q2 is connected to pin 8 of relay K1, and forms a loop with pin 1 of relay coil by connecting +24V; D3 is a loop protection diode; the microcontroller drive signal SLQH controls the conduction of optocoupler U1 by controlling the conduction of transistor Q3, and then controls the switch of relay K1, that is, the switch of ACLK / ADIO and BCLK / BDIO, so as to achieve the purpose of switching between test program and factory program;

[0024] The program burning control circuit comprises:

[0025] SLAC is the microcontroller drive signal, R93 is a current limiting resistor, connected to the base of transistor Q4; R98 is a pull-down resistor, connected between the base and emitter of transistor Q4 and grounded; the collector of transistor Q4 is connected to the 3.3V of the plug-in socket HX through the current limiting resistor R82;

[0026] SLBC is the microcontroller drive signal, R94 is a current limiting resistor, connected to the base of transistor Q5; R99 is a pull-down resistor, connected between the base and emitter of transistor Q5 and grounded; the collector of transistor Q5 is connected to the 3.3V of the plug-in socket HX through the current limiting resistor R83;

[0027] X15 is the JTAG socket for burning test programs. Pins 1 and 2 are connected to 3.3V power supply, pins 4, 6, 8, 10, 12, 14, 16, 18 and 20 are connected to DGND, ADIO\ACLK\ACTRL1 are connected to K1 relay of tooling board program burning switching circuit and ASTAT1 and ASTAT2 of main control MCU pins, pins 17 and 19 are connected to main control MCU through two current limiting resistors R148 and R150, and filter capacitors C46 and C48 are connected to DGND on the two signal lines respectively;

[0028] X17 is the JTAG socket for burning the factory program. Pins 1 and 2 are connected to 3.3V power supply, pins 4, 6, 8, 10, 12, 14, 16, 18 and 20 are connected to DGND, BDIO\BCLK\BCTRL1 are connected to the K1 relay of the tooling board program burning switching circuit and the BSTAT1 and BSTAT2 of the main control MCU pins, pins 17 and 19 are connected to the main control MCU through two current limiting resistors R149 and R151, and the two signal lines are connected to filter capacitors C47 and C49 respectively and then connected to DGND; the microcontroller drive signal SLAC controls the JTAG circuit for burning the test program by controlling the switch of transistor Q4; the microcontroller signal SLBC controls the JTAG circuit for burning the factory program by controlling the switch of transistor Q5.

[0029] Preferably, in the ejector pin socket, QD5V and QD3.3V are the power supply voltages for connecting the driver board to the tooling board, and DIO and CLK are the clock signal and data signal for connecting the tooling board to the driver board;

[0030] The SWD interface in the tooling board is used to control the program switching to the IC burning mode of the driver board, wherein P1 is the SWD burning socket; pin 1 is connected in series with a 51R resistor R141 and then connected to the IC pin PA13-SWDIO, pin 3 is connected in series with a 51R resistor R142 and then connected to the IC pin PA14-SWCLK, a 10K resistor R144 is connected in series between pins 2 and 3, pin 4 is connected to the power supply voltage 3.3V, and pin 5 is left floating.

[0031] Preferably, the host computer software is used to check the tested items of the driver board and to feed back the test results of the tested items; the host computer interface includes:

[0032] The serial port information column is used to select the communication serial port and open / close the serial port;

[0033] The board information column is used to input the material code of the board to be tested and for process quality traceability;

[0034] The function selection column is used to select the test code and factory code, as well as other related test items; at the same time, the "Start Test" control can control the switch of the test process;

[0035] The progress bar is used to display the progress information of burning and testing;

[0036] The sending area and receiving area are used for serial communication;

[0037] The log directory column can generate a txt file for the entire test process and store it in a specified location;

[0038] The test item details will fully explain the test results or reasons for failure of each test item.

