Microscope imaging automatic adjusting system and method

Abstract

The invention discloses a microscope imaging automatic adjusting system, and the system comprises a carrying assembly which is used for carrying a sample; the carrying assembly is arranged on the adjusting assembly; the imaging assembly is arranged on the upper side of the loading assembly and is used for amplifying and displaying the sample loaded on the loading assembly; the analysis assembly is used for analyzing the coordinates of the sample carried on the object carrying assembly, and a first parameter, a second parameter and a focus parameter are set in the analysis assembly; the analysis assembly obtains a first coordinate of the sample in a first direction, a second coordinate of the sample in a second direction and a third coordinate of the loading assembly in a third direction in a picture displayed by the imaging assembly; the position of the sample on the object carrying assembly is analyzed by using the analysis assembly, and the adjustment assembly is controlled to move the object carrying assembly according to the analysis result, so that the automatic focusing operation of the microscope is completed, manual adjustment is not needed, and the convenience and applicability of the microscope are improved.

Description

Technical Field

[0001] The invention relates to the technical field of microscope imaging, and in particular to an automatic adjustment system and method for microscope imaging. Background Art

[0002] With the exploration of the microscopic world by human beings, the status of microscopes has become increasingly important. Microscopes are an optical instrument composed of a lens or a combination of several lenses. They are a symbol of human beings entering the atomic age. Microscopes are instruments mainly used to magnify tiny objects so that they can be seen by the naked eye. In the current use of microscopes, manual focusing and adjustment of the center position of the image are usually required, which is not convenient enough. Summary of the invention

[0003] In order to overcome the above-mentioned shortcomings, the purpose of the present invention is to provide an automatic adjustment system and method for microscope imaging, by using an analysis component to analyze the sample position on the carrier component, and controlling the adjustment component to move the carrier component according to the analysis result, to complete the automatic focusing operation of the microscope without manual adjustment, thereby improving the convenience and applicability of the microscope.

[0004] In order to achieve the above purpose, the technical solution adopted by the present invention is: a microscope imaging automatic adjustment system, comprising: A loading assembly, which is used to load samples; An adjusting assembly, on which the object-carrying assembly is disposed, and the adjusting assembly includes a first motor for controlling the object-carrying assembly to move in a first direction, a second motor for controlling the object-carrying assembly to move in a second direction, and a third motor for controlling the object-carrying assembly to move in a third direction; An imaging component, which is disposed on the upper side of the object-carrying component and is used to magnify and display the sample carried on the object-carrying component; An analysis component is used to analyze the coordinates of the sample carried by the carrier component. The analysis component is provided with a first parameter, a second parameter and a focus parameter. The analysis component obtains the first coordinate of the sample in the first direction, the second coordinate in the second direction, and the third coordinate of the carrier component in the third direction in the picture displayed by the imaging component.

[0005] In this technical solution, the carrier component is used to carry the sample and to adjust the imaging of the sample by moving the carrier component. The adjustment component is used to adjust the position of the carrier component so as to make the imaging of the sample clearer. The imaging component is used to enlarge and display the sample carried on the carrier component for observation by the operator. The analysis component is used to provide an adjustment direction for the adjustment component to move the carrier component. The position of the sample on the carrier component is analyzed by using the analysis component, and the adjustment component is controlled to move the carrier component according to the analysis result, so as to complete the automatic focusing operation of the microscope without manual adjustment, thereby improving the convenience and applicability of the microscope.

[0006] In some embodiments, the error between the first parameter and the first coordinate is greater than the set error, and the adjustment component moves the carrier component along the first direction; the error between the second parameter and the second coordinate is greater than the set error, and the adjustment component moves the carrier component along the second direction; the focus coordinate and the sample coordinate are greater than the set error, and the adjustment component moves the carrier component along the third direction.

