Method and system for automatically testing insulation resistance of capacitor

Abstract

The invention provides an automatic test method and system for insulation resistance of a capacitor, and relates to the technical field of capacitors. The method comprises the steps that an initial pressurization test strategy of a to-be-tested capacitor is determined, the initial pressurization test strategy is used for indicating benchmark test voltages of different test periods, the benchmark test voltages corresponding to the different test periods are different, and in the different test periods, according to the benchmark test voltages, insulation resistance testing is carried out on the to-be-tested capacitor. The reference test voltage is smaller than or equal to the rated voltage of the to-be-tested capacitor, and determining the final insulation resistance test result of the to-be-tested capacitor according to the initial insulation resistance test results of the to-be-tested capacitor in different test periods. And executing a corresponding processing strategy according to the final insulation resistance test result of the capacitor to be tested. The objective of the invention is to improve the problem that a good capacitor is deteriorated when the insulation resistance of the capacitor is tested.

Description

Technical Field

[0001] The embodiments of the present application relate to the technical field of capacitors, and more particularly to a method and system for automatically testing the insulation resistance of a capacitor. Background Art

[0002] For high-voltage capacitors and capacitors in high-reliability applications, insulation resistance tests are required. Insulation resistance refers to the amount of leakage current that can be resisted between the two poles of the capacitor when a DC voltage is applied, reflecting the quality of the capacitor's dielectric material and its manufacturing process. If the insulation resistance of the capacitor is too low, it may cause increased leakage current, resulting in energy loss, affecting the efficiency and stability of the circuit, and even causing electrical failures or damage to other components. The purpose of the insulation resistance test is to evaluate the insulation performance and quality of the capacitor. The insulation resistance test can also help identify defects in the manufacturing process and ensure the reliability and safety of the capacitor in actual use.

[0003] Currently, when testing the insulation resistance of capacitors, good quality capacitors may be degraded. Summary of the invention

[0004] The embodiments of the present application provide a method and system for automatically testing the insulation resistance of a capacitor, which are used to improve the problem that good capacitors may be degraded when the insulation resistance of the capacitor is tested.

[0005] To achieve the above objectives, the embodiments of the present application adopt the following technical solutions:

[0006] In a first aspect, an embodiment of the present application provides an automatic insulation resistance testing method for a capacitor, the method comprising: determining an initial pressure test strategy for the capacitor to be tested, the initial pressure test strategy being used to indicate a reference test voltage for different test cycles, different reference test voltages corresponding to different test cycles being different, performing an insulation resistance test on the capacitor to be tested according to the reference test voltage in different test cycles to determine an initial insulation resistance test result of the capacitor to be tested, the reference test voltage being less than or equal to the rated voltage of the capacitor to be tested, determining a final insulation resistance test result of the capacitor to be tested according to the initial insulation resistance test results of different test cycles of the capacitor to be tested, and executing a corresponding processing strategy according to the final insulation resistance test result of the capacitor to be tested.

[0007] In a possible implementation of the first aspect, determining an initial pressure test strategy for a capacitor to be tested includes: determining a type label of the capacitor to be tested based on an identification image of the capacitor to be tested, and determining an initial pressure test strategy matching the type label using the type label as an index.

[0008] In a possible implementation of the first aspect, in different test cycles, an insulation resistance test is performed on the capacitor to be tested according to a reference test voltage to determine an initial insulation resistance test result of the capacitor to be tested, including: in the Nth test cycle, an insulation resistance test is performed on the capacitor to be tested by using the Nth reference test voltage to obtain the Nth evaluation parameter, and the initial insulation resistance test result of the capacitor to be tested is determined according to the Nth reference test voltage and the Nth evaluation parameter; in the N+1th test cycle, an insulation resistance test is performed on the capacitor to be tested by using the N+1th reference test voltage to obtain the N+1th evaluation parameter, and the initial insulation resistance test result of the capacitor to be tested is determined according to the N+1th reference test voltage and the N+1th evaluation parameter, and the N+1th reference test voltage is greater than the Nth reference test voltage.

[0009] In a possible implementation of the first aspect, the test cycle includes a plurality of test sub-cycles, and in the N+1th test cycle, the insulation resistance test of the capacitor to be tested is performed by the N+1th reference test voltage to obtain the N+1th evaluation parameter, including: increasing the incremental voltage sequentially on the basis of the N+1th reference test voltage to obtain a plurality of test voltages,

[0010] An insulation resistance test is performed in different test sub-cycles based on multiple test voltages to obtain multiple corresponding insulation resistance test results, and a reference test voltage of the N+2th test cycle is dynamically corrected according to the multiple corresponding insulation resistance test results.

[0011] In a possible implementation of the first aspect, an initial insulation resistance test result of the capacitor to be tested is determined according to the N+1th reference test voltage and the N+1th evaluation parameter, including: constructing a test simulation curve of the capacitor to be tested according to the N+1th reference test voltage and the N+1th evaluation parameter, the simulation curve is used to characterize the correspondence between the reference test voltage and the insulation resistance of the capacitor to be tested, and determining the initial insulation resistance test result of the capacitor to be tested according to the matching degree between the simulation curve and the standard curve; the standard curve is used to characterize the correspondence between the reference test voltage and the insulation resistance of the standard capacitor.

[0012] In a possible implementation of the first aspect, a test simulation curve of the capacitor to be tested is constructed according to the N+1th reference test voltage and the N+1th evaluation parameter, including: constructing a starting point of the test simulation curve with the first reference test voltage and the first evaluation parameter, constructing an ending point of the test simulation curve with the N+1th reference test voltage and the N+1th evaluation parameter to obtain an initial test simulation curve, determining a correction coefficient of the initial test simulation curve according to a type label of the capacitor to be tested, and correcting the initial test simulation curve according to the correction coefficient to construct the test simulation curve of the capacitor to be tested.

[0013] In a possible implementation of the first aspect, a final insulation resistance test result of the capacitor to be tested is determined based on initial insulation resistance test results of different test cycles of the capacitor to be tested, including: when the initial insulation resistance test results of at least two test cycles are in a passed state, determining that the capacitor to be tested has passed the final insulation resistance test, and when the insulation resistance test result of at most one test cycle is in a passed state, determining that the capacitor to be tested has not passed the final insulation resistance test.