[0039] The present invention also provides the following technical solution: a test method for an automatic switching control system of a control board burning test mode, comprising the following steps:

[0040] Step 1: Place the driver board in the automated test fixture with the fixture board installed, turn on the power, open the host computer software, connect the USB communication serial port to the host computer, select the corresponding COM port, and click the open button on the right. If the operation is successful, the open button will turn gray;

[0041] Step 2: Enter the driver board SN number. The SN number can be entered manually or scanned by a barcode scanner.

[0042] Step 3: Check the driver board test items on the host computer. The optional items on the host computer interface include burning test code, burning factory code, camera test, NTC test, 24V test, voice test, WIFI test, Bluetooth test, motor test, and EEROM. Among them, other circuit modules belonging to the driver board can be checked according to specific needs.

[0043] Step 4: Click the Start button to start the test. If the corresponding checked test item shows that the test has passed, it means the test is qualified. If the test fails, you can view the test log on the right and mark the corresponding driver board as defective and send it to the repair center for repair.

[0044] The present invention has the following beneficial effects:

[0045] (1) According to the driver board, the corresponding tooling board and host computer control program are designed, and combined with the tooling fixture, the hardware test of the driver board and the factory program burning are realized at the same time, which reduces production costs and improves production efficiency. During the test program, if a functional module of the driver board fails, the factory test cannot be burned until the maintenance personnel repairs it and retests it.

[0046] (2) The test fixture made based on the automatic switching control system proposed in the present invention has a high degree of automation, is easy and safe to operate, and has strong portability. Factory testers only need to follow the instructions for use of the test fixture. R&D designers can transplant solutions for different driver boards based on specific needs. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] Figure 1 This is a connection diagram of the automatic switching control system of the present invention.

[0048] Figure 2 This is a connection diagram of the DC-DC circuit of the driver board of the present invention.

[0049] Figure 3 This is a connection diagram of the minimum system circuit of the driver board MCU of the present invention.

[0050] Figure 4 This is a connection diagram of the SWD interface of the driver board of the present invention.

[0051] Figure 5 It is a schematic diagram of the host computer interface of the present invention.

[0052] Figure 6 This is the second connection diagram of the minimum system circuit of the tooling board MCU of the present invention.

[0053] Figure 7 This is a second connection diagram of the DC-DC circuit of the tooling board of the present invention.

[0054] Figure 8 This is a connection diagram of the tooling board program burning switching circuit of the present invention.

[0055] Figure 9 is a connection diagram of the tooling board program burning control circuit of the present invention; wherein (a) is a connection diagram of the test program burning control circuit, wherein (b) is a connection diagram of the factory program burning control circuit, wherein (c) is a connection diagram of the test program burning JTAG circuit, and wherein (d) is a connection diagram of the factory program burning JTAG circuit.

[0056] Fig.10 This is a circuit connection diagram of the pin-to-socket connection of the tooling board of the present invention.

[0057] Fig.11 This is a SWD interface connection diagram of the tooling board of the present invention. DETAILED DESCRIPTION

[0058] The present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments. The advantages and features of the present invention will become more apparent from the following description and claims. It should be noted that the drawings are all in very simplified form and are not in precise proportions, and are only used to conveniently and clearly assist in explaining the purpose of the embodiments of the present invention.

[0059] like Figure 1 As shown, an automatic switching control system for the burning test mode of a control board, the automatic switching control system includes three parts: a driver board, a tooling board and a host computer software. Among them, the driver board includes MCU minimum system circuit 1, DC-DC circuit 1, SWD circuit and other circuit modules; the tooling board includes MCU minimum system circuit 2, DC-DC circuit 2, program burning switching circuit, program burning control circuit, ejector pin socket and other circuit modules; the host computer software includes USB communication serial port, burning test code, power acquisition test, burning factory code and other modules.

