Tool for testing environmental adaptability of chip
通过设计灵活的芯片测试用工装,利用弹簧和传动系统实现对不同尺寸芯片的稳定夹持,解决了现有技术中夹持灵活性不足和夹持力过大的问题,提高了测试效率并保护 The chip is
Patent Information
- Application Number
- CN202420865359.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-24
- Publication Date
- 2025-01-03
- Estimated Expiration
- 2034-04-24
AI Technical Summary
The existing chip test tooling is insufficient clamping flexibility in environmental adaptability tests and cannot adapt to chips of different sizes, resulting in low loading and unloading efficiency, and excessive clamping force may damage the chip.
A chip environment adaptability test tool is designed, using bottom plate, back plate, slider, slider, spring, track rod, clamping rod and other structures, using spring elastic force to provide clamping force, and through transmission box and gear system Achieve flexible adjustment of the clamping rod to ensure stable chip clamping.
Quick clamping of multiple chips is achieved, loading and unloading efficiency is improved, and the clamping force provided by the spring prevents excessive clamping force from causing damage to the chip.
Smart Images

Figure CN222299748U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of chip testing, and in particular relates to a tool for chip environmental adaptability testing. Background Art
[0002] In the field of semiconductor chips, the existing technology requires various tests after the chip is produced. Among them, environmental adaptability test is an essential test item for the chip to leave the factory. Environmental adaptability test includes climate environmental factors: including temperature, humidity, pressure, sunlight radiation, sand and dust, snow, etc. Biological and chemical factors: including salt spray, mold, sulfur dioxide, hydrogen sulfide, etc. Mechanical environmental factors: including vibration (including sine, random), collision, drop, swing, impact, etc.
[0003] The test fixture is a tool for fixing semiconductor chips in order to facilitate stable testing of semiconductor chips. When the chip is tested for environmental adaptability, due to the large number of test items, the chip needs to be disassembled and reinstalled in the test body each time the item is changed. In addition, the existing chip clamping fixture is not flexible enough to adapt to the clamping of chips of different sizes, which leads to slow efficiency in loading and unloading. If a special fixture is used, the chip may be damaged due to excessive clamping force if it is not installed in place. Utility Model Content
[0004] In view of the problems existing in the prior art, the purpose of the utility model is to provide a tooling for chip environmental adaptability testing, which can realize the rapid clamping of multiple chips and improve the loading and unloading speed during testing. At the same time, the holding force is provided by the spring force, which can prevent the chip from being damaged by excessive clamping force.
[0005] In order to achieve the above purpose, the utility model provides the following technical solutions:
[0006] A tool for testing chip environmental adaptability comprises a base plate, back plates are symmetrically arranged on both sides of the upper surface of the base plate, a slide groove is horizontally opened on the surface of the back plate, the two slide grooves are of equal height, sliders are symmetrically slidably installed on the inner sides of the slide grooves, springs are symmetrically arranged on both sides of the inside of the slide grooves, the two springs are respectively placed on the outer sides of the two sliders, a track rod is arranged between the two sliders, the track rod is placed between the two back plates, the two track rods are parallel to each other, fixing sleeves are evenly installed on the surface of the track rods by bolts, a clamping rod is vertically fixed on the inner surface of the fixing sleeve, the clamping rod structure is L-shaped, the two clamping rods in the same group are symmetrically arranged, and a card groove matching the chip thickness is opened on the inner side of the clamping rod.
[0007] Furthermore, a transmission box is arranged below the side where the two back plates are close to each other, and gears are symmetrically installed on both sides of the upper part of the transmission box through bearings.
[0008] Furthermore, a toggle rod is fixed on the surface of the gear, the toggle rod extends beyond the outer surface of the transmission box, and a U-shaped rod is provided at one end of the toggle rod away from the gear.
[0009] Furthermore, the U-shaped rod is clamped on the end surface of the track rod.
[0010] Furthermore, a slideway is vertically opened at the inner center of the transmission box, a bidirectional gear rod is slidably installed inside the slideway, the bidirectional gear rod is placed between the two gears, and the two sides of the bidirectional gear rod are respectively meshed with the two gears.
[0011] Furthermore, an extrusion head is provided at the bottom of the bidirectional gear rod, a rotating shaft is installed between the two transmission boxes via a bearing, and an eccentric wheel is provided on the surface of the rotating shaft.
[0012] Furthermore, the eccentric wheel is placed below the inside of the slideway, and the bottom of the extrusion head is in contact with the surface of the eccentric wheel.
[0013] Furthermore, the rotating shaft is placed below between the two track rods, and a knob is provided at the end of the rotating shaft, and the knob is placed on the outer side of the back plate.
