Electronic component withstand voltage test equipment

Abstract

The invention relates to the technical field of electronic component testing, in particular to electronic component voltage withstanding testing equipment which comprises a testing device body, a detection bin and a material box and further comprises a plurality of arrangement grooves formed in the material box. The material box is provided with an arrangement groove, the arrangement groove is used for limiting and arranging to-be-detected diodes placed in the material box, the testing assembly is arranged in the detection bin, and the testing assembly is used for conducting voltage withstanding testing on the multiple diodes in a single batch at the same time, and when the electronic component voltage withstanding testing equipment is used, different from the prior art, the testing efficiency is improved, and the testing efficiency is improved. And the placing mechanism can quickly arrange the diodes, so that the manual arrangement and arrangement time is greatly reduced, the diodes can be uniformly fixed on the detection device through simple operation, and the test preparation time is further shortened.

Description

Technical Field

[0001] The invention relates to the technical field of electronic component testing, in particular to electronic component withstand voltage testing equipment. Background Art

[0002] The withstand voltage test, also known as the electrical strength test, is a test method for evaluating the insulation performance and stability of electronic components, electrical equipment, electrical appliances, electronic components and insulating materials under high voltage. The test applies a high voltage several times the rated voltage between the electrical components and the housing of the device under test for a specified period of time to verify whether the live parts of the device under test are grounded or faulty, thereby judging whether its insulation level meets the technical requirements specified in the standard. Diodes are indispensable components in the electronics industry. In their production and manufacturing process, withstand voltage testing is a key step to ensure product quality and is used to screen out products that do not meet the standards. However, due to the small size of diodes, the connection and fixation work in the withstand voltage test becomes particularly difficult, which not only increases the complexity and time-consumingness of the test, but also long-term reliance on manual operation is prone to introduce deviations in the fixation process, which in turn has an adverse effect on the accuracy of the test data. For this reason, we propose a withstand voltage test device for electronic components. Summary of the invention

[0003] One of the technical problems to be solved by the present application is that due to the small size of the diode, the connection and fixation work in the voltage withstand test becomes particularly difficult, which not only increases the complexity and time consumption of the test, but also the long-term reliance on manual operation is prone to introduce deviations in the fixation process, which in turn has an adverse effect on the accuracy of the test data.

[0004] To solve the above technical problems, an embodiment of the present application provides an electronic component withstand voltage test device, including a test device body, a detection chamber and a material box, and also including an arrangement groove, which is opened on the material box, and there are multiple arrangement grooves, and the arrangement grooves are used to limit and arrange the diodes to be tested placed in the material box: a test component, which is arranged in the detection chamber, and the test component is used to perform withstand voltage tests on multiple diodes in a single batch at the same time; a placement mechanism, which is arranged on the material box, and the opening of the arrangement groove is opened by the placement mechanism, so that the arranged diodes are moved to the test component for testing.

[0005] In some embodiments, the test assembly includes a fixing member arranged on the detection chamber, which is used to clamp and fix the diode. The fixing member is provided with a synchronization member, which drives multiple fixing members to operate synchronously. The fixing member is provided with a warning member, which is used to judge the clamping state of the diode.

[0006] In some embodiments, the fixing member includes a plurality of fixing rods arranged in the detection chamber, a test clamp is arranged on the fixing rods, a fixed screw is rotatably arranged on the side wall of the detection chamber, a sliding block is arranged on the fixed screw, the sliding block is threadedly connected with the fixed screw, a sliding tube is slidably arranged on the sliding block, an extrusion plate is arranged on the sliding tube, the extrusion plate is slidably connected with the test clamp, a buffer spring is arranged at one end of the sliding block located in the sliding tube, and one end of the buffer spring is connected to the extrusion plate.

[0007] In some embodiments, the synchronous component includes a synchronous groove opened in the detection chamber, one end of the fixed screw rod extends into the synchronous groove, and a synchronous worm gear is provided at one end of the fixed screw rod located in the synchronous groove. A plurality of synchronous worms are rotatably arranged in the synchronous groove and used in conjunction with the synchronous worm gear. A synchronous pulley is provided on the plurality of synchronous worms, and a synchronous belt is provided on the synchronous pulley.