[0060] like Figure 2 As shown, the DC-DC circuit 1 is used to realize 24V to 5V and 3.3V voltage conversion, and the output voltage is used to power various functional circuits in the driver board; wherein, POWER1 is a 24V access socket, L0 is a common mode inductor, F1 is a self-recovery fuse, D1 is a rectifier diode, D2 is a Schottky diode (voltage regulator), D3 is a transient suppression diode, U1 is a power conversion chip, U3 is a linear voltage regulator chip, L1 is an inductor, C1, C4, C5, C6, C8, C9 are chip capacitors, C2, C3 are electrolytic capacitors, R4, R6, R7, R8, R10, R11 are chip resistors;

[0061] Among them, the 1st and 2nd pins of the socket POWER1 are connected to the 1st and 2nd pins of the inductor L0 respectively, and the 3rd pin is connected in parallel with the 2nd pin of the inductor L0 and grounded DGND; the 3rd pin of the inductor L0 is grounded DGND, and the 4th pin is connected in parallel to the power supply VCC+24V; the fuse F1 is connected in series between the power supply VCC+24V and the diode D1; the diode D1 is connected in series between the fuse F1 and the chip U1; the diode D3 is connected in parallel between the power supply VCC+24V and DGND for voltage stabilization protection; the electrolytic capacitor C2 and the chip capacitor C4 are also connected in parallel between the power supply VCC+24V and DGND for filtering; the resistors R4 and R6 are connected in series between the power supply VCC+24V and DGND, and the The resistor R4 is also connected in parallel between the 7th and 2nd pins of the chip U1; the resistor R8 is connected in parallel between the 6th and 5th pins of the chip U1; the chip capacitor C6 and the resistor R10 are connected in series between the 3rd pin of the chip U1 and DGND; the resistor R11 is connected in series between the 4th pin of the chip U1 and DGND; the chip capacitor C1 is connected in series between the 1st and 8th pins of the chip U1, and the other end is connected to the negative electrode of the voltage regulator tube D2 and the inductor L1; the voltage regulator tube D2 is connected between the series circuit of the chip capacitor C1 and the inductor L1 and DGNG for voltage stabilization; the inductor L1 is connected in series between the chip U1 and the power supply VCC+5V; the electrolytic capacitor C3 and the chip capacitor C5 are used for energy storage filtering of the output voltage; the resistor R7 is used for pull protection;

[0062] Chip U3 is a three-terminal voltage regulator chip. Pin 1 is connected in parallel with chip capacitors C8 and C9 and then connected to DGND, pin 3 is connected to the power supply VCC+5V, and pins 2 and 4 are connected in parallel and then connected to the power supply +3.3V.

[0063] like Figure 3 As shown, the main chip U21 of the MCU minimum system circuit 1 adopts STM32F407VET6, and the peripheral circuit is connected according to the recommended circuit in the chip manual. Among them, 1uf C90-C97 filter capacitors are connected in parallel between 3.3V and DGND; the 6th, 11th, 19th, 21st, 22nd, 28th, 50th, 75th, and 100th pins of the chip U21 are connected to the 3.3V power supply, and the 10th, 20th, 27th, 74th, and 99th pins of the chip U21 are connected to DGND; the 12th and 13th pins of the chip U21 are connected to the 8M crystal oscillator Y2, and the two sides of the crystal oscillator Y2 are connected in parallel with 22pf capacitors C77, capacitors C78, ​​and 1M resistors R185, and the input end of the 13th pin of the chip U21 is added with a pull-up resistor R186 and a filter capacitor C79, and the 72nd and 76th pins of the chip U21 are programming pins.

[0064] like Figure 4 As shown, the SWD interface in the SWD circuit is used to burn the test program and the factory program to the driver board IC; wherein P2 is the SWD burning socket, pin 1 is connected in series with a 51R resistor R136 and then connected to the IC pin PA13-SWDIO, pin 3 is connected in series with a 51R resistor R135 and then connected to the IC pin PA14-SWCLK, a 10K resistor R134 is connected in series between pins 2 and 3, pin 4 is connected to the power supply voltage 3.3V, and pin 5 is left floating.

