Dynamic memory testing system and dynamic memory testing method

A dynamic memory and test system technology, applied in static memory, instruments, etc., can solve problems such as omissions and inability to support testing

Active Publication Date: 2015-04-08
SHENZHEN STATE MICROELECTRONICS CO LTD
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Problems solved by technology

[0002] As a general-purpose memory, dynamic memory widely exists in computer systems, and detailed and comprehensive testing of memory function indicators is a necessary condition to ensure reliable operation of memory; comprehensive testing involves all possible operating modes of dynamic memory, The test device must be able to generate corresponding test vectors. The comprehensive test here is mainly for the legal instruction operation in the dynamic memory. The legal instructions of the dynamic memory include commonly used read, write, precharge, etc., and several of these

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  • Dynamic memory testing system and dynamic memory testing method
  • Dynamic memory testing system and dynamic memory testing method
  • Dynamic memory testing system and dynamic memory testing method

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[0053] The principles and features of the invention will be described below in conjunction with the accompanying drawings, and the examples given are only used to explain the invention and are not intended to limit the scope of the invention.

[0054] figure 1 It is a schematic structural diagram of a dynamic memory testing system of the present invention; as figure 1 As shown, a dynamic memory test system of the present invention includes: a test vector generation and update platform, which is used to carry out software simulation testing through a dynamic memory simulation model, and captures software simulation tests according to the current dynamic memory instruction combination required for testing. The data of test waveform is to produce corresponding test vector; Control described dynamic memory to be in vector update state, carry out online update operation, described test vector is updated to dynamic memory test device; Dynamic memory test device, it is used for stori...

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Abstract

The invention discloses a dynamic memory testing system and a dynamic memory testing method. The dynamic memory testing system comprises a test vector generation and update platform and a dynamic memory testing device, wherein the test vector generation and update platform is used for software simulation test by virtue of a dynamic memory simulation model, is used for grasping data in a test waveform to generate special test vectors according to current test, controlling the dynamic memory to be in a vector updating state, executing an operation of updating the vectors and updating the test vectors to the dynamic memory testing device; the dynamic memory testing device is used for storing the test vector used for current test and controlling the dynamic memory to execute the test flow. According to the system and the method disclosed by the invention, due to the test vector generation and update platform, various test vectors required by complete testing dynamic memory command combination can be generated, and are transmitted to the dynamic memory testing device on line to dynamically update the testing vectors so as to quickly and completely test the dynamic memory. The dynamic memory testing system and the dynamic memory testing method disclosed by the invention can be widely applied to the field of digital test.

Description

technical field [0001] The invention relates to the field of digital testing, and more specifically, the invention relates to a dynamic memory testing system and method. Background technique [0002] As a general-purpose memory, dynamic memory widely exists in computer systems, and detailed and comprehensive testing of memory function indicators is a necessary condition to ensure reliable operation of memory; comprehensive testing involves all possible operating modes of dynamic memory, The test device must be able to generate corresponding test vectors. The comprehensive test here is mainly for the legal instruction operation in the dynamic memory. The legal instructions of the dynamic memory include commonly used read, write, precharge, etc., and several of these instructions Combining together, there are different command combinations, such as from reading to writing, from writing to reading, from reading to pre-charging, etc., the conversion of these commands is genera...

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Application Information

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IPC IPC(8): G11C29/56
Inventor 刘宇骐陈昆刘东李林旭章志李刚刘晓均
Owner SHENZHEN STATE MICROELECTRONICS CO LTD
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