[0008] In some embodiments, the warning member includes multiple trigger bins arranged on the side wall of the detection bin, a limit plate is slidably arranged in the trigger bin, a warning rod is arranged on the limit plate, the warning rod is slidably connected to the trigger bin, a return spring is arranged on the side of the limit plate away from the warning rod, a pull rope is arranged on the limit plate, and one end of the pull rope is connected to the sliding block.

[0009] In some embodiments, the placement mechanism includes an arranging member arranged in the material box, which is used to send the diodes in the material box into an arranging groove for sorting and arrangement. An isolation member is provided on the material box, which is used to isolate the diodes entering the arranging groove. A power member is provided on the material box, which is used to provide power for the isolation member.

[0010] In some embodiments, the arranging member includes a plurality of limit rods arranged at the bottom of the material box, a plurality of blocking plates are slidably arranged on the limit rods, the blocking plates are slidably connected to the material box, a synchronization rod is arranged on the blocking plates, a plurality of positioning blocks are arranged on the material box, a multi-stage telescopic rod 1 is arranged on the positioning block, the multi-stage telescopic rod 1 is connected to the blocking plate, and a push spring 1 is sleeved on the multi-stage telescopic rod 1.

[0011] In some embodiments, the isolation member includes an isolation groove opened in the material box, a plurality of isolation plates are slidably arranged in the isolation groove, a plurality of linkage rods are arranged on the isolation plates, a plurality of multi-stage telescopic rods 2 are arranged on the side of the isolation groove, the multi-stage telescopic rods 2 are connected to the linkage rods, a push spring 2 is sleeved on the multi-stage telescopic rods 2, a traction rope is arranged on the linkage rod, one end of the traction rope passes through the material box and is connected to the blocking plate, and the traction rope is movably connected to the material box.

[0012] In some embodiments, the power part includes a power groove opened on the detection bin, a power plate is slidably arranged in the power groove, a multi-stage telescopic rod three is arranged on the power plate, the multi-stage telescopic rod three is connected to the power groove, a power spring is sleeved on the multi-stage telescopic rod three, a power rope is arranged at one end of the power plate, one end of the power rope passes through the material box and is connected to the blocking plate, a driving rod is arranged on the power plate, a docking groove is arranged on the synchronous groove, the driving rod is movably connected to the docking groove, a tooth groove is arranged on the driving rod, and a power gear engaging with the tooth groove is arranged on the synchronous worm.

[0013] In some embodiments, guide plates are provided on both sides of the detection chamber.

[0014] The present invention has at least the following beneficial effects:

[0015] 1. Improve testing efficiency:

[0016] The placement mechanism can quickly arrange the diodes, greatly reducing the time for manual arrangement and arrangement. The diodes can be uniformly fixed to the detection device through simple operations, further shortening the test preparation time;

[0017] 2. Ensure test accuracy:

[0018] Neatly arranged diodes ensure that each diode is subjected to the same test conditions, thereby improving the accuracy of the test. The warning piece can determine in real time whether the diode is fixed properly, avoiding test errors or equipment damage caused by unstable fixation.

[0019] 3. Reduce the difficulty of operation:

[0020] The semi-automatic placement mechanism and fixing device reduce the difficulty of operation, making it easy for non-professionals to use. The intuitive display of the warning parts enables the operator to quickly understand the fixing status of the diode without complicated inspection.

[0021] 4. Enhanced device security:

[0022] By ensuring that the diode is stably fixed, the safety hazard caused by the diode falling off or moving during the test is reduced. The existence of the warning piece further reminds the operator to pay attention to the operating status of the equipment, so that timely measures can be taken to avoid potential dangers. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0024] Figure 2 This is a schematic diagram of the exploded structure of the placement mechanism of the present invention;

[0025] Figure 3 For the present invention Figure 2 Schematic diagram of the enlarged structure of the middle A area;

[0026] Figure 4 This is a schematic diagram of the cross-sectional structure of the material box of the present invention;

[0027] Figure 5 For the present invention Figure 4 Schematic diagram of the enlarged structure of the middle B area;

[0028] Figure 6 This is another cross-sectional structural schematic diagram of the material box of the present invention;

[0029] Figure 7 This is a schematic diagram of the explosion structure of the test assembly of the present invention;

[0030] Figure 8 This is a schematic diagram of the cross-sectional structure of the detection chamber of the present invention;

[0031] Fig. 9 It is a schematic diagram of the structure of the fixing member of the present invention;

[0032] Fig.10 For the present invention Fig. 9 Schematic diagram of explosion structure;

[0033] Fig.11 This is a structural diagram of Embodiment 2 of the present invention.