[0014] In a possible implementation of the first aspect, according to the final insulation resistance test result of the capacitor to be tested, executing a corresponding processing strategy includes: when the final insulation resistance test result is a pass state, generating a corresponding test report; when the final insulation resistance test result is a fail state, adjusting the initial pressure test strategy of the capacitor to be tested, and continuing to perform the insulation test based on the adjusted initial pressure test strategy.

[0015] In a second aspect, the present application provides another automatic insulation resistance testing system for a capacitor, the system comprising:

[0016] A determination module, used to determine an initial pressure test strategy for the capacitor to be tested, the initial pressure test strategy is used to indicate a reference test voltage for different test cycles, and different reference test voltages correspond to different test cycles;

[0017] A test module, used for performing an insulation resistance test on the capacitor to be tested according to a reference test voltage at different test cycles to determine an initial insulation resistance test result of the capacitor to be tested, wherein the reference test voltage is less than or equal to a rated voltage of the capacitor to be tested;

[0018] A judgment module, used to determine a final insulation resistance test result of the capacitor to be tested according to initial insulation resistance test results of different test cycles of the capacitor to be tested;

[0019] The execution module is used to execute a corresponding processing strategy according to the final insulation resistance test result of the capacitor to be tested.

[0020] In a possible implementation of the second aspect, the determining module includes:

[0021] A label determination submodule, used to determine the type label of the capacitor to be tested according to the identification image of the capacitor to be tested;

[0022] The matching submodule is used to determine an initial pressure test strategy that matches the category label using the category label as an index.

[0023] In a possible implementation of the second aspect, the test module includes:

[0024] A first test submodule is used to perform an insulation resistance test on the capacitor to be tested by using an Nth reference test voltage in an Nth test cycle to obtain an Nth evaluation parameter, and determine an initial insulation resistance test result of the capacitor to be tested according to the Nth reference test voltage and the Nth evaluation parameter;

[0025] The second test submodule is used to perform an insulation resistance test on the capacitor to be tested through the N+1th reference test voltage during the N+1th test cycle to obtain the N+1th evaluation parameter, and determine an initial insulation resistance test result of the capacitor to be tested based on the N+1th reference test voltage and the N+1th evaluation parameter, and the N+1th reference test voltage is greater than the Nth reference test voltage.

[0026] In a possible implementation of the second aspect, the second testing submodule includes:

[0027] A first voltage adjustment unit, used for sequentially increasing the incremental voltage based on the N+1th reference test voltage to obtain a plurality of test voltages;

[0028] A testing unit, configured to perform insulation resistance testing in different test sub-cycles based on a plurality of test voltages to obtain a plurality of corresponding insulation resistance test results;

[0029] The second voltage adjustment unit is used to dynamically correct the reference test voltage of the N+2th test cycle according to a plurality of corresponding insulation resistance test results.

[0030] In a possible implementation of the second aspect, the second testing submodule further includes:

[0031] A construction unit, used to construct a test simulation curve of the capacitor to be tested according to the N+1th reference test voltage and the N+1th evaluation parameter, wherein the simulation curve is used to characterize the corresponding relationship between the reference test voltage and the insulation resistance of the capacitor to be tested;

[0032] The matching unit is used to determine the initial insulation resistance test result of the capacitor to be tested according to the matching degree between the simulation curve and the standard curve; the standard curve is used to characterize the corresponding relationship between the reference test voltage and the insulation resistance of the standard capacitor.

[0033] In a possible implementation manner of the second aspect, the building block includes:

[0034] A curve construction subunit, constructing a starting point of a test simulation curve with a first reference test voltage and a first evaluation parameter, and constructing an ending point of the test simulation curve with an N+1th reference test voltage and an N+1th evaluation parameter, so as to obtain an initial test simulation curve;

[0035] The correction coefficient determination subunit determines the correction coefficient of the initial test simulation curve according to the type label of the capacitor to be tested;

[0036] The curve correction subunit corrects the initial test simulation curve according to the correction coefficient to construct a test simulation curve of the capacitor to be tested.

[0037] In a possible implementation of the second aspect, the judging module includes:

[0038] A first judgment submodule is used to determine that the capacitor to be tested has passed the final insulation resistance test when the initial insulation resistance test results of at least two test cycles are in a passed state;

[0039] The second judgment submodule is used to determine that the capacitor to be tested fails the final insulation resistance test when the insulation resistance test result of at most one test cycle is in a passed state.

[0040] In a possible implementation of the second aspect, the execution module includes:

[0041] The first execution submodule is used to generate a corresponding test report when the final insulation resistance test result is a pass state;

[0042] The second execution submodule is used to adjust the initial pressure test strategy of the capacitor to be tested when the final insulation resistance test result is a failed state, and continue to perform the insulation test based on the adjusted initial pressure test strategy.

[0043] In a third aspect, the present application also provides an electronic device, comprising: a memory and one or more processors, wherein the memory is coupled to the processor; wherein computer program code is stored in the memory, and the computer program code comprises computer instructions, and when the computer instructions are executed by the processor, the electronic device executes the methods in the above-mentioned first aspect, second aspect and any possible design thereof.

[0044] In a fourth aspect, the present application provides a computer-readable storage medium comprising computer instructions; when the computer instructions are executed on an electronic device, the electronic device executes the method in the first aspect, the second aspect and any possible design thereof.

[0045] In a fifth aspect, the present application provides a computer program product. When the computer program product runs on an electronic device, the electronic device executes the method in the first aspect, the second aspect and any possible design thereof.