[0014] Compared with the prior art, the utility model has the following beneficial effects: during installation, the positions of multiple clamping rods can be adjusted according to the number of single tests, and the elastic force of the springs on both sides is used to make the two track rods always have a force to approach each other. At this time, the chip is placed between the two clamping rods in the same group, and the chip is fixed by the L clamping rod to achieve simultaneous clamping of multiple chips and improve the efficiency of loading and unloading. At the same time, the holding force is provided by the spring elastic force, which can prevent the chip from being damaged by excessive clamping force. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 It is a three-dimensional structural schematic diagram of the utility model;
[0016] Figure 2 This is a front view structural diagram of the back plate of the utility model;
[0017] Figure 3 This is a schematic cross-sectional view of the transmission box of the utility model;
[0018] Figure 4 It is a schematic diagram of the three-dimensional structure of the clamping rod of the utility model.
[0019] In the accompanying drawings, the components represented by the reference numerals are listed as follows:
[0020] 1. Bottom plate; 2. Back plate; 3. Slide groove; 4. Slider; 5. Spring; 6. Track rod; 7. Fixed sleeve; 8. Clamping rod; 9. Slot; 10. Transmission box; 11. Gear; 12. Toggle rod; 13. U-shaped rod; 14. Slide; 15. Bidirectional gear rod; 16. Extrusion head; 17. Rotating shaft; 171. Knob; 18. Eccentric wheel. DETAILED DESCRIPTION
[0021] In order to make the purpose and advantages of the utility model more clear, the utility model is specifically described in combination with the following embodiments. It should be understood that the following text is only used to describe one or several specific implementations of the utility model, and does not strictly limit the protection scope of the specific request of the utility model.
[0022] Please refer to Figure 1-Figure 4 As shown, a chip environmental adaptability test tool comprises a bottom plate 1, back plates 2 are symmetrically arranged on both sides of the upper surface of the bottom plate 1, a slide groove 3 is horizontally opened on the surface of the back plate 2, the two slide grooves 3 are of equal height, a slider 4 is symmetrically slidably installed on the inner side of the slide groove 3, springs 5 are symmetrically arranged on both sides of the inside of the slide groove 3, the two springs 5 are respectively arranged on the outer sides of the two sliders 4, a track rod 6 is arranged between the two sliders 4, the elastic force of the springs 5 on both sides makes the two sliders 4 close to each other when not subject to external force, and then makes the two track rods 6 close to each other to clamp multiple chips, the track rod 6 is placed between the two back plates 2, the two track rods 6 are parallel to each other, a fixing sleeve 7 is evenly installed on the surface of the track rod 6 by bolts, a clamping rod 8 is vertically fixed on the inner surface of the fixing sleeve 7, and the clamping rod 8 has an L-shaped structure, which can realize the support of the bottom of the chip to prevent the chip from falling during the test, and the two clamping rods 8 in the same group are symmetrically arranged, and a card slot 9 adapted to the thickness of the chip is opened on the inner side of the clamping rod 8 to ensure the clamping force on the chip.
[0023] Please refer to Figure 2-Figure 3 As shown, a transmission box 10 is arranged below the side where the two back plates 2 are close to each other, and gears 11 are symmetrically installed on both sides of the upper inside of the transmission box 10 through bearings. A toggle rod 12 is fixed on the surface of the gear 11, and the toggle rod 12 extends beyond the outer surface of the transmission box 10. A U-shaped rod 13 is arranged on the end of the toggle rod 12 away from the gear 11. The U-shaped rod 13 is stuck on the end surface of the track rod 6. When the gear 11 rotates, the U-shaped rod 13 can be driven to push the track rod 6 to move, so as to separate the two track rods 6 during installation. The separation size is slightly larger than the chip width, which makes it convenient to place the chip between the clamping rods 8 on both sides.
[0024] Please refer to Figure 3As shown, a slideway 14 is vertically opened at the inner center of the transmission box 10, and a two-way gear rod 15 is slidably installed on the inner side of the slideway 14. The two-way gear rod 15 is placed between the two gears 11, and the two sides of the two-way gear rod 15 are respectively meshed with the two gears 11. When the two-way gear rod 15 is pushed up, the angle between the toggle rods 12 can be increased. At this time, the two track rods 6 are separated, and an extrusion head 16 is arranged at the bottom of the two-way gear rod 15. A rotating shaft 17 is installed between the two transmission boxes 10 through a bearing, and an eccentric wheel 18 is arranged on the surface of the rotating shaft 17 so that the two-way gear rod 15 can be moved upward by rotating the eccentric wheel 18.