[0034] In the figure: 1. Test device body; 2. Detection chamber; 3. Material box; 4. Arrangement slot; 5. Test assembly; 6. Fixing piece; 61. Fixing rod; 62. Test splint; 63. Fixing screw; 64. Sliding block; 65. Sliding tube; 66. Extrusion plate; 67. Buffer spring; 7. Synchronous piece; 71. Synchronous slot; 72. Synchronous worm gear; 73. Synchronous worm; 74. Synchronous pulley; 75. Synchronous belt; 8. Warning piece; 81. Trigger chamber; 82. Limiting plate; 83. Warning rod; 84. Reset spring; 85. Pull rope; 9. Placement mechanism; 10. Arrangement piece; 101. Limit rod; 102, blocking plate; 103, synchronization rod; 104, positioning block; 105, multi-stage telescopic rod one; 106, push spring one; 11, isolation piece; 111, isolation groove; 112, isolation plate; 113, linkage rod; 114, multi-stage telescopic rod two; 115, push spring two; 116, traction rope; 12, power piece; 121, power groove; 122, power plate; 123, multi-stage telescopic rod three; 124, power spring; 125, power rope; 126, driving rod; 127, tooth groove; 128, power gear; 129, docking groove; 13, guide plate. DETAILED DESCRIPTION

[0035] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0036] Example 1: Please refer to Figure 1-Figure 10 The present invention provides a technical solution: an electronic component withstand voltage test device, comprising a test device body 1, a detection chamber 2 and a material box 3, and also comprising an arrangement slot 4, wherein the arrangement slot 4 is provided on the material box 3, and the arrangement slot 4 is provided with a plurality of arrangement slots, and the arrangement slot 4 is specially designed, and a single arrangement slot 4 can only accommodate one diode, and the arrangement slot 4 is used to limit and arrange the diodes to be tested placed in the material box 3:

[0037] A test assembly 5 is provided in the inspection chamber 2 and is used to perform a withstand voltage test on a plurality of diodes in a single batch.

[0038] The advantage of the test component 5 is that it can quickly clamp and fix multiple diodes during the diode withstand voltage test, and can judge in real time whether the diodes are fixed properly. The quick clamping and fixing function can greatly reduce the preparation time for the diodes before testing, so that multiple diodes can be quickly fixed on the testing device, and the real-time judgment function allows the operator to immediately know whether the diodes are properly fixed, thereby avoiding repeated inspections and adjustments due to unstable fixation, further improving the detection efficiency, and the real-time judgment function can also effectively avoid misdetection or missed detection due to improper fixation of the diodes, thereby improving the accuracy of the detection.

[0039] The placing mechanism 9 is arranged on the material box 3 , and the opening of the arrangement slot 4 is opened by the placing mechanism 9 , so that the arranged diodes are moved to the test assembly 5 for detection.

[0040] The advantage of the placement mechanism 9 is that it can arrange and sort multiple diodes at a time, and then move them to the test clamp 62 for fixation. The placement mechanism 9 can arrange the diodes, greatly reducing the time for manual sorting and arrangement. The diodes can be uniformly fixed to the detection device through simple operations, further shortening the test preparation time, and the neatly arranged diodes can ensure that each diode is subjected to the same test conditions, thereby improving the accuracy of the test.

[0041] The test assembly 5 includes a fixing part 6 arranged on the detection chamber 2, and the diode is clamped and fixed by the fixing part 6. The fixing part 6 is provided with a synchronization part 7, and multiple fixing parts 6 are driven to operate synchronously by the synchronization part 7. The fixing part 6 is provided with a warning part 8, and the clamping state of the diode is judged by the warning part 8.

