Method and equipment for testing temperature

Abstract

The invention provides a method and equipment for testing temperature, and the method comprises the following steps: electronic equipment is integrally provided with a first temperature; a local temperature regulation unit is moved to a position, where the distance from the local temperature regulation unit to a target local element in the electronic equipment is within a preset distance; the local temperature regulation unit is controlled for regulating the temperature of the target local element and detecting the temperature of the local area corresponding to the target local element; when the phenomenon that the temperature of the local area reaches a second temperature is detected, the local temperature regulation unit is controlled for terminating the temperature regulation; and the electronic equipment is detected to acquire the working condition information of the electronic equipment. By adopting the embodiment of the invention, differential environmental temperature test on the local element in the electronic equipment is realized.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of temperature testing, in particular to a temperature testing method and equipment. Background technique [0002] The ambient temperature test is a test to test the duration of normal operation of electronic equipment and the performance of electronic equipment at a preset ambient temperature. Ambient temperature parameter is an important indicator of electronic equipment. Ambient temperature testing is required for most electronic equipment. [0003] Electronic equipment works in the form of a complete machine, so the environmental temperature test of the electronic equipment in the prior art is also performed on the complete electronic equipment. Typically, the ambient temperature test equipment is a test chamber that provides a closed space that provides a uniform or nearly uniform temperature at a specific time. The tested electronic equipment is placed in the test incubator...

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Problems solved by technology

[0005] The embodiment of the present invention provides a temperature test method and equipment, which is used to solve the defect that the environmental temperature test equipment such as the test thermostat in the prior art cannot perform the environmental temperature test on the local components in the electronic equipment, and realize the temperature control of the electronic equipment. Ambient temperature test for local components

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