[0007] In this technical solution, if the error between the first parameter and the first coordinate is greater than the set error, it means that the distance between the sample and the center point displayed by the imaging component in the first direction is too large, and the adjustment component moves the carrier component along the first direction to adjust the sample to the center point of the picture displayed by the imaging component. If the error between the second parameter and the second coordinate is greater than the set error, it means that the distance between the sample and the center point displayed by the imaging component in the second direction is too large, and the adjustment component moves the carrier component along the second direction to adjust the sample to the center point of the picture displayed by the imaging component. If the focus coordinates and the sample coordinates are greater than the set error, it means that the carrier component is not in the plane where the focus of the imaging component is located, and the adjustment component moves the carrier component along the third direction to adjust the sample to the focus of the picture displayed by the imaging component.

[0008] The present invention also provides a method for automatically adjusting microscope imaging, including the above-mentioned automatic microscope imaging adjustment system, characterized in that the method comprises: Obtain the third coordinate, and compare the third coordinate with the focus parameter; Determine that the comparison result between the third coordinate and the focus parameter is greater than the third error, adjust the component to move the carrier component m millimeters along the third direction, reacquire the third coordinate and compare it with the focus coordinate; determine that the comparison result between the third coordinate and the focus parameter is less than the third error, acquire the sample coordinate, and compare the sample coordinate with the set coordinate; If it is determined that the comparison result between the sample coordinates and the set coordinates is greater than the first error, the adjustment component moves the carrier component n millimeters, re-acquires the sample coordinates and compares them; if it is determined that the comparison result between the sample coordinates and the set coordinates is less than the first error, the imaging component displays the sample image carried by the carrier component.

[0009] In this method, a third coordinate is obtained, and the third coordinate is compared with a focus parameter to focus the microscope, thereby ensuring the clarity of the image of the sample displayed by the imaging component. If the comparison result of the third coordinate and the focus parameter is greater than the third error, it means that the difference between the position of the mounting component and the horizontal plane where the focus of the imaging component is located is too large, and the mounting component needs to be moved and adjusted in the third direction by means of an adjustment component. If the comparison result of the third coordinate and the focus parameter is less than the third error, it means that the difference between the position of the mounting component and the horizontal plane where the focus of the imaging component is located is within the allowable error range. If the comparison result of the sample coordinate and the set coordinate is greater than the first error, it means that the difference between the position of the mounting component and the center point of the image displayed by the imaging component is too large, and the sample on the mounting component needs to be moved and adjusted in the first direction and the second direction by means of an adjustment component. If the error between the sample coordinate and the set coordinate is less than the first error, the difference between the position of the mounting component and the center point of the image displayed by the imaging component is within the allowable error range.

[0010] In some embodiments, comparing the third coordinate with the focus parameter includes: subtracting the third coordinate from the focus parameter to obtain a third ratio.

[0011] In this method, the difference between the third coordinate and the focus parameter is calculated to represent the difference between the third coordinate and the focus of the imaging component.

[0012] In some embodiments, the adjusting component moves the carrier component m millimeters along the third direction, including: when the third ratio is greater than 0, the adjusting component moves the carrier component upward by m millimeters; when the third ratio is less than 0, the adjusting component moves the carrier component downward by m millimeters.

[0013] In this method, if the third ratio is greater than 0, it means that the carrier is below the focus of the imaging component, and the component needs to be adjusted to move the carrier upward; if the third ratio is less than 0, it means that the carrier is above the focus of the imaging component, and the component needs to be adjusted to move the carrier downward.

[0014] In some embodiments, the sample coordinates include a first coordinate and a second coordinate, the set coordinates include a first parameter and a second parameter, and comparing the sample coordinates with the set coordinates includes: subtracting the first coordinate from the first parameter to obtain a first ratio, and subtracting the second coordinate from the second parameter to obtain a second ratio.

[0015] In this method, the difference between the first coordinate and the first parameter is calculated to represent the difference between the first coordinate and the center point of the imaging component in the first direction, and the difference between the second coordinate and the second parameter is calculated to represent the difference between the second coordinate and the center point of the imaging component in the first and second directions.

[0016] In some embodiments, the adjusting component moves the carrier component n millimeters, including: when the first ratio is greater than 0, the adjusting component moves the carrier component to the left by n millimeters; when the first ratio is less than 0, the adjusting component moves the carrier component to the right by n millimeters.