[0042] The fixing member 6 includes a plurality of fixing rods 61 arranged in the detection chamber 2, a test clamp plate 62 is arranged on the fixing rods 61, a fixing screw 63 is rotatably arranged on the side wall of the detection chamber 2, a sliding block 64 is arranged on the fixing screw 63, the sliding block 64 is threadedly connected with the fixing screw 63, a sliding tube 65 is slidably arranged on the sliding block 64, an extrusion plate 66 is arranged on the sliding tube 65, the extrusion plate 66 is slidably connected with the test clamp plate 62, a buffer spring 67 is arranged at one end of the sliding block 64 located in the sliding tube 65, and one end of the buffer spring 67 is connected to the extrusion plate 66.

[0043] The advantage of the fixing member 6 is that it can quickly clamp and fix multiple diodes, which greatly shortens the preparation time for the diode withstand voltage test and improves the test efficiency.

[0044] The synchronous member 7 includes a synchronous groove 71 opened in the detection chamber 2, one end of the fixed screw 63 extends into the synchronous groove 71, and one end of the fixed screw 63 located in the synchronous groove 71 is provided with a synchronous worm wheel 72, and a plurality of synchronous worms 73 used in conjunction with the synchronous worm wheel 72 are rotatably arranged in the synchronous groove 71, and a plurality of synchronous worms 73 are provided with synchronous pulleys 74, and a synchronous belt 75 is provided on the synchronous pulley 74.

[0045] The warning member 8 includes a plurality of trigger bins 81 arranged on the side wall of the detection bin 2, a limit plate 82 is slidably arranged in the trigger bin 81, a warning rod 83 is arranged on the limit plate 82, the warning rod 83 is slidably connected to the trigger bin 81, a return spring 84 is arranged on the side of the limit plate 82 away from the warning rod 83, a pull rope 85 is arranged on the limit plate 82, and one end of the pull rope 85 is connected to the sliding block 64.

[0046] The advantage of setting up the warning piece 8 is that it can judge in real time whether the diode is fixed properly, and the real-time judgment function enables the operator to immediately know whether the diode is fixed properly, thereby avoiding repeated inspections and adjustments due to unstable fixation, further improving the detection efficiency, and the real-time judgment function can also effectively avoid misdetection or missed detection due to improper fixation of the diode, thereby improving the accuracy of detection.

[0047] When a single synchronous worm 73 rotates, multiple synchronous worms 73 are first driven to rotate simultaneously through the synchronous pulley 74 and the synchronous belt 75. The rotation of the synchronous worm 73 drives the synchronous worm wheel 72 set on the fixed screw 63 to rotate. The rotation of the synchronous worm wheel 72 drives the fixed screw 63 to rotate. The rotation of the fixed screw 63 drives the sliding block 64 to move. The movement of the sliding block 64 drives the sliding tube 65 and the extrusion plate 66 to move on the test clamp 62. The design of the buffer spring 67 can prevent the diode from being damaged due to excessive clamping force.

[0048] When the sliding block 64 moves, the limit plate 82 will be driven to move in the trigger chamber 81 through the pull rope 85, and the warning rod 83 will be driven to move downward simultaneously. When the diode is properly fixed, the warning rod 83 will drop to the specified height. If the height position of the warning rod 83 is different, it means that the diode is not properly fixed. At this time, the staff can quickly find the diode that is not properly fixed and make adjustments to ensure the safety of the diode test.

[0049] The placement mechanism 9 includes an arranging member 10 arranged in the material box 3, and the arranging member 10 is used to send the diodes in the material box 3 into the arranging groove 4 for sorting and arrangement. The material box 3 is provided with an isolating member 11, and the isolating member 11 is used to isolate the diodes entering the arranging groove 4. The material box 3 is provided with a power member 12, and the power member 12 is used to provide power for the operation of the isolating member 11.