[0025] Please refer to Figure 1 As shown, the eccentric wheel 18 is placed at the bottom of the slideway 14, the bottom of the extrusion head 16 is in contact with the surface of the eccentric wheel 18, the rotating shaft 17 is placed below between the two track rods 6, and a knob 171 is provided at the end of the rotating shaft 17. The knob 171 is placed on the outside of the back plate 2 to facilitate external control of the two eccentric wheels 18 to rotate in the same direction at the same time.
[0026] The working principle of the utility model is as follows: the mutual distances of the multiple fixed sleeves 7 are adjusted according to the test needs, and the positions of the two corresponding clamping rods 8 are ensured to be relative. Due to the presence of the springs 5 on both sides, the two sliders 4 always have the force to approach each other, thereby making the two track rods 6 approach each other, thereby making the two clamping rods 8 of the same group approach each other to clamp the chip. At the same time, since the clamping rod 8 is L-shaped, the bottom of the chip can be effectively supported to ensure the stability of the clamping during chip testing. At the same time, since the two sliders 4 are close to each other, the two toggle rods 12 can be made to tend to a vertical state. At this time, the two-way gear rod 15 is placed at the bottom of the stroke. When installing the chip, the knob 171 can be rotated to drive the rotating shaft 17 to rotate, thereby driving the eccentric wheel 18 to rotate. The eccentricity of the eccentric wheel 18 is used to squeeze the two-way gear rod 15 upward, thereby opening the angle between the two gears 11, and separating the two track rods 6 from each other through the U-shaped rod 13, thereby separating the two clamping rods 8 of the same group to facilitate clamping the chip.
[0027] The above is only a preferred embodiment of the present invention. It should be noted that, for ordinary technicians in the technical field, several improvements and modifications can be made without departing from the principle of the present invention, and these improvements and modifications should also be regarded as the protection scope of the present invention. The structures, devices and operating methods not specifically described and explained in the present invention shall be implemented according to the conventional means in the field unless otherwise specified and limited.
Claims
1. A chip environmental adaptability test tool, comprising a base plate (1), characterized in that: Back plates (2) are symmetrically arranged on both sides of the upper surface of the bottom plate (1), and a sliding groove (3) is transversely opened on the surface of the back plate (2). The two sliding grooves (3) are of equal height. Slide blocks (4) are symmetrically slidably installed on the inner sides of the sliding grooves (3). Springs (5) are symmetrically arranged on both sides of the inside of the sliding grooves (3). The two springs (5) are respectively arranged on the outer sides of the two slide blocks (4). A track rod (6) is arranged between the two slide blocks (4). The track rod (6) is arranged between the two back plates (2). The two track rods (6) are parallel to each other. Fixed sleeves (7) are evenly installed on the surface of the track rod (6) by bolts. A clamping rod (8) is vertically fixed on the inner surface of the fixed sleeve (7). The clamping rod (8) has an L-shaped structure. The two clamping rods (8) in the same group are symmetrically arranged. A clamping groove (9) adapted to the thickness of the chip is opened on the inner side of the clamping rod (8).
2. A chip environmental adaptability test tool according to claim 1, characterized in that: A transmission box (10) is arranged below the side where the two back plates (2) are close to each other, and gears (11) are symmetrically mounted on both sides of the upper part of the transmission box (10) via bearings.
3. A chip environmental adaptability test tool according to claim 2, characterized in that: A toggle rod (12) is fixed on the surface of the gear (11), the toggle rod (12) protrudes from the outer surface of the transmission box (10), and a U-shaped rod (13) is arranged at one end of the toggle rod (12) away from the gear (11).
4. A chip environmental adaptability test tool according to claim 3, characterized in that: The U-shaped rod (13) is clamped on the end surface of the track rod (6).
5. A chip environmental adaptability test tool according to claim 4, characterized in that: A slideway (14) is vertically provided at the center of the inner side of the transmission box (10), a bidirectional gear rod (15) is slidably installed inside the slideway (14), the bidirectional gear rod (15) is placed between the two gears (11), and the two sides of the bidirectional gear rod (15) are respectively meshed with the two gears (11).
6. A chip environmental adaptability test tool according to claim 5, characterized in that: An extrusion head (16) is arranged at the bottom of the bidirectional gear rod (15), a rotating shaft (17) is installed between the two transmission boxes (10) via a bearing, and an eccentric wheel (18) is arranged on the surface of the rotating shaft (17).
7. A chip environmental adaptability test tool according to claim 6, characterized in that: The eccentric wheel (18) is placed at the bottom of the slideway (14), and the bottom of the extrusion head (16) is in contact with the surface of the eccentric wheel (18).
8. The chip environmental adaptability test tool according to claim 6, characterized in that: The rotating shaft (17) is placed below and between the two track rods (6); a knob (171) is provided at the end of the rotating shaft (17); and the knob (171) is placed outside the back plate (2).