[0017] In this method, if the first ratio is greater than 0, it means that the carrier device is on the right side of the center point of the imaging component, and the component needs to be adjusted to move the carrier component to the left; if the first ratio is less than 0, it means that the carrier device is on the left side of the center point of the imaging component, and the component needs to be adjusted to move the carrier component to the right.

[0018] In some embodiments, the adjusting component moves the carrier component n millimeters, including: when the second ratio is greater than 0, the adjusting component moves the carrier component forward by n millimeters; and when the second ratio is less than 0, the adjusting component moves the carrier component backward by n millimeters.

[0019] In this method, if the second ratio is greater than 0, it means that the carrier is located at the rear side of the center point of the imaging component, and the component needs to be adjusted to move the carrier component forward; if the first ratio is less than 0, it means that the carrier is located at the front side of the center point of the imaging component, and the component needs to be adjusted to move the carrier component backward.

[0020] The beneficial effect of the present invention is that by comparing and analyzing the coordinates of the sample on the mounting assembly and the coordinates of the mounting assembly with the various parameters of the imaging assembly, and controlling the adjustment assembly to move the mounting assembly according to the analysis results, the automatic focusing operation of the microscope is completed without manual adjustment, thereby improving the convenience and applicability of the microscope. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 A schematic diagram of the positions of the object-carrying component and the imaging component of the automatic adjustment system for microscope imaging according to one embodiment of the present invention; Figure 2 A schematic diagram of the structure of an automatic adjustment system for microscope imaging according to an embodiment of the present invention; Figure 3 A schematic diagram of a flow chart of a method for automatically adjusting microscope imaging according to an embodiment of the present invention; In the figure: 1 is the object carrier component, 2 is the imaging component, x is the first direction, y is the second direction, and z is the third direction. DETAILED DESCRIPTION

[0022] The preferred embodiments of the present invention are described in detail below in conjunction with the accompanying drawings so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the protection scope of the present invention.

[0023] Combined with Figure 1 and attached Figure 2 As shown, the present invention provides a microscope imaging automatic adjustment system, comprising: The object carrier component 1 is used for carrying the sample; An adjusting component, on which the object-carrying component 1 is disposed, comprises a first motor for controlling the object-carrying component 1 to move in a first direction x, a second motor for controlling the object-carrying component 1 to move in a second direction y, and a third motor for controlling the object-carrying component 1 to move in a third direction z; An imaging component 2, which is disposed on the upper side of the object-carrying component 1 and is used to magnify and display the sample carried on the object-carrying component 1; An analysis component is used to analyze the coordinates of the sample carried by the carrier component 1. The analysis component is provided with a first parameter, a second parameter and a focus parameter. The analysis component obtains the first coordinate of the sample in the first direction x, the second coordinate in the second direction y, and the third coordinate of the carrier component 1 in the third direction z in the picture displayed by the imaging component 2.

[0024] The carrier component 1 is used for carrying samples and is convenient for adjusting the imaging of the samples by moving the carrier component 1. The adjustment component is used for adjusting the position of the carrier component 1 so as to make the imaging of the samples clearer. The imaging component 2 is used for enlarging and displaying the samples carried on the carrier component 1 for observation by the operator. The analysis component is used for providing adjustment direction for the adjustment component to move the carrier component 1. The position of the samples on the carrier component 1 is analyzed by using the analysis component, and the adjustment component is controlled to move the carrier component 1 according to the analysis result, so as to complete the automatic focusing operation of the microscope without manual adjustment, thereby improving the convenience and applicability of the microscope.

[0025] Continue to combine Figure 1 and attached Figure 2 As shown, in some embodiments, the error between the first parameter and the first coordinate is greater than the set error, the adjustment component moves the carrier component 1 along the first direction x, the error between the second parameter and the second coordinate is greater than the set error, the adjustment component moves the carrier component 1 along the second direction y, the focus coordinate and the sample coordinate are greater than the set error, and the adjustment component moves the carrier component 1 along the third direction z.