[0050] The arranging member 10 includes a plurality of limit rods 101 arranged at the bottom of the material box 3, a plurality of blocking plates 102 are slidably arranged on the limit rods 101, the blocking plates 102 are slidably connected to the material box 3, a synchronization rod 103 is arranged on the blocking plates 102, a plurality of positioning blocks 104 are arranged on the material box 3, a multi-stage telescopic rod 105 is arranged on the positioning blocks 104, the multi-stage telescopic rod 105 is connected to the blocking plates 102, and a push spring 106 is sleeved on the multi-stage telescopic rod 105.

[0051] The advantage of the arrangement of the arrangement member 10 is that multiple diodes can be arranged and sorted at a time, and then moved to the test clamp 62 for fixation, which greatly reduces the time for manual sorting and arrangement, and the diodes can be uniformly fixed to the test clamp 62 through simple operations, further shortening the test preparation time.

[0052] The isolation member 11 includes an isolation groove 111 opened in the material box 3, a plurality of isolation plates 112 are slidably arranged in the isolation groove 111, a plurality of linkage rods 113 are arranged on the isolation plates 112, a plurality of multi-stage telescopic rods 114 are arranged on the side of the isolation groove 111, the multi-stage telescopic rods 114 are connected to the linkage rod 113, a push spring 115 is sleeved on the multi-stage telescopic rods 114, a traction rope 116 is arranged on the linkage rod 113, one end of the traction rope 116 passes through the material box 3 and is connected to the blocking plate 102, and the traction rope 116 is movably connected to the material box 3.

[0053] The benefit of the isolation member 11 is that it can prevent multiple diodes from falling off simultaneously when the diodes are moved onto the test clamp 62 , thereby greatly improving the stability of the diode test.

[0054] The power member 12 includes a power groove 121 provided on the detection bin 2, a power plate 122 is slidably arranged in the power groove 121, a multi-stage telescopic rod three 123 is arranged on the power plate 122, the multi-stage telescopic rod three 123 is connected to the power groove 121, a power spring 124 is sleeved on the multi-stage telescopic rod three 123, a power rope 125 is arranged at one end of the power plate 122, one end of the power rope 125 passes through the material box 3 and is connected to the blocking plate 102, a driving rod 126 is arranged on the power plate 122, a docking groove 129 is arranged on the synchronization groove 71, the driving rod 126 is movably connected to the docking groove 129, a tooth groove 127 is arranged on the driving rod 126, and a power gear 128 meshing with the tooth groove 127 is arranged on the synchronization worm 73.

[0055] When conducting a diode test, the staff first places the diode to be tested into the material box 3, then shakes the material box 3 so that the diode falls into the arrangement slot 4. After completing the above operations, align the driving rod 126 on the material box 3 with the docking slot 129 and then press down the material box 3, so that the tooth groove 127 on the driving rod 126 drives the power gear 128 engaged with it to rotate, and when the power gear 128 rotates, it drives the synchronous worm 73 to rotate.

[0056] When the driving rod 126 reaches the bottom of the synchronization groove 71, the staff continues to press down the material box 3, so that the driving rod 126 squeezes the power plate 122, pushing the power plate 122 to move in the power groove 121. When the power plate 122 moves, the sealing plate 102 is driven to move through the power rope 125, thereby opening the bottom of the arrangement groove 4, so that the diode in the arrangement groove 4 falls between the test clamp 62 and the extrusion plate 66. At the same time, when the sealing plate 102 moves, it will drive the traction rope 116 to move synchronously. The movement of the traction rope 116 drives the isolation plate 112 to move, and the top of the arrangement groove 4 is sealed, thereby preventing multiple diodes from falling at the same time. After the diode is fixed, the material box 3 is removed and the test device body 1 is started to test the diode.

[0057] During use, when a diode test is required, the staff first places the diode to be tested into the material box 3, then shakes the material box 3 so that the diode falls into the arrangement slot 4. After completing the above operations, the driving rod 126 on the material box 3 is aligned with the docking slot 129 and then the material box 3 is pressed down, so that the tooth groove 127 on the driving rod 126 drives the power gear 128 engaged with it to rotate, and when the power gear 128 rotates, it will drive the synchronous worm 73 to rotate.