[0046] The present application provides an automatic insulation resistance test method for a capacitor, which tests the insulation resistance of the capacitor to be tested by setting an initial pressure test strategy and setting different reference test voltages for different test cycles, thereby determining its initial insulation resistance test result, and finally obtaining the final insulation resistance test result of the capacitor to be tested. The setting of the reference test voltage is always less than or equal to the rated voltage of the capacitor to be tested, and the reference test voltage varies between different test cycles, which effectively solves the degradation effect that may occur to good capacitors during the traditional insulation resistance test process. The excessive stress of the internal structure of the capacitor caused by applying a high voltage at one time can be avoided by gradually increasing the test voltage. In addition, the phased test strategy allows the insulation performance of the capacitor to be preliminarily evaluated at a lower voltage, which can minimize the electrical stress on the capacitor and reduce the risk of degradation. It can not only ensure the test accuracy, timely discover potential insulation quality problems, but also extend the service life of the capacitor.

[0047] Among them, the technical effects of the second to fifth aspects refer to the technical effects of the first aspect and any of its embodiments, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] Figure 1 A schematic diagram of the steps of an automatic insulation resistance test method for a capacitor provided in an embodiment of the present application;

[0049] Figure 2 A schematic diagram of the functional modules of a capacitor insulation resistance automatic testing system provided in an embodiment of the present application. DETAILED DESCRIPTION

[0050] The terms used in the following embodiments are only for the purpose of describing specific embodiments, and are not intended to be used as limitations to the present application. As used in the specification and appended claims of the present application, the singular expressions "one", "a kind of", "", "above", "the" and "this" are intended to also include expressions such as "one or more", unless there is a clear contrary indication in the context. It should also be understood that in the following embodiments of the present application, "at least one", "one or more" refer to one or more than two (including two). The character " / " generally indicates that the objects associated before and after are in a "or" relationship.

[0051] The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments.

[0052] In the following, the terms "first", "second", etc. are used only for convenience of description and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first", "second", etc. may explicitly or implicitly include one or more of the features. In the description of this application, unless otherwise specified, "plurality" means two or more. For example, a plurality of processing units refers to two or more processing units.

[0053] In addition, in the embodiments of the present application, "upper", "lower", "left" and "right" are not limited to being defined relative to the orientation of the components schematically placed in the drawings. It should be understood that these directional terms can be relative concepts, which are used for description and clarification relative to the components, and can change accordingly according to the change in the orientation of the components placed in the drawings. In the drawings, for the sake of clarity, the thickness of the layers and regions is exaggerated, and the size ratio relationship between the parts in the drawings does not reflect the actual size ratio relationship.

[0054] In the embodiments of the present application, unless otherwise clearly specified and limited, the term "connection" should be understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a direct connection or an indirect connection through an intermediate medium. In addition, the term "electrical connection" can be a direct electrical connection or an indirect electrical connection through an intermediate medium.

[0055] In the embodiments of the present application, the term "module" is generally a functional structure divided according to logic, and the "module" can be implemented by pure hardware, or by a combination of software and hardware. In the embodiments of the present application, "and / or" describes the association relationship of associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A exists alone, B exists alone, and A and B exist at the same time.

[0056] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0057] The purpose of insulation resistance testing of capacitors is to evaluate the insulation performance of capacitors and ensure that no leakage current occurs under the operating voltage, thereby preventing electrical equipment from malfunctioning, damaging or degrading. Insulation resistance testing can detect the deterioration of the insulation material inside the capacitor, help identify potential aging or damage problems, and ensure the long-term reliability and safety of the capacitor.

[0058] On the one hand, when testing the insulation performance of capacitors, a high voltage far higher than the rated voltage of the capacitor is usually used for testing. This voltage value is often several times or even dozens of times the rated voltage to ensure that the insulation material of the capacitor can withstand the corresponding electrical stress under extreme conditions. This high-voltage test can effectively screen out defective capacitors with poor insulation performance, because these capacitors may have insulation breakdown or excessive leakage current during the test, and thus be identified and eliminated. However, even good capacitors with good insulation performance may suffer minor damage due to the accumulation of electrical stress under the long-term action of such high voltage. These damages may manifest as local degradation of the insulation layer, slight breakdown of the dielectric, or fatigue effects of the material. Although this damage may not be obvious in the short term, it may have a potential negative impact on the long-term reliability and service life of the capacitor.

[0059] On the other hand, when testing the insulation performance of capacitors, a unified test process and parameters are usually used, regardless of which manufacturer the capacitors are produced by. This standardized test method is designed to ensure that different batches and brands of capacitors can be tested under the same conditions, thereby providing consistent data for comparison. However, even if the specifications of capacitors produced by different manufacturers are exactly the same, their insulation performance may vary due to differences in the materials and manufacturing processes used.

[0060] Based on this, the inventor proposed the inventive concept of the present application: during the test, a lower voltage is used to perform a preliminary test on the capacitor to be tested to avoid possible damage or excessive stress caused by direct application of high voltage. On this basis, through the accumulation of a large amount of test data, partial insulation resistance test curves of the capacitor to be tested under different conditions are gradually generated. These partial curves reflect the insulation characteristics of the capacitor at different voltage levels, especially in the low voltage range. Subsequently, these partial curve data are used to deduce the complete insulation resistance test curve of the capacitor to be tested. At the same time, during the test, the manufacturer's is used as an adjustment factor for the test process.

[0061] See also Figure 1 The embodiment of the present application provides a method for automatically testing the insulation resistance of a capacitor, and the method for automatically testing the insulation resistance of a capacitor includes:

[0062] S101: Determine an initial pressure test strategy for the capacitor to be tested.

[0063] In this embodiment, when performing an insulation resistance test on a capacitor, it is first necessary to obtain its corresponding initial pressure test strategy. The initial pressure test strategy is used to indicate the reference test voltages of different test cycles, and these voltage values ​​are gradually adjusted in different test cycles so that the insulation performance of the capacitor can be accurately evaluated. In different test cycles, the reference test voltage may gradually increase to test the capacitor's tolerance under high voltage conditions. Since capacitors produced by different manufacturers may have different electrical characteristics and withstand voltage capabilities due to differences in materials, design, and manufacturing processes, their corresponding initial pressure test strategies will also be different. Therefore, when conducting a test, it is necessary to determine the type of capacitor to be tested and determine the corresponding initial pressure test strategy. The specific steps may include:

[0064] S1011: Determine the type label of the capacitor to be tested according to the identification image of the capacitor to be tested;

[0065] S1012: Using the category label as an index, determine an initial pressure test strategy that matches the category label.