[0026] The error between the first parameter and the first coordinate is greater than the set error, indicating that the distance between the sample in the first direction x and the center point displayed by the imaging component 2 is too large. The adjustment component moves the carrier component 1 along the first direction x through the first motor to adjust the sample to the center point of the picture displayed by the imaging component 2. The error between the second parameter and the second coordinate is greater than the set error, indicating that the distance between the sample in the second direction y and the center point displayed by the imaging component 2 is too large. The adjustment component moves the carrier component 1 along the second direction y through the second motor to adjust the sample to the center point of the picture displayed by the imaging component 2. The focus coordinates and the sample coordinates are greater than the set error, indicating that the carrier component 1 is not in the plane where the focus of the imaging component 2 is located. The adjustment component moves the carrier component 1 along the third direction z through the third motor to adjust the sample to the focus of the picture displayed by the imaging component 2.

[0027] Combined with Figure 3 As shown, the present invention also provides a method for automatically adjusting microscope imaging, including the above-mentioned automatic microscope imaging adjustment system, characterized in that the method comprises: S100: Acquire the third coordinate, and compare the third coordinate with the focus parameter.

[0028] Obtain the third coordinate and compare it with the focus parameter to focus the microscope, thereby ensuring the clarity of the image of the sample displayed by the imaging component S200: Determine that the comparison result between the third coordinate and the focus parameter is greater than the third error, adjust the component to move the carrier component m millimeters along the third direction, re-acquire the third coordinate and compare it with the focus coordinate; determine that the comparison result between the third coordinate and the focus parameter is less than the third error, obtain the sample coordinate, and compare the sample coordinate with the set coordinate.

[0029] If the comparison result of the third coordinate and the focus parameter is greater than the third error, it means that the difference between the position of the carrier component and the horizontal plane where the focus of the imaging component is located is too large, and the carrier component needs to be moved and adjusted in the third direction by adjusting the component. If the comparison result of the third coordinate and the focus parameter is less than the third error, it means that the difference between the position of the carrier component and the horizontal plane where the focus of the imaging component is located is within the allowable error range.

[0030] For example, if the third coordinate is 10, the focus parameter is 8, the third error is 1, and m is 0.5, the comparison result is 10-8=2. If 2 is greater than 1, it means that the difference between the position of the carrier component and the horizontal plane where the focus of the imaging component is located is too large. The carrier component is adjusted by moving 0.5 mm in the third direction.

[0031] S300: If it is determined that the comparison result between the sample coordinates and the set coordinates is greater than the first error, the adjustment component moves the carrier component n millimeters, re-acquires the sample coordinates and compares them; if it is determined that the comparison result between the sample coordinates and the set coordinates is less than the first error, the imaging component displays the sample image carried by the carrier component.

[0032] The comparison result between the sample coordinates and the set coordinates is greater than the first error, indicating that the position of the carrier component and the center point of the picture displayed by the imaging component are too far apart, and the sample on the carrier component needs to be moved and adjusted in the first direction and the second direction through the adjustment component. The error between the sample coordinates and the set coordinates is less than the first error, and the difference between the position of the carrier component and the center point of the picture displayed by the imaging component is within the allowable error range.

[0033] For example, the coordinates are set to (10, 6), the coordinates are set to (6, 6), the third error is 2, and n is 1, then the comparison result is L=4. If 4 is greater than 2, it means that the position of the mounting component is too far away from the center point of the image displayed by the imaging component. The sample on the mounting component is adjusted by moving 1 mm through the over-adjustment component.

[0034] In some embodiments, comparing the third coordinate with the focus parameter includes: subtracting the third coordinate from the focus parameter to obtain a third ratio, and calculating the difference between the third coordinate and the focus parameter to represent the difference between the third coordinate and the focus of the imaging component.

[0035] In some embodiments, the adjusting component moves the carrier component m millimeters along the third direction, including: when the third ratio is greater than 0, the adjusting component moves the carrier component upward by m millimeters; when the third ratio is less than 0, the adjusting component moves the carrier component downward by m millimeters.