[0058] When a single synchronous worm 73 rotates, multiple synchronous worms 73 are first driven to rotate simultaneously through the synchronous pulley 74 and the synchronous belt 75. The rotation of the synchronous worm 73 drives the synchronous worm wheel 72 set on the fixed screw 63 to rotate. The rotation of the synchronous worm wheel 72 drives the fixed screw 63 to rotate. The rotation of the fixed screw 63 drives the sliding block 64 to move. The movement of the sliding block 64 drives the sliding tube 65 and the extrusion plate 66 to move on the test clamp 62. The design of the buffer spring 67 can prevent the diode from being damaged due to excessive clamping force.

[0059] When the sliding block 64 moves, the limit plate 82 will be driven to move in the trigger chamber 81 through the pull rope 85, and the warning rod 83 will be driven to move downward simultaneously. When the diode is properly fixed, the warning rod 83 will drop to the specified height. If the height position of the warning rod 83 is different, it means that the diode is not properly fixed. At this time, the staff can quickly find the diode that is not properly fixed and make adjustments to ensure the safety of the diode test.

[0060] When the driving rod 126 reaches the bottom of the synchronization groove 71, the staff continues to press down the material box 3, so that the driving rod 126 squeezes the power plate 122, pushing the power plate 122 to move in the power groove 121. When the power plate 122 moves, the sealing plate 102 is driven to move through the power rope 125, thereby opening the bottom of the arrangement groove 4, so that the diode in the arrangement groove 4 falls between the test clamp 62 and the extrusion plate 66. At the same time, when the sealing plate 102 moves, it will drive the traction rope 116 to move synchronously. The movement of the traction rope 116 drives the isolation plate 112 to move, and the top of the arrangement groove 4 is sealed, thereby preventing multiple diodes from falling at the same time. After the diode is fixed, the material box 3 is removed and the test device body 1 is started to test the diode.

[0061] Example 2: Please refer to Fig.11 The present invention provides a technical solution: guide plates 13 are provided on both sides of the detection bin 2. The setting of the guide plates 13 can help the staff to quickly align the material box 3 with the detection bin 2 to improve the work efficiency.

[0062] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0063] While the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that many changes, modifications, substitutions and variations can be made to the embodiments without departing from the principles and spirit of the invention.

Claims

1. An electronic component withstand voltage test device, comprising a test device body (1), a test chamber (2) and a material box (3), characterized in that: Also includes: An arrangement groove (4), wherein the arrangement groove (4) is provided on the material box (3), and a plurality of the arrangement grooves (4) are provided, and the arrangement grooves (4) are used to arrange the diodes to be detected placed in the material box (3) in a limited position: A test assembly (5), the test assembly (5) being arranged in the detection chamber (2), and using the test assembly (5) to simultaneously perform a withstand voltage test on a plurality of diodes in a single batch; A placing mechanism (9) is arranged on the material box (3), and the opening of the arrangement slot (4) is opened by the placing mechanism (9), so that the arranged diodes are moved to the test assembly (5) for testing.

2. The electronic component withstand voltage test equipment according to claim 1, characterized in that: The test assembly (5) comprises a fixing member (6) arranged on the detection chamber (2), the fixing member (6) being used to clamp and fix the diode, a synchronization member (7) being provided on the fixing member (6), a plurality of fixing members (6) being driven to operate synchronously by the synchronization member (7), a warning member (8) being provided on the fixing member (6), and a clamping state of the diode being judged by the warning member (8).

3. The electronic component withstand voltage test equipment according to claim 2, characterized in that: The fixing member (6) comprises a plurality of fixing rods (61) arranged in the detection chamber (2), a test clamp (62) being arranged on the fixing rods (61), a fixing screw (63) being rotatably arranged on the side wall of the detection chamber (2), a sliding block (64) being arranged on the fixing screw (63), the sliding block (64) being threadedly connected to the fixing screw (63), a sliding tube (65) being slidably arranged on the sliding block (64), an extrusion plate (66) being arranged on the sliding tube (65), the extrusion plate (66) being slidably connected to the test clamp (62), a buffer spring (67) being arranged at one end of the sliding block (64) located in the sliding tube (65), one end of the buffer spring (67) being connected to the extrusion plate (66).

