This invention provides a sensitivity-enhanced
temperature measurement device based on an
optoelectronic oscillator, comprising: a
laser, an
intensity modulator, a
delay line interferometer, a sensitive arm
fiber optic unit located in the space where the
signal to be measured is located, a reference arm
fiber optic unit, a
photodetector, a
microwave amplifier, a bandpass filter, a power divider, and a frequency measurement section. The
intensity modulator generates an optical
signal containing two frequency components: a carrier wave f0 and a first-order single-
sideband wave f1. The
delay line interferometer then separates these two frequency components, allowing them to propagate separately along the reference arm and sensitive arm fibers. These components are then returned to the
delay line interferometer and combined to output an optical
signal whose phase contains the temperature signal to be measured. The
phase change of the optical signal caused by the temperature signal to be measured is then converted into a frequency change in the
microwave signal output by the
optoelectronic oscillator. This invention also provides a sensitivity-enhanced
temperature measurement method. The device provided by this invention can effectively improve the sensitivity of temperature detection.