[0036] If the third ratio is greater than 0, it means that the loading device is below the focus of the imaging component, and the component needs to be adjusted to move the loading component upward; if the third ratio is less than 0, it means that the loading device is above the focus of the imaging component, and the component needs to be adjusted to move the loading component downward.

[0037] For example, the third coordinate is 10, the focus parameter is 8, and m is 0.5, then the third ratio is 10-8=2, and 2 is greater than 0, which means that the object carrier is located at the lower side of the focus of the imaging component, and the object carrier is adjusted to move 0.5 mm upward in the third direction through the third motor by the adjustment component; The third coordinate is 6, the focus parameter is 8, and m is 0.5, then the third ratio is 6-8=-2, -2 is greater than 0, which means that the carrier is on the upper side of the focus of the imaging component. The carrier component is adjusted by moving downward 0.5 mm in the third direction through the third motor through the adjustment component.

[0038] In some embodiments, the sample coordinates include a first coordinate and a second coordinate, the set coordinates include a first parameter and a second parameter, and comparing the sample coordinates with the set coordinates includes: subtracting the first coordinate from the first parameter to obtain a first ratio, and subtracting the second coordinate from the second parameter to obtain a second ratio.

[0039] The difference between the first coordinate and the first parameter is calculated to represent the difference between the first coordinate and the center point of the imaging component in the first direction. The difference between the second coordinate and the second parameter is calculated to represent the difference between the second coordinate and the center point of the imaging component in the first and second directions.

[0040] In some embodiments, the adjusting component moves the carrier component n millimeters, including: when the first ratio is greater than 0, the adjusting component moves the carrier component n millimeters to the left through the first motor; when the first ratio is less than 0, the adjusting component moves the carrier component n millimeters to the right through the first motor.

[0041] The first ratio is greater than 0, indicating that the loading device is on the right side of the center point of the imaging component, and the component needs to be adjusted to move the loading component to the left; the first ratio is less than 0, indicating that the loading device is on the left side of the center point of the imaging component, and the component needs to be adjusted to move the loading component to the right.

[0042] For example, the first coordinate is 12, the first parameter is 9, and n is 1, then the first ratio is 12-9=3, and 3 is greater than 0, which means that the object-carrying device is on the right side of the center point of the imaging component, and the adjustment component uses the first motor to adjust the object-carrying component to move 1 mm to the left in the first direction; The first coordinate is 6, the first parameter is 9, and n is 1, then the first ratio is 6-9=-3, -3 is greater than 0, which means that the carrier is on the left side of the center point of the imaging component, and the adjustment component adjusts the carrier component by moving 1 mm to the right in the first direction through the second motor.

[0043] In some embodiments, the adjusting component moves the carrier component n millimeters, including: the second ratio is greater than 0, and the adjusting component moves the carrier component forward n millimeters; the second ratio is less than 0, The second ratio is greater than 0, indicating that the loading device is at the rear side of the center point of the imaging component, and the component needs to be adjusted to move the loading component forward; the first ratio is less than 0, indicating that the loading device is at the front side of the center point of the imaging component, and the component needs to be adjusted to move the loading component backward.

[0044] For example, the second coordinate is 12, the second parameter is 9, and n is 1, then the second ratio is 12-9=3, and 3 is greater than 0, which means that the object-carrying device is located at the rear side of the center point of the imaging assembly, and the adjustment assembly adjusts the object-carrying assembly by moving 1 mm forward in the first direction through the second motor; The second coordinate is 6, the second parameter is 9, and n is 1, then the second ratio is 6-9=-3, -3 is greater than 0, which means that the carrier is in front of the center point of the imaging component, and the carrier component is adjusted by moving 1 mm backward in the first direction through the adjustment component.

[0045] In summary, the present invention provides an automatic adjustment system and method for microscope imaging, which compares and analyzes the coordinates of the sample on the carrier component and the coordinates of the carrier component with the various parameters of the imaging component, and controls the adjustment component to move the carrier component according to the analysis results, thereby completing the automatic focusing operation of the microscope without manual adjustment, thereby improving the convenience and applicability of the microscope.