[0066] In the implementation of S1011 to S1012, it is first necessary to obtain the image information of the capacitor to be tested, which can be obtained by taking an image of the appearance of the capacitor by a camera or scanning device, and then using image recognition technology to analyze the image and extract key features (such as shape, size, color, logo, model, manufacturer information, etc.). These features are matched with the capacitor type information pre-stored in the database, and the specific type label of the capacitor to be tested is confirmed by comparison and analysis. The type label may include the type of capacitor (such as ceramic capacitor, aluminum electrolytic capacitor, film capacitor, etc.), model, rated voltage, capacity range and manufacturer, etc. Once the type label of the capacitor is confirmed, this label can be used as an index to retrieve the initial pressure test strategy corresponding to the label from the pre-defined test strategy database. The initial pressure test strategy usually includes detailed test parameters for specific types of capacitors, such as the voltage value, pressure duration, ambient temperature conditions, etc. that should be applied in different test cycles.

[0067] S102: performing an insulation resistance test on the capacitor to be tested according to a reference test voltage in different test cycles to determine an initial insulation resistance test result of the capacitor to be tested.

[0068] In this embodiment, after determining the initial pressure test strategy of the capacitor to be tested, the insulation resistance of the capacitor to be tested can be tested multiple times based on the initial pressure test strategy, and the reference test voltage selected for each test is less than the rated voltage of the capacitor to be tested. After multiple tests, multiple insulation resistance test results can be obtained, and each test cycle corresponds to an initial insulation resistance test result. Determining the initial insulation resistance test result of the capacitor to be tested may include:

[0069] S1021: In an Nth test cycle, perform an insulation resistance test on the capacitor to be tested by using an Nth reference test voltage to obtain an Nth evaluation parameter, and determine an initial insulation resistance test result of the capacitor to be tested according to the Nth reference test voltage and the Nth evaluation parameter;

[0070] S1022: In the N+1th test cycle, an insulation resistance test is performed on the capacitor to be tested using the N+1th reference test voltage to obtain the N+1th evaluation parameter, and an initial insulation resistance test result of the capacitor to be tested is determined based on the N+1th reference test voltage and the N+1th evaluation parameter.

[0071] In the implementation of S1021 to S1022, the benchmark test voltage increases as the number of test cycles increases. During the test, a specific voltage (i.e., the Nth benchmark test voltage) is applied to both ends of the capacitor, and the insulation resistance value of the capacitor is measured. After the voltage is applied, the current or other electrical characteristics leaked from the capacitor are measured, and an evaluation parameter, i.e., the Nth evaluation parameter, is calculated from these data. This evaluation parameter may include insulation resistance value, leakage current, or other electrical indicators related to the insulation performance of the capacitor. According to the Nth benchmark test voltage and the Nth evaluation parameter, the initial insulation resistance test result of the capacitor to be tested during this test cycle can be determined. This result is usually used to evaluate whether the insulation performance of the capacitor meets the expected standard.

[0072] In the N+1th test cycle, a similar test procedure is repeated, but the voltage used this time is the N+1th reference test voltage. After applying the N+1th reference test voltage, the insulation resistance test is performed again to obtain the N+1th evaluation parameter. Similar to the Nth test cycle, this evaluation parameter will be used to evaluate the insulation performance of the capacitor in this test cycle. By comparing the results of the Nth and N+1th test cycles, the changes in the insulation performance of the capacitor at different voltage levels can be further analyzed.

[0073] As an example, assume that the rated voltage of the capacitor to be tested is 100V. The test strategy may specify that 80V is applied for testing in the first test cycle, and 100V is applied for testing in the second test cycle. In the first test cycle, a test voltage of 80V is applied to the capacitor. During the test, the insulation resistance of the capacitor is measured to be 500MΩ (i.e., the Nth evaluation parameter). Based on this parameter, it can be determined that the initial insulation resistance test result of the capacitor under 80V conditions is 500MΩ. In the second test cycle, the voltage is increased to 100V. The insulation resistance is tested again, and the measured value is 450MΩ. Based on this new parameter, it can be determined that the initial insulation resistance test result of the capacitor under 100V conditions is 450MΩ.

[0074] In order to improve the test precision and accuracy, the voltage can be fine-tuned within a small range based on the reference voltage of each test cycle, and multiple groups of tests can be performed based on the fine-tuned voltage. This can more carefully capture the changes in the insulation characteristics of the capacitor under different voltage conditions, reduce test errors, and provide more reliable test data.

[0075] In a feasible implementation manner, performing an insulation resistance test on the capacitor to be tested by using an Nth reference test voltage to obtain an Nth evaluation parameter specifically includes:

[0076] On the basis of the N+1th reference test voltage, the incremental voltage is sequentially increased to obtain multiple test voltages;

[0077] Performing insulation resistance testing in different test sub-cycles based on multiple test voltages to obtain multiple corresponding insulation resistance test results;

[0078] The reference test voltage of the N+2th test cycle is dynamically corrected according to the multiple corresponding insulation resistance test results.

[0079] In this embodiment, as an example, in the first test cycle, the reference test voltage is set to 80V. At this time, in order to obtain more detailed test data, a small voltage increment test can be performed on the basis of 80V. For example, the voltage increment of different test sub-cycles is set to 5V, and 80V is fine-tuned in turn to obtain a series of incremental voltages: 80V, 85V, 90V, etc. It should be noted that the voltage increments of different test sub-cycles can also be different, and the voltage increments of different test sub-cycles are much smaller than the voltage change of the test cycle. In this way, multiple test voltages can be obtained, such as 80V, 85V, 90V, and can even continue to increase to 95V (but still remain below the rated voltage of 100V), thereby forming a sequence containing multiple test voltages. At each incremental voltage, an insulation resistance test is performed, and the insulation resistance value corresponding to each voltage is recorded. For example: at 80V, the insulation resistance is measured to be 500MΩ. At 85V, the insulation resistance is measured to be 480MΩ. At 90V, the insulation resistance is measured to be 460MΩ. At 95V, the insulation resistance was measured to be 445MΩ. By analyzing multiple sets of test results, the trend of insulation resistance changing with voltage was identified. For example, as the voltage gradually increased from 80V to 95V, the insulation resistance showed a downward trend, but it remained within a reasonable range.