[0065] like Figure 6As shown, the main chip U20 of the MCU minimum system circuit 2 adopts STM32F407VET6, and the peripheral circuit is connected according to the recommended circuit in the chip manual. Among them, 1uf C50-C57 filter capacitors are connected in parallel between the 3.3V power supply and DGND, and the 6th, 11th, 19th, 21st, 22nd, 28th, 50th, 75th and 100th pins of the chip U20 are connected to the 3.3V power supply, and the 10th, 20th, 27th, 74th and 99th pins of the chip U20 are connected to the ground DGND; the 12th and 13th pins of the chip U20 are connected to the 8M crystal oscillator Y1, and the two sides of the crystal oscillator Y1 are connected in parallel with 22pf capacitors C63, capacitors C69 and 1M resistors R155, and the input end of the 13th pin of the chip U20 is added with a pull-up resistor R154 and a filter capacitor C70, and the 72nd and 76th pins of the chip U20 are burned in. Write port, pin 7 (SLBC) of chip U20 is the factory program burning control pin, and pin 5 (SLAC) of chip U20 is the test program burning control pin; pins 95 and 96 (ASTAT1\2) of chip U20 are the test program burning JTAG circuit pins, and pins 97 and 98 (BSTAT1\2) of chip U20 are the factory program burning JTAG circuit pins, SLQH controls the program burning switching circuit, SLAC controls the test program burning circuit, and SLBC controls the factory program burning circuit. Pins 49 and 73 of chip U20 are respectively connected in series with a 0.1uf capacitor C66 and capacitor C68 and then grounded to DGND.

[0066] like Figure 7 As shown, the DC-DC circuit 2 is used to realize 24V to 5V and 3.3V voltage conversion, and the output voltage is used to power various functional circuits in the tooling board. A 220V to 24V DC switching power supply module is installed in the automated test tooling of this scheme. After the mains is connected, the DC switching power supply module supplies power to the automated test tooling, thereby improving the safety and reliability of the tooling. Among them, X2 is a 24V access socket, L1 is a common mode inductor, F1 is a self-recovery fuse, D1 is a Schottky diode, D2 is a transient suppression diode, D3 is a light-emitting diode, D4 ​​is a Schottky diode, U1 is a power conversion chip, U2 is a linear voltage regulator power supply chip, L2 is an inductor, C1, C3, C4, C5, C6, C7 are chip capacitors, C2, C8 are electrolytic capacitors, and R1, R2, R3, R4, R5, R6, R9 are chip resistors;

[0067] Pin 1 of socket X2 is connected to the power supply +24V, and pin 2 is connected to the ground GND; diode D1 is connected in series between socket X2 and inductor L1; pin 12 of inductor L1 is connected to pin 12 of socket X2, pin 3 is connected to the ground DGND, and pin 4 is connected to fuse F1; voltage regulator D2, chip capacitor C1 and electrolytic capacitor C2 are connected in parallel between pins 3 and 4 of inductor L1; resistor R5 and resistor R6 are connected in series between pin 4 of inductor L1 and ground DGND, and resistor R6 is connected in parallel between pins 2 and 7 of chip U1; pin 6 of chip U1 is connected in series with resistor R1 and then to ground, pin 5 is directly connected to ground DGND, and pin 3 is connected in series with chip capacitor C3 and resistor R4 and then to ground DGN D, 4-pin is connected in series with resistor R2 and then to ground DGND, 1-pin and 8-pin are connected in parallel with C4 and then connected to pin 1 of L1; voltage regulator D4 is connected to the input end of L2 and DGND for voltage regulation; inductor L2 is connected in series between the power chip U1 and the three-terminal voltage regulator chip U2; chip capacitor C6, chip capacitor C7 and electrolytic capacitor C8 are connected in parallel between the two ends of inductor L2 and DGND, and the chip capacitor C7 end can output a stable and clean 5V voltage; pin 3 of the three-terminal voltage regulator chip U2 is connected to inductor L2, pin 1 is connected to DGND, and pin 4 is connected to filter capacitor C5 and light-emitting diode D3, R6 is a current limiting resistor, and the filter capacitor C5 end can obtain a stable and clean 3.3V DC voltage.