4. The electronic component withstand voltage test equipment according to claim 3, characterized in that: The synchronous member (7) comprises a synchronous groove (71) provided in the detection chamber (2); one end of the fixed screw (63) extends into the synchronous groove (71); one end of the fixed screw (63) located in the synchronous groove (71) is provided with a synchronous worm wheel (72); a plurality of synchronous worms (73) for use with the synchronous worm wheel (72) are rotatably provided in the synchronous groove (71); a plurality of synchronous worms (73) are provided with synchronous pulleys (74); and a synchronous belt (75) is provided on the synchronous pulleys (74).

5. The electronic component withstand voltage test equipment according to claim 4, characterized in that: The warning member (8) comprises a plurality of trigger chambers (81) arranged on the side wall of the detection chamber (2); a limit plate (82) is slidably arranged in the trigger chamber (81); a warning rod (83) is arranged on the limit plate (82); the warning rod (83) is slidably connected to the trigger chamber (81); a return spring (84) is arranged on the side of the limit plate (82) away from the warning rod (83); a pull rope (85) is arranged on the limit plate (82); one end of the pull rope (85) is connected to the sliding block (64).

6. The electronic component withstand voltage test equipment according to claim 1, characterized in that: The placement mechanism (9) comprises an arranging member (10) arranged in the material box (3), and the arranging member (10) is used to send the diodes in the material box (3) into the arranging slot (4) for sorting and arranging. The material box (3) is provided with an isolating member (11), and the isolating member (11) is used to isolate the diodes entering the arranging slot (4). The material box (3) is provided with a power member (12), and the power member (12) is used to provide power for the operation of the isolating member (11).

7. The electronic component withstand voltage test equipment according to claim 6, characterized in that: The arrangement member (10) comprises a plurality of limit rods (101) arranged at the bottom of the material box (3); a plurality of blocking plates (102) are slidably arranged on the limit rods (101); the blocking plates (102) are slidably connected to the material box (3); a synchronization rod (103) is arranged on the blocking plates (102); a plurality of positioning blocks (104) are arranged on the material box (3); a multi-stage telescopic rod (105) is arranged on the positioning blocks (104); the multi-stage telescopic rod (105) is connected to the blocking plates (102); and a push spring (106) is sleeved on the multi-stage telescopic rod (105).

8. The electronic component withstand voltage test equipment according to claim 7, characterized in that: The isolating member (11) comprises an isolating groove (111) provided in the material box (3), a plurality of isolating plates (112) being slidably arranged in the isolating groove (111), a plurality of linkage rods (113) being arranged on the isolating plates (112), a plurality of multi-stage telescopic rods (114) being arranged on the side of the isolating groove (111), the multi-stage telescopic rods (114) being connected to the linkage rods (113), a push spring (115) being sleeved on the multi-stage telescopic rods (114), a traction rope (116) being arranged on the linkage rods (113), one end of the traction rope (116) passing through the material box (3) and being connected to the blocking plate (102), and the traction rope (116) being movably connected to the material box (3).

9. The electronic component withstand voltage test equipment according to claim 8, characterized in that: The power member (12) comprises a power slot (121) provided on the detection chamber (2), a power plate (122) being slidably arranged in the power slot (121), a multi-stage telescopic rod (123) being arranged on the power plate (122), the multi-stage telescopic rod (123) being connected to the power slot (121), a power spring (124) being sleeved on the multi-stage telescopic rod (123), and a power rope (125) being arranged at one end of the power plate (122). One end of the power rope (125) passes through the material box (3) and is connected to the blocking plate (102); a driving rod (126) is provided on the power plate (122); a docking groove (129) is provided on the synchronization groove (71); the driving rod (126) is movably connected to the docking groove (129); a tooth groove (127) is provided on the driving rod (126); and a power gear (128) meshing with the tooth groove (127) is provided on the synchronization worm (73).

10. The electronic component withstand voltage test equipment according to claim 1, characterized in that: Guide plates (13) are provided on both sides of the detection chamber (2).

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