[0080] According to the above trend analysis, it is determined whether the reference voltage of the next test cycle needs to be corrected, that is, the reference test voltage of the capacitor to be tested can be dynamically adjusted during the test process. If it is found that the insulation resistance decreases nonlinearly with the increase of voltage, it may be necessary to adjust the reference voltage of the next test cycle. For example: if the resistance decreases significantly (such as from 500MΩ to 445MΩ), it may indicate that the insulation performance decays rapidly when approaching the rated voltage. It is necessary to reduce the reference test voltage of the N+2 test cycle to prevent further insulation loss or failure caused by excessive voltage.

[0081] Based on the analysis results of the previous cycle, the reference voltage of the next cycle is dynamically corrected. For example, the voltage was originally set to 100V in the second test cycle, but considering that the insulation resistance at 95V has been significantly reduced, the reference voltage of the second test cycle can be corrected to 95V, or set to a more moderate value (such as 97V) based on the correction factor to obtain a more stable test result.

[0082] After obtaining the evaluation parameters of each test cycle, the initial insulation resistance test result of the test cycle can be determined based on this. The specific steps may include:

[0083] S10221: constructing a test simulation curve of the capacitor to be tested according to the N+1th reference test voltage and the N+1th evaluation parameter, where the simulation curve is used to characterize the corresponding relationship between the reference test voltage and the insulation resistance of the capacitor to be tested;

[0084] S10222: Determine the initial insulation resistance test result of the capacitor to be tested according to the matching degree between the simulation curve and the standard curve; the standard curve is used to characterize the corresponding relationship between the reference test voltage and the insulation resistance of the standard capacitor.

[0085] In the implementation of S10221 to S10222, after obtaining the evaluation parameters of each test cycle, the benchmark test voltage of each test cycle can be mapped with the corresponding evaluation parameters to construct a test simulation curve of the capacitor to be tested under the current test conditions. This curve reflects the insulation resistance change of the capacitor to be tested under different voltages (partial low voltage) and shows the overall trend of its insulation characteristics changing with voltage. It should be noted that the standard curve represents the expected insulation resistance characteristics of the standard capacitor under different benchmark test voltages. It is constructed through test data or theoretical models of a large number of qualified capacitors, rather than pre-calibrated by the manufacturer. The coverage of the standard curve is greater than the simulation curve, and the standard curve is continuously updated during the test process.

[0086] The performance of the capacitor to be tested is determined by comparing the test simulation curve of the capacitor to be tested with the standard curve and calculating the matching degree between the two curves. A high matching degree means that the insulation performance of the capacitor to be tested is similar to that of the standard capacitor and meets the design and safety requirements. According to the matching degree, the initial insulation resistance test result of the capacitor to be tested is determined. If the matching degree is within the allowable error range, the test result is "passed", indicating that the capacitor has good performance; if the matching degree is lower than the standard, the test result is "failed", indicating that there is a problem with the insulation performance of the capacitor. By constructing a test simulation curve and performing a matching analysis with the standard curve, the insulation performance of the capacitor to be tested can be effectively evaluated.

[0087] The specific steps of constructing the test simulation curve of the capacitor to be tested may include:

[0088] Constructing a starting point of a test simulation curve with a first reference test voltage and a first evaluation parameter, and constructing an ending point of the test simulation curve with an N+1th reference test voltage and an N+1th evaluation parameter to obtain an initial test simulation curve;

[0089] Determine the correction factor of the initial test simulation curve according to the type label of the capacitor to be tested;

[0090] The initial test simulation curve is corrected according to the correction factor to construct a test simulation curve for the capacitor to be tested.

[0091] In this embodiment, the starting point of the test simulation curve is constructed based on the first reference test voltage and the first evaluation parameter. By connecting the starting point and the end point, a preliminary test simulation curve is obtained. This initial curve roughly reflects the change trend of the insulation resistance of the capacitor during the change from low voltage to high voltage. However, this is only a preliminary model, which does not take into account the specific type of capacitor and the difference between manufacturers. Therefore, it is necessary to determine the correction factor of the initial test simulation curve according to the type label of the capacitor to be tested. The correction factor is used to adjust the initial curve so that it more accurately reflects the true performance of the capacitor. The calculation of the correction factor is usually based on historical test data or theoretical models of a large number of capacitors with the same label. By analyzing these data, one or more parameters are determined to adjust the initial test simulation curve. After correction, the obtained test simulation curve more accurately reflects the change of the insulation resistance of the capacitor to be tested under different voltages. This final test simulation curve can be used as an important basis for evaluating the insulation performance of the capacitor, and is used for matching analysis with the standard curve to further determine the insulation quality of the capacitor.

[0092] Through the above steps, an accurate test simulation curve is constructed, which reflects the change trend of the insulation resistance of the capacitor under test during the change from low voltage to high voltage. The introduction of the correction coefficient is to adjust the initial curve to make it more consistent with the actual characteristics of the capacitor and ensure the accuracy and reliability of the test results.

[0093] S103: Determine a final insulation resistance test result of the capacitor to be tested according to initial insulation resistance test results of different test cycles of the capacitor to be tested.

[0094] In this embodiment, after obtaining the initial insulation resistance test results corresponding to each test cycle, the final insulation resistance test results of the capacitor to be tested can be determined based on the initial insulation resistance test results of different test cycles of the capacitor to be tested, and the specific steps of determining the final insulation resistance test results through the initial insulation resistance test results of different test cycles of the capacitor to be tested may include:

[0095] S1031: When the initial insulation resistance test results of at least two test cycles are in a passed state, determining that the capacitor to be tested passes the final insulation resistance test;

[0096] S1032: When the insulation resistance test result of at most one test cycle is in a passed state, determine that the capacitor to be tested fails the final insulation resistance test.

