Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Analytical Method of Electromagnetic Scattering by Multilayer Spin Electromagnetic Anisotropic Dielectric Ball

An anisotropic, analytical approach to the field of electromagnetic scattering from a three-dimensional dielectric sphere

Inactive Publication Date: 2016-11-02
HANGZHOU DIANZI UNIV
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to propose an analytical method for calculating the electromagnetic scattering of a multilayer spin electromagnetic anisotropic medium sphere in view of the deficiency of the existing electromagnetic scattering analytical solution theory

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Analytical Method of Electromagnetic Scattering by Multilayer Spin Electromagnetic Anisotropic Dielectric Ball
  • Analytical Method of Electromagnetic Scattering by Multilayer Spin Electromagnetic Anisotropic Dielectric Ball
  • Analytical Method of Electromagnetic Scattering by Multilayer Spin Electromagnetic Anisotropic Dielectric Ball

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0068] The present invention will be further described below in conjunction with drawings and embodiments.

[0069] An analytical method for electromagnetic scattering of a multilayer spin electromagnetic anisotropic dielectric sphere, comprising the following steps:

[0070] Assign values ​​to the parameters in the electromagnetic parameter matrix for each layer of the multilayer gyromagnetic medium:

[0071] The eigenvalues ​​and eigenvectors of each layer were calculated by a Fortran program. Then calculate the expansion coefficient of each layer and . In this way, we can calculate the expansion coefficient of the outermost layer (the first layer) through the boundary conditions (9a)-(10b), use (11a) (11b) to find the scattering coefficient, and finally use (12) to find the incident plane wave Bottom, the radar cross section of a multilayered spin electromagnetic sphere.

[0072] To sum up, the field inside the multi-layer rotating electromagnetic dielectric sphere c...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an analysis method for electromagnetic scattering of a multilayer spin electromagnetic anisotropy medium sphere. The steps of the present invention are as follows: Step 1. Utilize the established spin electromagnetic medium spherical vector wave function, according to the characteristics of the spherical vector wave function, draw the electromagnetic field in the uniform spin electromagnetic anisotropic medium, and the electromagnetic field can be used with the first and the second The second type of spherical vector wave function superposition represents; step 2. Utilize the tangential continuity of the electromagnetic field on the spherical boundary and the tangential orthogonal characteristics of the spherical vector wave function to obtain the spherical vector wave function for the electromagnetic field in the multilayer spiral electromagnetic dielectric sphere The iterative formula of the expanded expansion coefficient; solving the iterative equation, obtains the expansion coefficient expanded by the spherical vector wave function of the scattering field, and then obtains the electromagnetic scattering characteristics of the multi-layer rotating electromagnetic dielectric sphere under the incident plane wave. The invention is suitable for solving the electromagnetic scattering characteristics of multi-layer spin electromagnetic anisotropy medium spheres under general conditions.

Description

technical field [0001] The invention belongs to the field of electromagnetic scattering of three-dimensional dielectric spheres, and in particular relates to an analysis method for electromagnetic scattering of multi-layer spin electromagnetic anisotropic dielectric spheres. Background technique [0002] Generally, there are three main methods to study electromagnetic scattering. 1. Numerical calculation method, which is directly calculated by computer, such as method of moments, finite element, etc. The second is the experimental method, which is divided into direct test and scale model test, and the third is the analytical method, such as the mode expansion method, separation of variables, wave function method, etc. The analytical method is a relatively traditional research method, which has the disadvantage of high requirements for the model studied, but because it can give a closed solution, it has a clear physical meaning and is an exact solution. Using its numerical re...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F19/00
Inventor 耿友林葛亚岑田莹莹
Owner HANGZHOU DIANZI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com