[0068] like Figure 8 As shown, the principle of the program burning switching circuit is that the microcontroller signal SLQH controls the conduction of the optocoupler U1 by controlling the conduction of the transistor Q3, and then controls the switch of the relay K1 to achieve the purpose of switching between the test program and the factory program.

[0069] Specifically, the program burning switching circuit includes:

[0070] SLQH is the microcontroller drive signal, R61 is a current limiting resistor, connected to the base of transistor Q3; R62 is a pull-down resistor, connected to the base and emitter of transistor Q3 and then grounded; the collector of transistor Q3 is connected to the current limiting resistor R50; C23 and R43 are connected in parallel between pin 1 and pin 3 of optocoupler U1; pin 1 of optocoupler U1 is connected to a 5V power supply, pin 6 is connected in series with R41 and then connected to a +24V power supply, pin 4 is connected to the base of transistor Q2, and pull-down resistor R54 is connected to the base of transistor Q2. Connected between pin 4 and GND; the collector of transistor Q2 is connected to pin 8 of relay K1, and forms a loop with pin 1 of the relay coil by connecting +24V; D3 is a loop protection diode; the microcontroller drive signal SLQH controls the conduction of the optocoupler U1 by controlling the conduction of the transistor Q3, and then controls the switch of relay K1, that is, the switching of ACLK / ADIO and BCLK / BDIO, so as to achieve the purpose of switching between the test program and the factory program.

[0071] As shown in FIG9 , the principle of the program burning control circuit is that the MCU signal SLAC controls the JTAG circuit for burning the test program by controlling the switch of transistor Q4; the MCU signal SLBC controls the JTAG circuit for burning the factory program by controlling the switch of transistor Q5; X15 and X17 are JTAG sockets.

[0072] Specifically, the program burning control circuit includes:

[0073] SLAC is the microcontroller drive signal, R93 is a current limiting resistor, connected to the base of transistor Q4; R98 is a pull-down resistor, connected between the base and emitter of transistor Q4 and grounded; the collector of transistor Q4 is connected to the 3.3V of the plug-in socket HX through the current limiting resistor R82;

[0074] SLBC is the microcontroller drive signal, R94 is a current limiting resistor, connected to the base of transistor Q5; R99 is a pull-down resistor, connected between the base and emitter of transistor Q5 and grounded; the collector of transistor Q5 is connected to the 3.3V of the plug-in socket HX through the current limiting resistor R83;

[0075] X15 is the JTAG socket for burning test programs. Pins 1 and 2 are connected to 3.3V power supply, pins 4, 6, 8, 10, 12, 14, 16, 18 and 20 are connected to DGND, ADIO\ACLK\ACTRL1 are connected to K1 relay of tooling board program burning switching circuit and ASTAT1 and ASTAT2 of main control MCU pins, pins 17 and 19 are connected to main control MCU through two current limiting resistors R148 and R150, and filter capacitors C46 and C48 are connected to DGND on the two signal lines respectively;

[0076] X17 is the JTAG socket for burning the factory program. Pins 1 and 2 are connected to 3.3V power supply, pins 4, 6, 8, 10, 12, 14, 16, 18 and 20 are connected to DGND, BDIO\BCLK\BCTRL1 are connected to the K1 relay of the tooling board program burning switching circuit and the BSTAT1 and BSTAT2 of the main control MCU pins, pins 17 and 19 are connected to the main control MCU through two current limiting resistors R149 and R151, and the two signal lines are connected to filter capacitors C47 and C49 respectively and then connected to DGND; the microcontroller drive signal SLAC controls the JTAG circuit for burning the test program by controlling the switch of transistor Q4; the microcontroller signal SLBC controls the JTAG circuit for burning the factory program by controlling the switch of transistor Q5.