[0097] In the implementation of S1031 to S1032, the initial insulation resistance test result of the capacitor to be tested may include two results: a pass state and a fail state, and the number of each test cycle passed can be used as a basis for judging whether the capacitor to be tested has passed the final test. If the initial insulation resistance test results are all displayed as "pass state" in at least two different test cycles, this indicates that the capacitor to be tested exhibits consistent good insulation performance under different conditions. This consistency indicates that the capacitor can maintain its insulation properties under a variety of working conditions, so it can be considered that it has passed the overall insulation resistance test. The more test cycles that pass the state, the higher the accuracy of identifying the insulation performance of the capacitor to be tested. If only one or no test cycle is displayed as a pass state in multiple test cycles, this indicates that there is a problem with the insulation performance of the capacitor to be tested.

[0098] Through these two steps, the system can effectively evaluate the insulation performance of capacitors, ensuring that only those capacitors that perform well in multiple test cycles can pass the test, thereby ensuring their safety and reliability in actual applications. This evaluation process plays an important role in the quality control and reliability verification of capacitors.

[0099] S104: Execute a corresponding processing strategy according to the final insulation resistance test result of the capacitor to be tested.

[0100] In this embodiment, after determining the final insulation resistance test result of the capacitor to be tested, different processing strategies need to be executed according to the final insulation resistance test result. The specific implementation steps may include:

[0101] S1041: When the final insulation resistance test result is in a passed state, a corresponding test report is generated;

[0102] S1042: When the final insulation resistance test result is a failed state, the initial pressure test strategy of the capacitor to be tested is adjusted, and the insulation test is continued based on the adjusted initial pressure test strategy.

[0103] In the implementation of S1041 to S1042, when the final insulation resistance test result of the capacitor to be tested is in a passed state, this means that the capacitor exhibits stable and qualified insulation performance in all test cycles, meeting the design and safety standards. At this time, the corresponding test report is generated to record the entire process of the test, result analysis and related data. At the same time, the standard curve can be adjusted according to the test simulation curve of the capacitor to be tested, so that the standard curve can more accurately reflect the actual insulation performance of the capacitor to be tested under different voltage conditions. Through this adjustment, the standard curve can not only match the actual test results of the capacitor to be tested, but also take into account the unique characteristics of different types of capacitors during voltage changes, thereby improving the accuracy and reliability of the test analysis. This adjustment process makes the standard curve more targeted and can effectively reduce errors caused by differences in capacitor type, material or manufacturing process.

[0104] If the final insulation resistance test result of the capacitor to be tested is not passed, it is necessary to consider whether the initial pressure test strategy of the capacitor to be tested has a low matching degree. For example, the capacitor to be tested may be a new type of capacitor, and there is no type label that fully matches it, resulting in the existing initial pressure test strategy failing to fully consider the uniqueness of the capacitor. Therefore, the test results may be inaccurate or biased. In this case, the initial pressure test strategy of the capacitor to be tested needs to be adjusted to improve its matching degree with the actual test conditions. The adjustment process may include redefining the benchmark test voltage, increasing the voltage fine-tuning range, or correcting the evaluation parameters of the test cycle to ensure that the test strategy can better reflect the actual performance characteristics of the capacitor to be tested, and ultimately improve the accuracy and reliability of the test results. If the capacitor to be tested still fails after multiple adjustments, it is necessary to further analyze the possible reasons. First of all, it should be considered whether the capacitor to be tested itself has internal problems such as manufacturing defects or material aging, which causes its insulation performance to fail to meet the expected standards. In addition, it is also necessary to check whether there are adverse factors in the test environment, such as humidity, temperature or electromagnetic interference, which may affect the accuracy of the test results. If the capacitor still fails the test after confirming that these external factors do not exist, it may indicate that the capacitor is no longer suitable for continued use and should be considered for replacement or scrapping.

[0105] It should be noted that in the solution of the present application, the test process of the capacitors to be tested becomes more simplified and efficient as the number of capacitors to be tested increases. This is because as the test data accumulates, the system can gradually optimize the test strategy, such as automatically adjusting the test parameters through data analysis, thereby reducing unnecessary repeated tests. In addition, the degree of automation of the test process is also constantly improving, making the test steps simpler and the process smoother.

[0106] At the same time, due to the optimization and precise control of the test process, the impact of the test on the degradation of the capacitor to be tested is gradually reduced. By fine-tuning the voltage, setting the test cycle reasonably, and adjusting the initial pressure test strategy, the test system can avoid applying excessive stress or too many tests while ensuring the test accuracy, thereby reducing the potential damage to the capacitor. This approach ensures efficiency in large-scale testing and the long-term reliability of the capacitor.

[0107] The automatic insulation resistance test method of the capacitor provided by the present application, by setting the initial pressure test strategy, setting different reference test voltages for different test cycles to test the insulation resistance of the capacitor to be tested, thereby determining its initial insulation resistance test result, and finally obtaining the final insulation resistance test result of the capacitor to be tested. The setting of the reference test voltage is always less than or equal to the rated voltage of the capacitor to be tested, and the reference test voltage varies between different test cycles, which effectively solves the degradation effect that may be produced on the good capacitor during the traditional insulation resistance test process. The excessive stress of the internal structure of the capacitor caused by the one-time application of high voltage can be avoided by gradually increasing the test voltage. In addition, the phased test strategy allows the insulation performance of the capacitor to be preliminarily evaluated at a lower voltage, which can minimize the electrical stress on the capacitor and reduce the risk of degradation. It can not only ensure the test accuracy, timely discover potential insulation quality problems, but also extend the service life of the capacitor.

[0108] In the second aspect, based on the same inventive concept, refer to Figure 2 , shows an automatic insulation resistance testing system 200 for a capacitor provided in an embodiment of the present application, the system comprising:

[0109] A determination module 201 is used to determine an initial pressure test strategy for the capacitor to be tested, where the initial pressure test strategy is used to indicate reference test voltages for different test cycles, and different reference test voltages correspond to different test cycles;

[0110] A testing module 202, for performing an insulation resistance test on the capacitor to be tested according to a reference test voltage in different test cycles to determine an initial insulation resistance test result of the capacitor to be tested, wherein the reference test voltage is less than or equal to a rated voltage of the capacitor to be tested;

[0111] The judgment module 203 is used to determine the final insulation resistance test result of the capacitor to be tested according to the initial insulation resistance test results of different test cycles of the capacitor to be tested;

[0112] The execution module 204 is used to execute a corresponding processing strategy according to the final insulation resistance test result of the capacitor to be tested.