[0046] The above implementation modes are only for illustrating the technical concept and features of the present invention, and their purpose is to enable people familiar with this technology to understand the content of the present invention and implement it, and they cannot be used to limit the protection scope of the present invention. Any equivalent changes or modifications made according to the spirit of the present invention should be included in the protection scope of the present invention.

Claims

1. A microscope imaging automatic adjustment system, characterized in that: include: A carrier assembly, the carrier assembly is used to carry a sample; An adjusting assembly, the object-carrying assembly is arranged on the adjusting assembly, and the adjusting assembly includes a first motor for controlling the object-carrying assembly to move in a first direction, a second motor for controlling the object-carrying assembly to move in a second direction, and a third motor for controlling the object-carrying assembly to move in a third direction; An imaging component, which is disposed on the upper side of the carrier component and is used to magnify and display the sample carried on the carrier component; An analysis component is used to analyze the coordinates of the sample carried by the carrier component, wherein the analysis component is provided with a first parameter, a second parameter and a focus parameter, and the analysis component obtains the first coordinate of the sample in the first direction, the second coordinate in the second direction, and the third coordinate of the carrier component in the third direction in the picture displayed by the imaging component.

2. The microscope imaging automatic adjustment system according to claim 1, characterized in that: When the error between the first parameter and the first coordinate is greater than the set error, the adjustment component moves the carrier component along the first direction; when the error between the second parameter and the second coordinate is greater than the set error, the adjustment component moves the carrier component along the second direction; when the error between the focus coordinate and the sample coordinate is greater than the set error, the adjustment component moves the carrier component along the third direction.

3. A method for automatically adjusting microscope imaging, comprising the automatic microscope imaging adjustment system according to any one of claims 1 to 2, characterized in that: The method comprises: Acquire the third coordinate, and compare the third coordinate with the focus parameter; Determine that the comparison result between the third coordinate and the focus parameter is greater than the third error, move the mounting component m millimeters along the third direction, reacquire the third coordinate and compare it with the focus coordinate; Determine that the comparison result between the third coordinate and the focus parameter is less than the third error, acquire the sample coordinate, and compare the sample coordinate with the set coordinate; If it is determined that the comparison result between the sample coordinates and the set coordinates is greater than the first error, the adjustment component moves the carrier component n millimeters, reacquires the sample coordinates and compares them; if it is determined that the comparison result between the sample coordinates and the set coordinates is less than the first error, the imaging component displays the sample image carried by the carrier component.

4. The automatic adjustment method for microscope imaging according to claim 3, characterized in that: The comparing the third coordinate with the focus parameter includes: subtracting the third coordinate from the focus parameter to obtain a third ratio.

5. The automatic adjustment method for microscope imaging according to claim 4, characterized in that: The adjusting component moves the carrier component m millimeters along the third direction, including: when the third ratio is greater than 0, the adjusting component moves the carrier component upward by m millimeters; when the third ratio is less than 0, the adjusting component moves the carrier component downward by m millimeters.

6. The automatic adjustment method for microscope imaging according to claim 3, characterized in that: The sample coordinates include a first coordinate and a second coordinate, the set coordinates include a first parameter and a second parameter, and comparing the sample coordinates with the set coordinates includes: subtracting the first coordinate from the first parameter to obtain a first ratio, and subtracting the second coordinate from the second parameter to obtain a second ratio.

7. The automatic adjustment method for microscope imaging according to claim 6, characterized in that: The adjusting component moves the carrier component n millimeters, which includes: when the first ratio is greater than 0, the adjusting component moves the carrier component to the left by n millimeters; when the first ratio is less than 0, the adjusting component moves the carrier component to the right by n millimeters.

8. The method for automatically adjusting microscope imaging according to claim 6, characterized in that: The adjusting component moves the carrier component n millimeters, which includes: when the second ratio is greater than 0, the adjusting component moves the carrier component forward by n millimeters; and when the second ratio is less than 0, the adjusting component moves the carrier component backward by n millimeters.

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