A kind of mosfet device and preparation method thereof
A device and substrate technology, applied in the field of MOSFET devices and their preparation, can solve problems such as lateral diffusion, increase in source-drain series resistance, and larger device size, so as to eliminate lateral diffusion, increase operating speed, and reduce source-drain series connection The effect of resistance
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[0041] According to one embodiment of the present invention, a method for forming a shallow trench isolation structure includes the following steps:
[0042] First, a first oxide layer and a first nitride layer are sequentially formed on the semiconductor substrate 101 . The first oxide layer can be obtained by high temperature oxidation, and its thickness can be 100-200 angstroms. The first oxide layer may serve as an isolation layer to protect the semiconductor substrate 101 from damage and contamination. The first nitride layer may be formed by a chemical vapor deposition (CVD) method, a physical vapor deposition (PVD) method, an atomic layer deposition (ALD) method, or the like. As an example, the first nitride layer may be formed by low pressure chemical vapor deposition using ammonia and dichlorosilane at a temperature of about 750°C. The first nitride layer can not only be used as a mask layer during the etching process of the semiconductor substrate 101, but also can...
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