[0113] In a possible implementation of the second aspect, the determining module includes:

[0114] A label determination submodule, used to determine the type label of the capacitor to be tested according to the identification image of the capacitor to be tested;

[0115] The matching submodule is used to determine an initial pressure test strategy that matches the category label using the category label as an index.

[0116] In a possible implementation of the second aspect, the test module includes:

[0117] A first test submodule is used to perform an insulation resistance test on the capacitor to be tested by using an Nth reference test voltage in an Nth test cycle to obtain an Nth evaluation parameter, and determine an initial insulation resistance test result of the capacitor to be tested according to the Nth reference test voltage and the Nth evaluation parameter;

[0118] The second test submodule is used to perform an insulation resistance test on the capacitor to be tested through the N+1th reference test voltage during the N+1th test cycle to obtain the N+1th evaluation parameter, and determine an initial insulation resistance test result of the capacitor to be tested based on the N+1th reference test voltage and the N+1th evaluation parameter, and the N+1th reference test voltage is greater than the Nth reference test voltage.

[0119] In a possible implementation of the second aspect, the second testing submodule includes:

[0120] A first voltage adjustment unit, used for sequentially increasing the incremental voltage based on the N+1th reference test voltage to obtain a plurality of test voltages;

[0121] A testing unit, configured to perform insulation resistance testing in different test sub-cycles based on a plurality of test voltages to obtain a plurality of corresponding insulation resistance test results;

[0122] The second voltage adjustment unit is used to dynamically correct the reference test voltage of the N+2th test cycle according to a plurality of corresponding insulation resistance test results.

[0123] In a possible implementation of the second aspect, the second testing submodule further includes:

[0124] A construction unit, used to construct a test simulation curve of the capacitor to be tested according to the N+1th reference test voltage and the N+1th evaluation parameter, wherein the simulation curve is used to characterize the corresponding relationship between the reference test voltage and the insulation resistance of the capacitor to be tested;

[0125] The matching unit is used to determine the initial insulation resistance test result of the capacitor to be tested according to the matching degree between the simulation curve and the standard curve; the standard curve is used to characterize the corresponding relationship between the reference test voltage and the insulation resistance of the standard capacitor.

[0126] In a possible implementation manner of the second aspect, the building block includes:

[0127] A curve construction subunit, constructing a starting point of a test simulation curve with a first reference test voltage and a first evaluation parameter, and constructing an ending point of the test simulation curve with an N+1th reference test voltage and an N+1th evaluation parameter, so as to obtain an initial test simulation curve;

[0128] The correction coefficient determination subunit determines the correction coefficient of the initial test simulation curve according to the type label of the capacitor to be tested;

[0129] The curve correction subunit corrects the initial test simulation curve according to the correction coefficient to construct a test simulation curve of the capacitor to be tested.

[0130] In a possible implementation of the second aspect, the judging module includes:

[0131] A first judgment submodule, used for determining that the capacitor to be tested passes the final insulation resistance test when the initial insulation resistance test results of at least two test cycles are in a passed state;

[0132] The second judgment submodule is used to determine that the capacitor to be tested fails the final insulation resistance test when the insulation resistance test result of at most one test cycle is in a passed state.

[0133] In a possible implementation of the second aspect, the execution module includes:

[0134] The first execution submodule is used to generate a corresponding test report when the final insulation resistance test result is a pass state;

[0135] The second execution submodule is used to adjust the initial pressure test strategy of the capacitor to be tested when the final insulation resistance test result is a failed state, and continue to perform the insulation test based on the adjusted initial pressure test strategy.

[0136] It should be noted that the specific implementation of the automatic insulation resistance testing system 200 of a capacitor in the embodiment of the present application refers to the specific implementation of the automatic insulation resistance testing method of a capacitor proposed in the first aspect of the embodiment of the present application, which will not be repeated here.

[0137] The present application also provides an electronic device, which may include: a memory and one or more processors. The memory and the processor are coupled. The memory is used to store computer program code, and the computer program code includes computer instructions. When the processor executes the computer instructions, the electronic device can perform each function or step in the above method embodiment.

[0138] This embodiment also provides a computer-readable storage medium, in which computer instructions are stored. When the computer instructions are executed on an electronic device, the electronic device executes each function or step in the above method embodiment.

[0139] This embodiment also provides a computer program product. When the computer program product is run on a computer, it enables the computer to execute each function or step in the above method embodiment.

[0140] Among them, the electronic device, computer-readable storage medium, and computer program product provided in this embodiment are all used to execute the corresponding methods provided above. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding methods provided above, and will not be repeated here.

[0141] The above embodiments can be implemented in whole or in part by software, hardware (such as circuits), firmware or any other combination. When implemented using software, the above embodiments can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions or computer programs. When a computer instruction or computer program is loaded or executed on a computer, a process or function according to an embodiment of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable system. The computer program or instruction can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer program or instruction can be transmitted from one website site, computer, server or data center to another website site, computer, server or data center by wired (such as infrared, wireless, microwave, etc.). The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center containing one or more available media sets. The available medium can be a magnetic medium (for example, a floppy disk, a hard disk, a tape), an optical medium (for example, a DVD), or a semiconductor medium. The semiconductor medium can be a solid-state hard disk.

[0142] It should be understood that in the various embodiments of the present application, the size of the serial numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0143] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0144] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described systems, systems and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0145] In the several embodiments provided in the present application, it should be understood that the disclosed systems, systems and methods can be implemented in other ways. For example, the system embodiments described above are only schematic. For example, the division of units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the system or unit can be electrical, mechanical or other forms.

[0146] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0147] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0148] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the various embodiments of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM), random access memory (RAM), disk or optical disk, and other media that can store program codes.

