Processing method and system for testing log

Abstract

The invention relates to a method and a system for processing a test log, applied to an electronic device provided with a test program which generates a test log with a plurality of key words. A database is used to store a plurality of corresponding test program names and test standard sets which are respectively provided with a plurality of corresponding second key words and test standards; after detecting the name of a currently running test program of the electronic device, a detecting module is used to search the corresponding test standard set thereof from the database for an extraction module to extract the second key word corresponding to the test standard set from the database; a processing module is used to match the second key word selected one by one with the first key word in the test log generated corresponding to the current test program; when the first and second key words are matched, the test standard corresponding to the second key word is extracted from the database, and the test standard is loaded to the first key word corresponding to the test log.

Description

technical field [0001] The present invention relates to a test log (Log) processing technology, more specifically, to a test log processing method and system applied to an electronic device installed with a test program for generating test logs with multiple keywords. Background technique [0002] Existing tests, such as Baseboard Management Controller (BMC) tests, will generate relevant test logs (Log) after running corresponding test programs in electronic devices such as computers, for testers to use according to the test The log performs corresponding analysis and processing operations on the test. [0003] Existing test logs usually only record multiple keywords such as type (type) corresponding to the test program and the parameter values ​​​​corresponding to the keywords. However, if you are not familiar with the definition of the keywords, just refer to the above The test log cannot be analyzed and processed correctly according to the test log. At this time, it is g...

AI Technical Summary

Problems solved by technology

[0003] Existing test logs usually only record multiple keywords such as type (type) corresponding to the test program and the parameter values ​​​​corresponding to the keywords. However, if you are not familiar with the definition of the keywords, just refer to the above The test log cannot be analyzed and processed correctly according to the test log. At this time, it is generally necessary to use other media (such as a browser) to assist in viewing the keywords corresponding to each test program. Defined test standard (SPEC) set (a single keyword corresponds to the definition of a single test standard), and then according to the keyword recorded in the test log, search for the test standard defined by the keyword from the test standard set

However, the number of keywords recorded in each test log is not only one, and its quantity may be relatively large. If each analysis of the test log needs to be searched and matched one by one by the above-mentioned artificial method, it will not only waste time, but also affect the accuracy of the test results. The analysis and processing operation brings a certain degree of inconvenience; in addition, due to the large number of keywords to be searched and the uncertainty of human memory, the definition of each keyword may be confused in the subsequent test analysis and processing operations If the situation occurs, it will affect the results of subsequent test analysis and processing; moreover, the above operations need to view the test standard set through other media, so that additional test resources will be required

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