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2 results about "Delay line interferometer" patented technology

A delay line interferometer (DLI) can be a Mach–Zehnder interferometer or Michelson interferometer based on two-beam interference, in which one beam is time-delayed to the other by a desired interval.

Quantum state encoding device and method without long delay line

PCT designated stageWO2026138776A1Injection lockedSoftware engineering
The present application discloses a quantum state encoding device and method without a long delay line. The device and method use a random minute radio frequency signal to modulate a laser to achieve phase difference adjustment between pulse pairs, while simultaneously employing chopping to achieve a constant phase difference between two laser pulses of a pulse pair. Thus, without the aid of a long delay line interferometer or multiple lasers used for injection locking, the requirements for phase randomization between pulse pairs and a constant or specific phase difference between the two laser pulses in each pulse pair can be simultaneously satisfied. In addition, the present application can be implemented by means of conventional lasers, intensity modulators, and phase modulators, facilitating chip integration and achieving high yield and good stability.
Owner:QUANTUMCTEK CO LTD

A Sensitized Temperature Measurement Device and Method Based on a Photoelectric Oscillator

This invention provides a sensitivity-enhanced temperature measurement device based on an optoelectronic oscillator, comprising: a laser, an intensity modulator, a delay line interferometer, a sensitive arm fiber optic unit located in the space where the signal to be measured is located, a reference arm fiber optic unit, a photodetector, a microwave amplifier, a bandpass filter, a power divider, and a frequency measurement section. The intensity modulator generates an optical signal containing two frequency components: a carrier wave f0 and a first-order single-sideband wave f1. The delay line interferometer then separates these two frequency components, allowing them to propagate separately along the reference arm and sensitive arm fibers. These components are then returned to the delay line interferometer and combined to output an optical signal whose phase contains the temperature signal to be measured. The phase change of the optical signal caused by the temperature signal to be measured is then converted into a frequency change in the microwave signal output by the optoelectronic oscillator. This invention also provides a sensitivity-enhanced temperature measurement method. The device provided by this invention can effectively improve the sensitivity of temperature detection.
Owner:ZHEJIANG UNIV