[0149] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A method for automatically testing the insulation resistance of a capacitor, characterized in that: The method comprises: Determine an initial pressure test strategy for the capacitor to be tested, wherein the initial pressure test strategy is used to indicate reference test voltages for different test cycles, and the reference test voltages corresponding to different test cycles are different; In different test cycles, performing an insulation resistance test on the capacitor to be tested according to the reference test voltage to determine an initial insulation resistance test result of the capacitor to be tested, wherein the reference test voltage is less than or equal to a rated voltage of the capacitor to be tested; Determining a final insulation resistance test result of the capacitor to be tested according to initial insulation resistance test results of different test cycles of the capacitor to be tested; A corresponding processing strategy is executed according to the final insulation resistance test result of the capacitor to be tested.

2. The method according to claim 1, characterized in that The initial pressure test strategy for determining the capacitor to be tested includes: Determining a type label of the capacitor to be tested according to the identification image of the capacitor to be tested; Using the category label as an index, an initial pressure test strategy matching the category label is determined.

3. The method according to claim 1, characterized in that: The step of performing an insulation resistance test on the capacitor to be tested according to the reference test voltage in different test cycles to determine an initial insulation resistance test result of the capacitor to be tested includes: In an Nth test cycle, an insulation resistance test is performed on the capacitor to be tested by using an Nth reference test voltage to obtain an Nth evaluation parameter, and an initial insulation resistance test result of the capacitor to be tested is determined according to the Nth reference test voltage and the Nth evaluation parameter; In the N+1th test cycle, an insulation resistance test is performed on the capacitor to be tested using the N+1th reference test voltage to obtain the N+1th evaluation parameter, and an initial insulation resistance test result of the capacitor to be tested is determined based on the N+1th reference test voltage and the N+1th evaluation parameter, and the N+1th reference test voltage is greater than the Nth reference test voltage.

4. The method according to claim 3, characterized in that The test cycle includes a plurality of test sub-cycles. In the N+1th test cycle, the insulation resistance test is performed on the capacitor to be tested by using the N+1th reference test voltage to obtain the N+1th evaluation parameter, including: On the basis of the N+1th reference test voltage, increasing the incremental voltage in sequence to obtain a plurality of test voltages; Performing insulation resistance tests in different test sub-periods based on the multiple test voltages to obtain multiple corresponding insulation resistance test results; The reference test voltage of the N+2th test cycle is dynamically corrected according to the multiple corresponding insulation resistance test results.

5. The method according to claim 3, characterized in that: The step of determining an initial insulation resistance test result of the capacitor to be tested according to the N+1th reference test voltage and the N+1th evaluation parameter comprises: According to the N+1th reference test voltage and the N+1th evaluation parameter, construct a test simulation curve of the capacitor to be tested, wherein the simulation curve is used to characterize a corresponding relationship between the reference test voltage and the insulation resistance of the capacitor to be tested; The initial insulation resistance test result of the capacitor to be tested is determined according to the matching degree between the simulation curve and the standard curve; the standard curve is used to characterize the corresponding relationship between the reference test voltage and the insulation resistance of the standard capacitor.

6. The method according to claim 5, characterized in that The step of constructing a test simulation curve of the capacitor to be tested according to the N+1th reference test voltage and the N+1th evaluation parameter comprises: Constructing a starting point of the test simulation curve with a first reference test voltage and a first evaluation parameter, and constructing an ending point of the test simulation curve with the N+1th reference test voltage and the N+1th evaluation parameter, so as to obtain an initial test simulation curve; Determining a correction coefficient of the initial test simulation curve according to the type label of the capacitor to be tested; The initial test simulation curve is corrected according to the correction coefficient to construct a test simulation curve of the capacitor to be tested.

7. The method according to claim 1, characterized in that The step of determining a final insulation resistance test result of the capacitor to be tested according to initial insulation resistance test results of different test cycles of the capacitor to be tested comprises: When the initial insulation resistance test results of at least two of the test cycles are in a passed state, determining that the capacitor to be tested passes the final insulation resistance test; In the case that the insulation resistance test result of at most one of the test cycles is in a passed state, it is determined that the capacitor to be tested fails the final insulation resistance test.

8. The method according to claim 1, characterized in that The executing a corresponding processing strategy according to the final insulation resistance test result of the capacitor to be tested comprises: When the final insulation resistance test result is in a passed state, generating a corresponding test report; When the final insulation resistance test result is a failed state, the initial pressure test strategy of the capacitor to be tested is adjusted, and the insulation test is continued to be performed based on the adjusted initial pressure test strategy.

9. An automatic insulation resistance test system for capacitors, characterized in that: The system comprises: A determination module, used to determine an initial pressure test strategy for the capacitor to be tested, wherein the initial pressure test strategy is used to indicate reference test voltages for different test cycles, and the reference test voltages corresponding to different test cycles are different; A testing module, configured to perform an insulation resistance test on the capacitor to be tested according to the reference test voltage in different test cycles to determine an initial insulation resistance test result of the capacitor to be tested, wherein the reference test voltage is less than or equal to a rated voltage of the capacitor to be tested; A judgment module, used to determine a final insulation resistance test result of the capacitor to be tested according to initial insulation resistance test results of different test cycles of the capacitor to be tested; The execution module is used to execute a corresponding processing strategy according to the final insulation resistance test result of the capacitor to be tested.

10. The system according to claim 9, characterized in that The test module comprises: A first test submodule is used to perform an insulation resistance test on the capacitor to be tested by using an Nth reference test voltage in an Nth test cycle to obtain an Nth evaluation parameter, and determine an initial insulation resistance test result of the capacitor to be tested according to the Nth reference test voltage and the Nth evaluation parameter; The second test submodule is used to perform an insulation resistance test on the capacitor to be tested by using an N+1th reference test voltage during the N+1th test cycle to obtain an N+1th evaluation parameter, and determine an initial insulation resistance test result of the capacitor to be tested based on the N+1th reference test voltage and the N+1th evaluation parameter, wherein the N+1th reference test voltage is greater than the Nth reference test voltage.

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