[0077] like Fig.10As shown, in the ejector pin socket, QD5V and QD3.3V are the power supply voltages from the driver board to the tooling board, and DIO and CLK are the clock signal and data signal from the tooling board to the driver board;

[0078] like Fig.11 As shown, the SWD interface in the tooling board is used to control the program switching to the IC burning mode of the driver board, wherein P1 is the SWD burning socket; pin 1 is connected in series with a 51R resistor R141 and then connected to the IC pin PA13-SWDIO, pin 3 is connected in series with a 51R resistor R142 and then connected to the IC pin PA14-SWCLK, a 10K resistor R144 is connected in series between pins 2 and 3, pin 4 is connected to the power supply voltage 3.3V, and pin 5 is left floating.

[0079] like Figure 5 As shown, the host computer is used to check the driver board test items and feedback the test results of the test items. The serial port information column is used to select the communication serial port and the serial port open / close operation; the board information column is used to enter the material code of the board under test, which can be used for process quality traceability; the function selection column is used to select the test code and factory code, as well as other related test items; at the same time, the "start" control can control the switch of the test process; the progress bar is used to display the progress information of burning and testing; the sending area and receiving area are used for serial communication; the log directory column can produce a txt file for the entire test process and store it in a specified location; the test item details will fully explain the test results or reasons for failure of each test item.

[0080] The present invention also provides the following technical solution: a test method for an automatic switching control system of a control board burning test mode, comprising the following steps:

[0081] Step 1: Place the driver board in the automated test fixture with the fixture board installed, and turn on the power. Open the host computer software, connect the USB serial port to the host computer, select the corresponding COM port, and click the open button on the right. If the operation is successful, the open button will turn gray;

[0082] Step 2: Enter the driver board SN number. The SN number can be entered manually or scanned by a barcode scanner.

[0083] Step 3: Check the driver board test item on the host computer. Figure 2 As shown in the upper computer interface, the optional items include burning test code, burning factory code, camera test, NTC test, 24V test, voice test, WIFI test, Bluetooth test, motor test, EEROM, etc. Among them, other circuit modules belonging to the driver board can be checked according to specific needs.

[0084] Step 4: Click the Start button to start the test. If the corresponding checked test item shows that the test is passed, it means the test is qualified. If the test fails, you can check the test log on the right and mark the corresponding driver board as defective and send it to the maintenance center for repair.

[0085] The above description is only a description of the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention. Any changes or modifications made by a person skilled in the art in the field of the present invention based on the above disclosure shall fall within the scope of protection of the claims.

Claims

1. An automatic switching control system for a control board burning test mode, characterized in that: include: Driver board, including MCU minimum system circuit 1, DC-DC circuit 1 and SWD circuit; The tooling board is connected to the driving board through an ejector pin; it includes a second MCU minimum system circuit, a second DC-DC circuit, a program burning switching circuit, a program burning control circuit and an ejector pin socket; The upper computer software is connected to the tooling board via USB; including a USB communication serial port, burning test code, checking test controls and burning factory code; The program burning switching circuit comprises: SLQH is the microcontroller drive signal, R61 is a current limiting resistor, connected to the base of transistor Q3; R62 is a pull-down resistor, connected to the base and emitter of transistor Q3 and then grounded; the collector of transistor Q3 is connected to the current limiting resistor R50; C23 and R43 are connected in parallel between pin 1 and pin 3 of optocoupler U1; pin 1 of optocoupler U1 is connected to a 5V power supply, pin 6 is connected in series with R41 and then connected to a +24V power supply, pin 4 is connected to the base of transistor Q2, and pull-down resistor R54 is connected to the base of transistor Q2. Connected between pin 4 and GND; the collector of transistor Q2 is connected to pin 8 of relay K1, and forms a loop with pin 1 of relay coil by connecting +24V; D3 is a loop protection diode; the microcontroller drive signal SLQH controls the conduction of optocoupler U1 by controlling the conduction of transistor Q3, and then controls the switch of relay K1, that is, the switch of ACLK / ADIO and BCLK / BDIO, so as to achieve the purpose of switching between test program and factory program; The program burning control circuit comprises: SLAC is the microcontroller drive signal, R93 is a current limiting resistor, connected to the base of transistor Q4; R98 is a pull-down resistor, connected between the base and emitter of transistor Q4 and grounded; the collector of transistor Q4 is connected to the 3.3V of the plug-in socket HX through the current limiting resistor R82; SLBC is the microcontroller drive signal, R94 is a current limiting resistor, connected to the base of transistor Q5; R99 is a pull-down resistor, connected between the base and emitter of transistor Q5 and grounded; the collector of transistor Q5 is connected to the 3.3V of the plug-in socket HX through the current limiting resistor R83; X15 is the JTAG socket for burning test programs. Pins 1 and 2 are connected to 3.3V power supply, pins 4, 6, 8, 10, 12, 14, 16, 18 and 20 are connected to DGND, ADIO\ACLK\ACTRL1 are connected to K1 relay of tooling board program burning switching circuit and ASTAT1 and ASTAT2 of main control MCU pins, pins 17 and 19 are connected to main control MCU through two current limiting resistors R148 and R150, and filter capacitors C46 and C48 are connected to DGND on the two signal lines respectively; X17 is the JTAG socket for burning the factory program. Pins 1 and 2 are connected to 3.3V power supply, pins 4, 6, 8, 10, 12, 14, 16, 18 and 20 are connected to DGND, BDIO\BCLK\BCTRL1 are connected to the K1 relay of the tooling board program burning switching circuit and the BSTAT1 and BSTAT2 of the main control MCU pins, pins 17 and 19 are connected to the main control MCU through two current limiting resistors R149 and R151, and the two signal lines are connected to filter capacitors C47 and C49 respectively and then connected to DGND; the single-chip microcomputer drive signal SLAC controls the JTAG circuit for burning the test program by controlling the switch of the transistor Q4; the single-chip microcomputer signal SLBC controls the JTAG circuit for burning the factory program by controlling the switch of the transistor Q5; In the ejector pin socket, QD5V and QD3.3V are the power supply voltages from the driver board to the tooling board, and DIO and CLK are the clock signal and data signal from the tooling board to the driver board; The SWD interface in the tooling board is used to control the program switching to the IC burning mode of the driver board, where P1 is the SWD burning socket; Pin 1 is connected in series with a 51R resistor R141 and then connected to the IC pin PA13-SWDIO, Pin 3 is connected in series with a 51R resistor R142 and then connected to the IC pin PA14-SWCLK, a 10K resistor R144 is connected in series between Pins 2 and 3, Pin 4 is connected to the power supply voltage 3.3V, and Pin 5 is left floating; The host computer software is used to check the tested items of the driver board and feedback the test results of the tested items; the host computer interface includes: a serial port information column, which is used to select the communication serial port and the opening / closing operation of the serial port; The board information column is used to input the material code of the board being tested and for process quality traceability; The function selection column is used to select the test code and factory code, as well as other related test items; at the same time, the "start test" control can control the switch of the test process; The progress bar is used to display the progress information of burning and testing; The sending area and receiving area are used for serial communication; The log directory column can generate a txt file for the entire test process and store it in a specified location; The test item details will fully explain the test results or reasons for failure of each test item.

2. The test method of the automatic switching control system of the control board burning test mode as claimed in claim 1, characterized in that: The steps include: Step 1: Place the driver board in the automated test fixture with the fixture board installed, turn on the power, open the host computer software, connect the USB communication serial port to the host computer, select the corresponding COM port, and click the open button on the right. If the operation is successful, the open button will turn gray; Step 2: Enter the driver board SN number. The SN number can be entered manually or scanned by a barcode scanner. Step 3: Check the driver board test item on the host computer. The optional items on the host computer interface include burning test code, burning factory code, camera test, NTC test, 24V test, voice test, WIFI test, Bluetooth test, motor test, and EEROM. Among them, other circuit modules belonging to the driver board can be checked according to specific needs. Step 4: Click the Start button to start the test. If the corresponding checked test item shows that the test has passed, it means the test is qualified. If the test fails, you can view the test log on the right and mark the corresponding driver board as defective and send it to the repair center for repair.

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